BE760324A - Procede de fabrication de transistors, comprenant une etape de determination du gain - Google Patents

Procede de fabrication de transistors, comprenant une etape de determination du gain

Info

Publication number
BE760324A
BE760324A BE760324A BE760324A BE760324A BE 760324 A BE760324 A BE 760324A BE 760324 A BE760324 A BE 760324A BE 760324 A BE760324 A BE 760324A BE 760324 A BE760324 A BE 760324A
Authority
BE
Belgium
Prior art keywords
manufacturing process
determination step
transistor manufacturing
gain determination
gain
Prior art date
Application number
BE760324A
Other languages
English (en)
French (fr)
Inventor
N W Brackelmanns
Original Assignee
Rca Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rca Corp filed Critical Rca Corp
Publication of BE760324A publication Critical patent/BE760324A/xx

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2614—Circuits therefor for testing bipolar transistors for measuring gain factor thereof
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00—Subject matter not provided for in other groups of this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P54/00—Cutting or separating of wafers, substrates or parts of devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
    • H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/085—Isolated-integrated
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/162—Testing steps

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Bipolar Transistors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Bipolar Integrated Circuits (AREA)
BE760324A 1969-12-17 1970-12-14 Procede de fabrication de transistors, comprenant une etape de determination du gain BE760324A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US88569969A 1969-12-17 1969-12-17

Publications (1)

Publication Number Publication Date
BE760324A true BE760324A (fr) 1971-05-17

Family

ID=25387505

Family Applications (1)

Application Number Title Priority Date Filing Date
BE760324A BE760324A (fr) 1969-12-17 1970-12-14 Procede de fabrication de transistors, comprenant une etape de determination du gain

Country Status (7)

Country Link
US (1) US3666573A (https=)
JP (1) JPS4832938B1 (https=)
BE (1) BE760324A (https=)
DE (1) DE2062059A1 (https=)
FR (1) FR2068815B1 (https=)
GB (1) GB1281769A (https=)
SE (1) SE356848B (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4046605A (en) * 1974-01-14 1977-09-06 National Semiconductor Corporation Method of electrically isolating individual semiconductor circuits in a wafer
FR2280203A1 (fr) * 1974-07-26 1976-02-20 Thomson Csf Procede d'ajustement de tension de seuil de transistors a effet de champ
DE2949590A1 (de) * 1979-12-10 1981-06-11 Robert Bosch do Brasil, Campinas Verfahren zur vormessung von hochstromparametern bei leistungstransistoren und hierzu geeigneter leistungstransistor
DE3138340C2 (de) * 1981-09-26 1987-01-29 Telefunken electronic GmbH, 7100 Heilbronn Verfahren zum Herstellen von mehreren planaren Bauelementen
WO1999040170A1 (en) * 1998-02-04 1999-08-12 Unilever Plc Lavatory cleansing compositions
KR100663347B1 (ko) * 2004-12-21 2007-01-02 삼성전자주식회사 중첩도 측정마크를 갖는 반도체소자 및 그 형성방법
RU173641U1 (ru) * 2017-03-27 2017-09-04 Закрытое акционерное общество "ГРУППА КРЕМНИЙ ЭЛ" Тестовый планарный p-n-p транзистор

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL276676A (https=) * 1961-04-13

Also Published As

Publication number Publication date
DE2062059A1 (de) 1971-06-24
FR2068815A1 (https=) 1971-09-03
JPS4832938B1 (https=) 1973-10-09
FR2068815B1 (https=) 1976-04-16
GB1281769A (en) 1972-07-12
US3666573A (en) 1972-05-30
SE356848B (https=) 1973-06-04

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