FI121962B - Förfarande för framställning av hög-luminans fosfor - Google Patents
Förfarande för framställning av hög-luminans fosfor Download PDFInfo
- Publication number
- FI121962B FI121962B FI991732A FI19991732A FI121962B FI 121962 B FI121962 B FI 121962B FI 991732 A FI991732 A FI 991732A FI 19991732 A FI19991732 A FI 19991732A FI 121962 B FI121962 B FI 121962B
- Authority
- FI
- Finland
- Prior art keywords
- host material
- growth
- thin film
- pbx
- reaction
- Prior art date
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16D—COUPLINGS FOR TRANSMITTING ROTATION; CLUTCHES; BRAKES
- F16D65/00—Parts or details
- F16D65/38—Slack adjusters
- F16D65/40—Slack adjusters mechanical
- F16D65/42—Slack adjusters mechanical non-automatic
- F16D65/46—Slack adjusters mechanical non-automatic with screw-thread and nut
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G21/00—Compounds of lead
- C01G21/21—Sulfides
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/56—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing sulfur
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/88—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing selenium, tellurium or unspecified chalcogen elements
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16D—COUPLINGS FOR TRANSMITTING ROTATION; CLUTCHES; BRAKES
- F16D65/00—Parts or details
- F16D65/14—Actuating mechanisms for brakes; Means for initiating operation at a predetermined position
- F16D65/28—Actuating mechanisms for brakes; Means for initiating operation at a predetermined position arranged apart from the brake
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/14—Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material, or by the simultaneous addition of the electroluminescent material in or onto the light source
- H05B33/145—Arrangements of the electroluminescent material
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
- Luminescent Compositions (AREA)
- Chemical Vapour Deposition (AREA)
- Illuminated Signs And Luminous Advertising (AREA)
Claims (11)
1. Förfarande för framstäflning av ett lysämnesskikt kärsne-tecknat avattdetomfattarsteg, ivilka 5 bildas ett värdmaterial genom användning av en odlingsreaktion för värdmateriaiei, varvid värdmateriatet innehäller ett grundämne i grupp ii (M = Ca, Sr, Zn, Ba eller Mg) och ett grundämne i grupp VI (X = S eiler Se); tillsätts en Pb2+-jon i värdmateriatet som en Ijusemitterande central-jon, varvid tillsätfningssteget innehäller ett steg, där PbX bildas genom att 10 bringa H2X (X = S eller Se) att reagera med en Pb-prekursor som vaits bland tetraarylbly och alkylarylbly, varvid lysämnesskiktets Pb2+~half är i omrädet 0,2 - 4,0 mol-% och PbX-tunnfilmens odlingshastighet är i omrädet 0.005 - 0,6 Ä/cykel.
2. Förfarande enligt patentkrav 1, kännetecknat av att som 15 tetraarylbiys och alkylarylblys aikylgrupp eller arylgrupp väljs minst en bland metyl-, etyl-, propyi-, isopropyl-, cyklohexyl-, fenyl- och bensylgruppen.
3. Förfarande enligt patentkrav 1, kännetecknat av att värd-materiaiet är en ll-VI-förening, som bildas genom att bringa att reagera en M-prekursor och H2X (X = S eller Se), 20
4, Förfarande enligt patentkrav 1, k ä n n e t e c k n a t av att od- lingsreaktionen och reaktionen, där man tiilsätter en Ijusemitterande centraljon, förverkligas samtidigt och Pb2+-jonhalten regleras med ett förhällande mellan M~prekursorhalten och Pb-prekursorhalten.
