JPS5661624A - Photometry unit of double beam spectrophotometer - Google Patents
Photometry unit of double beam spectrophotometerInfo
- Publication number
- JPS5661624A JPS5661624A JP13821479A JP13821479A JPS5661624A JP S5661624 A JPS5661624 A JP S5661624A JP 13821479 A JP13821479 A JP 13821479A JP 13821479 A JP13821479 A JP 13821479A JP S5661624 A JPS5661624 A JP S5661624A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- mirror
- double beam
- beam spectrophotometer
- photometry unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005375 photometry Methods 0.000 title abstract 3
- 230000004907 flux Effects 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
- G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
Abstract
PURPOSE:To permit the photometry unit of a double beam spectrophotometer having a simpler constitution to reduce the measuring error by providing means to allow the real images of a sample and a contrast sample by a converging spherical mirror to be focused with equal magnification on the photoactive face of a photoelectric detector. CONSTITUTION:The luminous flux having penetrated through a sample 1 is reflected by, e.g., a plane mirror 8, before being applied to an edge mirror 3 so that the optical path between the sample 1 and a converging spherical mirror 5 is made adjustable by the positions of the plane mirror 8 and the edge mirror 3. On a photoactive face 7 of a photoelectric sensor 6, the real images of the sample 1 and a contrast sample 2 having almost equal magnification are focused. This permits a simpler constitution to reduce the photometry error.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13821479A JPS5661624A (en) | 1979-10-24 | 1979-10-24 | Photometry unit of double beam spectrophotometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13821479A JPS5661624A (en) | 1979-10-24 | 1979-10-24 | Photometry unit of double beam spectrophotometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5661624A true JPS5661624A (en) | 1981-05-27 |
JPS6161332B2 JPS6161332B2 (en) | 1986-12-25 |
Family
ID=15216742
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13821479A Granted JPS5661624A (en) | 1979-10-24 | 1979-10-24 | Photometry unit of double beam spectrophotometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5661624A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59153132A (en) * | 1983-02-21 | 1984-09-01 | Shimadzu Corp | Spectrophotometer device for plurality of channels |
-
1979
- 1979-10-24 JP JP13821479A patent/JPS5661624A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59153132A (en) * | 1983-02-21 | 1984-09-01 | Shimadzu Corp | Spectrophotometer device for plurality of channels |
Also Published As
Publication number | Publication date |
---|---|
JPS6161332B2 (en) | 1986-12-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS51122483A (en) | Scanner type inspection device | |
JPS5483854A (en) | Measuring device | |
GB1090217A (en) | Optical system for measuring absorption of light | |
JPS5295221A (en) | Detector for focusing | |
DE3373212D1 (en) | Detector system for measuring the intensity of a radiation scattered at a predetermined angle from a sample irradiated at a specified angle of incidence | |
JPS55119006A (en) | Displacement measuring instrument | |
JPS5661624A (en) | Photometry unit of double beam spectrophotometer | |
JPS56160631A (en) | Measuring apparatus for thickness and eccentricity of lens or the like | |
JPS5629112A (en) | Distance measurement unit | |
JPS5767815A (en) | Measuring method for position of reflector using light | |
US3979596A (en) | Coronametric instrument for aerosol measurements | |
GB1252498A (en) | ||
JPS5720636A (en) | Measuring device for transmittance of lens | |
JPS56157841A (en) | Detecting apparatus for surface defect of body | |
JPS53107865A (en) | Detector of minute undulations | |
FR2425065A1 (en) | Optical system for measuring surface reflectance properties - has optical elements aligned close to surface normal (OE 15.10.79) | |
JPS5669606A (en) | Focus detector | |
JPS57120871A (en) | Magnetic field measuring device | |
JPS5435759A (en) | Measuring method of numerical aperture of optical fibers | |
JPS56166434A (en) | Chopper for spectrophotometer | |
JPS57178134A (en) | Specular surface defect observing device | |
JPS5648050A (en) | Reflected electron detector | |
JPS56146109A (en) | Photometric device | |
SU473049A2 (en) | The way to control the shape of concave aspherical surfaces | |
JPS57179607A (en) | Thickness gage for infrared ray film |