FR2015121A1 - - Google Patents
Info
- Publication number
- FR2015121A1 FR2015121A1 FR6923612A FR6923612A FR2015121A1 FR 2015121 A1 FR2015121 A1 FR 2015121A1 FR 6923612 A FR6923612 A FR 6923612A FR 6923612 A FR6923612 A FR 6923612A FR 2015121 A1 FR2015121 A1 FR 2015121A1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
- H10P30/21—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping of electrically active species
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/137—Collector regions of BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
- H10D62/834—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge further characterised by the dopants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0112—Integrating together multiple components covered by H10D8/00, H10D10/00 or H10D18/00, e.g. integrating multiple BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
- H10P30/202—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping characterised by the semiconductor materials
- H10P30/204—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping characterised by the semiconductor materials into Group IV semiconductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
- H10P30/208—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping of electrically inactive species
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
- H10P30/222—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping characterised by the angle between the ion beam and the crystal planes or the main crystal surface
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P36/00—Gettering within semiconductor bodies
- H10P36/03—Gettering within semiconductor bodies within silicon bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/40—Treatments of semiconductor bodies to modify their internal properties, e.g. to produce internal imperfections
- H10P95/402—Treatments of semiconductor bodies to modify their internal properties, e.g. to produce internal imperfections of silicon bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/01—Manufacture or treatment
- H10W10/031—Manufacture or treatment of isolation regions comprising PN junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W10/00—Isolation regions in semiconductor bodies between components of integrated devices
- H10W10/30—Isolation regions comprising PN junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W15/00—Highly-doped buried regions of integrated devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W15/00—Highly-doped buried regions of integrated devices
- H10W15/01—Manufacture or treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/062—Gold diffusion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/085—Isolated-integrated
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/151—Simultaneous diffusion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/904—Charge carrier lifetime control
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US75065068A | 1968-08-06 | 1968-08-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| FR2015121A1 true FR2015121A1 (https=) | 1970-04-24 |
Family
ID=25018702
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR6923612A Withdrawn FR2015121A1 (https=) | 1968-08-06 | 1969-07-08 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US3655457A (https=) |
| JP (3) | JPS501636B1 (https=) |
| CA (1) | CA922024A (https=) |
| DE (3) | DE1966236C3 (https=) |
| FR (1) | FR2015121A1 (https=) |
| GB (3) | GB1262705A (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2305853A1 (fr) * | 1975-03-26 | 1976-10-22 | Ibm | Procede de diffusion intensifiee par bombardement protonique pour former simultanement des regions de circuit integre de profondeurs differentes |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3919006A (en) * | 1969-09-18 | 1975-11-11 | Yasuo Tarui | Method of manufacturing a lateral transistor |
| US3853644A (en) * | 1969-09-18 | 1974-12-10 | Kogyo Gijutsuin | Transistor for super-high frequency and method of manufacturing it |
| BE759667A (fr) * | 1969-12-01 | 1971-06-01 | Philips Nv | Procede permettant la fabrication d'un dispositif semiconducteur, et dispositif semiconducteur obtenu par la mise en oeuvre de ce procede |
| JPS4936514B1 (https=) * | 1970-05-13 | 1974-10-01 | ||
| US3868722A (en) * | 1970-06-20 | 1975-02-25 | Philips Corp | Semiconductor device having at least two transistors and method of manufacturing same |
| US3918996A (en) * | 1970-11-02 | 1975-11-11 | Texas Instruments Inc | Formation of integrated circuits using proton enhanced diffusion |
| US3707765A (en) * | 1970-11-19 | 1973-01-02 | Motorola Inc | Method of making isolated semiconductor devices |
| FR2123179B1 (https=) * | 1971-01-28 | 1974-02-15 | Commissariat Energie Atomique | |
