ES8302912A1 - Un metodo para analizar trozos de mineral con fines de se- leccion - Google Patents

Un metodo para analizar trozos de mineral con fines de se- leccion

Info

Publication number
ES8302912A1
ES8302912A1 ES505458A ES505458A ES8302912A1 ES 8302912 A1 ES8302912 A1 ES 8302912A1 ES 505458 A ES505458 A ES 505458A ES 505458 A ES505458 A ES 505458A ES 8302912 A1 ES8302912 A1 ES 8302912A1
Authority
ES
Spain
Prior art keywords
effect
ore
piece
gamma radiation
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES505458A
Other languages
English (en)
Spanish (es)
Other versions
ES505458A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Outokumpu Oyj
Original Assignee
Outokumpu Oyj
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Outokumpu Oyj filed Critical Outokumpu Oyj
Publication of ES505458A0 publication Critical patent/ES505458A0/es
Publication of ES8302912A1 publication Critical patent/ES8302912A1/es
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/05Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/05Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/063Investigating materials by wave or particle radiation by diffraction, scatter or reflection inelastic scatter, e.g. Compton effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/071Investigating materials by wave or particle radiation secondary emission combination of measurements, at least 1 secondary emission
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/084Investigating materials by wave or particle radiation secondary emission photo-electric effect
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/20Sources of radiation
    • G01N2223/206Sources of radiation sources operating at different energy levels
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/50Detectors
    • G01N2223/505Detectors scintillation

Landscapes

  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Sorting Of Articles (AREA)
ES505458A 1980-09-15 1981-09-14 Un metodo para analizar trozos de mineral con fines de se- leccion Expired ES8302912A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI802882A FI61361C (fi) 1980-09-15 1980-09-15 Foerfarande och anordning foer analys av malm med anvaendning av gammastraolning

Publications (2)

Publication Number Publication Date
ES505458A0 ES505458A0 (es) 1982-12-01
ES8302912A1 true ES8302912A1 (es) 1982-12-01

Family

ID=8513771

Family Applications (2)

Application Number Title Priority Date Filing Date
ES505458A Expired ES8302912A1 (es) 1980-09-15 1981-09-14 Un metodo para analizar trozos de mineral con fines de se- leccion
ES515253A Granted ES515253A0 (es) 1980-09-15 1982-08-25 "un aparato para analizar trozos de mineral con fines de seleccion".

Family Applications After (1)

Application Number Title Priority Date Filing Date
ES515253A Granted ES515253A0 (es) 1980-09-15 1982-08-25 "un aparato para analizar trozos de mineral con fines de seleccion".

Country Status (12)

Country Link
US (1) US4520267A (OSRAM)
AU (1) AU527158B2 (OSRAM)
BR (1) BR8105860A (OSRAM)
CA (1) CA1168766A (OSRAM)
DE (1) DE3136343C2 (OSRAM)
ES (2) ES8302912A1 (OSRAM)
FI (1) FI61361C (OSRAM)
FR (1) FR2490823A1 (OSRAM)
GB (1) GB2083618B (OSRAM)
SE (1) SE8105326L (OSRAM)
SU (1) SU1355111A3 (OSRAM)
ZA (1) ZA816268B (OSRAM)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI67626C (fi) * 1983-03-23 1985-04-10 Outokumpu Oy Foerfarande foer analysering av malmblock
FI72211C (fi) * 1983-03-23 1987-04-13 Outokumpu Oy Foerfarande foer beaktande av straolningsbakgrunden foer bestaemning av straolningsintensiteter som uppstaor i kroppar som skall analyseras.
US4916719A (en) * 1988-06-07 1990-04-10 Board Of Control Of Michigan Technological University On-line analysis of ash containing slurries
US5506406A (en) * 1993-05-17 1996-04-09 Atomic Energy Corporation Of South Africa Ltd. Method and apparatus for determining the concentration of a heavy element in a rock face
AUPN226295A0 (en) * 1995-04-07 1995-05-04 Technological Resources Pty Limited A method and an apparatus for analysing a material
RU2154537C1 (ru) * 1999-02-03 2000-08-20 Интегра Груп Лимитед Способ рентгенорадиометрической сепарации минерализованной массы
US7075062B2 (en) * 2001-12-10 2006-07-11 Schlumberger Technology Corporation Apparatus and methods for downhole determination of characteristics of formation fluids
RU2426104C1 (ru) * 2010-05-27 2011-08-10 Федеральное государственное образовательное учреждение высшего профессионального образования Санкт-Петербургский государственный университет Способ рентгеноспектрального определения содержания водорода, углерода и кислорода в органических соединениях и устройство для определения содержания водорода, углерода и кислорода в органических соединениях
RU2432571C1 (ru) * 2010-05-27 2011-10-27 Федеральное государственное образовательное учреждение высшего профессионального образования Санкт-Петербургский государственный университет Способ рентгеноспектрального определения эффективного атомного номера материала и устройство для определения эффективного атомного номера материала
US9482762B2 (en) 2014-08-28 2016-11-01 Infineon Technologies Ag Gamma ray detector and method of detecting gamma rays
GB2571099B (en) * 2018-02-15 2022-12-21 Bae Systems Plc Radiation detector
EP3737972A1 (en) 2018-02-15 2020-11-18 BAE SYSTEMS plc Radiation detector
US11650338B2 (en) 2018-11-23 2023-05-16 Bae Systems Plc Scintillation detector
EP4208301A4 (en) * 2020-09-02 2024-05-29 Botswana International University of Science and Technology Method and system for sorting of diamonds

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1389417A (fr) * 1963-04-01 1965-02-19 Commissariat Energie Atomique Procédé de dosage et dispositifs en faisant application
GB1103591A (en) * 1964-02-25 1968-02-21 Nat Res Dev Improvements in or relating to analysing and/or sorting arrangements
AU475297B2 (en) * 1972-06-09 1976-08-19 Commonwealth Scientific And Industrial Research Organisation Analysis utilizing neutron irradiation
DK134687B (da) * 1972-11-22 1976-12-20 Isotopcentralen Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler.
ZA766086B (en) * 1975-10-29 1977-07-27 Atomic Energy Commission Analysis of coal
DE2622175C3 (de) * 1976-05-19 1982-04-01 Gkss - Forschungszentrum Geesthacht Gmbh, 2000 Hamburg Verfahren zum Ermitteln der Volumenanteile eines Drei-Komponenten-Gemisches
GB2039363B (en) * 1979-01-12 1983-02-16 Coal Ind Determining the nature of transported material
DE2920364A1 (de) * 1979-05-19 1980-11-27 Strahlen Umweltforsch Gmbh Verfahren zur bestimmung von substanzen niederer ordnungszahl
US4314155A (en) * 1979-07-19 1982-02-02 Australian Atomic Energy Commission Method and apparatus for elemental analysis employing combination of neutron inelastic scattering and γ ray scattering
AU546141B2 (en) * 1979-12-20 1985-08-15 Australian Atomic Energy Commission Annihilation radiation analysis

Also Published As

Publication number Publication date
AU7521781A (en) 1982-04-08
ES8306257A1 (es) 1983-05-01
AU527158B2 (en) 1983-02-17
CA1168766A (en) 1984-06-05
DE3136343A1 (de) 1982-06-16
FI61361C (fi) 1982-07-12
ZA816268B (en) 1983-01-26
SE8105326L (sv) 1982-03-16
SU1355111A3 (ru) 1987-11-23
FI61361B (fi) 1982-03-31
ES505458A0 (es) 1982-12-01
US4520267A (en) 1985-05-28
FR2490823B1 (OSRAM) 1984-11-16
GB2083618A (en) 1982-03-24
FR2490823A1 (fr) 1982-03-26
ES515253A0 (es) 1983-05-01
DE3136343C2 (de) 1986-01-02
BR8105860A (pt) 1982-06-08
GB2083618B (en) 1984-06-13

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