FR2425065A1 - Optical system for measuring surface reflectance properties - has optical elements aligned close to surface normal (OE 15.10.79) - Google Patents

Optical system for measuring surface reflectance properties - has optical elements aligned close to surface normal (OE 15.10.79)

Info

Publication number
FR2425065A1
FR2425065A1 FR7911074A FR7911074A FR2425065A1 FR 2425065 A1 FR2425065 A1 FR 2425065A1 FR 7911074 A FR7911074 A FR 7911074A FR 7911074 A FR7911074 A FR 7911074A FR 2425065 A1 FR2425065 A1 FR 2425065A1
Authority
FR
France
Prior art keywords
optical system
reflectance properties
elements aligned
optical elements
aligned close
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7911074A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Allnex Austria GmbH
Original Assignee
Vianova Resins AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vianova Resins AG filed Critical Vianova Resins AG
Publication of FR2425065A1 publication Critical patent/FR2425065A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Abstract

The measuring system consists of a light source (1) in whose beam is a splitter (3) by which a portion of the light output can be directed to a detector (7). The main beam passes through a single, moveable slit aperture (2) to a second splitter (4) with reference detector (8) and to an objective (5) and hence to the surface being measured (6). The light source and optical system is orientated at an angle of under 3 deg. with respect to the normal on the surface under measurement. This arrangement provides accurate measurement of the reflectance properties and is insensitive to stray illumination. An alternative arrangement has both the splitters between the slit and object lens.
FR7911074A 1978-05-02 1979-05-02 Optical system for measuring surface reflectance properties - has optical elements aligned close to surface normal (OE 15.10.79) Withdrawn FR2425065A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT313478A AT356935B (en) 1978-05-02 1978-05-02 ARRANGEMENT FOR MEASURING THE CHARACTERISTICS OF THE GLOSS SURFACE OF SURFACES

Publications (1)

Publication Number Publication Date
FR2425065A1 true FR2425065A1 (en) 1979-11-30

Family

ID=3545828

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7911074A Withdrawn FR2425065A1 (en) 1978-05-02 1979-05-02 Optical system for measuring surface reflectance properties - has optical elements aligned close to surface normal (OE 15.10.79)

Country Status (3)

Country Link
AT (1) AT356935B (en)
DE (1) DE2905727A1 (en)
FR (1) FR2425065A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109060730A (en) * 2018-09-21 2018-12-21 深圳市林上科技有限公司 A kind of vancometer

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4368982A (en) * 1980-06-09 1983-01-18 Avery International Corporation Retroreflectometer
DE3305284A1 (en) * 1983-02-16 1984-08-23 Siemens AG, 1000 Berlin und 8000 München Contactless measurement of the gloss of surfaces and coatings
DE4138679C2 (en) * 1991-11-25 1998-07-23 Helmut Dipl Ing Reiser Device for determining visual surface properties
US5747813A (en) * 1992-06-16 1998-05-05 Kla-Tencop. Corporation Broadband microspectro-reflectometer
FI111757B (en) * 1999-05-10 2003-09-15 Metso Automation Oy Method and Measurement Arrangement to Measure Paper Surface

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2451501A (en) * 1944-09-21 1948-10-19 Liben William Specular reflectometer
US3461856A (en) * 1965-10-23 1969-08-19 American Optical Corp Oximeters
DE1548263C3 (en) * 1966-11-10 1975-05-22 Ernst Leitz Gmbh, 6330 Wetzlar Method for determining the size of geometric changes or deviations of a reflective surface from a target surface by means of optical means
GB1214148A (en) * 1967-12-12 1970-12-02 Mining & Chemical Products Ltd Device for detecting variations in the surface reflectance of objects
DE2011597A1 (en) * 1970-03-11 1971-09-30 Ts B Technizne Przemysllu Masz Photo-optical system for non-contact measurement
DE2122655A1 (en) * 1971-05-07 1972-11-30 Max Planck Gesellschaft Optical absorption device for determining the concentration of a component of a substance mixture
AT334657B (en) * 1975-01-24 1976-01-25 Vianova Kunstharz Ag IMPROVEMENT FOR MEASURING THE GLOSS POWER OF PLANE SURFACES
US3972619A (en) * 1975-08-11 1976-08-03 General Atomic Company Method and apparatus for surface analysis

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109060730A (en) * 2018-09-21 2018-12-21 深圳市林上科技有限公司 A kind of vancometer

Also Published As

Publication number Publication date
AT356935B (en) 1980-06-10
ATA313478A (en) 1979-10-15
DE2905727A1 (en) 1979-11-15

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Legal Events

Date Code Title Description
ST Notification of lapse