JPS55121140A - Photoelectric spectroscope - Google Patents

Photoelectric spectroscope

Info

Publication number
JPS55121140A
JPS55121140A JP2890879A JP2890879A JPS55121140A JP S55121140 A JPS55121140 A JP S55121140A JP 2890879 A JP2890879 A JP 2890879A JP 2890879 A JP2890879 A JP 2890879A JP S55121140 A JPS55121140 A JP S55121140A
Authority
JP
Japan
Prior art keywords
sample
energy
photo electrons
detectors
analyzers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2890879A
Other languages
Japanese (ja)
Inventor
Kenji Kojima
Yuji Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP2890879A priority Critical patent/JPS55121140A/en
Publication of JPS55121140A publication Critical patent/JPS55121140A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To take a wide analysis in the depth direction of a sample by irradiating the sample with X rays emitted from at least two kind of metals and then by spectrally diffracting generated photo electrons by using a spectroscopic system. CONSTITUTION:When target 3 is an alloy containing magnesium and chromium, X-ray source 1 emits characteristic X rays of those two elements, with which sample 4 is irradiated. Photo electrons generated by sample 4 are led to electron lenses 6a, 6b but decelerated according to a high voltage applied to electron lenses 6a,6b; and only photo electrons with specific energy are selected by energy analyzers 7a, 7b and then detected by detectors 8a, 8b. Here, sweeping the above-mentioned high voltage can vary the energy of photo electrons incident ot analyzers 7a, 7b and detectors 8a, 8b detect photo electrons from sample 4 sequentially according to the energy.
JP2890879A 1979-03-13 1979-03-13 Photoelectric spectroscope Pending JPS55121140A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2890879A JPS55121140A (en) 1979-03-13 1979-03-13 Photoelectric spectroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2890879A JPS55121140A (en) 1979-03-13 1979-03-13 Photoelectric spectroscope

Publications (1)

Publication Number Publication Date
JPS55121140A true JPS55121140A (en) 1980-09-18

Family

ID=12261494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2890879A Pending JPS55121140A (en) 1979-03-13 1979-03-13 Photoelectric spectroscope

Country Status (1)

Country Link
JP (1) JPS55121140A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02145950A (en) * 1988-11-26 1990-06-05 Shimadzu Corp X-ray photoelectron analyzer
JP2002168495A (en) * 2000-11-30 2002-06-14 Fuji Industrial Co Ltd Exhaust device for ih cooking heater

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02145950A (en) * 1988-11-26 1990-06-05 Shimadzu Corp X-ray photoelectron analyzer
JP2002168495A (en) * 2000-11-30 2002-06-14 Fuji Industrial Co Ltd Exhaust device for ih cooking heater

Similar Documents

Publication Publication Date Title
Kornblum et al. Measurement of 0.1–3‐keV x rays from laser plasmas
IL77952A (en) High energy radiation detector and method of detection
KR20060088272A (en) X-ray photoelectron spectroscopy
US4417355A (en) X-Ray fluorescence spectrometer
US4937455A (en) Position-sensitive director
JPS55121140A (en) Photoelectric spectroscope
ES444049A1 (en) Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons
JPS55144576A (en) Semiconductor radiation detector
Young et al. Filtered x‐ray diodes for imploding plasma experiments
US6596994B1 (en) Beam position monitor
Alexander X-ray fluorescence analysis of biological tissues
EP0091884A3 (en) Fluorescence laser exafs
RU2095883C1 (en) Electroluminescent gas detector
Volkov et al. Dependence of the yield of hard incoherent X-rays from femtosecond laser plasma on the atomic number of a target material
JPS5260686A (en) X-ray photoelectronic analysis
Anzelmo et al. X-ray fluorescence spectrometric analysis of geologic materials Part 1. Principles and instrumentation
JPH0569393B2 (en)
JPS6417371A (en) Spectrum display unit in x-ray microanalyzer, etc.
Rauš et al. Ultra'soft X-ray diagnostics of short-living plasmas
Ledingham et al. Multielement photon activation analysis of coal samples using a Compton suppressed Ge (Li) detector
GB1219448A (en) Improvements relating to x-ray spectrometry
Bradford Absolute yields of X-ray induced photoemission from metals
EP0343018A3 (en) Spectroscopes
Larsen et al. A secondary-source energy-dispersive x-ray spectrometer
Nickles et al. A gas scintillation counter with imaging optics and large area UV-detector