ES2053545T3 - Mejoras referentes a espectrometros. - Google Patents
Mejoras referentes a espectrometros.Info
- Publication number
- ES2053545T3 ES2053545T3 ES87306569T ES87306569T ES2053545T3 ES 2053545 T3 ES2053545 T3 ES 2053545T3 ES 87306569 T ES87306569 T ES 87306569T ES 87306569 T ES87306569 T ES 87306569T ES 2053545 T3 ES2053545 T3 ES 2053545T3
- Authority
- ES
- Spain
- Prior art keywords
- spectrometers
- effect
- reflecting structure
- improvements regarding
- utilise
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 abstract 4
- 238000001228 spectrum Methods 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4788—Diffraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/2866—Markers; Calibrating of scan
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J2003/425—Reflectance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
- G01N2201/0627—Use of several LED's for spectral resolution
Abstract
METODO Y APARATO PARA ANALIZAR EL ESPECTRO DEL LUZ REFLEJADA POR UNA ESTRUCTURA REFLECTANTE (24) EN LA CUAL EL EFECTO SOBRE LOS RESULTADOS DE ANALISIS DE LA VARIACION EN EL ANGULO ENTRE LA ESTRUCTURA REFLECTANTE Y EL HAZ INCIDENTE (22) SE MINIMIZA. EL METODO Y APARATO PUEDE UTILIZAR UN ELEMENTO DISPERSIVO (26) CONSTRUIDO Y DISPUESTO DE FORMA QUE SE MINIMICE EL EFECTO DE LAS VARIACIONES. EL METODO Y APARATO PUEDE TAMBIEN UTILIZAR UNA TECNICA DE CALIBRACION EN LA CUAL LA LUZ CON UN ESPECTRO CONOCIDO SE REFLEJA FUERA DE LA ESTRUCTURA REFLECTANTE Y ES ANALIZADA DE FORMA QUE LA COMPENSACION PUEDA HACERSE POR EL EFECTO DE LA VARIACION.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB868618159A GB8618159D0 (en) | 1986-07-25 | 1986-07-25 | Spectrometer based instruments |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2053545T3 true ES2053545T3 (es) | 1994-08-01 |
Family
ID=10601663
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES87306569T Expired - Lifetime ES2053545T3 (es) | 1986-07-25 | 1987-07-24 | Mejoras referentes a espectrometros. |
Country Status (10)
Country | Link |
---|---|
US (1) | US4828387A (es) |
EP (1) | EP0255302B1 (es) |
JP (1) | JP2511057B2 (es) |
AT (1) | ATE106555T1 (es) |
AU (1) | AU598007B2 (es) |
CA (1) | CA1301470C (es) |
DE (1) | DE3789923T2 (es) |
ES (1) | ES2053545T3 (es) |
GB (1) | GB8618159D0 (es) |
IL (1) | IL83280A (es) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8620193D0 (en) * | 1986-08-19 | 1986-10-01 | Emi Plc Thorn | Chemical sensor |
FI875236A (fi) * | 1987-11-27 | 1989-05-28 | Outokumpu Oy | Maetningsgivare foer baerbar analysator. |
US5478755A (en) * | 1988-07-25 | 1995-12-26 | Ares Serono Research & Development Ltd. | Long range surface plasma resonance immunoassay |
DE3909144A1 (de) * | 1989-03-21 | 1990-09-27 | Basf Ag | Verfahren zur bestimmung von brechungsindex und schichtdicke duenner schichten |
US5830766A (en) * | 1990-05-23 | 1998-11-03 | Ares-Serono Research & Development Ltd. Partnership | Enhanced signal-to-noise ratio and sensitivity optical immunoassay |
GB9406142D0 (en) * | 1994-03-28 | 1994-05-18 | British Tech Group | A sensor |
US5955378A (en) * | 1997-08-20 | 1999-09-21 | Challener; William A. | Near normal incidence optical assaying method and system having wavelength and angle sensitivity |
US5925878A (en) * | 1997-08-20 | 1999-07-20 | Imation Corp. | Diffraction anomaly sensor having grating coated with protective dielectric layer |
US5994150A (en) | 1997-11-19 | 1999-11-30 | Imation Corp. | Optical assaying method and system having rotatable sensor disk with multiple sensing regions |
US5986762A (en) * | 1998-06-15 | 1999-11-16 | Imation Corp. | Optical sensor having optimized surface profile |
US6320991B1 (en) | 1998-10-16 | 2001-11-20 | Imation Corp. | Optical sensor having dielectric film stack |
US6771376B2 (en) * | 1999-07-05 | 2004-08-03 | Novartis Ag | Sensor platform, apparatus incorporating the platform, and process using the platform |
AU5824300A (en) | 1999-07-05 | 2001-01-22 | Novartis Ag | Sensor platform, apparatus incorporating the platform, and process using the platform |
US7167615B1 (en) | 1999-11-05 | 2007-01-23 | Board Of Regents, The University Of Texas System | Resonant waveguide-grating filters and sensors and methods for making and using same |
EP2275802A1 (de) * | 2000-08-09 | 2011-01-19 | Artificial Sensing Instruments ASI AG | Wellenleitergitterstruktur und optische Messanordnung |
