FR2362412B1 - - Google Patents

Info

Publication number
FR2362412B1
FR2362412B1 FR7724897A FR7724897A FR2362412B1 FR 2362412 B1 FR2362412 B1 FR 2362412B1 FR 7724897 A FR7724897 A FR 7724897A FR 7724897 A FR7724897 A FR 7724897A FR 2362412 B1 FR2362412 B1 FR 2362412B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7724897A
Other versions
FR2362412A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of FR2362412A1 publication Critical patent/FR2362412A1/fr
Application granted granted Critical
Publication of FR2362412B1 publication Critical patent/FR2362412B1/fr
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/20Filters
    • G02B5/28Interference filters
    • G02B5/285Interference filters comprising deposited thin solid films
    • G02B5/288Interference filters comprising deposited thin solid films comprising at least one thin film resonant cavity, e.g. in bandpass filters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0216Coatings
    • H01L31/02161Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02162Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H01L31/02165Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Light Receiving Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Photovoltaic Devices (AREA)
  • Optical Filters (AREA)
FR7724897A 1976-08-20 1977-08-12 Filtres pour photodetecteurs Granted FR2362412A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19762637616 DE2637616A1 (de) 1976-08-20 1976-08-20 Filter fuer fotodetektoren

Publications (2)

Publication Number Publication Date
FR2362412A1 FR2362412A1 (fr) 1978-03-17
FR2362412B1 true FR2362412B1 (fr) 1982-09-10

Family

ID=5985967

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7724897A Granted FR2362412A1 (fr) 1976-08-20 1977-08-12 Filtres pour photodetecteurs

Country Status (6)

Country Link
US (1) US4158133A (fr)
JP (1) JPS5326147A (fr)
DE (1) DE2637616A1 (fr)
FR (1) FR2362412A1 (fr)
GB (1) GB1591812A (fr)
IT (1) IT1085965B (fr)

