FR2532512A1 - Procede de fabrication d'une matrice de composants electroniques - Google Patents

Procede de fabrication d'une matrice de composants electroniques Download PDF

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Publication number
FR2532512A1
FR2532512A1 FR8214582A FR8214582A FR2532512A1 FR 2532512 A1 FR2532512 A1 FR 2532512A1 FR 8214582 A FR8214582 A FR 8214582A FR 8214582 A FR8214582 A FR 8214582A FR 2532512 A1 FR2532512 A1 FR 2532512A1
Authority
FR
France
Prior art keywords
sub
matrix
matrices
components
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8214582A
Other languages
English (en)
French (fr)
Other versions
FR2532512B1 (enExample
Inventor
Jacques Duchene
Jacques Lacour
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR8214582A priority Critical patent/FR2532512A1/fr
Priority to CA000434828A priority patent/CA1195783A/en
Priority to EP83401687A priority patent/EP0102296B1/fr
Priority to DE8383401687T priority patent/DE3368128D1/de
Priority to JP58154222A priority patent/JPS5986243A/ja
Publication of FR2532512A1 publication Critical patent/FR2532512A1/fr
Application granted granted Critical
Publication of FR2532512B1 publication Critical patent/FR2532512B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
FR8214582A 1982-08-25 1982-08-25 Procede de fabrication d'une matrice de composants electroniques Granted FR2532512A1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR8214582A FR2532512A1 (fr) 1982-08-25 1982-08-25 Procede de fabrication d'une matrice de composants electroniques
CA000434828A CA1195783A (en) 1982-08-25 1983-08-17 Process for the production of a matrix of electronic components
EP83401687A EP0102296B1 (fr) 1982-08-25 1983-08-19 Procédé de fabrication d'une matrice de composants électroniques
DE8383401687T DE3368128D1 (en) 1982-08-25 1983-08-19 Process for manufacturing a matrix of electronic components
JP58154222A JPS5986243A (ja) 1982-08-25 1983-08-25 電子素子マトリツクスの製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8214582A FR2532512A1 (fr) 1982-08-25 1982-08-25 Procede de fabrication d'une matrice de composants electroniques

Publications (2)

Publication Number Publication Date
FR2532512A1 true FR2532512A1 (fr) 1984-03-02
FR2532512B1 FR2532512B1 (enExample) 1985-02-08

Family

ID=9277048

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8214582A Granted FR2532512A1 (fr) 1982-08-25 1982-08-25 Procede de fabrication d'une matrice de composants electroniques

Country Status (5)

Country Link
EP (1) EP0102296B1 (enExample)
JP (1) JPS5986243A (enExample)
CA (1) CA1195783A (enExample)
DE (1) DE3368128D1 (enExample)
FR (1) FR2532512A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4733393A (en) * 1985-12-12 1988-03-22 Itt Corporation Test method and apparatus for cellular array processor chip
JPH04351972A (ja) * 1990-04-26 1992-12-07 Genrad Inc フラットパネルディスプレイ用制御マトリックスの試験方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2137619A1 (de) * 1971-07-28 1973-02-08 Ibm Deutschland Verfahren zum pruefen des elektrischen durchganges
US3835530A (en) * 1967-06-05 1974-09-17 Texas Instruments Inc Method of making semiconductor devices
DE2409280A1 (de) * 1974-02-27 1975-08-28 Grundig Emv Verfahren zur schnellen ueberpruefung und fehlereingrenzung an umfangreichen schaltungsanordnungen
DE2739952A1 (de) * 1977-09-05 1979-03-15 Computer Ges Konstanz Grossintegrierter halbleiter-speicherbaustein in form einer unzerteilten halbleiterscheibe
US4191996A (en) * 1977-07-22 1980-03-04 Chesley Gilman D Self-configurable computer and memory system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3835530A (en) * 1967-06-05 1974-09-17 Texas Instruments Inc Method of making semiconductor devices
DE2137619A1 (de) * 1971-07-28 1973-02-08 Ibm Deutschland Verfahren zum pruefen des elektrischen durchganges
DE2409280A1 (de) * 1974-02-27 1975-08-28 Grundig Emv Verfahren zur schnellen ueberpruefung und fehlereingrenzung an umfangreichen schaltungsanordnungen
US4191996A (en) * 1977-07-22 1980-03-04 Chesley Gilman D Self-configurable computer and memory system
DE2739952A1 (de) * 1977-09-05 1979-03-15 Computer Ges Konstanz Grossintegrierter halbleiter-speicherbaustein in form einer unzerteilten halbleiterscheibe

Also Published As

Publication number Publication date
EP0102296A1 (fr) 1984-03-07
JPS5986243A (ja) 1984-05-18
FR2532512B1 (enExample) 1985-02-08
EP0102296B1 (fr) 1986-12-03
CA1195783A (en) 1985-10-22
DE3368128D1 (en) 1987-01-15

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