| US3895965A (en) * | 1971-05-24 | 1975-07-22 | Bell Telephone Labor Inc | Method of forming buried layers by ion implantation |
| US3897274A (en) * | 1971-06-01 | 1975-07-29 | Texas Instruments Inc | Method of fabricating dielectrically isolated semiconductor structures |
| US3775191A (en) * | 1971-06-28 | 1973-11-27 | Bell Canada Northern Electric | Modification of channel regions in insulated gate field effect transistors |
| US3737346A (en) * | 1971-07-01 | 1973-06-05 | Bell Telephone Labor Inc | Semiconductor device fabrication using combination of energy beams for masking and impurity doping |
| US3841917A (en) * | 1971-09-06 | 1974-10-15 | Philips Nv | Methods of manufacturing semiconductor devices |
| JPS4879585A (https=) * | 1972-01-24 | 1973-10-25 | ||
| DE2235865A1 (de) * | 1972-07-21 | 1974-01-31 | Licentia Gmbh | Halbleiteranordnung aus einer vielzahl von in einem gemeinsamen halbleiterkoerper untergebrachten halbleiterbauelementen |
| CH560463A5 (https=) * | 1972-09-26 | 1975-03-27 | Siemens Ag | |
| US3841918A (en) * | 1972-12-01 | 1974-10-15 | Bell Telephone Labor Inc | Method of integrated circuit fabrication |
| US3981072A (en) * | 1973-05-25 | 1976-09-21 | Trw Inc. | Bipolar transistor construction method |
| JPS5029186A (https=) * | 1973-07-17 | 1975-03-25 | ||
| US3921199A (en) * | 1973-07-31 | 1975-11-18 | Texas Instruments Inc | Junction breakdown voltage by means of ion implanted compensation guard ring |
| DE2341311C3 (de) * | 1973-08-16 | 1981-07-09 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Verfahren zum Einstellen der Lebensdauer von Ladungsträgern in Halbleiterkörpern |
| FR2249491B1 (https=) * | 1973-10-30 | 1976-10-01 | Thomson Csf | |
| US3909304A (en) * | 1974-05-03 | 1975-09-30 | Western Electric Co | Method of doping a semiconductor body |
| US3909807A (en) * | 1974-09-03 | 1975-09-30 | Bell Telephone Labor Inc | Integrated circuit memory cell |
| JPS5138990A (en) * | 1974-09-30 | 1976-03-31 | Suwa Seikosha Kk | Handotaisochino seizohoho |
| DE2453134C3 (de) * | 1974-11-08 | 1983-02-10 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Planardiffusionsverfahren |
| US4053924A (en) * | 1975-02-07 | 1977-10-11 | California Linear Circuits, Inc. | Ion-implanted semiconductor abrupt junction |
| US4033787A (en) * | 1975-10-06 | 1977-07-05 | Honeywell Inc. | Fabrication of semiconductor devices utilizing ion implantation |
| DE2554426C3 (de) * | 1975-12-03 | 1979-06-21 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Verfahren zur Erzeugung einer lokal hohen inversen Stromverstärkung bei einem Planartransistor sowie nach diesem Verfahren hergestellter invers betriebener Transistor |
| US4003759A (en) * | 1976-03-01 | 1977-01-18 | Honeywell Inc. | Ion implantation of gold in mercury cadmium telluride |
| DE2627855A1 (de) * | 1976-06-22 | 1977-12-29 | Siemens Ag | Halbleiterbauelement mit wenigstens zwei, einen pn-uebergang bildenden zonen unterschiedlichen leitungstyps sowie verfahren zu dessen herstellung |
| JPS5327110U (https=) * | 1976-08-13 | 1978-03-08 | ||
| US4044371A (en) * | 1976-09-29 | 1977-08-23 | Honeywell Inc. | Plurality of precise temperature resistors formed in monolithic integrated circuits |
| US4034395A (en) * | 1976-09-29 | 1977-07-05 | Honeywell Inc. | Monolithic integrated circuit having a plurality of resistor regions electrically connected in series |
| US4111720A (en) * | 1977-03-31 | 1978-09-05 | International Business Machines Corporation | Method for forming a non-epitaxial bipolar integrated circuit |
| US4157268A (en) * | 1977-06-16 | 1979-06-05 | International Business Machines Corporation | Localized oxidation enhancement for an integrated injection logic circuit |
| FR2406301A1 (fr) * | 1977-10-17 | 1979-05-11 | Silicium Semiconducteur Ssc | Procede de fabrication de dispositifs semi-conducteurs rapides |
| US4338138A (en) * | 1980-03-03 | 1982-07-06 | International Business Machines Corporation | Process for fabricating a bipolar transistor |
| JPS56149473U (https=) * | 1981-03-26 | 1981-11-10 | ||
| US4536945A (en) * | 1983-11-02 | 1985-08-27 | National Semiconductor Corporation | Process for producing CMOS structures with Schottky bipolar transistors |
| US4727038A (en) * | 1984-08-22 | 1988-02-23 | Mitsubishi Denki Kabushiki Kaisha | Method of fabricating semiconductor device |
| US4717588A (en) * | 1985-12-23 | 1988-01-05 | Motorola Inc. | Metal redistribution by rapid thermal processing |
| US4910158A (en) * | 1987-11-23 | 1990-03-20 | Hughes Aircraft Company | Zener diode emulation and method of forming the same |
| US4937756A (en) * | 1988-01-15 | 1990-06-26 | Industrial Technology Research Institute | Gated isolated structure |
| DE59010851D1 (de) * | 1989-04-27 | 1998-11-12 | Max Planck Gesellschaft | Halbleiterstruktur mit einer 2D-Ladungsträgerschicht und Herstellungsverfahren |