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DE3109653A1 (de) * 1980-03-31 1982-01-28 Jenoptik Jena Gmbh, Ddr 6900 Jena "resonanzabsorber"
FR2484708A1 (fr) * 1980-06-13 1981-12-18 Telecommunications Sa Photodetecteur rapide de grande surface sensible dans la gamme 0,8 - 1,1 mm
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US4594605A (en) * 1983-04-28 1986-06-10 Rca Corporation Imaging device having enhanced quantum efficiency
FR2559619B1 (fr) * 1984-02-10 1987-01-16 Thomson Csf Dispositif photosensible avec filtres integres pour la separation des couleurs et procede de fabrication
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GB8610129D0 (en) * 1986-04-25 1986-05-29 Secr Defence Electro-optical device
EP0253002A1 (fr) * 1986-07-12 1988-01-20 Günter Dr.-Ing. Pusch Dispositif pour la reconnaissance de contrastes thermiques
US4851664A (en) * 1988-06-27 1989-07-25 United States Of America As Represented By The Secretary Of The Navy Narrow band and wide angle hemispherical interference optical filter
US5216237A (en) * 1989-02-03 1993-06-01 British Telecommunications, Plc Optical detector with integral filter and having fabry perot resonator system
US4956555A (en) * 1989-06-30 1990-09-11 Rockwell International Corporation Multicolor focal plane arrays
DE4004398A1 (de) * 1990-02-13 1991-08-14 Siemens Ag Wellenlaengenselektiver photodetektor
JPH04179278A (ja) * 1990-11-13 1992-06-25 Sumitomo Electric Ind Ltd 受光素子
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DE4234471C1 (de) * 1992-10-13 1994-01-20 Fraunhofer Ges Forschung Vorrichtung zur Absorption infraroter Strahlung
CH695281A5 (de) * 1993-04-02 2006-02-28 Balzers Hochvakuum Verfahren zur Herstellung eines Filters, danach hergestellte optische Schicht, optisches Bauelement mit einer derartigen Schicht und Braeunungsanlage mit einem solchen Element.
DE4439533C2 (de) * 1994-06-02 1996-10-02 Rolf Dipl Phys Weidemann Vorrichtung und Verfahren zur farbmetrischen Erfassung von Farbkontrollfeldern bei der Farbkalibrierung der ausgegebenen Farben von elektronischen Bildverarbeitungssystemen
FI98325C (fi) * 1994-07-07 1997-05-26 Vaisala Oy Selektiivinen infrapunadetektori
US5477075A (en) * 1994-12-16 1995-12-19 Advanced Photonix, Inc. Solid state photodetector with light-responsive rear face
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US6005276A (en) * 1997-11-12 1999-12-21 Advanced Photonix, Inc. Solid state photodetector with light-responsive rear face
US6355939B1 (en) 1998-11-03 2002-03-12 Lockheed Martin Corporation Multi-band infrared photodetector
US6341040B1 (en) * 1999-06-08 2002-01-22 Jds Uniphase Corporation Multi-plate comb filter and applications therefor
US6727192B2 (en) * 2001-03-01 2004-04-27 Micron Technology, Inc. Methods of metal doping a chalcogenide material
US6581465B1 (en) 2001-03-14 2003-06-24 The United States Of America As Represented By The Secretary Of The Navy Micro-electro-mechanical systems ultra-sensitive accelerometer
US6550330B1 (en) 2001-03-14 2003-04-22 The United States Of America As Represented By The Secretary Of The Navy Differential amplification for micro-electro-mechanical ultra-sensitive accelerometer
US6991695B2 (en) * 2002-05-21 2006-01-31 3M Innovative Properties Company Method for subdividing multilayer optical film cleanly and rapidly
US7095009B2 (en) * 2002-05-21 2006-08-22 3M Innovative Properties Company Photopic detector system and filter therefor
US7396493B2 (en) 2002-05-21 2008-07-08 3M Innovative Properties Company Multilayer optical film with melt zone to control delamination
US6818962B2 (en) * 2002-10-25 2004-11-16 Omnivision International Holding Ltd Image sensor having integrated thin film infrared filter
AU2003301707A1 (en) * 2002-10-31 2004-05-25 Harald Philipp Charge transfer capacitive position sensor
US6897447B2 (en) * 2002-12-05 2005-05-24 Lockheed Martin Corporation Bias controlled multi-spectral infrared photodetector and imager
US7135698B2 (en) * 2002-12-05 2006-11-14 Lockheed Martin Corporation Multi-spectral infrared super-pixel photodetector and imager
DE10302165A1 (de) * 2003-01-22 2004-07-29 Robert Bosch Gmbh Infrarotquelle und Gassensor
JP2007515621A (ja) * 2003-06-11 2007-06-14 フリー ブラザーズ エルエルシィ 赤外線カメラ・システムを用いて検査を実施する及び化学物質漏出を検出するためのシステム及び方法
DE10335189A1 (de) * 2003-07-30 2005-03-03 Daimlerchrysler Ag Vorrichtung zur Sichtverbesserung bei Kraftfahrzeugen
US7223960B2 (en) * 2003-12-03 2007-05-29 Micron Technology, Inc. Image sensor, an image sensor pixel, and methods of forming the same
WO2005069376A1 (fr) * 2004-01-15 2005-07-28 Matsushita Electric Industrial Co.,Ltd. Dispositif d'imagerie a l'etat solide, procede de production dudit dispositif d'imagerie a l'etat solide et camera utilisant ledit dispositif
US7521666B2 (en) * 2005-02-17 2009-04-21 Capella Microsystems Inc. Multi-cavity Fabry-Perot ambient light filter apparatus
US20070115415A1 (en) * 2005-11-21 2007-05-24 Arthur Piehl Light absorbers and methods
US20080180665A1 (en) * 2007-01-31 2008-07-31 Redman David J Measuring color spectra using color filter arrays
US20080266563A1 (en) * 2007-04-26 2008-10-30 Redman David J Measuring color using color filter arrays
DE102007032371A1 (de) * 2007-07-06 2009-01-15 Carl Zeiss Laser Optics Gmbh Verfahren zum Beschichten eines optischen Bauelements für eine Laseranordnung
WO2009036438A1 (fr) * 2007-09-13 2009-03-19 Casey Dame Modules photovoltaïques tridimensionnels dans un panneau de réception d'énergie
JP5266321B2 (ja) * 2008-06-04 2013-08-21 旭化成エレクトロニクス株式会社 量子型赤外線センサおよびそれを用いた量子型赤外線ガス濃度計
IT1392502B1 (it) * 2008-12-31 2012-03-09 St Microelectronics Srl Sensore comprendente almeno un fotodiodo a doppia giunzione verticale integrato su substrato semiconduttore e relativo processo di integrazione
US20100163759A1 (en) * 2008-12-31 2010-07-01 Stmicroelectronics S.R.L. Radiation sensor with photodiodes being integrated on a semiconductor substrate and corresponding integration process
DE102009012755A1 (de) * 2009-03-12 2010-09-16 Osram Opto Semiconductors Gmbh Strahlungsempfangendes Halbleiterbauelement und optoelektrisches Bauteil
US20110068423A1 (en) * 2009-09-18 2011-03-24 International Business Machines Corporation Photodetector with wavelength discrimination, and method for forming the same and design structure
CN104285297B (zh) 2012-04-30 2017-08-29 皇家飞利浦有限公司 在读出电子器件和/或光传感器中具有抗混叠滤波器的成像探测器
DE102013101001B4 (de) * 2013-01-31 2020-10-08 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronisches Halbleiterbauteil und Strahlungssensor
CN103698831B (zh) * 2013-11-29 2016-04-27 杭州麦乐克电子科技有限公司 通过带为7600-9900nm的红外测温滤光片
CN103713346B (zh) * 2013-11-29 2016-02-10 杭州麦乐克电子科技有限公司 中心波长2700nm的航空尾气气体检测滤光片
CN103713347B (zh) * 2013-11-29 2016-02-10 杭州麦乐克电子科技有限公司 通过带为7550-13900nm的红外测温滤光片
US10078142B2 (en) * 2014-03-26 2018-09-18 California Institute Of Technology Sensor integrated metal dielectric filters for solar-blind silicon ultraviolet detectors
WO2015148861A1 (fr) * 2014-03-26 2015-10-01 California Institute Of Technology Détecteur de scintillation inférieure à la nanoseconde
US20160035914A1 (en) * 2014-07-31 2016-02-04 Analog Devices, Inc. Filter coating design for optical sensors
JP6529743B2 (ja) * 2014-11-06 2019-06-12 株式会社豊田中央研究所 光電変換素子
JP2016167530A (ja) * 2015-03-10 2016-09-15 ソニー株式会社 固体撮像装置及びその製造方法、並びに電子機器
JP6504874B2 (ja) * 2015-03-27 2019-04-24 株式会社豊田中央研究所 光学フィルタおよび光学測定装置
GB2542802A (en) * 2015-09-30 2017-04-05 Cambridge Display Tech Ltd Organic-based fluorescence sensor with low background signal
JP2019200383A (ja) * 2018-05-18 2019-11-21 ソニーセミコンダクタソリューションズ株式会社 共振器構造体、撮像素子、および電子機器
CN110824599B (zh) 2018-08-14 2021-09-03 白金科技股份有限公司 一种红外带通滤波器
EP3640690B1 (fr) * 2018-09-27 2023-06-21 Seiko Epson Corporation Dispositif optique et appareil électronique

