FR2081249A1 - Junction field effect transistors - using tantlum oxide dielectric and needing fewer masks - Google Patents
Junction field effect transistors - using tantlum oxide dielectric and needing fewer masksInfo
- Publication number
- FR2081249A1 FR2081249A1 FR7010340A FR7010340A FR2081249A1 FR 2081249 A1 FR2081249 A1 FR 2081249A1 FR 7010340 A FR7010340 A FR 7010340A FR 7010340 A FR7010340 A FR 7010340A FR 2081249 A1 FR2081249 A1 FR 2081249A1
- Authority
- FR
- France
- Prior art keywords
- field effect
- effect transistors
- junction field
- tantlum
- oxide dielectric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000005669 field effect Effects 0.000 title abstract 2
- 239000002184 metal Substances 0.000 abstract 3
- 229910052751 metal Inorganic materials 0.000 abstract 3
- 230000003647 oxidation Effects 0.000 abstract 2
- 238000007254 oxidation reaction Methods 0.000 abstract 2
- 229910052735 hafnium Inorganic materials 0.000 abstract 1
- 229910052715 tantalum Inorganic materials 0.000 abstract 1
- 229910052726 zirconium Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02172—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides
- H01L21/02175—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal
- H01L21/02183—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal the material containing tantalum, e.g. Ta2O5
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/0223—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate
- H01L21/02244—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of a metallic layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/02255—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/291—Oxides or nitrides or carbides, e.g. ceramics, glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7010340A FR2081249A1 (en) | 1970-03-23 | 1970-03-23 | Junction field effect transistors - using tantlum oxide dielectric and needing fewer masks |
DE19712113831 DE2113831A1 (de) | 1970-03-23 | 1971-03-23 | Sperrschicht-Feldeffekttransistor und Verfahren zu seiner Herstellung |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7010340A FR2081249A1 (en) | 1970-03-23 | 1970-03-23 | Junction field effect transistors - using tantlum oxide dielectric and needing fewer masks |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2081249A1 true FR2081249A1 (en) | 1971-12-03 |
Family
ID=9052716
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7010340A Withdrawn FR2081249A1 (en) | 1970-03-23 | 1970-03-23 | Junction field effect transistors - using tantlum oxide dielectric and needing fewer masks |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE2113831A1 (fr) |
FR (1) | FR2081249A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2263149A1 (de) * | 1971-12-24 | 1973-07-19 | Nippon Electric Co | Oberflaechen-feldeffekt-transistor mit niedriger und stabiler tor-schwellwertspannung |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS524426B2 (fr) * | 1973-04-20 | 1977-02-03 |
-
1970
- 1970-03-23 FR FR7010340A patent/FR2081249A1/fr not_active Withdrawn
-
1971
- 1971-03-23 DE DE19712113831 patent/DE2113831A1/de active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2263149A1 (de) * | 1971-12-24 | 1973-07-19 | Nippon Electric Co | Oberflaechen-feldeffekt-transistor mit niedriger und stabiler tor-schwellwertspannung |
Also Published As
Publication number | Publication date |
---|---|
DE2113831A1 (de) | 1971-10-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
IT948918B (it) | Procedimento per fabbricare circui ti integrati con isolamento ossida to e struttura risultante | |
CA970478A (en) | Method of manufacturing semiconductor devices in which silicon oxide regions inset in silicon are formed by a masking oxidation, and semiconductor devices manufactured in this manner | |
NL167049C (nl) | Microschakelelement of geintegreerde schakeling met dunne geleiders en werkwijze ter vervaardiging van deze inrichtingen. | |
CA945271A (en) | Electrical circuit packaging structure and method of fabrication thereof | |
IT7822167A0 (it) | Metodo di fabbricazione di dispositivi semiconduttori e dispositivi semiconduttori prodotti con tale metodo. | |
FR2081249A1 (en) | Junction field effect transistors - using tantlum oxide dielectric and needing fewer masks | |
BE618081A (nl) | Werkwijze voor de vervaardiging van elektrische halfgeleiderinrichtingen | |
CA927978A (en) | Fabrication of integrated semiconductor devices by electrochemical etching | |
NL185591C (nl) | Werkwijze voor het vervaardigen van een geintegreerde halfgeleiderschakeling van tenminste een veldeffecttransistor met een geisoleerde poortelektrode van een eerste soort en van tenminste een veldeffecttransistor met een geisoleerde poortelektrode van de voor de eerste soort complementaire tweede soort. | |
JPS5275187A (en) | Mos type semiconductor device | |
CA920722A (en) | Formation of openings in insulating layers in mos semiconductor devices | |
JPS5267963A (en) | Manufacture of semiconductor unit | |
CA836799A (en) | Fabrication of semiconductor devices utilizing bombardment enhanced etching of insulating layers | |
JPS51137386A (en) | Semiconductor protective circuit | |
JPS5254370A (en) | Production of semiconductor device | |
CA950130A (en) | Overlay transistor employing highly conductive semiconductor grid and method for making | |
CA835596A (en) | Manufacture of semiconductor circuits or assemblies | |
JPS5232682A (en) | Manufacturing process of semiconductor device | |
AU460855B2 (en) | Electrical resistance element witha semiconductor overlay and method of fabrication thereof | |
CA984974A (en) | Integrated circuit having bipolar transistors and method of manufacturing said circuit | |
CA821733A (en) | Semiconductor device comprising a field-effect transistor of the type having an insulated gate electrode and circuit arrangements comprising such a semiconductor device | |
AU284817B2 (en) | Method of making semiconductor integrated circuit elements | |
JPS51120182A (en) | Semiconductor integrated circuit | |
AU247880B2 (en) | Process for etching semiconductors inthe fabrication of miniature solid state electrical circuits comprising asingle semiconductor block | |
JPS5670645A (en) | Manufacture of semiconductor device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |