FR2379800A1 - Procede de mesure de valeurs absolues au moyen d'un capteur de mesure a fonctionnement non lineaire et d'un dispositif de mesure pour la realisation de ce procede - Google Patents

Procede de mesure de valeurs absolues au moyen d'un capteur de mesure a fonctionnement non lineaire et d'un dispositif de mesure pour la realisation de ce procede

Info

Publication number
FR2379800A1
FR2379800A1 FR7804327A FR7804327A FR2379800A1 FR 2379800 A1 FR2379800 A1 FR 2379800A1 FR 7804327 A FR7804327 A FR 7804327A FR 7804327 A FR7804327 A FR 7804327A FR 2379800 A1 FR2379800 A1 FR 2379800A1
Authority
FR
France
Prior art keywords
absolute
measurement
measuring
quantities
absolute values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7804327A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zumbach Electronic AG
Original Assignee
Zumbach Electronic AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic AG filed Critical Zumbach Electronic AG
Publication of FR2379800A1 publication Critical patent/FR2379800A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/008—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 with calibration coefficients stored in memory

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

La présente invention a pour objet un procédé pour la mesure de valeurs absolues au moyen d'un capteur de mesure à fonctionnement non linéaire, ainsi que les dispositifs pour l'application de ce procédé. Le procédé permet une mesure absolue dans une gamme déterminée sans mesure comparative simultanée sur un objet de référence par mémorisation des grandeurs absolues d'un nombre de valeurs de mesure donné et appel aux adresses correspondantes de la mémoire des grandeurs absolues lors de la mesure Il autorise une résolution plus ou moins fine suivant le nombre de grandeurs absolues mémorisé. Le disposition conforme à l'invention comprend un moyen de saisie des valeurs absolues et une mémoire pour un certain nombre de valeurs absolues sous les adresses correspondant aux grandeurs de mesure et un moyen de prélèvement des grandeurs absolues mémorisées en fonction des grandeurs de mesure entrées. L'invention s'applique au contrôle de l'épaisseur de l'isolation de câbles, d'épaisseurs de parois de tubes et de revêtement de tôles.
FR7804327A 1977-02-08 1978-02-02 Procede de mesure de valeurs absolues au moyen d'un capteur de mesure a fonctionnement non lineaire et d'un dispositif de mesure pour la realisation de ce procede Withdrawn FR2379800A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH148077A CH615503A5 (fr) 1977-02-08 1977-02-08

Publications (1)

Publication Number Publication Date
FR2379800A1 true FR2379800A1 (fr) 1978-09-01

Family

ID=4211453

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7804327A Withdrawn FR2379800A1 (fr) 1977-02-08 1978-02-02 Procede de mesure de valeurs absolues au moyen d'un capteur de mesure a fonctionnement non lineaire et d'un dispositif de mesure pour la realisation de ce procede

Country Status (8)

Country Link
US (1) US4181961A (fr)
AU (1) AU3286478A (fr)
BE (1) BE863532A (fr)
CA (1) CA1097815A (fr)
CH (1) CH615503A5 (fr)
DE (1) DE2804678B2 (fr)
FR (1) FR2379800A1 (fr)
GB (1) GB1595682A (fr)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2439975A1 (fr) * 1978-10-23 1980-05-23 Otdel Fiz Nerazrushajuschego Dispositif pour la mesure d'epaisseurs de revetements
FR2450441A1 (fr) * 1978-12-18 1980-09-26 Schlumberger Prospection Procede et dispositif d'inspection electromagnetique des tubages avec correction de permeabilite
FR2509851A1 (fr) * 1981-07-17 1983-01-21 Tesa Sa Capteur electronique de mesure
FR2590671A1 (fr) * 1985-11-26 1987-05-29 Iveco Fiat Procede et appareil pour mesurer des parametres lies a la trempe de pieces metalliques
EP0280632A1 (fr) * 1987-02-26 1988-08-31 Sgs-Thomson Microelectronics S.A. Dispositif électronique de mesure d'angle

