FR2394173A1 - Procede de fabrication de dispositifs electroniques qui comportent une couche mince de silicium amorphe et dispositif electronique obtenu par un tel procede - Google Patents
Procede de fabrication de dispositifs electroniques qui comportent une couche mince de silicium amorphe et dispositif electronique obtenu par un tel procedeInfo
- Publication number
- FR2394173A1 FR2394173A1 FR777717245A FR7717245A FR2394173A1 FR 2394173 A1 FR2394173 A1 FR 2394173A1 FR 777717245 A FR777717245 A FR 777717245A FR 7717245 A FR7717245 A FR 7717245A FR 2394173 A1 FR2394173 A1 FR 2394173A1
- Authority
- FR
- France
- Prior art keywords
- amorphous silicon
- thin layer
- electronic devices
- silicon
- device obtained
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910052710 silicon Inorganic materials 0.000 title abstract 2
- 239000010703 silicon Substances 0.000 title abstract 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 229910021417 amorphous silicon Inorganic materials 0.000 abstract 4
- 229910052739 hydrogen Inorganic materials 0.000 abstract 2
- 239000001257 hydrogen Substances 0.000 abstract 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 abstract 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- 238000009792 diffusion process Methods 0.000 abstract 1
- 230000005669 field effect Effects 0.000 abstract 1
- 150000002431 hydrogen Chemical class 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 239000010409 thin film Substances 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/58—After-treatment
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/58—After-treatment
- C23C14/5826—Treatment with charged particles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02631—Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/3003—Hydrogenation or deuterisation, e.g. using atomic hydrogen from a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/20—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
- H01L31/202—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic System
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Abstract
L'invention a pour but de conférer au silicium amorphe des propriétés compatibles avec la possibilité de modifier par dopage ou effet de champ la position du niveau de Fermi dans le volume du silicium amorphe et notamment d'en élever la résistivité électrique. L'invention consiste à introduire pour diffusion dans le silicium amorphe la quantité d'hydrogène nécessaire pour saturer les liaisons brisées existant dans le silicium pur à l'état amorphe. A cet effet on fait subir au silicium amorphe, préalablement déposé sous vide, un traitement à chaud consistant à maintenir une couche mince de ce matériau dans l'atmosphère d'un plasma contenant de l'hydrogène ou l'un de ses isotopes. Application aux dispositifs électroniques à couche mince semi-conductrice notamment aux piles solaires.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR777717245A FR2394173A1 (fr) | 1977-06-06 | 1977-06-06 | Procede de fabrication de dispositifs electroniques qui comportent une couche mince de silicium amorphe et dispositif electronique obtenu par un tel procede |
GB24344/78A GB1602038A (en) | 1977-06-06 | 1978-05-30 | Method for manufacturing a layer of amorphous silicon usable in an electronic device |
US05/912,533 US4151058A (en) | 1977-06-06 | 1978-06-05 | Method for manufacturing a layer of amorphous silicon usable in an electronic device |
DE2824564A DE2824564C2 (de) | 1977-06-06 | 1978-06-05 | Verfahren zum Herstellen von Halbleiterelementen wie Photodioden |