US6898537B1 (en) * | 2001-04-27 | 2005-05-24 | Nanometrics Incorporated | Measurement of diffracting structures using one-half of the non-zero diffracted orders |
US7316322B2 (en) * | 2002-12-24 | 2008-01-08 | Kubota Corporation | Quality evaluation apparatus for fruits and vegetables |
US7151597B2 (en) * | 2003-12-05 | 2006-12-19 | Agilent Technologie, Inc | Optical wavelength standard and optical wavelength calibration system and method |
US7158240B2 (en) * | 2004-06-16 | 2007-01-02 | The United States Of America As Represented By The Secretary Of The Army | Measurement device and method |
DE102004033869B3 (de) * | 2004-07-13 | 2006-03-30 | Gesellschaft zur Förderung der Spektrochemie und angewandten Spektroskopie e.V. | Verfahren zur Bestimmung von Oberflächenplasmonenresonanzen an zweidimensionalen Messflächen |
US20110267623A1 (en) * | 2009-11-02 | 2011-11-03 | Matejka Steven R | Multi-Wavelength Reference Microplate For Label-Independent Optical Reader |
JP5947502B2 (ja) * | 2011-08-11 | 2016-07-06 | キヤノン株式会社 | 分光測色器、および画像形成装置 |
US9541998B2 (en) * | 2015-01-29 | 2017-01-10 | Samsung Electronics Co., Ltd. | Electronic system with gaze alignment mechanism and method of operation thereof |
EP3637069A4 (en) * | 2017-06-08 | 2021-09-08 | Ushio Denki Kabushiki Kaisha | SPECTRUM MEASUREMENT METHOD, SPECTRUM MEASURING DEVICE AND WIDEBAND PULSED LIGHT SOURCE UNIT |
JPWO2021193589A1 (es) * | 2020-03-23 | 2021-09-30 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3985442A (en) * | 1974-06-07 | 1976-10-12 | Gte Sylvania Incorporated | Data acquisition system for spectrophotometer |
US3973849A (en) * | 1975-06-16 | 1976-08-10 | International Business Machines Corporation | Self-calibratable spectrum analyzer |
DE2655272A1 (de) * | 1976-12-07 | 1978-06-08 | Leybold Heraeus Gmbh & Co Kg | Spektralfotometeranordnung |
JPS5410576A (en) * | 1978-01-06 | 1979-01-26 | Hitachi Ltd | Washer |
US4207467A (en) * | 1978-09-05 | 1980-06-10 | Laser Precision Corp. | Film measuring apparatus and method |
US4345840A (en) * | 1980-04-08 | 1982-08-24 | California Institute Of Technology | Method and apparatus for instantaneous band ratioing in a reflectance radiometer |
AU543052B2 (en) * | 1981-04-27 | 1985-03-28 | Hajime Industries Ltd. | Object inspection device |
FR2510254A1 (fr) * | 1981-07-21 | 1983-01-28 | Guillaume Michel | Procede et dispositif de mesure de temperature utilisant un reseau de diffraction |
DE3224736A1 (de) * | 1982-07-02 | 1984-01-05 | Bodenseewerk Perkin-Elmer & Co GmbH, 7770 Überlingen | Gitterspektrometer |
DE3406645A1 (de) * | 1984-02-24 | 1985-08-29 | Leybold-Heraeus GmbH, 5000 Köln | Spektralfotometeranordnung |
US4664522A (en) * | 1984-08-24 | 1987-05-12 | Guided Wave, Inc. | Optical waveguide spectrum analyzer and method |
JPS61217705A (ja) * | 1985-03-22 | 1986-09-27 | Dainippon Screen Mfg Co Ltd | 膜厚測定装置 |
-
1986
- 1986-07-25 GB GB868618159A patent/GB8618159D0/en active Pending
-
1987
- 1987-07-22 IL IL83280A patent/IL83280A/xx not_active IP Right Cessation
- 1987-07-22 AU AU76006/87A patent/AU598007B2/en not_active Expired
- 1987-07-22 US US07/076,467 patent/US4828387A/en not_active Expired - Lifetime
- 1987-07-24 CA CA000542948A patent/CA1301470C/en not_active Expired - Lifetime
- 1987-07-24 AT AT87306569T patent/ATE106555T1/de not_active IP Right Cessation
- 1987-07-24 DE DE3789923T patent/DE3789923T2/de not_active Expired - Lifetime
- 1987-07-24 EP EP87306569A patent/EP0255302B1/en not_active Expired - Lifetime
- 1987-07-24 ES ES87306569T patent/ES2053545T3/es not_active Expired - Lifetime
- 1987-07-25 JP JP62184701A patent/JP2511057B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
CA1301470C (en) | 1992-05-26 |
JPS6381226A (ja) | 1988-04-12 |
IL83280A (en) | 1990-11-05 |
JP2511057B2 (ja) | 1996-06-26 |
EP0255302B1 (en) | 1994-06-01 |
IL83280A0 (en) | 1987-12-31 |
AU7600687A (en) | 1988-01-28 |
EP0255302A3 (en) | 1989-10-18 |
DE3789923D1 (de) | 1994-07-07 |
DE3789923T2 (de) | 1994-09-08 |
ATE106555T1 (de) | 1994-06-15 |
GB8618159D0 (en) | 1986-09-03 |
AU598007B2 (en) | 1990-06-14 |
US4828387A (en) | 1989-05-09 |
EP0255302A2 (en) | 1988-02-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
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