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2948337C2 (de) * 1979-10-11 1983-07-21 Maag-Zahnräder & -Maschinen AG, 8023 Zürich Schaltungsanordnung zum Festlegen der Grenzen einer Meßstrecke eines Zahnflankenprüfgerätes
DE3024716C2 (de) * 1980-06-30 1986-10-23 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Digitales Längen- oder Winkelmeßsystem
US4443117A (en) * 1980-09-26 1984-04-17 Terumo Corporation Measuring apparatus, method of manufacture thereof, and method of writing data into same
DE3036830C2 (de) * 1980-09-30 1987-01-08 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Verfahren zur Korrektur von Meßwerten bei einem digitalen elektrischen Längen- oder Winkelmeßsystem
DE3128095A1 (de) * 1981-07-16 1983-02-03 Hartmann & Braun Ag, 6000 Frankfurt "verfahren zur digitalen korrektur des zusammenhanges zwischen einem digitalen eingangssignal und einem digitalen ausgangssignal sowie schaltungsanordnung zur durchfuehrung dieses verfahrens"
DE3404720A1 (de) * 1984-02-10 1985-08-14 Karl Deutsch Prüf- und Meßgerätebau GmbH + Co KG, 5600 Wuppertal Verfahren und vorrichtung zur schichtdickenmessung
FI70485C (fi) * 1984-10-26 1986-09-19 Vaisala Oy Maetningsfoerfarande foer impedanser saerskilt smao kapacitanser vid vilket man anvaender en eller flera referenser
JPS61137011A (ja) * 1984-12-06 1986-06-24 Dainippon Screen Mfg Co Ltd エンコ−ダ出力の精度向上方法
DE3516303A1 (de) * 1985-05-07 1986-11-13 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur transformation der signalcharakteristik eines sensorsignals
US5258931A (en) * 1988-07-08 1993-11-02 Parker-Hannifin Corporation Precision electronic absolute and relative position sensing device and method of using same
DE3826698A1 (de) * 1988-08-05 1990-02-08 Wacker Chemitronic Verfahren und vorrichtung zur kontrolle des schnittverlaufes beim abtrennen von scheiben von nichtmagnetisierbaren werkstuecken
US4970670A (en) * 1988-11-30 1990-11-13 Westinghouse Electric Corp. Temperature compensated eddy current sensor temperature measurement in turbine blade shroud monitor
US5485082A (en) * 1990-04-11 1996-01-16 Micro-Epsilon Messtechnik Gmbh & Co. Kg Method of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the like
US5142284A (en) * 1990-04-25 1992-08-25 Tektronix, Inc. Sample and hold with intermediate reset voltage outside of the magnitude range of the input
US5185635A (en) * 1990-04-25 1993-02-09 Tektronix, Inc. Method of calibrating and controlling the optical power output of an OTDR
GB9208190D0 (en) * 1992-04-11 1992-05-27 Elcometer Instr Ltd Measuring instrument
US8286081B2 (en) 2009-04-30 2012-10-09 Apple Inc. Editing and saving key-indexed geometries in media editing applications
CN103471641B (zh) * 2013-09-03 2015-12-23 中国科学技术大学 一种电涡流传感器的温度漂移自动校正方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3855466A (en) * 1973-04-05 1974-12-17 Bodenseewerk Geraetetech Circuit arrangement for linearization of the characteristic of a sensor
DE2360011A1 (de) * 1973-06-05 1975-01-02 Rationalisierung Konfekt Veb Verfahren zur temperaturmessung mittels eines halbleiterwiderstandes
FR2329975A1 (fr) * 1975-11-03 1977-05-27 Siemens Ag Montage numerique pour lineariser des courbes caracteristiques non lineaires de generateurs
DE2703932A1 (de) * 1976-02-02 1977-09-01 Perkin Elmer Corp Verfahren und vorrichtung zur fehlerkorrektur

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1305092A (fr) * 1969-04-23 1973-01-31
US3662163A (en) * 1970-08-04 1972-05-09 Gen Electric Digital signal linearizer
US3790910A (en) * 1972-04-21 1974-02-05 Garrett Corp Conditioning circuit and method for variable frequency sensor
US3808525A (en) * 1972-06-22 1974-04-30 A Ott Thickness measuring device for indicating the mean value of a pre-set number of measurements of the thickness of a layer
US3878457A (en) * 1973-11-16 1975-04-15 Wayne E Rodgers Thin film thickness measuring apparatus using an unbalanced inductive bridge

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3855466A (en) * 1973-04-05 1974-12-17 Bodenseewerk Geraetetech Circuit arrangement for linearization of the characteristic of a sensor
DE2360011A1 (de) * 1973-06-05 1975-01-02 Rationalisierung Konfekt Veb Verfahren zur temperaturmessung mittels eines halbleiterwiderstandes
FR2329975A1 (fr) * 1975-11-03 1977-05-27 Siemens Ag Montage numerique pour lineariser des courbes caracteristiques non lineaires de generateurs
DE2703932A1 (de) * 1976-02-02 1977-09-01 Perkin Elmer Corp Verfahren und vorrichtung zur fehlerkorrektur

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2439975A1 (fr) * 1978-10-23 1980-05-23 Otdel Fiz Nerazrushajuschego Dispositif pour la mesure d'epaisseurs de revetements
FR2450441A1 (fr) * 1978-12-18 1980-09-26 Schlumberger Prospection Procede et dispositif d'inspection electromagnetique des tubages avec correction de permeabilite
FR2509851A1 (fr) * 1981-07-17 1983-01-21 Tesa Sa Capteur electronique de mesure
FR2590671A1 (fr) * 1985-11-26 1987-05-29 Iveco Fiat Procede et appareil pour mesurer des parametres lies a la trempe de pieces metalliques
EP0280632A1 (fr) * 1987-02-26 1988-08-31 Sgs-Thomson Microelectronics S.A. Dispositif électronique de mesure d'angle

Also Published As

Publication number Publication date
CH615503A5 (fr) 1980-01-31
BE863532A (fr) 1978-05-29
GB1595682A (en) 1981-08-12
AU3286478A (en) 1979-08-09
DE2804678A1 (de) 1978-08-10
DE2804678B2 (de) 1979-11-22
US4181961A (en) 1980-01-01
CA1097815A (fr) 1981-03-17

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Legal Events

Date Code Title Description
RE Withdrawal of published application