5. Förfarande enligt patentkrav 1, k ä n n e t e c k n a t av att od~ 25 lingsreaktionen och reaktionen, där man tiilsätter en Ijusemitterande centraljon, förverkligas turvis. 5
6. Förfarande enligt patentkrav 5, kännetecknat av att det CM ^ dessutom omfattar ett steg för att bilda en lysämnestunnflim med tjockleken [N ° x (A + B)3 Ä, varvid detta steg förverkligas genom att upprepa N ganger föfjan- o 30 de steg: | odias värdmaterialomrädets tunnfilm tili tjockleken A A genom an- <M vändning av värdmaterialets odlingsreaktion; odias PbX (X = S eller Se)-iunn- filmen tili tjockleken B A genom användning av den Ijusemitterande centraljo-σ> nens tiflsättningsreaktion. 26
7. Förfarande enligt patentkrav 6, kännetecknat avail Pb2+~ jonhalten regSeras med förhallandet mailan den i värdmaterialomradet radande tunnfilmens tjocktek och PbX-tunnfilmens tjockfek.
8. Förfarande enligt patentkrav 8, kännetecknat avatt PbX-5 tunnfilmens tjockfek (B A) är i omrädet 0,005 - 0,6 A.
9. Förfarande enligt patentkrav 6, k ä n n e t e c k n a t av att en mängd "a" odiingsreaktionscykler för värdmaterialet och en mängd "b" odlings-reaktfonscykler för det Ijusemitterande omradet förverkiigas separat, varvid an-telet upprepningsgänger är N, 10
10. Förfarande enligt patentkrav 9, kännetecknat av att ifall reaktionstemperaturen är minst 350 °C, är antalet "b" odiingsreaktionscykler för det Ijusemitterande omrädet högst 2.
11. Förfarande enligt patentkrav 1, k ä n n e t e c k n a t av att od-lingsreaktionen och reaktionen, där den Ijusemitterande centrafjonen tiiisätts, 15 förverkiigas vid en temperatur i omradet 150 - 500 °C. o (M in o i o X en CL (M CO Is- 5) σ>
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR19980033090 | 1998-08-14 | ||
KR19980033090 | 1998-08-14 | ||
KR1019990026897A KR100327105B1 (ko) | 1998-08-14 | 1999-07-05 | 고휘도 형광체 및 그 제조방법 |
KR19990026897 | 1999-07-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
FI19991732A FI19991732A (sv) | 2000-02-14 |
FI121962B true FI121962B (sv) | 2011-06-30 |
Family
ID=26634016
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI991732A FI121962B (sv) | 1998-08-14 | 1999-08-16 | Förfarande för framställning av hög-luminans fosfor |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2000138094A (sv) |
KR (1) | KR100327105B1 (sv) |
FI (1) | FI121962B (sv) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6899961B2 (en) * | 1999-12-15 | 2005-05-31 | Samsung Sdi Co., Ltd. | Organic electroluminescence device |
US6620723B1 (en) | 2000-06-27 | 2003-09-16 | Applied Materials, Inc. | Formation of boride barrier layers using chemisorption techniques |
US7405158B2 (en) | 2000-06-28 | 2008-07-29 | Applied Materials, Inc. | Methods for depositing tungsten layers employing atomic layer deposition techniques |
US6551929B1 (en) | 2000-06-28 | 2003-04-22 | Applied Materials, Inc. | Bifurcated deposition process for depositing refractory metal layers employing atomic layer deposition and chemical vapor deposition techniques |
US7964505B2 (en) | 2005-01-19 | 2011-06-21 | Applied Materials, Inc. | Atomic layer deposition of tungsten materials |
US7732327B2 (en) | 2000-06-28 | 2010-06-08 | Applied Materials, Inc. | Vapor deposition of tungsten materials |
KR100392363B1 (ko) * | 2000-12-26 | 2003-07-22 | 한국전자통신연구원 | 형광체 및 그 제조방법 |