CA304,800A CA1097433A (fr) | 1977-06-06 | 1978-06-05 | Traduction non-disponible |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR777717245A FR2394173A1 (fr) | 1977-06-06 | 1977-06-06 | Procede de fabrication de dispositifs electroniques qui comportent une couche mince de silicium amorphe et dispositif electronique obtenu par un tel procede |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2394173A1 true FR2394173A1 (fr) | 1979-01-05 |
FR2394173B1 FR2394173B1 (fr) | 1981-04-10 |
Family
ID=9191720
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR777717245A Granted FR2394173A1 (fr) | 1977-06-06 | 1977-06-06 | Procede de fabrication de dispositifs electroniques qui comportent une couche mince de silicium amorphe et dispositif electronique obtenu par un tel procede |
Country Status (5)
Country | Link |
---|---|
US (1) | US4151058A (fr) |
CA (1) | CA1097433A (fr) |
DE (1) | DE2824564C2 (fr) |
FR (1) | FR2394173A1 (fr) |
GB (1) | GB1602038A (fr) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0010415A1 (fr) * | 1978-10-16 | 1980-04-30 | Exxon Research And Engineering Company | Procédé pour la fabrication d'un film semi-conducteur |
FR2462782A1 (fr) * | 1979-08-03 | 1981-02-13 | Thomson Csf | Procede de realisation d'une couche contenant du silicium et dispositif de conversion photoelectrique mettant en oeuvre ce procede |
FR2463510A1 (fr) * | 1979-08-10 | 1981-02-20 | Siemens Ag | Procede pour reduire la densite des etats de surface rapides dans le cas de composants mos |
FR2473792A1 (fr) * | 1980-01-11 | 1981-07-17 | Siemens Ag | Procede de fabrication de piles solaires |
FR2513659A1 (fr) * | 1981-09-29 | 1983-04-01 | Centre Nat Rech Scient | Procede de recuit superficiel par energie micro-onde pulsee de materiaux semi-conducteurs |
FR2536210A1 (fr) * | 1982-11-12 | 1984-05-18 | Rca Corp | Couches en silicium polycristallin pour dispositifs a semi-conducteurs et procede de formation d'un dispositif a semi-conducteurs |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4217374A (en) * | 1978-03-08 | 1980-08-12 | Energy Conversion Devices, Inc. | Amorphous semiconductors equivalent to crystalline semiconductors |
US4226898A (en) * | 1978-03-16 | 1980-10-07 | Energy Conversion Devices, Inc. | Amorphous semiconductors equivalent to crystalline semiconductors produced by a glow discharge process |
SE7803079L (sv) * | 1978-03-16 | 1979-09-17 | Lindstroem O | Framstellning av slipmedelspartiklar |
DE2836911C2 (de) * | 1978-08-23 | 1986-11-06 | Siemens AG, 1000 Berlin und 8000 München | Passivierungsschicht für Halbleiterbauelemente |
JPS5562778A (en) * | 1978-11-02 | 1980-05-12 | Fuji Photo Film Co Ltd | Preparation of photoconductor film |
DE2904171A1 (de) * | 1979-02-05 | 1980-08-14 | Siemens Ag | Verfahren zum herstellen von aus amorphem silizium bestehenden halbleiterkoerpern durch glimmentladung |
US4237150A (en) * | 1979-04-18 | 1980-12-02 | The United States Of America As Represented By The United States Department Of Energy | Method of producing hydrogenated amorphous silicon film |
US4237151A (en) * | 1979-06-26 | 1980-12-02 | The United States Of America As Represented By The United States Department Of Energy | Thermal decomposition of silane to form hydrogenated amorphous Si film |
FR2461359A1 (fr) * | 1979-07-06 | 1981-01-30 | Commissariat Energie Atomique | Procede et appareil d'hydrogenation de dispositifs a semi-conducteurs |
US4229502A (en) * | 1979-08-10 | 1980-10-21 | Rca Corporation | Low-resistivity polycrystalline silicon film |
DE2941908C2 (de) * | 1979-10-17 | 1986-07-03 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Verfahren zum Herstellen einer eine Silizium-Schicht aufweisenden Solarzelle |
US4266986A (en) * | 1979-11-29 | 1981-05-12 | Bell Telephone Laboratories, Incorporated | Passivation of defects in laser annealed semiconductors |
US4285762A (en) * | 1979-12-31 | 1981-08-25 | Exxon Research & Engineering Co. | Plasma etching of amorphous silicon (SE-35) |
