FI122041B - Testadapterkonfiguration - Google Patents
Testadapterkonfiguration Download PDFInfo
- Publication number
- FI122041B FI122041B FI20085881A FI20085881A FI122041B FI 122041 B FI122041 B FI 122041B FI 20085881 A FI20085881 A FI 20085881A FI 20085881 A FI20085881 A FI 20085881A FI 122041 B FI122041 B FI 122041B
- Authority
- FI
- Finland
- Prior art keywords
- base plate
- test
- product
- testing
- common
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/24—Arrangements for testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Signal Processing (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- Mobile Radio Communication Systems (AREA)
- Tests Of Electronic Circuits (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Claims (12)
1. Bottenplatta för en testadapter, som är konfigurerad att möjlig-göra testning av olika apparater i en testningsstation, vilken bottenplatta omfat-tar: 5 ett första gränssnitt konfigurerat att kopplas till en produktspecifik del (4), som är konfigurerad att motta och testa en viss typs apparat som ska testas; och ett andra gränssnitt konfigurerat att kopplad till en gemensam del (3), som omfattar för de olika apparaterna som ska testas gemensamma test- 10 element, kännetecknad av att bottenplattan (1) är ett viktledar-kretskort, som är anordnat att dirigera elektriska koppling frän den gemensamma delen (3) till den produktspecifika delens (4) testelement som ska an-vändas för testning av apparaten som ska testas.
2. Bottenplatta enligt patentkrav 1, väri bottenplattans ledningsföring är anordnad att koppia signaler frän den gemensamma delen (3) direkt till apparaten som ska testas och/eller via den produktspecifika delen (4).
3. Bottenplatta enligt patentkrav 1 eller 2, vari bottenplattans (1) ledningsföring är anordnad att koppia en radiofrekvenssignal till apparaten 20 som ska testas via en i bottenplattan fusionerad antenn (12).
4. Bottenplatta enligt patentkrav 3, väri ätminstone en del av anten-nen är en del av bottenplattans viktledningsföring.
5. Bottenplatta enligt nägot av de föregäende patentkraven, vilken bottenplatta kan kopplas löstagbart till den gemensamma delen.
6. Bottenplatta enligt patentkrav 5, vari bottenplattan kan kopplas ^ löstagbart till den gemensamma delen med bajonettfästen.
^ 7. Bottenplatta enligt patentkrav 5 eller 6, vari bottenplattan kan LO 9 kopplas till den gemensamma delens elektriska anslutningsdon med ett i bot- c3 tenplattan placerat anslutningsdonmotstycke (200). I 30
8. Bottenplatta enligt nägot av de föregäende patentkraven, vari pä bottenplattan har fusionerats en eller flera sensorer som ska användas vid oo testning av apparaten som ska testas.
9. Bottenplatta enligt patentkrav 1, vari en eller flera sensorer omfat- o ^ tar ätminstone en av följande: en produktdetekteringssensor, en aktuators 35 platssensor, en ljudsensor, en ljussensor, en vibrationssensor.
10. Testadapter för testning av en apparat i en testningsstations, vilken testadapter omfattar: en bottenplatta enligt nägot av patentkraven 1-9; en produktspecifik del anordnad pä bottenplattan och konfigurerad 5 att motta och testa en viss typs apparat som ska testas; och en gemensam del som kan kopplad tili bottenplattan och omfat-tande för de oi ikä apparaterna som ska testas gemensamma testelement.
11. Testningsstation för testning av en apparat, vilken testningsstat-ion omfattar en testningsadapter enligt patentkrav 10.