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US3076861A (en) * 1959-06-30 1963-02-05 Space Technology Lab Inc Electromagnetic radiation converter
US3247392A (en) * 1961-05-17 1966-04-19 Optical Coating Laboratory Inc Optical coating and assembly used as a band pass interference filter reflecting in the ultraviolet and infrared
US3528726A (en) * 1969-07-10 1970-09-15 Perkin Elmer Corp Narrow band interference light filter
US3649359A (en) * 1969-10-27 1972-03-14 Optical Coating Laboratory Inc Multilayer filter with metal dielectric period
US3743847A (en) * 1971-06-01 1973-07-03 Motorola Inc Amorphous silicon film as a uv filter
US3929398A (en) * 1971-08-18 1975-12-30 Harry E Bates High speed optical wavelength detection system
US3781090A (en) * 1972-11-06 1973-12-25 Minolta Camera Kk Four layer anti-reflection coating
US3949463A (en) * 1973-02-13 1976-04-13 Communications Satellite Corporation (Comsat) Method of applying an anti-reflective coating to a solar cell
US3996461A (en) * 1975-03-31 1976-12-07 Texas Instruments Incorporated Silicon photosensor with optical thin film filter

Also Published As

Publication number Publication date
JPS5326147A (en) 1978-03-10
FR2362412A1 (fr) 1978-03-17
IT1085965B (it) 1985-05-28
GB1591812A (en) 1981-06-24
DE2637616A1 (de) 1978-02-23
US4158133A (en) 1979-06-12

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Legal Events

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ST Notification of lapse