JPS56137614A (en) * | 1980-03-31 | 1981-10-27 | Futaba Corp | Manufacture of amorphous silicon coat |
US4322253A (en) * | 1980-04-30 | 1982-03-30 | Rca Corporation | Method of making selective crystalline silicon regions containing entrapped hydrogen by laser treatment |
JPS56165371A (en) * | 1980-05-26 | 1981-12-18 | Shunpei Yamazaki | Semiconductor device |
US4315782A (en) * | 1980-07-21 | 1982-02-16 | Rca Corporation | Method of making semiconductor device with passivated rectifying junctions having hydrogenated amorphous regions |
JPS5750427A (en) * | 1980-09-12 | 1982-03-24 | Ushio Inc | Annealing device and annealing method |
JPS57205312A (en) * | 1981-05-12 | 1982-12-16 | Meidensha Electric Mfg Co Ltd | Silicon substance containing hydrogen, its manufacture and use |
US4402762A (en) * | 1981-06-02 | 1983-09-06 | John Puthenveetil K | Method of making highly stable modified amorphous silicon and germanium films |
US4465529A (en) * | 1981-06-05 | 1984-08-14 | Mitsubishi Denki Kabushiki Kaisha | Method of producing semiconductor device |
JPS57208181A (en) * | 1981-06-17 | 1982-12-21 | Hitachi Ltd | Manufacture of photoelectric conversion film |
JPS5826052A (ja) * | 1981-08-06 | 1983-02-16 | Asahi Glass Co Ltd | アルカリ拡散防止酸化ケイ素膜付ガラス体 |
GB2106709B (en) * | 1981-09-17 | 1986-11-12 | Itt Ind Ltd | Semiconductor processing |
US4589006A (en) * | 1982-08-23 | 1986-05-13 | The United States Of America As Represented By The United States Department Of Energy | Germanium detector passivated with hydrogenated amorphous germanium |
US4618381A (en) * | 1983-05-26 | 1986-10-21 | Fuji Electric Corporate Research And Development Ltd. | Method for adding impurities to semiconductor base material |
US4569697A (en) * | 1983-08-26 | 1986-02-11 | Energy Conversion Devices, Inc. | Method of forming photovoltaic quality amorphous alloys by passivating defect states |
US4710648A (en) * | 1984-05-09 | 1987-12-01 | Hitachi, Ltd. | Semiconductor including signal processor and transient detector for low temperature operation |
EP0211634B1 (fr) * | 1985-08-02 | 1994-03-23 | Sel Semiconductor Energy Laboratory Co., Ltd. | Procédé et appareil pour la fabrication de dispositifs semi-conducteurs |
US5296405A (en) * | 1985-08-02 | 1994-03-22 | Semiconductor Energy Laboratory Co.., Ltd. | Method for photo annealing non-single crystalline semiconductor films |
US5753542A (en) * | 1985-08-02 | 1998-05-19 | Semiconductor Energy Laboratory Co., Ltd. | Method for crystallizing semiconductor material without exposing it to air |
US5171710A (en) * | 1985-08-02 | 1992-12-15 | Semiconductor Energy Laboratory Co., Ltd. | Method for photo annealing non-single crystalline semiconductor films |
JPH0618176B2 (ja) * | 1986-03-14 | 1994-03-09 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 半導体製造装置 |
JPH0640550B2 (ja) * | 1987-06-09 | 1994-05-25 | 沖電気工業株式会社 | 薄膜トランジスタの製造方法 |
US5213670A (en) * | 1989-06-30 | 1993-05-25 | Siemens Aktiengesellschaft | Method for manufacturing a polycrystalline layer on a substrate |
US5198387A (en) * | 1989-12-01 | 1993-03-30 | Texas Instruments Incorporated | Method and apparatus for in-situ doping of deposited silicon |
US5578520A (en) | 1991-05-28 | 1996-11-26 | Semiconductor Energy Laboratory Co., Ltd. | Method for annealing a semiconductor |
US5766344A (en) * | 1991-09-21 | 1998-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Method for forming a semiconductor |
JPH05243596A (ja) * | 1992-03-02 | 1993-09-21 | Showa Shell Sekiyu Kk | 積層型太陽電池の製造方法 |
WO1993019022A1 (fr) * | 1992-03-25 | 1993-09-30 | Kanegafuchi Chemical Industry Co., Ltd. | Couche mince de polysilicium et sa fabrication |
US7097712B1 (en) | 1992-12-04 | 2006-08-29 | Semiconductor Energy Laboratory Co., Ltd. | Apparatus for processing a semiconductor |