12. Produktionslinje för en apparat, vilken produktionslinje omfattar en testningsstation enligt patentkrav 11. δ (M tn o i oo (M X en CL δ oo m oo o o (M
Priority Applications (11)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20085881A FI122041B (sv) | 2008-09-18 | 2008-09-18 | Testadapterkonfiguration |
CN2009801365931A CN102159959A (zh) | 2008-09-18 | 2009-09-17 | 测试适配器配置 |
BRPI0918048-6A BRPI0918048B1 (pt) | 2008-09-18 | 2009-09-17 | Placa de base para um dispositivo adaptado para testes, dispositivo adaptado para testes, plataforma de ensaio para testar um dispositivo e linha de produção de um dispositivo |
PCT/FI2009/050746 WO2010031904A1 (en) | 2008-09-18 | 2009-09-17 | Test adapter configuration |
US13/062,993 US8860453B2 (en) | 2008-09-18 | 2009-09-17 | Test adapter configuration for testing a communication device |
KR1020117008241A KR20110082521A (ko) | 2008-09-18 | 2009-09-17 | 검사 어댑터 구조 |
ES09814143T ES2713056T3 (es) | 2008-09-18 | 2009-09-17 | Configuración de adaptador de ensayo |
EP09814143.5A EP2335084B1 (en) | 2008-09-18 | 2009-09-17 | Test adapter configuration |
PL09814143T PL2335084T3 (pl) | 2008-09-18 | 2009-09-17 | Konfiguracja adaptera testowego |
MX2011002744A MX2011002744A (es) | 2008-09-18 | 2009-09-17 | Configuracion de adaptador de ensayos. |
MA33711A MA32643B1 (fr) | 2008-09-18 | 2011-03-18 | Configuration d'adaptateur de test |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20085881A FI122041B (sv) | 2008-09-18 | 2008-09-18 | Testadapterkonfiguration |
FI20085881 | 2008-09-18 |
Publications (3)
Publication Number | Publication Date |
---|---|
FI20085881A0 FI20085881A0 (sv) | 2008-09-18 |
FI20085881A FI20085881A (sv) | 2010-03-19 |
FI122041B true FI122041B (sv) | 2011-07-29 |
Family
ID=39852271
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20085881A FI122041B (sv) | 2008-09-18 | 2008-09-18 | Testadapterkonfiguration |
Country Status (11)
Country | Link |
---|---|
US (1) | US8860453B2 (sv) |
EP (1) | EP2335084B1 (sv) |
KR (1) | KR20110082521A (sv) |
CN (1) | CN102159959A (sv) |
BR (1) | BRPI0918048B1 (sv) |
ES (1) | ES2713056T3 (sv) |
FI (1) | FI122041B (sv) |
MA (1) | MA32643B1 (sv) |
MX (1) | MX2011002744A (sv) |
PL (1) | PL2335084T3 (sv) |
WO (1) | WO2010031904A1 (sv) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201245738A (en) * | 2011-05-12 | 2012-11-16 | Askey Computer Corp | Inspection apparatus using touch probe for signal transmission |
US20130200915A1 (en) * | 2012-02-06 | 2013-08-08 | Peter G. Panagas | Test System with Test Trays and Automated Test Tray Handling |
US10557889B2 (en) * | 2012-05-07 | 2020-02-11 | Flextronics Ap, Llc | Universal device multi-function test apparatus |
KR101888983B1 (ko) * | 2012-06-08 | 2018-08-16 | 삼성전자주식회사 | 피시험 단말기에 대한 자동화 테스트 장치 및 방법 |
CN103913603B (zh) * | 2013-01-04 | 2017-02-22 | 航天科工防御技术研究试验中心 | 电连接器测试适配器 |
WO2015059508A1 (en) * | 2013-10-24 | 2015-04-30 | Teleplan Technology B.V. | Method and apparatus for testing cell phones |
US9485038B2 (en) * | 2014-03-06 | 2016-11-01 | Litepoint Corporation | System and method for enabling automated testing of wireless data packet signal transceivers |
CN105592190A (zh) * | 2016-03-08 | 2016-05-18 | 深圳市佳斯捷科技有限公司 | 一种手机自动检测设备 |
CN105635374B (zh) * | 2016-03-11 | 2019-02-01 | 深圳市佳斯捷科技有限公司 | 一种手机自动检测设备的支架 |
