JPS5661624A - Photometry unit of double beam spectrophotometer - Google Patents

Photometry unit of double beam spectrophotometer

Info

Publication number
JPS5661624A
JPS5661624A JP13821479A JP13821479A JPS5661624A JP S5661624 A JPS5661624 A JP S5661624A JP 13821479 A JP13821479 A JP 13821479A JP 13821479 A JP13821479 A JP 13821479A JP S5661624 A JPS5661624 A JP S5661624A
Authority
JP
Japan
Prior art keywords
sample
mirror
double beam
beam spectrophotometer
photometry unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13821479A
Other languages
Japanese (ja)
Other versions
JPS6161332B2 (en
Inventor
Yoshio Toyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13821479A priority Critical patent/JPS5661624A/en
Publication of JPS5661624A publication Critical patent/JPS5661624A/en
Publication of JPS6161332B2 publication Critical patent/JPS6161332B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/22Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
    • G01J1/24Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors

Abstract

PURPOSE:To permit the photometry unit of a double beam spectrophotometer having a simpler constitution to reduce the measuring error by providing means to allow the real images of a sample and a contrast sample by a converging spherical mirror to be focused with equal magnification on the photoactive face of a photoelectric detector. CONSTITUTION:The luminous flux having penetrated through a sample 1 is reflected by, e.g., a plane mirror 8, before being applied to an edge mirror 3 so that the optical path between the sample 1 and a converging spherical mirror 5 is made adjustable by the positions of the plane mirror 8 and the edge mirror 3. On a photoactive face 7 of a photoelectric sensor 6, the real images of the sample 1 and a contrast sample 2 having almost equal magnification are focused. This permits a simpler constitution to reduce the photometry error.
JP13821479A 1979-10-24 1979-10-24 Photometry unit of double beam spectrophotometer Granted JPS5661624A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13821479A JPS5661624A (en) 1979-10-24 1979-10-24 Photometry unit of double beam spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13821479A JPS5661624A (en) 1979-10-24 1979-10-24 Photometry unit of double beam spectrophotometer

Publications (2)

Publication Number Publication Date
JPS5661624A true JPS5661624A (en) 1981-05-27
JPS6161332B2 JPS6161332B2 (en) 1986-12-25

Family

ID=15216742

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13821479A Granted JPS5661624A (en) 1979-10-24 1979-10-24 Photometry unit of double beam spectrophotometer

Country Status (1)

Country Link
JP (1) JPS5661624A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59153132A (en) * 1983-02-21 1984-09-01 Shimadzu Corp Spectrophotometer device for plurality of channels

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59153132A (en) * 1983-02-21 1984-09-01 Shimadzu Corp Spectrophotometer device for plurality of channels

Also Published As

Publication number Publication date
JPS6161332B2 (en) 1986-12-25

Similar Documents

Publication Publication Date Title
JPS51122483A (en) Scanner type inspection device
JPS5483854A (en) Measuring device
GB1090217A (en) Optical system for measuring absorption of light
JPS5295221A (en) Detector for focusing
DE3373212D1 (en) Detector system for measuring the intensity of a radiation scattered at a predetermined angle from a sample irradiated at a specified angle of incidence
JPS55119006A (en) Displacement measuring instrument
JPS5661624A (en) Photometry unit of double beam spectrophotometer
JPS56160631A (en) Measuring apparatus for thickness and eccentricity of lens or the like
JPS5629112A (en) Distance measurement unit
JPS5767815A (en) Measuring method for position of reflector using light
US3979596A (en) Coronametric instrument for aerosol measurements
GB1252498A (en)
JPS5720636A (en) Measuring device for transmittance of lens
JPS56157841A (en) Detecting apparatus for surface defect of body
JPS53107865A (en) Detector of minute undulations
FR2425065A1 (en) Optical system for measuring surface reflectance properties - has optical elements aligned close to surface normal (OE 15.10.79)
JPS5669606A (en) Focus detector
JPS57120871A (en) Magnetic field measuring device
JPS5435759A (en) Measuring method of numerical aperture of optical fibers
JPS56166434A (en) Chopper for spectrophotometer
JPS57178134A (en) Specular surface defect observing device
JPS5648050A (en) Reflected electron detector
JPS56146109A (en) Photometric device
SU473049A2 (en) The way to control the shape of concave aspherical surfaces
JPS57179607A (en) Thickness gage for infrared ray film