CN100367461C (zh) | 1993-11-05 | 2008-02-06 | 株式会社半导体能源研究所 | 一种制造薄膜晶体管和电子器件的方法 |
US6897100B2 (en) | 1993-11-05 | 2005-05-24 | Semiconductor Energy Laboratory Co., Ltd. | Method for processing semiconductor device apparatus for processing a semiconductor and apparatus for processing semiconductor device |
US5624873A (en) * | 1993-11-12 | 1997-04-29 | The Penn State Research Foundation | Enhanced crystallization of amorphous films |
DE19640832C2 (de) * | 1996-10-02 | 2000-08-10 | Fraunhofer Ges Forschung | Verfahren zur Herstellung wärmereflektierender Schichtsysteme |
DE102013018533B4 (de) * | 2013-08-23 | 2019-01-10 | Centrotherm Photovoltaics Ag | Verfahren zum Reduzieren der Oberflächenrauigkeit einer Oberfläche aus Halbleitermaterial eines Substrats mit 3-D Strukturen |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3463715A (en) * | 1966-07-07 | 1969-08-26 | Trw Inc | Method of cathodically sputtering a layer of silicon having a reduced resistivity |
US3501336A (en) * | 1967-12-11 | 1970-03-17 | Texas Instruments Inc | Method for etching single crystal silicon substrates and depositing silicon thereon |
GB1384692A (en) * | 1971-06-05 | 1975-02-19 | Marconi Co Ltd | Methods of producing amorphous semiconductor devices |
AU503228B2 (en) * | 1975-07-28 | 1979-08-30 | Rca Corp. | Semiconductor device |
US4064521A (en) * | 1975-07-28 | 1977-12-20 | Rca Corporation | Semiconductor device having a body of amorphous silicon |
CA1078078A (fr) * | 1976-03-22 | 1980-05-20 | David E. Carlson | Dispositif a semiconducteur a barriere de schottky et methode de fabrication |
-
1977
- 1977-06-06 FR FR777717245A patent/FR2394173A1/fr active Granted
-
1978
- 1978-05-30 GB GB24344/78A patent/GB1602038A/en not_active Expired
- 1978-06-05 CA CA304,800A patent/CA1097433A/fr not_active Expired
- 1978-06-05 DE DE2824564A patent/DE2824564C2/de not_active Expired
- 1978-06-05 US US05/912,533 patent/US4151058A/en not_active Expired - Lifetime
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0010415A1 (fr) * | 1978-10-16 | 1980-04-30 | Exxon Research And Engineering Company | Procédé pour la fabrication d'un film semi-conducteur |
FR2462782A1 (fr) * | 1979-08-03 | 1981-02-13 | Thomson Csf | Procede de realisation d'une couche contenant du silicium et dispositif de conversion photoelectrique mettant en oeuvre ce procede |
EP0024378A1 (fr) * | 1979-08-03 | 1981-03-04 | Thomson-Csf | Procédé de réalisation d'une couche contenant du silicium à structure hybride entre les formes amorphe et polycristalline, et pile solaire comprenant une telle couche |
FR2463510A1 (fr) * | 1979-08-10 | 1981-02-20 | Siemens Ag | Procede pour reduire la densite des etats de surface rapides dans le cas de composants mos |
FR2473792A1 (fr) * | 1980-01-11 | 1981-07-17 | Siemens Ag | Procede de fabrication de piles solaires |
FR2513659A1 (fr) * | 1981-09-29 | 1983-04-01 | Centre Nat Rech Scient | Procede de recuit superficiel par energie micro-onde pulsee de materiaux semi-conducteurs |
EP0076769A1 (fr) * | 1981-09-29 | 1983-04-13 | Centre National De La Recherche Scientifique (Cnrs) | Procédé de recuit superficiel par énergie micro-onde pulsée de matériaux semi-conducteurs |
FR2536210A1 (fr) * | 1982-11-12 | 1984-05-18 | Rca Corp | Couches en silicium polycristallin pour dispositifs a semi-conducteurs et procede de formation d'un dispositif a semi-conducteurs |
Also Published As
Publication number | Publication date |
---|---|
US4151058A (en) | 1979-04-24 |
DE2824564A1 (de) | 1978-12-14 |
GB1602038A (en) | 1981-11-04 |
FR2394173B1 (fr) | 1981-04-10 |
CA1097433A (fr) | 1981-03-10 |
DE2824564C2 (de) | 1984-12-06 |
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