DK325778A - Maaleapparat til roentgenfluorescensanalyse - Google Patents

Maaleapparat til roentgenfluorescensanalyse

Info

Publication number
DK325778A
DK325778A DK325778A DK325778A DK325778A DK 325778 A DK325778 A DK 325778A DK 325778 A DK325778 A DK 325778A DK 325778 A DK325778 A DK 325778A DK 325778 A DK325778 A DK 325778A
Authority
DK
Denmark
Prior art keywords
roentgenfluoresce
analysis
measuring apparatus
measuring
roentgenfluoresce analysis
Prior art date
Application number
DK325778A
Other languages
English (en)
Other versions
DK146367B (da
DK146367C (da
Inventor
H Schwenke
J Knoth
R Marten
H Rosomm
Original Assignee
Kernenergieverwert Ges Fuer
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kernenergieverwert Ges Fuer filed Critical Kernenergieverwert Ges Fuer
Publication of DK325778A publication Critical patent/DK325778A/da
Publication of DK146367B publication Critical patent/DK146367B/da
Application granted granted Critical
Publication of DK146367C publication Critical patent/DK146367C/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK325778A 1977-08-17 1978-07-21 Maaleapparat til roentgenfluorescensanalyse DK146367C (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2736960 1977-08-17
DE2736960A DE2736960C3 (de) 1977-08-17 1977-08-17 Meßanordnung zur Röntgenfluoreszenzanalyse

Publications (3)

Publication Number Publication Date
DK325778A true DK325778A (da) 1979-02-18
DK146367B DK146367B (da) 1983-09-19
DK146367C DK146367C (da) 1984-02-27

Family

ID=6016538

Family Applications (1)

Application Number Title Priority Date Filing Date
DK325778A DK146367C (da) 1977-08-17 1978-07-21 Maaleapparat til roentgenfluorescensanalyse

Country Status (12)

Country Link
US (1) US4426717A (da)
AT (1) AT368285B (da)
BE (1) BE869791A (da)
CA (1) CA1111576A (da)
CH (1) CH635433A5 (da)
DE (1) DE2736960C3 (da)
DK (1) DK146367C (da)
FR (1) FR2400704A1 (da)
GB (1) GB2003267B (da)
IT (1) IT1162195B (da)
LU (1) LU80106A1 (da)
NL (1) NL185305C (da)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3542003A1 (de) * 1985-11-28 1987-06-04 Geesthacht Gkss Forschung Verfahren zur zerstoerungsfreien analyse der oberflaechenschicht von proben
DE3606748C1 (de) * 1986-03-01 1987-10-01 Geesthacht Gkss Forschung Anordnung zur zerstoerungsfreien Messung von Metallspuren
DE3813329A1 (de) * 1988-04-21 1989-11-02 Geesthacht Gkss Forschung Verfahren und anordnung zur sammlung und analyse von staub
EP0372278A3 (de) * 1988-12-02 1991-08-21 Gkss-Forschungszentrum Geesthacht Gmbh Verfahren und Anordung zur Untersuchung von Proben nach der Methode der Röntgenfluoreszenzanalyse
JP2853261B2 (ja) * 1989-05-16 1999-02-03 三菱マテリアル株式会社 金属分析方法および分析装置
US5249216B1 (en) * 1989-10-19 1996-11-05 Sumitomo Electric Industries Total reflection x-ray fluorescence apparatus
US5220591A (en) * 1989-10-19 1993-06-15 Sumitomo Electric Industries, Ltd. Total reflection X-ray fluorescence apparatus
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
DE4127778C2 (de) * 1991-04-30 1994-11-03 Picolab Oberflaechen Und Spure Vorrichtung zur Totalreflexions-Röntgenfluoreszenzanalyse
RU2315981C1 (ru) * 2006-07-05 2008-01-27 Закрытое акционерное общество "КОРДОН" (ЗАО "КОРДОН") Устройство для рентгенофлуоресцентного анализа с полным внешним отражением первичного излучения
CN109827982B (zh) * 2017-11-23 2024-04-26 核工业西南物理研究院 一种土壤重金属检测的快速检测仪

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer
US3944822A (en) 1974-09-30 1976-03-16 The United States Of America As Represented By The Administrator Of The U. S. Environmental Protection Agency Polarization excitation device for X-ray fluorescence analysis

Also Published As

Publication number Publication date
AT368285B (de) 1982-09-27
DK146367B (da) 1983-09-19
LU80106A1 (da) 1979-01-19
FR2400704B1 (da) 1983-09-16
NL185305C (nl) 1990-03-01
NL7808130A (nl) 1979-02-20
DK146367C (da) 1984-02-27
NL185305B (nl) 1989-10-02
DE2736960A1 (de) 1979-03-01
CA1111576A (en) 1981-10-27
IT7883626A0 (it) 1978-07-16
CH635433A5 (de) 1983-03-31
GB2003267B (en) 1982-01-06
DE2736960C3 (de) 1980-03-06
GB2003267A (en) 1979-03-07
ATA557478A (de) 1982-01-15
IT1162195B (it) 1987-03-25
US4426717A (en) 1984-01-17
DE2736960B2 (de) 1979-06-28
BE869791A (fr) 1978-12-18
FR2400704A1 (fr) 1979-03-16

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Legal Events

Date Code Title Description
PBP Patent lapsed