JPS57179607A - Thickness gage for infrared ray film - Google Patents

Thickness gage for infrared ray film

Info

Publication number
JPS57179607A
JPS57179607A JP6401781A JP6401781A JPS57179607A JP S57179607 A JPS57179607 A JP S57179607A JP 6401781 A JP6401781 A JP 6401781A JP 6401781 A JP6401781 A JP 6401781A JP S57179607 A JPS57179607 A JP S57179607A
Authority
JP
Japan
Prior art keywords
infrared ray
wavelength
infrared
peak point
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6401781A
Other languages
Japanese (ja)
Inventor
Takafumi Fumoto
Mutsuo Sawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FUJI DENKI SOUGOU KENKYUSHO KK
Fuji Electric Co Ltd
Original Assignee
FUJI DENKI SOUGOU KENKYUSHO KK
Fuji Electric Co Ltd
Fuji Electric Corporate Research and Development Ltd
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FUJI DENKI SOUGOU KENKYUSHO KK, Fuji Electric Co Ltd, Fuji Electric Corporate Research and Development Ltd, Fuji Electric Manufacturing Co Ltd filed Critical FUJI DENKI SOUGOU KENKYUSHO KK
Priority to JP6401781A priority Critical patent/JPS57179607A/en
Publication of JPS57179607A publication Critical patent/JPS57179607A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material

Abstract

PURPOSE:To prevent the effect of disturbing light and to contrive to perform highly accurate measurement, by providing an infrared long path filter whose infrared ray transmittance at a reference wavelength and in the vicinity of the peak point where the measuring wavelength is the maximum in a light path in a light receiving part. CONSTITUTION:In the light receiving part 24 in the infrared ray film thickness gage, the infrared long path filter 38 is provided in front of a converging lens 28 facing a infrared detector 30. Said filter 38 has a cutoff wavelength which is as close as possible to the reference wavelength and the peak point of the measuring wavelength and is made to have the maximum transmittance in the vicinity of the peak point. Thus the disturbing light is cut off and the highly accurate measurement can be performed.
JP6401781A 1981-04-30 1981-04-30 Thickness gage for infrared ray film Pending JPS57179607A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6401781A JPS57179607A (en) 1981-04-30 1981-04-30 Thickness gage for infrared ray film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6401781A JPS57179607A (en) 1981-04-30 1981-04-30 Thickness gage for infrared ray film

Publications (1)

Publication Number Publication Date
JPS57179607A true JPS57179607A (en) 1982-11-05

Family

ID=13245966

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6401781A Pending JPS57179607A (en) 1981-04-30 1981-04-30 Thickness gage for infrared ray film

Country Status (1)

Country Link
JP (1) JPS57179607A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6176697U (en) * 1984-10-24 1986-05-23
EP0749000A2 (en) * 1995-06-16 1996-12-18 International Business Machines Corporation Method and apparatus for color thickness testing

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6176697U (en) * 1984-10-24 1986-05-23
EP0749000A2 (en) * 1995-06-16 1996-12-18 International Business Machines Corporation Method and apparatus for color thickness testing
EP0749000A3 (en) * 1995-06-16 1998-06-17 International Business Machines Corporation Method and apparatus for color thickness testing

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