CN105847481A (zh) * | 2016-05-27 | 2016-08-10 | 深圳天珑无线科技有限公司 | 一种移动终端接地结构和移动终端 |
KR102478111B1 (ko) * | 2016-07-27 | 2022-12-14 | 삼성전자주식회사 | 테스트 장치 |
KR102231941B1 (ko) * | 2020-04-10 | 2021-03-25 | 위드시스템 주식회사 | 단자 얼라인장치 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4922191A (en) * | 1988-11-30 | 1990-05-01 | General Dynamics Corporation, Electronics Division | Electronic testing equipment interconnection assembly |
CA2049616C (en) | 1991-01-22 | 2000-04-04 | Jacob Soiferman | Contactless test method and system for testing printed circuit boards |
US5349640A (en) * | 1993-06-24 | 1994-09-20 | Rolm Company | Option bus adapter |
JPH09297162A (ja) * | 1996-04-30 | 1997-11-18 | Nittetsu Semiconductor Kk | バーンインボード |
DE19732639C1 (de) | 1997-07-29 | 1999-01-28 | Wavetek Gmbh | Antennenkoppler zum Testen von Mobiltelefonen |
US6119255A (en) * | 1998-01-21 | 2000-09-12 | Micron Technology, Inc. | Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit |
US6170329B1 (en) * | 1999-06-14 | 2001-01-09 | Agilent Technologies, Inc. | Test fixture customization adapter enclosure |
DE10057457A1 (de) | 2000-11-20 | 2002-05-23 | Test Plus Electronic Gmbh | Testadapter zum Testen einer Leiterplatine |
US6891384B2 (en) | 2002-06-25 | 2005-05-10 | Xilinx, Inc. | Multi-socket board for open/short tester |
FI117578B (sv) * | 2003-12-03 | 2006-11-30 | Elektrobit Testing Oy | Förfarande och arrangemang för att utföra testning av en elektronisk anordning |
CN100360948C (zh) * | 2004-09-28 | 2008-01-09 | 华硕电脑股份有限公司 | 电路板测试治具 |
FI119529B (sv) * | 2004-11-09 | 2008-12-15 | Jot Automation Oy | Testning av en elektronisk anordning |
CN2881652Y (zh) | 2005-11-21 | 2007-03-21 | 洛阳卓航测控设备有限责任公司 | 一种通用测试接口设备及其通用测试系统 |
US7737715B2 (en) * | 2006-07-31 | 2010-06-15 | Marvell Israel (M.I.S.L) Ltd. | Compensation for voltage drop in automatic test equipment |
-
2008
- 2008-09-18 FI FI20085881A patent/FI122041B/sv not_active IP Right Cessation
-
2009
- 2009-09-17 WO PCT/FI2009/050746 patent/WO2010031904A1/en active Application Filing
- 2009-09-17 US US13/062,993 patent/US8860453B2/en not_active Expired - Fee Related
- 2009-09-17 MX MX2011002744A patent/MX2011002744A/es active IP Right Grant
- 2009-09-17 KR KR1020117008241A patent/KR20110082521A/ko not_active Application Discontinuation
- 2009-09-17 BR BRPI0918048-6A patent/BRPI0918048B1/pt not_active IP Right Cessation
- 2009-09-17 CN CN2009801365931A patent/CN102159959A/zh active Pending
- 2009-09-17 EP EP09814143.5A patent/EP2335084B1/en not_active Not-in-force
- 2009-09-17 ES ES09814143T patent/ES2713056T3/es active Active
- 2009-09-17 PL PL09814143T patent/PL2335084T3/pl unknown
-
2011
- 2011-03-18 MA MA33711A patent/MA32643B1/fr unknown
Also Published As
Publication number | Publication date |
---|---|
MX2011002744A (es) | 2011-04-07 |
EP2335084A4 (en) | 2014-07-02 |
EP2335084A1 (en) | 2011-06-22 |
BRPI0918048B1 (pt) | 2019-07-30 |
ES2713056T3 (es) | 2019-05-17 |
US8860453B2 (en) | 2014-10-14 |
FI20085881A0 (sv) | 2008-09-18 |
KR20110082521A (ko) | 2011-07-19 |
MA32643B1 (fr) | 2011-09-01 |
CN102159959A (zh) | 2011-08-17 |
PL2335084T3 (pl) | 2019-08-30 |
US20110227597A1 (en) | 2011-09-22 |
FI20085881A (sv) | 2010-03-19 |
WO2010031904A1 (en) | 2010-03-25 |
EP2335084B1 (en) | 2018-12-05 |
BRPI0918048A2 (pt) | 2015-12-01 |
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