ES2531087T3 - Pastas de grabado que contienen partículas para superficies y capas de silicio - Google Patents
Pastas de grabado que contienen partículas para superficies y capas de silicio Download PDFInfo
- Publication number
- ES2531087T3 ES2531087T3 ES07818738T ES07818738T ES2531087T3 ES 2531087 T3 ES2531087 T3 ES 2531087T3 ES 07818738 T ES07818738 T ES 07818738T ES 07818738 T ES07818738 T ES 07818738T ES 2531087 T3 ES2531087 T3 ES 2531087T3
- Authority
- ES
- Spain
- Prior art keywords
- etching
- paste
- layers
- melting point
- low melting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title abstract 2
- 229910052710 silicon Inorganic materials 0.000 title abstract 2
- 239000010703 silicon Substances 0.000 title abstract 2
- 239000002245 particle Substances 0.000 title 1
- -1 d) if necessary Substances 0.000 abstract 5
- 238000005530 etching Methods 0.000 abstract 5
- 238000002844 melting Methods 0.000 abstract 2
- 230000008018 melting Effects 0.000 abstract 2
- 239000004698 Polyethylene Substances 0.000 abstract 1
- 239000004743 Polypropylene Substances 0.000 abstract 1
- 239000000654 additive Substances 0.000 abstract 1
- 239000002318 adhesion promoter Substances 0.000 abstract 1
- 239000003795 chemical substances by application Substances 0.000 abstract 1
- 239000010954 inorganic particle Substances 0.000 abstract 1
- 239000010410 layer Substances 0.000 abstract 1
- 239000000155 melt Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000011812 mixed powder Substances 0.000 abstract 1
- 239000000203 mixture Substances 0.000 abstract 1
- 239000011146 organic particle Substances 0.000 abstract 1
- 229920000573 polyethylene Polymers 0.000 abstract 1
- 229920000642 polymer Polymers 0.000 abstract 1
- 239000013047 polymeric layer Substances 0.000 abstract 1
- 229920001155 polypropylene Polymers 0.000 abstract 1
- 239000000843 powder Substances 0.000 abstract 1
- 150000003376 silicon Chemical class 0.000 abstract 1
- 239000002904 solvent Substances 0.000 abstract 1
- 239000002562 thickening agent Substances 0.000 abstract 1
- 239000013008 thixotropic agent Substances 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/02—Etching, surface-brightening or pickling compositions containing an alkali metal hydroxide
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1481—Pastes, optionally in the form of blocks or sticks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic System
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Photovoltaic Devices (AREA)
- Weting (AREA)
- Surface Treatment Of Glass (AREA)
- Laminated Bodies (AREA)
- ing And Chemical Polishing (AREA)
- Treatments Of Macromolecular Shaped Articles (AREA)
Abstract
Procedimiento para el grabado de superficies y capas de silicio, o de superficies vítreas que consisten en un derivado de silicio, caracterizado por que una pasta alcalina que puede imprimirse y dispensarse que contiene a) al menos un componente de grabado básico, b) al menos un disolvente c) partículas orgánicas muy finas con un punto de fusión bajo y dado el caso, partículas inorgánicas, d) dado el caso, agentes espesantes, y e) dado el caso, aditivos como antiespumantes, agentes tixotrópicos, agentes de control del flujo, desaireadores, promotores de adhesión, se aplica selectivamente sobre la superficie, caracterizado por que durante el tiempo de aplicación la pasta de grabado se calienta a una temperatura superior a 70 ºC, pero inferior a 200 ºC, donde el polvo polimérico que contiene el medio de grabado, seleccionado del grupo de polvo de polietileno, polipropileno o polvo mixto correspondiente, funde con un punto de fusión bajo por debajo de 150 ºC y en estado fundido no se mezcla con el resto de componentes de la pasta de grabado, sino que forma un sistema de dos fases y una capa polimérica delgada sobre el medio de grabado.