IT1082962B - Apparecchio di prova per semiconduttori - Google Patents

Apparecchio di prova per semiconduttori

Info

Publication number
IT1082962B
IT1082962B IT67710/77A IT6771077A IT1082962B IT 1082962 B IT1082962 B IT 1082962B IT 67710/77 A IT67710/77 A IT 67710/77A IT 6771077 A IT6771077 A IT 6771077A IT 1082962 B IT1082962 B IT 1082962B
Authority
IT
Italy
Prior art keywords
semiconductors
test apparatus
test
Prior art date
Application number
IT67710/77A
Other languages
English (en)
Original Assignee
Huntron Instr Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Huntron Instr Inc filed Critical Huntron Instr Inc
Application granted granted Critical
Publication of IT1082962B publication Critical patent/IT1082962B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2843—In-circuit-testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
IT67710/77A 1977-02-16 1977-03-31 Apparecchio di prova per semiconduttori IT1082962B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/769,110 US4074195A (en) 1977-02-16 1977-02-16 Semiconductor tester

Publications (1)

Publication Number Publication Date
IT1082962B true IT1082962B (it) 1985-05-21

Family

ID=25084487

Family Applications (1)

Application Number Title Priority Date Filing Date
IT67710/77A IT1082962B (it) 1977-02-16 1977-03-31 Apparecchio di prova per semiconduttori

Country Status (9)

Country Link
US (1) US4074195A (it)
JP (1) JPS53101984A (it)
CA (1) CA1093705A (it)
FR (1) FR2381316A1 (it)
GB (1) GB1567231A (it)
IL (1) IL51637A (it)
IT (1) IT1082962B (it)
MX (1) MX145865A (it)
NL (1) NL7702877A (it)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4386317A (en) * 1980-09-12 1983-05-31 Huntron Instruments, Inc. Apparatus for testing, in-circuit, semiconductors shunted by a low resistance
FR2662259B1 (fr) * 1990-05-17 1992-09-18 Commissariat Energie Atomique Dispositif automatique pour la mesure de caracteristiques concernant des composants electroniques.
GB2278689B (en) * 1993-06-02 1997-03-19 Ford Motor Co Method and apparatus for testing integrated circuits
US5508607A (en) * 1994-08-11 1996-04-16 Fluke Corporation Electronic test instrument for component test
US5596280A (en) * 1995-06-15 1997-01-21 International Business Machines Corp. Apparatus and method for testing circuits by the response of a phase-locked loop
US9310408B2 (en) * 2012-04-30 2016-04-12 Keysight Technologies, Inc. Power device analyzer
WO2024029282A1 (ja) * 2022-08-04 2024-02-08 ローム株式会社 半導体試験装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4720457U (it) * 1971-03-06 1972-11-08
DE2345469A1 (de) * 1973-09-08 1975-03-20 Rolf Kox Verfahren, geraet und schaltungsanordnung zur funktionsfaehigkeitspruefung eines in einer schaltung integrierten elektrischen bauelementes
US3973198A (en) * 1974-10-29 1976-08-03 Bill Hunt In-circuit semiconductor tester

Also Published As

Publication number Publication date
IL51637A (en) 1979-09-30
US4074195A (en) 1978-02-14
GB1567231A (en) 1980-05-14
IL51637A0 (en) 1977-05-31
MX145865A (es) 1982-04-12
NL7702877A (nl) 1978-08-18
FR2381316B1 (it) 1983-02-25
CA1093705A (en) 1981-01-13
FR2381316A1 (fr) 1978-09-15
JPS53101984A (en) 1978-09-05

Similar Documents

Publication Publication Date Title
IT1054599B (it) Apparecchio per analisi
SE7802190L (sv) Anordning for transportor
IT1079401B (it) Dispositivo per impaccettare lasagne
SE7803106L (sv) Halvledaranordning
SE7800917L (sv) Halvledaranordning
SE7810315L (sv) Halvledaranordning
BR7804638A (pt) Aparelho de icamento
DK325778A (da) Maaleapparat til roentgenfluorescensanalyse
IT1082962B (it) Apparecchio di prova per semiconduttori
IT1096015B (it) Dispositivo per singolarizzare piastrine
IT1100970B (it) Apaprecchiatura di prova o collaudo ultrasonico
IT1099689B (it) Apparato elettromeccanico per misure di livello
IT1154000B (it) Prova per catecolammine
AT350304B (de) Pruefgeraet
SE7805782L (sv) Halvledaranordning
IT1104494B (it) Dispositivo invergature per orditoi
SE7813007L (sv) For stomister avsedd saniter anordning
DK403377A (da) Fastgoerelsesanordning for en redningsflaade
IT1101801B (it) Apparecchio diluitore per microerogatori per microanalisi
IT1100700B (it) Stazione di collaudo di componenti elettrici
SE7801698L (sv) Halvledaranordning
JPS5441079A (en) Device for inspecting semiconductor
IT1107527B (it) Apparecchio di sostenamento per aliare
JPS5441078A (en) Device for inspecting semiconductor
GB2002129B (en) Apparatus for testing semiconductor memories