FR2619633B1 - Appareil de mesure des caracteristiques de dispositifs electroniques - Google Patents

Appareil de mesure des caracteristiques de dispositifs electroniques

Info

Publication number
FR2619633B1
FR2619633B1 FR888811010A FR8811010A FR2619633B1 FR 2619633 B1 FR2619633 B1 FR 2619633B1 FR 888811010 A FR888811010 A FR 888811010A FR 8811010 A FR8811010 A FR 8811010A FR 2619633 B1 FR2619633 B1 FR 2619633B1
Authority
FR
France
Prior art keywords
measuring
electronic devices
electronic
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR888811010A
Other languages
English (en)
French (fr)
Other versions
FR2619633A1 (fr
Inventor
Hisashi Tamamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Publication of FR2619633A1 publication Critical patent/FR2619633A1/fr
Application granted granted Critical
Publication of FR2619633B1 publication Critical patent/FR2619633B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Current Or Voltage (AREA)
FR888811010A 1987-08-18 1988-08-18 Appareil de mesure des caracteristiques de dispositifs electroniques Expired - Fee Related FR2619633B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62204924A JPH0721526B2 (ja) 1987-08-18 1987-08-18 素子測定装置

Publications (2)

Publication Number Publication Date
FR2619633A1 FR2619633A1 (fr) 1989-02-24
FR2619633B1 true FR2619633B1 (fr) 1990-07-06

Family

ID=16498620

Family Applications (1)

Application Number Title Priority Date Filing Date
FR888811010A Expired - Fee Related FR2619633B1 (fr) 1987-08-18 1988-08-18 Appareil de mesure des caracteristiques de dispositifs electroniques

Country Status (6)

Country Link
US (1) US4818934A (enExample)
JP (1) JPH0721526B2 (enExample)
CA (1) CA1278880C (enExample)
DE (1) DE3814060A1 (enExample)
FR (1) FR2619633B1 (enExample)
GB (1) GB2208719B (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0632061B2 (ja) * 1990-08-27 1994-04-27 喜光 松本 アナログ乗算・平均回路及び該回路を使用した電力計回路
US5265099A (en) * 1991-02-28 1993-11-23 Feinstein David Y Method for heating dynamic memory units whereby
JP2512362B2 (ja) * 1991-12-03 1996-07-03 ソニー・テクトロニクス株式会社 素子測定装置
US5731700A (en) * 1994-03-14 1998-03-24 Lsi Logic Corporation Quiescent power supply current test method and apparatus for integrated circuits
JPH08195660A (ja) * 1995-01-19 1996-07-30 Rohm Co Ltd トランジスタのドライブ電流の予測方法
JP3558425B2 (ja) * 1995-09-01 2004-08-25 アジレント・テクノロジーズ・インク 信号切換装置およびスイッチ回路
US6281699B1 (en) * 2000-03-15 2001-08-28 Teradyne, Inc. Detector with common mode comparator for automatic test equipment
SG101938A1 (en) * 2000-06-16 2004-02-27 Yong Khim Swee High speed idd measurement circuit
US7411150B2 (en) * 2002-06-12 2008-08-12 Alstom Technology Ltd. Method of producing a composite component
JP6017176B2 (ja) * 2012-05-01 2016-10-26 エスアイアイ・セミコンダクタ株式会社 充放電制御回路を有する電子機器
WO2018204481A1 (en) * 2017-05-03 2018-11-08 Qualitau, Inc. Signal distribution apparatus
US10460326B2 (en) * 2017-10-24 2019-10-29 Global Circuit Innovations, Inc. Counterfeit integrated circuit detection by comparing integrated circuit signature to reference signature
CN111308232B (zh) * 2018-12-12 2022-08-19 中车株洲电力机车研究所有限公司 用于大功率变流模块电流回路杂散参数的测取系统及方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL148598B (nl) * 1948-12-29 1900-01-01 Science Union & Cie Werkwijze voor de bereiding van een geneesmiddel, dat de neiging van de bloedplaatjes tot samenklonteren en aan elkaar plakken vermindert, en een fibrinolytische werking vertoont, een geneesmiddel met een dergelijke werking, en een werkwijze voor de bereiding van een geneeskrachtige verbinding.
US3054954A (en) * 1958-10-14 1962-09-18 Philco Corp System for testing transistors
US3286180A (en) * 1962-06-22 1966-11-15 E H Res Lab Inc Electrical measuring apparatus for determining response time of transistors and the like
US3371276A (en) * 1964-12-28 1968-02-27 Rca Corp Apparatus responsive to radio frequency noise for non-destructively testing a reversely biased transistor for second breakdown
US3707677A (en) * 1971-03-08 1972-12-26 Communications Transistor Corp Method and apparatus for measuring r. f. current gain of a transistor
US3965420A (en) * 1974-12-16 1976-06-22 Rca Corporation Apparatus for non-destructively testing the voltage characteristics of a transistor
JPS5332428A (en) * 1976-09-08 1978-03-27 Hitachi Ltd Safety check circuit of combustion controlling apparatus
US4368425A (en) * 1980-11-24 1983-01-11 Dbx, Inc. System for and method of testing transistors
JPS61134682A (ja) * 1984-12-05 1986-06-21 Sony Tektronix Corp 素子特性測定装置
US4727318A (en) * 1984-10-04 1988-02-23 Sony/Tektronix Corporation Apparatus for measuring characteristics of electronic devices
NL8502385A (nl) * 1984-10-04 1986-05-01 Sony Tektronix Corp Inrichting voor het meten van de karakteristieken van elektronische inrichtingen.
JPS6187429A (ja) * 1984-10-04 1986-05-02 Sony Tektronix Corp 繰返し電圧発生回路

Also Published As

Publication number Publication date
FR2619633A1 (fr) 1989-02-24
DE3814060A1 (de) 1989-03-02
CA1278880C (en) 1991-01-08
GB8806770D0 (en) 1988-04-20
GB2208719A (en) 1989-04-12
US4818934A (en) 1989-04-04
GB2208719B (en) 1991-06-26
DE3814060C2 (enExample) 1993-06-24
JPH0721526B2 (ja) 1995-03-08
JPS6447967A (en) 1989-02-22

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Legal Events

Date Code Title Description
ST Notification of lapse