FR2068815B1 - - Google Patents

Info

Publication number
FR2068815B1
FR2068815B1 FR7041962A FR7041962A FR2068815B1 FR 2068815 B1 FR2068815 B1 FR 2068815B1 FR 7041962 A FR7041962 A FR 7041962A FR 7041962 A FR7041962 A FR 7041962A FR 2068815 B1 FR2068815 B1 FR 2068815B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7041962A
Other languages
French (fr)
Other versions
FR2068815A1 (https=
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp filed Critical RCA Corp
Publication of FR2068815A1 publication Critical patent/FR2068815A1/fr
Application granted granted Critical
Publication of FR2068815B1 publication Critical patent/FR2068815B1/fr
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2608Circuits therefor for testing bipolar transistors
    • G01R31/2614Circuits therefor for testing bipolar transistors for measuring gain factor thereof
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P54/00Cutting or separating of wafers, substrates or parts of devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/23Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/085Isolated-integrated
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/162Testing steps

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Bipolar Transistors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Bipolar Integrated Circuits (AREA)
FR7041962A 1969-12-17 1970-11-23 Expired FR2068815B1 (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US88569969A 1969-12-17 1969-12-17

Publications (2)

Publication Number Publication Date
FR2068815A1 FR2068815A1 (https=) 1971-09-03
FR2068815B1 true FR2068815B1 (https=) 1976-04-16

Family

ID=25387505

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7041962A Expired FR2068815B1 (https=) 1969-12-17 1970-11-23

Country Status (7)

Country Link
US (1) US3666573A (https=)
JP (1) JPS4832938B1 (https=)
BE (1) BE760324A (https=)
DE (1) DE2062059A1 (https=)
FR (1) FR2068815B1 (https=)
GB (1) GB1281769A (https=)
SE (1) SE356848B (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4046605A (en) * 1974-01-14 1977-09-06 National Semiconductor Corporation Method of electrically isolating individual semiconductor circuits in a wafer
FR2280203A1 (fr) * 1974-07-26 1976-02-20 Thomson Csf Procede d'ajustement de tension de seuil de transistors a effet de champ
DE2949590A1 (de) * 1979-12-10 1981-06-11 Robert Bosch do Brasil, Campinas Verfahren zur vormessung von hochstromparametern bei leistungstransistoren und hierzu geeigneter leistungstransistor
DE3138340C2 (de) * 1981-09-26 1987-01-29 Telefunken electronic GmbH, 7100 Heilbronn Verfahren zum Herstellen von mehreren planaren Bauelementen
WO1999040170A1 (en) * 1998-02-04 1999-08-12 Unilever Plc Lavatory cleansing compositions
KR100663347B1 (ko) * 2004-12-21 2007-01-02 삼성전자주식회사 중첩도 측정마크를 갖는 반도체소자 및 그 형성방법
RU173641U1 (ru) * 2017-03-27 2017-09-04 Закрытое акционерное общество "ГРУППА КРЕМНИЙ ЭЛ" Тестовый планарный p-n-p транзистор

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL276676A (https=) * 1961-04-13

Also Published As

Publication number Publication date
DE2062059A1 (de) 1971-06-24
FR2068815A1 (https=) 1971-09-03
BE760324A (fr) 1971-05-17
JPS4832938B1 (https=) 1973-10-09
GB1281769A (en) 1972-07-12
US3666573A (en) 1972-05-30
SE356848B (https=) 1973-06-04

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Legal Events

Date Code Title Description
ST Notification of lapse