JPS57153250A - Measuring apparatus of spectral transmissivity of polarizable sample - Google Patents

Measuring apparatus of spectral transmissivity of polarizable sample

Info

Publication number
JPS57153250A
JPS57153250A JP3985281A JP3985281A JPS57153250A JP S57153250 A JPS57153250 A JP S57153250A JP 3985281 A JP3985281 A JP 3985281A JP 3985281 A JP3985281 A JP 3985281A JP S57153250 A JPS57153250 A JP S57153250A
Authority
JP
Japan
Prior art keywords
light
sample
made incident
incident
spectroscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3985281A
Other languages
Japanese (ja)
Other versions
JPS6244215B2 (en
Inventor
Osamu Akiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP3985281A priority Critical patent/JPS57153250A/en
Publication of JPS57153250A publication Critical patent/JPS57153250A/en
Publication of JPS6244215B2 publication Critical patent/JPS6244215B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255Details, e.g. use of specially adapted sources, lighting or optical systems

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To measure the spectral transmissivity to natural light of a substance having a polarization characteristic with one measuring operation, by making emitted light from a spectroscope incident to a light diffusion plate and making its reflected light incident to a sample. CONSTITUTION:Exit light of a spectroscope M which is made incident light from a light source L is reflected by a reflecting mirror MR and is made into parallel light flux and then, is made incident to a light diffusion plate D. A slit-shaped collimator C is arranged in front of a sample S and only the light flux in the direction vertical to the plate D is made incident to the sample S among the light flux reflected scatteringly by the plate D. And, the light transmitted the sample S is made incident to an integral globe I and exit light emitted from a window different from a sample transmitted light incidence window of the globe I is made incident to a photodetector DT and then, the spectral transmissivity is measured. Hereby, the spectral characteristic of the sample is measured by the light nearer to natural light than that in using a prism spectroscope without using an expensive apparatus such as the prism spectroscope.
JP3985281A 1981-03-18 1981-03-18 Measuring apparatus of spectral transmissivity of polarizable sample Granted JPS57153250A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3985281A JPS57153250A (en) 1981-03-18 1981-03-18 Measuring apparatus of spectral transmissivity of polarizable sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3985281A JPS57153250A (en) 1981-03-18 1981-03-18 Measuring apparatus of spectral transmissivity of polarizable sample

Publications (2)

Publication Number Publication Date
JPS57153250A true JPS57153250A (en) 1982-09-21
JPS6244215B2 JPS6244215B2 (en) 1987-09-18

Family

ID=12564490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3985281A Granted JPS57153250A (en) 1981-03-18 1981-03-18 Measuring apparatus of spectral transmissivity of polarizable sample

Country Status (1)

Country Link
JP (1) JPS57153250A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63236944A (en) * 1987-03-25 1988-10-03 Shimadzu Corp Atomic absorption analysis instrument
CN103512864A (en) * 2012-06-25 2014-01-15 中国科学院微电子研究所 Optical measuring system for measuring reflectivity and transmissivity of substrate by utilizing parallel light
WO2019077932A1 (en) * 2017-10-19 2019-04-25 コニカミノルタ株式会社 Diffracted light removal slit and optical sample detection system using same

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63236944A (en) * 1987-03-25 1988-10-03 Shimadzu Corp Atomic absorption analysis instrument
CN103512864A (en) * 2012-06-25 2014-01-15 中国科学院微电子研究所 Optical measuring system for measuring reflectivity and transmissivity of substrate by utilizing parallel light
CN103512864B (en) * 2012-06-25 2016-07-06 中国科学院微电子研究所 Optical measuring system for measuring reflectivity and transmissivity of substrate by utilizing parallel light
WO2019077932A1 (en) * 2017-10-19 2019-04-25 コニカミノルタ株式会社 Diffracted light removal slit and optical sample detection system using same
JPWO2019077932A1 (en) * 2017-10-19 2020-11-05 コニカミノルタ株式会社 Diffraction light removal slit and optical sample detection system using this
EP3683571A4 (en) * 2017-10-19 2020-11-25 Konica Minolta, Inc. Diffracted light removal slit and optical sample detection system using same
US11169090B2 (en) 2017-10-19 2021-11-09 Konica Minolta, Inc. Diffracted light removal slit and optical sample detection system using same

Also Published As

Publication number Publication date
JPS6244215B2 (en) 1987-09-18

Similar Documents

Publication Publication Date Title
CN103674891B (en) Atmospheric NO3 free radical concentration measurement system based on double-cavity type cavity ring-down technology
JPH0131130B2 (en)
US2451501A (en) Specular reflectometer
JPS5483854A (en) Measuring device
JPS57153250A (en) Measuring apparatus of spectral transmissivity of polarizable sample
CN204924927U (en) Portable full gloss register for easy reference mummification food security rapid analysis appearance
GB2200987A (en) Ultraviolet radiation detector
JPS56115905A (en) Measuring method for thickness of transparent film and device therefor
RU178357U1 (en) INFRARED HYDROGEN
JPS6449940A (en) Method for measuring concentration of material in leaf
JPS5236081A (en) Optical part for colorimeter
JPS6423126A (en) Multiple light source polarization analyzing method
JPS55155204A (en) Measuring instrument for thickness of film
SU135256A1 (en) Instrument for measuring the reflection coefficients of flat specular reflecting surfaces when normal light is incident on them
JPS5720636A (en) Measuring device for transmittance of lens
JPS5435759A (en) Measuring method of numerical aperture of optical fibers
JPS56100379A (en) Operation check circuit for radiant ray measuring device
JPS56111446A (en) Photometric analyzer of cell-length modulation system
RU2073834C1 (en) Polarization device
JPS56137136A (en) Optical sensor
CN106353262A (en) Atomic absorption measuring method and measuring device
SU802849A1 (en) Cuvette for refractometric detecting in liquid chromatography
JPS5647738A (en) Turbidimeter
JPS57101744A (en) Optical concentration meter
JPS53129086A (en) Varied angle absolute reflectance measuring device