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006051952A DE102006051952A1 (de) | 2006-11-01 | 2006-11-01 | Partikelhaltige Ätzpasten für Siliziumoberflächen und -schichten |
PCT/EP2007/008662 WO2008052636A1 (de) | 2006-11-01 | 2007-10-05 | Partikelhaltige ätzpasten für siliziumoberflächen und -schichten |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2531087T3 true ES2531087T3 (es) | 2015-03-10 |
Family
ID=38926215
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES07818738T Active ES2531087T3 (es) | 2006-11-01 | 2007-10-05 | Pastas de grabado que contienen partículas para superficies y capas de silicio |
Country Status (11)
Country | Link |
---|---|
US (1) | US20100068889A1 (es) |
EP (1) | EP2099877B1 (es) |
JP (1) | JP5033193B2 (es) |
KR (1) | KR101473502B1 (es) |
CN (1) | CN101528884B (es) |
DE (1) | DE102006051952A1 (es) |
ES (1) | ES2531087T3 (es) |
HK (1) | HK1133030A1 (es) |
MY (1) | MY149145A (es) |
TW (1) | TWI425078B (es) |
WO (1) | WO2008052636A1 (es) |
Families Citing this family (51)
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DE102006051735A1 (de) * | 2006-10-30 | 2008-05-08 | Merck Patent Gmbh | Druckfähiges Medium zur Ätzung von oxidischen, transparenten, leitfähigen Schichten |
WO2009040794A1 (en) * | 2007-09-24 | 2009-04-02 | Dip Tech. Ltd. | Etching compositions, methods and printing components |
EP2220687A1 (en) * | 2007-11-19 | 2010-08-25 | Applied Materials, Inc. | Solar cell contact formation process using a patterned etchant material |
WO2009067475A1 (en) * | 2007-11-19 | 2009-05-28 | Applied Materials, Inc. | Crystalline solar cell metallization methods |
DE102007058829A1 (de) | 2007-12-06 | 2009-06-10 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Textur- und Reinigungsmedium zur Oberflächenbehandlung von Wafern und dessen Verwendung |
JP5575771B2 (ja) * | 2008-09-01 | 2014-08-20 | メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング | エッチングによる薄層ソーラーモジュールの端部除去 |
DE102008056086A1 (de) * | 2008-11-06 | 2010-05-12 | Gp Solar Gmbh | Additiv für alkalische Ätzlösungen, insbesondere für Texturätzlösungen sowie Verfahren zu dessen Herstellung |
US20100130014A1 (en) * | 2008-11-26 | 2010-05-27 | Palo Alto Research Center Incorporated | Texturing multicrystalline silicon |
DE102009012827A1 (de) * | 2009-03-03 | 2010-10-07 | Gebr. Schmid Gmbh & Co. | Verfahren zur Texturierung von Siliziumwafern für Solarzellen und Behandlungsflüssigkeit dafür |
CN101958361A (zh) * | 2009-07-13 | 2011-01-26 | 无锡尚德太阳能电力有限公司 | 透光薄膜太阳电池组件刻蚀方法 |
DE102009028762A1 (de) * | 2009-08-20 | 2011-03-03 | Rena Gmbh | Verfahren zum Ätzen von Siliziumoberflächen |
US7955989B2 (en) * | 2009-09-24 | 2011-06-07 | Rohm And Haas Electronic Materials Llc | Texturing semiconductor substrates |
CN102859707B (zh) * | 2009-10-30 | 2016-02-24 | 默克专利股份有限公司 | 用于制造具有选择性发射极的太阳能电池的方法 |
KR101383395B1 (ko) * | 2009-12-28 | 2014-04-09 | 현대중공업 주식회사 | 후면전극형 태양전지의 제조방법 |
DE102010004743A1 (de) * | 2010-01-14 | 2011-07-21 | Merck Patent GmbH, 64293 | Laseradditiv |
