FR2296847A1 - Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires - Google Patents

Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires

Info

Publication number
FR2296847A1
FR2296847A1 FR7500050A FR7500050A FR2296847A1 FR 2296847 A1 FR2296847 A1 FR 2296847A1 FR 7500050 A FR7500050 A FR 7500050A FR 7500050 A FR7500050 A FR 7500050A FR 2296847 A1 FR2296847 A1 FR 2296847A1
Authority
FR
France
Prior art keywords
primary
intensity
energy
monokinetic
electrons
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7500050A
Other languages
English (en)
French (fr)
Other versions
FR2296847B1 (enExample
Inventor
Claude Le Gressus
Daniel Massignon
Rene Sopizet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR7500050A priority Critical patent/FR2296847A1/fr
Priority to GB42084/75A priority patent/GB1530277A/en
Priority to DE19752546053 priority patent/DE2546053A1/de
Priority to US05/641,240 priority patent/US4034220A/en
Priority to CA242,530A priority patent/CA1048163A/en
Priority to CH1677775A priority patent/CH592306A5/xx
Priority to IL48721A priority patent/IL48721A/xx
Priority to ZA00758018A priority patent/ZA758018B/xx
Priority to JP15966475A priority patent/JPS557179B2/ja
Priority to SE7514717A priority patent/SE413556B/xx
Priority to NL7515242A priority patent/NL7515242A/xx
Priority to BE163292A priority patent/BE837288A/xx
Priority to ES444049A priority patent/ES444049A1/es
Publication of FR2296847A1 publication Critical patent/FR2296847A1/fr
Application granted granted Critical
Publication of FR2296847B1 publication Critical patent/FR2296847B1/fr
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7500050A 1975-01-02 1975-01-02 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires Granted FR2296847A1 (fr)

Priority Applications (13)

Application Number Priority Date Filing Date Title
FR7500050A FR2296847A1 (fr) 1975-01-02 1975-01-02 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires
GB42084/75A GB1530277A (en) 1975-01-02 1975-10-14 Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
DE19752546053 DE2546053A1 (de) 1975-01-02 1975-10-14 Verfahren und vorrichtung zur analyse durch spektralanalyse der energie von sekundaerelektronen
US05/641,240 US4034220A (en) 1975-01-02 1975-12-16 Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
CA242,530A CA1048163A (en) 1975-01-02 1975-12-22 Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
IL48721A IL48721A (en) 1975-01-02 1975-12-24 Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of thesecondary electrons
CH1677775A CH592306A5 (enExample) 1975-01-02 1975-12-24
ZA00758018A ZA758018B (en) 1975-01-02 1975-12-29 Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
JP15966475A JPS557179B2 (enExample) 1975-01-02 1975-12-29
SE7514717A SE413556B (sv) 1975-01-02 1975-12-29 Sett for analys av ett elektronbestralat prov medelst utsenda sekunderelektroner samt anordning for genomforande av settet
NL7515242A NL7515242A (nl) 1975-01-02 1975-12-31 Werkwijze en inrichting voor spectraal-analyse.
BE163292A BE837288A (fr) 1975-01-02 1976-01-02 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires
ES444049A ES444049A1 (es) 1975-01-02 1976-01-02 Procedimiento y dispositivo de analisis elemental y quimico de una muestra.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7500050A FR2296847A1 (fr) 1975-01-02 1975-01-02 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires

Publications (2)

Publication Number Publication Date
FR2296847A1 true FR2296847A1 (fr) 1976-07-30
FR2296847B1 FR2296847B1 (enExample) 1977-11-18

Family

ID=9149370

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7500050A Granted FR2296847A1 (fr) 1975-01-02 1975-01-02 Procede et dispositif d'analyse elementaire et chimique d'un echantillon par analyse spectrale des energies des electrons secondaires

Country Status (3)

Country Link
BE (1) BE837288A (enExample)
FR (1) FR2296847A1 (enExample)
ZA (1) ZA758018B (enExample)

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
NEANT *

Also Published As

Publication number Publication date
BE837288A (fr) 1976-05-03
ZA758018B (en) 1976-12-29
FR2296847B1 (enExample) 1977-11-18

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