FR2581808B1 - Dispositif integre de protection dynamique, notamment pour des circuits integres a etages d'entree mos - Google Patents

Dispositif integre de protection dynamique, notamment pour des circuits integres a etages d'entree mos

Info

Publication number
FR2581808B1
FR2581808B1 FR868606709A FR8606709A FR2581808B1 FR 2581808 B1 FR2581808 B1 FR 2581808B1 FR 868606709 A FR868606709 A FR 868606709A FR 8606709 A FR8606709 A FR 8606709A FR 2581808 B1 FR2581808 B1 FR 2581808B1
Authority
FR
France
Prior art keywords
integrated
protection device
input stages
dynamic protection
mos input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR868606709A
Other languages
English (en)
Other versions
FR2581808A1 (fr
Inventor
Roberto Finaurini
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
SGS Microelettronica SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=11170318&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=FR2581808(B1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by SGS Microelettronica SpA filed Critical SGS Microelettronica SpA
Publication of FR2581808A1 publication Critical patent/FR2581808A1/fr
Application granted granted Critical
Publication of FR2581808B1 publication Critical patent/FR2581808B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0266—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electronic Switches (AREA)
  • Logic Circuits (AREA)
FR868606709A 1985-05-13 1986-05-09 Dispositif integre de protection dynamique, notamment pour des circuits integres a etages d'entree mos Expired - Lifetime FR2581808B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT8520670A IT1214606B (it) 1985-05-13 1985-05-13 Dispositivo integrato di protezione dinamica, in particolare per circuiti integrati con ingresso in tecnologia mos.

Publications (2)

Publication Number Publication Date
FR2581808A1 FR2581808A1 (fr) 1986-11-14
FR2581808B1 true FR2581808B1 (fr) 1990-10-26

Family

ID=11170318

Family Applications (1)

Application Number Title Priority Date Filing Date
FR868606709A Expired - Lifetime FR2581808B1 (fr) 1985-05-13 1986-05-09 Dispositif integre de protection dynamique, notamment pour des circuits integres a etages d'entree mos

Country Status (6)

Country Link
US (1) US4698720A (fr)
JP (1) JPH0746726B2 (fr)
DE (1) DE3615690C2 (fr)
FR (1) FR2581808B1 (fr)
GB (1) GB2175163B (fr)
IT (1) IT1214606B (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0724310B2 (ja) * 1987-01-23 1995-03-15 松下電子工業株式会社 半導体装置
US4750078A (en) * 1987-06-15 1988-06-07 Motorola, Inc. Semiconductor protection circuit having both positive and negative high voltage protection
JPH0748652B2 (ja) * 1987-07-23 1995-05-24 三菱電機株式会社 半導体回路装置の入力保護装置
US4835416A (en) * 1987-08-31 1989-05-30 National Semiconductor Corporation VDD load dump protection circuit
US4829350A (en) * 1988-05-05 1989-05-09 National Semiconductor Corporation Electrostatic discharge integrated circuit protection
DE4004526C1 (fr) * 1990-02-14 1991-09-05 Texas Instruments Deutschland Gmbh, 8050 Freising, De
EP0740344B1 (fr) * 1995-04-24 2002-07-24 Conexant Systems, Inc. Procédé et appareil pour le couplage de bus on-chip Vdd multiples, indépendants à un verrouillage ESD
US5745323A (en) * 1995-06-30 1998-04-28 Analog Devices, Inc. Electrostatic discharge protection circuit for protecting CMOS transistors on integrated circuit processes
US5751525A (en) * 1996-01-05 1998-05-12 Analog Devices, Inc. EOS/ESD Protection circuit for an integrated circuit with operating/test voltages exceeding power supply rail voltages
US5917689A (en) * 1996-09-12 1999-06-29 Analog Devices, Inc. General purpose EOS/ESD protection circuit for bipolar-CMOS and CMOS integrated circuits
US5838146A (en) * 1996-11-12 1998-11-17 Analog Devices, Inc. Method and apparatus for providing ESD/EOS protection for IC power supply pins
JP4917460B2 (ja) * 2007-03-19 2012-04-18 ルネサスエレクトロニクス株式会社 半導体装置
US7862656B2 (en) * 2007-07-03 2011-01-04 Siemens Medical Solutions Usa, Inc. Apparatus and method for growing a crystal and heating an annular channel circumscribing the crystal

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3636385A (en) * 1970-02-13 1972-01-18 Ncr Co Protection circuit
DE2539890B2 (de) * 1975-09-08 1978-06-01 Siemens Ag, 1000 Berlin Und 8000 Muenchen Schaltungsanordnung zum Schutz von Eingängen integrierter MOS-Schaltkreise
JPS6048106B2 (ja) * 1979-12-24 1985-10-25 富士通株式会社 半導体集積回路
JPS57109375A (en) * 1980-12-26 1982-07-07 Fujitsu Ltd Mis type transistor protection circuit
US4400625A (en) * 1981-11-30 1983-08-23 Reliance Electric Company Standby A-C power system with transfer compensation circuitry
US4492876A (en) * 1983-07-18 1985-01-08 At&T Bell Laboratories Power supply switching arrangement

Also Published As

Publication number Publication date
US4698720A (en) 1987-10-06
DE3615690A1 (de) 1986-11-13
JPH0746726B2 (ja) 1995-05-17
IT8520670A0 (it) 1985-05-13
FR2581808A1 (fr) 1986-11-14
GB2175163A (en) 1986-11-19
DE3615690C2 (de) 1996-09-12
IT1214606B (it) 1990-01-18
GB8611213D0 (en) 1986-06-18
GB2175163B (en) 1989-12-13
JPS61264749A (ja) 1986-11-22

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Legal Events

Date Code Title Description
D6 Patent endorsed licences of rights
ST Notification of lapse