CN101777605A (zh) * | 2010-03-15 | 2010-07-14 | 山东力诺太阳能电力股份有限公司 | 一种晶体硅太阳能电池边缘刻蚀工艺 |
US8524524B2 (en) * | 2010-04-22 | 2013-09-03 | General Electric Company | Methods for forming back contact electrodes for cadmium telluride photovoltaic cells |
DE102010019079A1 (de) * | 2010-04-30 | 2011-11-03 | Gp Solar Gmbh | Additiv für alkalische Ätzlösungen, insbesondere für Texturätzlösungen, sowie Verfahren zu dessen Herstellung |
CN102893421B (zh) * | 2010-05-21 | 2016-01-20 | 默克专利股份有限公司 | 在塑料底材结构上的碳纳米管(cnt)聚合物基质的选择性蚀刻 |
CN101864569B (zh) * | 2010-05-31 | 2013-01-09 | 江西赛维Ldk太阳能高科技有限公司 | 一种制作太阳能电池片的刻蚀装置以及方法 |
WO2011158118A2 (en) * | 2010-06-14 | 2011-12-22 | Indian Institute Of Technology | Method and device for forming an electrical contact pattern on a solar cell |
EP2596081A1 (en) * | 2010-06-14 | 2013-05-29 | Merck Patent GmbH | Cross-linking and multi-phase etch pastes for high resolution feature patterning |
WO2012023613A1 (ja) * | 2010-08-20 | 2012-02-23 | 株式会社トクヤマ | テクスチャー形成用組成物、シリコン基板の製造方法、及びテクスチャー形成用組成物調製キット |
EP2651841A1 (en) | 2010-12-15 | 2013-10-23 | Sun Chemical Corporation | Printable etchant compositions for etching silver nanowire-based transparent, conductive films |
US8999186B2 (en) * | 2011-04-28 | 2015-04-07 | Merck Patent Gmbh | Selectively etching of a polymer matrix on pet |
KR20140058563A (ko) * | 2011-07-18 | 2014-05-14 | 메르크 파텐트 게엠베하 | 대전방지 및 반사방지 코팅들 그리고 대응하는 적층된 층들의 구조화 |
CN102432185B (zh) * | 2011-09-30 | 2014-09-10 | 郑州恒昊玻璃技术有限公司 | 一种防眩玻璃制品蚀刻液及蚀刻工艺 |
EP2587564A1 (en) * | 2011-10-27 | 2013-05-01 | Merck Patent GmbH | Selective etching of a matrix comprising silver nanowires or carbon nanotubes |
CN102623568B (zh) * | 2012-04-10 | 2014-08-06 | 苏州阿特斯阳光电力科技有限公司 | 一种晶体硅太阳电池扩散死层的去除方法 |
KR102078293B1 (ko) | 2012-05-10 | 2020-02-17 | 코닝 인코포레이티드 | 유리 에칭 매질 및 방법 |
SG11201408430WA (en) * | 2012-06-25 | 2015-01-29 | Merck Patent Gmbh | Method for producing solar cells with local back surface field (lbsf) |
JP6081218B2 (ja) * | 2013-02-20 | 2017-02-15 | 新日鉄住金マテリアルズ株式会社 | エッチング装置およびエッチング方法 |
TWI488943B (zh) * | 2013-04-29 | 2015-06-21 | Chi Mei Corp | 蝕刻膏組成物及其應用 |
CN103500772B (zh) * | 2013-09-06 | 2016-06-15 | 江苏爱多光伏科技有限公司 | 浆料腐蚀法制备背面抛光多晶硅太阳电池的工艺方法 |
CN103508677A (zh) * | 2013-09-24 | 2014-01-15 | 苏州诺维克光伏新材料有限公司 | 一种膏体材料及其应用 |
US9059341B1 (en) | 2014-01-23 | 2015-06-16 | E I Du Pont De Nemours And Company | Method for manufacturing an interdigitated back contact solar cell |
JP2015173184A (ja) * | 2014-03-11 | 2015-10-01 | 東京応化工業株式会社 | アルカリエッチングマスク剤組成物、及びエッチング方法 |
CN105236756A (zh) * | 2015-09-21 | 2016-01-13 | 海南大学 | 减反射玻璃及其制备方法 |
CN106800040B (zh) * | 2017-02-24 | 2022-10-21 | 南京航空航天大学 | 一种汽车电控复合转向系统及其多目标优化方法 |
CN109835867B (zh) * | 2017-11-24 | 2023-07-14 | 中芯国际集成电路制造(上海)有限公司 | 刻蚀溶液和刻蚀方法 |
CN108004598A (zh) * | 2017-12-01 | 2018-05-08 | 绍兴拓邦电子科技有限公司 | 一种晶体硅边缘刻蚀添加剂及其使用方法 |
EP3761766A1 (en) * | 2019-07-03 | 2021-01-06 | AT & S Austria Technologie & Systemtechnik Aktiengesellschaft | Anisotropic etching using additives |
CN111559863B (zh) * | 2020-05-12 | 2022-04-19 | 江苏华鸥玻璃有限公司 | 一种耐热耐腐蚀的高硼硅棕色玻璃及其制备方法 |
TWI751568B (zh) * | 2020-05-29 | 2022-01-01 | 新應材股份有限公司 | 蝕刻劑組成物、增黏劑、鹼溶液、移除聚醯亞胺的方法以及蝕刻製程 |
CN113736466B (zh) * | 2020-05-29 | 2023-05-12 | 新应材股份有限公司 | 蚀刻剂组合物、增粘剂、移除聚酰亚胺的方法以及蚀刻工艺 |
CN111952409B (zh) * | 2020-06-30 | 2022-04-19 | 泰州中来光电科技有限公司 | 一种具有选择性发射极结构的钝化接触电池的制备方法 |
