SE356848B - - Google Patents

Info

Publication number
SE356848B
SE356848B SE16963/70A SE1696370A SE356848B SE 356848 B SE356848 B SE 356848B SE 16963/70 A SE16963/70 A SE 16963/70A SE 1696370 A SE1696370 A SE 1696370A SE 356848 B SE356848 B SE 356848B
Authority
SE
Sweden
Application number
SE16963/70A
Inventor
N Brackelmann
Original Assignee
Rca Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rca Corp filed Critical Rca Corp
Publication of SE356848B publication Critical patent/SE356848B/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2608Circuits therefor for testing bipolar transistors
    • G01R31/2614Circuits therefor for testing bipolar transistors for measuring gain factor thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/085Isolated-integrated
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/162Testing steps
SE16963/70A 1969-12-17 1970-12-15 SE356848B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US88569969A 1969-12-17 1969-12-17

Publications (1)

Publication Number Publication Date
SE356848B true SE356848B (xx) 1973-06-04

Family

ID=25387505

Family Applications (1)

Application Number Title Priority Date Filing Date
SE16963/70A SE356848B (xx) 1969-12-17 1970-12-15

Country Status (7)

Country Link
US (1) US3666573A (xx)
JP (1) JPS4832938B1 (xx)
BE (1) BE760324A (xx)
DE (1) DE2062059A1 (xx)
FR (1) FR2068815B1 (xx)
GB (1) GB1281769A (xx)
SE (1) SE356848B (xx)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4046605A (en) * 1974-01-14 1977-09-06 National Semiconductor Corporation Method of electrically isolating individual semiconductor circuits in a wafer
FR2280203A1 (fr) * 1974-07-26 1976-02-20 Thomson Csf Procede d'ajustement de tension de seuil de transistors a effet de champ
DE2949590A1 (de) * 1979-12-10 1981-06-11 Robert Bosch do Brasil, Campinas Verfahren zur vormessung von hochstromparametern bei leistungstransistoren und hierzu geeigneter leistungstransistor
DE3138340A1 (de) * 1981-09-26 1983-04-14 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zum herstellen von planaren bauelementen
TR200002281T2 (tr) * 1998-02-04 2000-11-21 Unilever N.V Tuvalet temizleme bileşimleri
KR100663347B1 (ko) * 2004-12-21 2007-01-02 삼성전자주식회사 중첩도 측정마크를 갖는 반도체소자 및 그 형성방법
RU173641U1 (ru) * 2017-03-27 2017-09-04 Закрытое акционерное общество "ГРУППА КРЕМНИЙ ЭЛ" Тестовый планарный p-n-p транзистор

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL276676A (xx) * 1961-04-13

Also Published As

Publication number Publication date
JPS4832938B1 (xx) 1973-10-09
GB1281769A (en) 1972-07-12
FR2068815A1 (xx) 1971-09-03
FR2068815B1 (xx) 1976-04-16
BE760324A (fr) 1971-05-17
DE2062059A1 (de) 1971-06-24
US3666573A (en) 1972-05-30

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