BE869791A - Dispositif de mesure pour analyse de fluorescence x - Google Patents

Dispositif de mesure pour analyse de fluorescence x

Info

Publication number
BE869791A
BE869791A BE189920A BE189920A BE869791A BE 869791 A BE869791 A BE 869791A BE 189920 A BE189920 A BE 189920A BE 189920 A BE189920 A BE 189920A BE 869791 A BE869791 A BE 869791A
Authority
BE
Belgium
Prior art keywords
measuring device
fluorescence analysis
fluorescence
analysis
measuring
Prior art date
Application number
BE189920A
Other languages
English (en)
Original Assignee
Kernenergieverwert Ges Fuer
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kernenergieverwert Ges Fuer filed Critical Kernenergieverwert Ges Fuer
Publication of BE869791A publication Critical patent/BE869791A/fr

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE189920A 1977-08-17 1978-08-17 Dispositif de mesure pour analyse de fluorescence x BE869791A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2736960A DE2736960C3 (de) 1977-08-17 1977-08-17 Meßanordnung zur Röntgenfluoreszenzanalyse

Publications (1)

Publication Number Publication Date
BE869791A true BE869791A (fr) 1978-12-18

Family

ID=6016538

Family Applications (1)

Application Number Title Priority Date Filing Date
BE189920A BE869791A (fr) 1977-08-17 1978-08-17 Dispositif de mesure pour analyse de fluorescence x

Country Status (12)

Country Link
US (1) US4426717A (fr)
AT (1) AT368285B (fr)
BE (1) BE869791A (fr)
CA (1) CA1111576A (fr)
CH (1) CH635433A5 (fr)
DE (1) DE2736960C3 (fr)
DK (1) DK146367C (fr)
FR (1) FR2400704A1 (fr)
GB (1) GB2003267B (fr)
IT (1) IT1162195B (fr)
LU (1) LU80106A1 (fr)
NL (1) NL185305C (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3542003A1 (de) * 1985-11-28 1987-06-04 Geesthacht Gkss Forschung Verfahren zur zerstoerungsfreien analyse der oberflaechenschicht von proben
DE3606748C1 (de) * 1986-03-01 1987-10-01 Geesthacht Gkss Forschung Anordnung zur zerstoerungsfreien Messung von Metallspuren
DE3813329A1 (de) * 1988-04-21 1989-11-02 Geesthacht Gkss Forschung Verfahren und anordnung zur sammlung und analyse von staub
EP0372278A3 (fr) * 1988-12-02 1991-08-21 Gkss-Forschungszentrum Geesthacht Gmbh Procédé et appareil d'analyse d'échantillons par fluorescence aux rayons X
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
US5220591A (en) * 1989-10-19 1993-06-15 Sumitomo Electric Industries, Ltd. Total reflection X-ray fluorescence apparatus
US5249216B1 (en) * 1989-10-19 1996-11-05 Sumitomo Electric Industries Total reflection x-ray fluorescence apparatus
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
DE4127778C2 (de) * 1991-04-30 1994-11-03 Picolab Oberflaechen Und Spure Vorrichtung zur Totalreflexions-Röntgenfluoreszenzanalyse
CN109827982B (zh) * 2017-11-23 2024-04-26 核工业西南物理研究院 一种土壤重金属检测的快速检测仪

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer

Also Published As

Publication number Publication date
FR2400704A1 (fr) 1979-03-16
AT368285B (de) 1982-09-27
FR2400704B1 (fr) 1983-09-16
NL7808130A (nl) 1979-02-20
DE2736960C3 (de) 1980-03-06
GB2003267A (en) 1979-03-07
GB2003267B (en) 1982-01-06
DE2736960B2 (de) 1979-06-28
US4426717A (en) 1984-01-17
DK325778A (da) 1979-02-18
DK146367B (da) 1983-09-19
NL185305B (nl) 1989-10-02
ATA557478A (de) 1982-01-15
IT1162195B (it) 1987-03-25
NL185305C (nl) 1990-03-01
DK146367C (da) 1984-02-27
CA1111576A (fr) 1981-10-27
CH635433A5 (de) 1983-03-31
LU80106A1 (fr) 1979-01-19
IT7883626A0 (it) 1978-07-16
DE2736960A1 (de) 1979-03-01

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Legal Events

Date Code Title Description
RE Patent lapsed

Owner name: GESELLSCHAFT FUR KERNENERGIEVERWERTUNG IN SCHIFFB

Effective date: 19910831