| EP0834909A3 (de) * | 1989-09-28 | 1998-06-10 | Siemens Aktiengesellschaft | Verfahren zur Erhöhung der Spannungsfestigkeit eines mehrschichtigen Halbleiterbauelements |
| US5385865A (en) * | 1990-04-26 | 1995-01-31 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften | Method of generating active semiconductor structures by means of starting structures which have a 2D charge carrier layer parallel to the surface |
| US5108935A (en) * | 1990-11-16 | 1992-04-28 | Texas Instruments Incorporated | Reduction of hot carrier effects in semiconductor devices by controlled scattering via the intentional introduction of impurities |
| US5179030A (en) * | 1991-04-26 | 1993-01-12 | Unitrode Corporation | Method of fabricating a buried zener diode simultaneously with other semiconductor devices |
| GB2300753A (en) * | 1995-05-06 | 1996-11-13 | Atomic Energy Authority Uk | Reducing the minority carrier lifetime of semiconductor devices |
| US20080087978A1 (en) * | 2006-10-11 | 2008-04-17 | Coolbaugh Douglas D | Semiconductor structure and method of manufacture |
| US8178430B2 (en) | 2009-04-08 | 2012-05-15 | International Business Machines Corporation | N-type carrier enhancement in semiconductors |
| CN110095941B (zh) * | 2011-12-26 | 2023-02-17 | 东丽株式会社 | 感光性树脂组合物和半导体元件的制造方法 |
| CN103426735B (zh) * | 2012-05-24 | 2016-08-10 | 中芯国际集成电路制造(上海)有限公司 | 半导体结构的形成方法及mos晶体管的形成方法 |
| US8999800B2 (en) * | 2012-12-12 | 2015-04-07 | Varian Semiconductor Equipment Associates, Inc. | Method of reducing contact resistance |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2787564A (en) * | 1954-10-28 | 1957-04-02 | Bell Telephone Labor Inc | Forming semiconductive devices by ionic bombardment |
| US3108914A (en) * | 1959-06-30 | 1963-10-29 | Fairchild Camera Instr Co | Transistor manufacturing process |
| US3423647A (en) * | 1964-07-30 | 1969-01-21 | Nippon Electric Co | Semiconductor device having regions with preselected different minority carrier lifetimes |
| US3388009A (en) * | 1965-06-23 | 1968-06-11 | Ion Physics Corp | Method of forming a p-n junction by an ionic beam |
| US3434894A (en) * | 1965-10-06 | 1969-03-25 | Ion Physics Corp | Fabricating solid state devices by ion implantation |
| US3341754A (en) * | 1966-01-20 | 1967-09-12 | Ion Physics Corp | Semiconductor resistor containing interstitial and substitutional ions formed by an ion implantation method |
| US3448344A (en) * | 1966-03-15 | 1969-06-03 | Westinghouse Electric Corp | Mosaic of semiconductor elements interconnected in an xy matrix |
| US3413531A (en) * | 1966-09-06 | 1968-11-26 | Ion Physics Corp | High frequency field effect transistor |
| US3440113A (en) * | 1966-09-19 | 1969-04-22 | Westinghouse Electric Corp | Process for diffusing gold into semiconductor material |
| US3431150A (en) * | 1966-10-07 | 1969-03-04 | Us Air Force | Process for implanting grids in semiconductor devices |
| US3479233A (en) * | 1967-01-16 | 1969-11-18 | Ibm | Method for simultaneously forming a buried layer and surface connection in semiconductor devices |
-
1968
- 1968-08-06 US US750650A patent/US3655457A/en not_active Expired - Lifetime
-
1969
- 1969-07-08 FR FR6923612A patent/FR2015121A1/fr not_active Withdrawn
- 1969-07-22 CA CA057611A patent/CA922024A/en not_active Expired
- 1969-07-29 DE DE1966236A patent/DE1966236C3/de not_active Expired
- 1969-07-29 DE DE19691938365 patent/DE1938365B2/de active Pending
- 1969-07-29 DE DE1966237A patent/DE1966237C3/de not_active Expired
- 1969-08-05 GB GB39125/69A patent/GB1262705A/en not_active Expired
- 1969-08-05 GB GB39127/69A patent/GB1270170A/en not_active Expired
- 1969-08-05 GB GB39126/69A patent/GB1274725A/en not_active Expired
- 1969-08-06 JP JP44061752A patent/JPS501636B1/ja active Pending
- 1969-08-06 JP JP44061750A patent/JPS5125713B1/ja active Pending
-
1975
- 1975-06-24 JP JP50077131A patent/JPS528673B1/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2305853A1 (fr) * | 1975-03-26 | 1976-10-22 | Ibm | Procede de diffusion intensifiee par bombardement protonique pour former simultanement des regions de circuit integre de profondeurs differentes |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1274725A (en) | 1972-05-17 |
| DE1938365A1 (de) | 1970-02-12 |
| DE1966236A1 (de) | 1971-12-16 |
| GB1262705A (en) | 1972-02-02 |
| DE1966236B2 (de) | 1975-08-07 |
| DE1966237A1 (de) | 1972-01-13 |
| DE1938365B2 (de) | 1972-12-21 |
| DE1966237C3 (de) | 1979-07-12 |
| JPS528673B1 (https=) | 1977-03-10 |
| US3655457A (en) | 1972-04-11 |
| JPS501636B1 (https=) | 1975-01-20 |
| DE1966237B2 (de) | 1975-07-17 |
| JPS5125713B1 (https=) | 1976-08-02 |
| DE1966236C3 (de) | 1979-07-19 |
| CA922024A (en) | 1973-02-27 |
| GB1270170A (en) | 1972-04-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |