DK134687B - Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler. - Google Patents

Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler.

Info

Publication number
DK134687B
DK134687B DK581972AA DK581972A DK134687B DK 134687 B DK134687 B DK 134687B DK 581972A A DK581972A A DK 581972AA DK 581972 A DK581972 A DK 581972A DK 134687 B DK134687 B DK 134687B
Authority
DK
Denmark
Prior art keywords
gamma
rays
concentration
measuring
elements
Prior art date
Application number
DK581972AA
Other languages
English (en)
Other versions
DK134687C (da
Inventor
Steen Teller Techn
Original Assignee
Isotopcentralen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Isotopcentralen filed Critical Isotopcentralen
Priority to DK581972AA priority Critical patent/DK134687B/da
Priority to US417407A priority patent/US3928765A/en
Priority to AT982573A priority patent/AT342898B/de
Priority to NL7316006A priority patent/NL7316006A/xx
Priority to JP48132090A priority patent/JPS5825976B2/ja
Priority to GB5417773A priority patent/GB1455869A/en
Priority to DE2358237A priority patent/DE2358237C2/de
Priority to FR7341600A priority patent/FR2208529A5/fr
Publication of DK134687B publication Critical patent/DK134687B/da
Application granted granted Critical
Publication of DK134687C publication Critical patent/DK134687C/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK581972AA 1972-11-22 1972-11-22 Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler. DK134687B (da)

Priority Applications (8)

Application Number Priority Date Filing Date Title
DK581972AA DK134687B (da) 1972-11-22 1972-11-22 Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler.
US417407A US3928765A (en) 1972-11-22 1973-11-19 Determining composition of a substance by the use of both reflected and transmitted radiation
AT982573A AT342898B (de) 1972-11-22 1973-11-22 Vorrichtung zur gehaltsermittlung fur wenigstens ein chemisches element eines mediums mit hilfe einer elektromagnetischen strahlung
NL7316006A NL7316006A (da) 1972-11-22 1973-11-22
JP48132090A JPS5825976B2 (ja) 1972-11-22 1973-11-22 媒質中の少くともひとつの元素の電磁輻射線法による定量装置
GB5417773A GB1455869A (en) 1972-11-22 1973-11-22 Method for the determination of the content of at least one chemical element in a medium by an electromagnetic method
DE2358237A DE2358237C2 (de) 1972-11-22 1973-11-22 Verfahren zur Bestimmung des Gehalts an mindestens einem chemischen Element in einer Substanz, insbesondere zur Bestimmung des Schwefelgehalts in Kohlenwasserstoff-Brennstoffen
FR7341600A FR2208529A5 (da) 1972-11-22 1973-11-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DK581972AA DK134687B (da) 1972-11-22 1972-11-22 Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler.

Publications (2)

Publication Number Publication Date
DK134687B true DK134687B (da) 1976-12-20
DK134687C DK134687C (da) 1977-05-23

Family

ID=8145471

Family Applications (1)

Application Number Title Priority Date Filing Date
DK581972AA DK134687B (da) 1972-11-22 1972-11-22 Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler.

Country Status (8)

Country Link
US (1) US3928765A (da)
JP (1) JPS5825976B2 (da)
AT (1) AT342898B (da)
DE (1) DE2358237C2 (da)
DK (1) DK134687B (da)
FR (1) FR2208529A5 (da)
GB (1) GB1455869A (da)
NL (1) NL7316006A (da)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4081676A (en) * 1976-12-17 1978-03-28 Sentrol Systems Ltd. On-line system for monitoring sheet material additives
USRE30884E (en) * 1976-12-17 1982-03-16 Sentrol Systems Ltd. On-line system for monitoring sheet material additives
US4194114A (en) * 1978-01-03 1980-03-18 Ukrainsky Nauchno-Issledovatelsky Institut Tselljulozno-Bumazhoi Promyshlennosti (UKRNIIB) Device for non-contact gauging of thickness or weight per unit area of sheet and like materials
US4494001A (en) * 1979-07-30 1985-01-15 United Kingdom Atomic Energy Authority Detection of concealed materials
FI61361C (fi) * 1980-09-15 1982-07-12 Outokumpu Oy Foerfarande och anordning foer analys av malm med anvaendning av gammastraolning
US4799247A (en) * 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
USRE39396E1 (en) * 1996-02-12 2006-11-14 American Science And Engineering, Inc. Mobile x-ray inspection system for large objects
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
US7505556B2 (en) * 2002-11-06 2009-03-17 American Science And Engineering, Inc. X-ray backscatter detection imaging modules
US7099434B2 (en) * 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US20090257555A1 (en) * 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US7447298B2 (en) * 2003-04-01 2008-11-04 Cabot Microelectronics Corporation Decontamination and sterilization system using large area x-ray source
JP2005127983A (ja) 2003-09-30 2005-05-19 Mitsubishi Heavy Ind Ltd 硬Ｘ線又はγ線を利用した埋没物評価方法、地下資源評価方法、地下廃棄物評価方法、地下貯蔵物評価方法、地層構造評価方法及び建造物内監視方法
US20060245548A1 (en) * 2005-04-22 2006-11-02 Joseph Callerame X-ray backscatter inspection with coincident optical beam
WO2007051092A2 (en) * 2005-10-24 2007-05-03 American Science And Engineering, Inc. X-ray inspection based on scatter detection
US20080297355A1 (en) * 2007-06-04 2008-12-04 Seiji Matsumoto Container with Electronic Tag and RFID System Using the Container with Electronic Tag
US7593510B2 (en) * 2007-10-23 2009-09-22 American Science And Engineering, Inc. X-ray imaging with continuously variable zoom and lateral relative displacement of the source
WO2011014445A1 (en) 2009-07-29 2011-02-03 American Science And Engineering, Inc. Top-down x-ray inspection trailer
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
US8532823B2 (en) 2010-02-12 2013-09-10 American Science And Engineering, Inc. Disruptor guidance system and methods based on scatter imaging
US9739727B2 (en) * 2015-01-21 2017-08-22 The Boeing Company Systems and methods for aligning an aperture

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2642537A (en) * 1949-12-22 1953-06-16 United States Steel Corp Apparatus for determining coating thickness
BE628322A (da) * 1962-02-12
GB1067430A (en) * 1964-09-11 1967-05-03 Atomic Energy Authority Uk Improvements in or relating to x-ray analysis
US3764805A (en) * 1967-07-06 1973-10-09 Us Army Control of propellant compositions by x-ray fluorescence analysis
GB1259771A (en) * 1967-10-27 1972-01-12 Hilger & Watts Ltd Improvements in radiometric analysis
FI40753B (da) * 1968-04-03 1969-01-31 Valmet Oy
US3746874A (en) * 1969-10-08 1973-07-17 Yokogawa Electric Works Ltd Apparatus using x-rays for measuring the content of an element having a higher mass absorption coefficient than hydrogen and carbon in hydrocarbon compounds

Also Published As

Publication number Publication date
DE2358237C2 (de) 1984-10-31
JPS5047692A (da) 1975-04-28
GB1455869A (en) 1976-11-17
JPS5825976B2 (ja) 1983-05-31
ATA982573A (de) 1977-08-15
DK134687C (da) 1977-05-23
FR2208529A5 (da) 1974-06-21
AT342898B (de) 1978-04-25
US3928765A (en) 1975-12-23
DE2358237A1 (de) 1974-05-30
NL7316006A (da) 1974-05-27

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