JPS5764130A - Radiation thermometer - Google Patents
Radiation thermometerInfo
- Publication number
- JPS5764130A JPS5764130A JP55141084A JP14108480A JPS5764130A JP S5764130 A JPS5764130 A JP S5764130A JP 55141084 A JP55141084 A JP 55141084A JP 14108480 A JP14108480 A JP 14108480A JP S5764130 A JPS5764130 A JP S5764130A
- Authority
- JP
- Japan
- Prior art keywords
- board
- angle
- polarized light
- light
- incident
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 title abstract 3
- 238000009529 body temperature measurement Methods 0.000 abstract 2
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 abstract 1
- 229910001634 calcium fluoride Inorganic materials 0.000 abstract 1
- 238000001514 detection method Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
- 238000002834 transmittance Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Abstract
PURPOSE:To decrease the error of temperature measurement due to the background light, by setting an angle of the material to be measured facing to a radiation thermometer at a specific angle determined by an optical constant of the surface of the material to be measured and also and providing a polarized light apparatus on a photodetecting part. CONSTITUTION:A radiation thermometer 17 is set so as to face to a slab 3 the temperature of which is measured at an angle thetaB. thetaB is the angle of being a reflection factor of polarized light component in an incident face minimum. A polarized light apparatus 20 intercepting the polarized light component in the direction crossing at right angles to the incident face, is provided to a detection part 21. The apparatus 20 is composed of a relfecting board 24 having a high transmittance of infrared rays such as CaF2 and a light shielding board 28 and an input light 23 is made incident to the part 21 by reflecting with the board 24, the board 24 is set up so as to cross at right angles to the incident face for the slab 3 and because of setting up an incident angle 26 to the board 24 at Brewster's angle, the polarized light component in the incident face for the board 24 is not included in a reflected light 25 and a transmitted light 27 is not varied by the board 28. Hereby, the error of temperature measurement by the background light is lessened.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55141084A JPS5764130A (en) | 1980-10-08 | 1980-10-08 | Radiation thermometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55141084A JPS5764130A (en) | 1980-10-08 | 1980-10-08 | Radiation thermometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5764130A true JPS5764130A (en) | 1982-04-19 |
JPS6112212B2 JPS6112212B2 (en) | 1986-04-07 |
Family
ID=15283828
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55141084A Granted JPS5764130A (en) | 1980-10-08 | 1980-10-08 | Radiation thermometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5764130A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7350970B2 (en) * | 2003-05-30 | 2008-04-01 | Alexandr Mikhailovich Derevyagin | Dew point measurement method and device for carrying out said method |
CN110036265A (en) * | 2016-12-07 | 2019-07-19 | 旭化成株式会社 | Radiation temperature measurement device |
-
1980
- 1980-10-08 JP JP55141084A patent/JPS5764130A/en active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7350970B2 (en) * | 2003-05-30 | 2008-04-01 | Alexandr Mikhailovich Derevyagin | Dew point measurement method and device for carrying out said method |
CN110036265A (en) * | 2016-12-07 | 2019-07-19 | 旭化成株式会社 | Radiation temperature measurement device |
JP2021139917A (en) * | 2016-12-07 | 2021-09-16 | 旭化成株式会社 | Radiation temperature measuring device |
US11573128B2 (en) | 2016-12-07 | 2023-02-07 | Asahi Kasel Kabushiki Kaisha | Radiation temperature measuring device |
Also Published As
Publication number | Publication date |
---|---|
JPS6112212B2 (en) | 1986-04-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS55154439A (en) | Method and apparatus for measuring moisture content of paper | |
SE7903311L (en) | SET YEMFORA TWO SURFACE REFLECTION FEATURES | |
GB1104964A (en) | Skip detector for viscous layer filmstrip processor | |
JPS5764130A (en) | Radiation thermometer | |
DE69314829D1 (en) | Measuring the curvature of a surface | |
GB1218289A (en) | Infrared image translator | |
JPS5611439A (en) | Focus detector of camera | |
JPS56115905A (en) | Measuring method for thickness of transparent film and device therefor | |
JPS5760233A (en) | Radiation thermometer | |
JPS557654A (en) | Measuring unit for variance of refractive index | |
JPS55144567A (en) | Optical fiber device for light wave range finder | |
JPS5618731A (en) | Pyrheliometer employing solar battery | |
JPS5690227A (en) | Optical fiber temperature detector | |
JPS57120871A (en) | Magnetic field measuring device | |
JPS5750674A (en) | Radiation detector | |
JPS57153206A (en) | Light interference measuring device | |
JPS5473690A (en) | Method and apparatus for measuring linearity of photo detectors | |
JPS55158525A (en) | Optical sensor for detecting temperature | |
JPS57147004A (en) | Method for optical measurement of semiconductor plate dimension | |
Smartt | A Variable Transmittance Beam Splitter | |
JPS55159273A (en) | Optical unit | |
JPS5611326A (en) | Infrared ray detecting unit | |
JPS6466549A (en) | Transmission of light through light transmitting sheet-like product | |
SU453564A1 (en) | METHOD OF MEASURING THE THICKNESS OF A LAYER OF A SEMI-TRANSPARENT MATERIAL | |
JPS56112620A (en) | Measuring device for temperature |