US6765178B2 (en) | 2000-12-29 | 2004-07-20 | Applied Materials, Inc. | Chamber for uniform substrate heating |
US6825447B2 (en) | 2000-12-29 | 2004-11-30 | Applied Materials, Inc. | Apparatus and method for uniform substrate heating and contaminate collection |
US6951804B2 (en) | 2001-02-02 | 2005-10-04 | Applied Materials, Inc. | Formation of a tantalum-nitride layer |
US6878206B2 (en) | 2001-07-16 | 2005-04-12 | Applied Materials, Inc. | Lid assembly for a processing system to facilitate sequential deposition techniques |
US6660126B2 (en) | 2001-03-02 | 2003-12-09 | Applied Materials, Inc. | Lid assembly for a processing system to facilitate sequential deposition techniques |
US6734020B2 (en) | 2001-03-07 | 2004-05-11 | Applied Materials, Inc. | Valve control system for atomic layer deposition chamber |
US7211144B2 (en) | 2001-07-13 | 2007-05-01 | Applied Materials, Inc. | Pulsed nucleation deposition of tungsten layers |
US7780785B2 (en) | 2001-10-26 | 2010-08-24 | Applied Materials, Inc. | Gas delivery apparatus for atomic layer deposition |
US6916398B2 (en) | 2001-10-26 | 2005-07-12 | Applied Materials, Inc. | Gas delivery apparatus and method for atomic layer deposition |
US6729824B2 (en) | 2001-12-14 | 2004-05-04 | Applied Materials, Inc. | Dual robot processing system |
US6620670B2 (en) | 2002-01-18 | 2003-09-16 | Applied Materials, Inc. | Process conditions and precursors for atomic layer deposition (ALD) of AL2O3 |
US6911391B2 (en) | 2002-01-26 | 2005-06-28 | Applied Materials, Inc. | Integration of titanium and titanium nitride layers |
US6998014B2 (en) | 2002-01-26 | 2006-02-14 | Applied Materials, Inc. | Apparatus and method for plasma assisted deposition |
US6827978B2 (en) | 2002-02-11 | 2004-12-07 | Applied Materials, Inc. | Deposition of tungsten films |
US6833161B2 (en) | 2002-02-26 | 2004-12-21 | Applied Materials, Inc. | Cyclical deposition of tungsten nitride for metal oxide gate electrode |
US6720027B2 (en) | 2002-04-08 | 2004-04-13 | Applied Materials, Inc. | Cyclical deposition of a variable content titanium silicon nitride layer |
US7279432B2 (en) | 2002-04-16 | 2007-10-09 | Applied Materials, Inc. | System and method for forming an integrated barrier layer |
KR100494843B1 (ko) * | 2002-11-01 | 2005-06-14 | 한국전자통신연구원 | 란탄족 이온이 도핑된 2족 금속황화물 형광층 제조 방법 |
WO2006045885A1 (en) * | 2004-10-26 | 2006-05-04 | Asm International N.V. | Method of depositing lead containing oxides films |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8909011D0 (en) * | 1989-04-20 | 1989-06-07 | Friend Richard H | Electroluminescent devices |
JPH0645073A (ja) * | 1992-07-23 | 1994-02-18 | Idemitsu Kosan Co Ltd | 有機el素子 |
JPH09298089A (ja) * | 1996-05-02 | 1997-11-18 | Oki Electric Ind Co Ltd | 正孔輸送材料及び有機エレクトロルミネッセンス素子 |
FI100758B (sv) * | 1996-09-11 | 1998-02-13 | Planar Internat Oy Ltd | Sätt att bilda ett luminescensskikt av ZnS:Mn för tunnfilmselektrolumi nescenskomponenter |
-
1999
- 1999-07-05 KR KR1019990026897A patent/KR100327105B1/ko not_active IP Right Cessation
- 1999-08-13 JP JP11229063A patent/JP2000138094A/ja active Pending
- 1999-08-16 FI FI991732A patent/FI121962B/sv not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
FI19991732A (sv) | 2000-02-14 |
JP2000138094A (ja) | 2000-05-16 |
KR100327105B1 (ko) | 2002-03-09 |
KR20000016902A (ko) | 2000-03-25 |
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