EP3984970A1 (en) | 2020-10-14 | 2022-04-20 | Schott Ag | Method for processing glass by alkaline etching |
JP2022148455A (ja) * | 2021-03-24 | 2022-10-06 | 株式会社Screenホールディングス | 基板処理方法、および、基板処理装置 |
KR20220136540A (ko) * | 2021-03-30 | 2022-10-11 | 삼성디스플레이 주식회사 | 표시 장치, 윈도우 제조 방법, 및 표시 장치 제조 방법 |
CN113488385B (zh) * | 2021-05-21 | 2022-10-28 | 刘军 | 一种导电膜气离式刻蚀工艺 |
CN115011348B (zh) * | 2022-06-30 | 2023-12-29 | 湖北兴福电子材料股份有限公司 | 一种氮化铝蚀刻液及其应用 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3031567A1 (de) * | 1980-08-21 | 1982-04-29 | Elochem Ätztechnik GmbH, 7758 Meersburg | Verfahren zum regenerieren einer ammoniakalischen aetzloesung |
US5500188A (en) * | 1984-03-01 | 1996-03-19 | Molecular Devices Corporation | Device for photoresponsive detection and discrimination |
US5688366A (en) * | 1994-04-28 | 1997-11-18 | Canon Kabushiki Kaisha | Etching method, method of producing a semiconductor device, and etchant therefor |
JP3173318B2 (ja) * | 1994-04-28 | 2001-06-04 | キヤノン株式会社 | エッチング方法及び半導体素子の製造方法 |
JP2003531807A (ja) * | 2000-04-28 | 2003-10-28 | メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフトング | 無機表面用エッチングペースト |
GB0108199D0 (en) * | 2001-04-02 | 2001-05-23 | Dupont Teijin Films Us Ltd | Multilayer film |
EP1378947A1 (en) * | 2002-07-01 | 2004-01-07 | Interuniversitair Microelektronica Centrum Vzw | Semiconductor etching paste and the use thereof for localised etching of semiconductor substrates |
DE10241300A1 (de) * | 2002-09-04 | 2004-03-18 | Merck Patent Gmbh | Ätzpasten für Siliziumoberflächen und -schichten |
EP1476002B1 (en) * | 2003-05-08 | 2018-07-04 | Samsung Display Co., Ltd. | Method of manufacturing a substrate for organic electroluminescent device |
US7612368B2 (en) * | 2004-12-29 | 2009-11-03 | E.I. Du Pont De Nemours And Company | Organic bottom emission electronic device |
DE102005007743A1 (de) * | 2005-01-11 | 2006-07-20 | Merck Patent Gmbh | Druckfähiges Medium zur Ätzung von Siliziumdioxid- und Siliziumnitridschichten |
-
2006
- 2006-11-01 DE DE102006051952A patent/DE102006051952A1/de not_active Withdrawn
-
2007
- 2007-10-05 WO PCT/EP2007/008662 patent/WO2008052636A1/de active Application Filing
- 2007-10-05 KR KR1020097011083A patent/KR101473502B1/ko not_active IP Right Cessation
- 2007-10-05 JP JP2009534998A patent/JP5033193B2/ja not_active Expired - Fee Related
- 2007-10-05 ES ES07818738T patent/ES2531087T3/es active Active
- 2007-10-05 EP EP07818738.2A patent/EP2099877B1/de not_active Not-in-force
- 2007-10-05 US US12/447,921 patent/US20100068889A1/en not_active Abandoned
- 2007-10-05 CN CN200780040165XA patent/CN101528884B/zh not_active Expired - Fee Related
- 2007-10-05 MY MYPI20091713A patent/MY149145A/en unknown
- 2007-10-29 TW TW096140603A patent/TWI425078B/zh not_active IP Right Cessation
-
2009
- 2009-11-10 HK HK09110459.4A patent/HK1133030A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE102006051952A1 (de) | 2008-05-08 |
EP2099877A1 (de) | 2009-09-16 |
US20100068889A1 (en) | 2010-03-18 |
TWI425078B (zh) | 2014-02-01 |
JP5033193B2 (ja) | 2012-09-26 |
EP2099877B1 (de) | 2014-11-26 |
CN101528884B (zh) | 2013-09-25 |
HK1133030A1 (en) | 2010-03-12 |
MY149145A (en) | 2013-07-15 |
KR20090091733A (ko) | 2009-08-28 |
KR101473502B1 (ko) | 2014-12-16 |
WO2008052636A1 (de) | 2008-05-08 |
TW200835778A (en) | 2008-09-01 |
CN101528884A (zh) | 2009-09-09 |
JP2010508663A (ja) | 2010-03-18 |
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