ES2047108T3 - Metodo para medir el espesor de peliculas delgadas. - Google Patents
Metodo para medir el espesor de peliculas delgadas.Info
- Publication number
- ES2047108T3 ES2047108T3 ES89202969T ES89202969T ES2047108T3 ES 2047108 T3 ES2047108 T3 ES 2047108T3 ES 89202969 T ES89202969 T ES 89202969T ES 89202969 T ES89202969 T ES 89202969T ES 2047108 T3 ES2047108 T3 ES 2047108T3
- Authority
- ES
- Spain
- Prior art keywords
- thickness
- coating
- beams
- measuring
- polarized light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0641—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization
- G01B11/065—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of polarization using one or more discrete wavelengths
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Magnetic Heads (AREA)
- Insulated Conductors (AREA)
- Organic Insulating Materials (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
CALIBRE DE ESPESOR DE REVESTIMIENTO QUE MIDE EL ESPESOR DE UN REVESTIMIENTO DE OXIDO DE CROMO EN UNA CAPA DE CROMO SOBRE UN SUSTRATO QUE TIENE UNA FUENTE DE ILUMINACION (17) QUE GENERA LUZ POLARIZADA LINEALMENTE, UN DISPOSITIVO (19) PARA DIVIDIR ELIPTICAMENTE LA LUZ POLARIZADA REFLEJADA POR EL REVESTIMIENTO DE OXIDO DE CROMO EN UN CIERTO NUMERO DE RAYOS (20, 21), DETECTORES (22, 23) QUE MIDEN LA INTENSIDAD DE LOS RAYOS, Y DISPOSITIVOS (24) QUE CALCULAN EL ESPESOR DEL REVESTIMIENTOS DE OXIDO DE CROMO A PARTIR DE LAS INTESIDADES DE LUZ MEDIDAS. PARA SIMPLIFICAR EL DISPOSITIVO Y EL CALCULO EL DISPOSITIVO DIVISOR ESTA DISPUESTO PARA DIVIDIR LA LUZ POLARIZADA REFLEJADA EN DOS RAYOS PARCIALES (20, 21), POLARIZADOS A UN CIERTO ANGULO CONOCIDO ENTRE SI Y EL DISPOSITIVO DE CALCULO QUE CALCULA LA ELIPTICIDAD A PARTIR DE LA INTENSIDAD MEDIDA DE LOS DOS RAYOS PARCIALES, Y EL ESPESOR A PARTIR DE LA ELIPTICIDAD.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL8802920A NL8802920A (nl) | 1988-11-28 | 1988-11-28 | Laagdiktemeter. |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2047108T3 true ES2047108T3 (es) | 1994-02-16 |
Family
ID=19853294
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES89202969T Expired - Lifetime ES2047108T3 (es) | 1988-11-28 | 1989-11-23 | Metodo para medir el espesor de peliculas delgadas. |
Country Status (11)
Country | Link |
---|---|
US (1) | US5170049A (es) |
EP (1) | EP0371550B1 (es) |
JP (1) | JPH0678892B2 (es) |
AT (1) | ATE99046T1 (es) |
AU (1) | AU629265B2 (es) |
CA (1) | CA2003983C (es) |
DE (1) | DE68911659T2 (es) |
ES (1) | ES2047108T3 (es) |
MX (1) | MX172398B (es) |
NL (1) | NL8802920A (es) |
TR (1) | TR26149A (es) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5243185A (en) * | 1992-07-31 | 1993-09-07 | Loral Aerospace Corp. | Apparatus and method for ice detection |
ES2076083B1 (es) * | 1993-06-04 | 1996-06-01 | Fuesca Sl | Aparato y metodo de medida y control de la densidad de reticulacion de los tratamientos en caliente y frio del vidrio aligerado. |
US5650610A (en) * | 1995-03-15 | 1997-07-22 | National Research Council Of Canada | Apparatus and method for remote detection of ice or other birefringent material on a surface |
CN1131741A (zh) * | 1995-03-22 | 1996-09-25 | 载歌公司 | 光学间隙测量装置和方法 |
US5557399A (en) * | 1995-03-22 | 1996-09-17 | Zygo Corporation | Optical gap measuring apparatus and method |
US5953125A (en) * | 1995-09-01 | 1999-09-14 | Zygo Corporation | Optical gap measuring apparatus and method |
US6483580B1 (en) | 1998-03-06 | 2002-11-19 | Kla-Tencor Technologies Corporation | Spectroscopic scatterometer system |
JP3893868B2 (ja) * | 2000-10-11 | 2007-03-14 | 東京エレクトロン株式会社 | 電界効果トランジスタの製造方法、並びに、半導体デバイスの製造方法及びその装置 |
US6908774B2 (en) * | 2002-08-12 | 2005-06-21 | S.O. I. Tec Silicon On Insulator Technologies S.A. | Method and apparatus for adjusting the thickness of a thin layer of semiconductor material |
EP1619465A1 (en) * | 2004-07-19 | 2006-01-25 | Nederlandse Organisatie Voor Toegepast-Natuurwetenschappelijk Onderzoek Tno | Optical monitoring apparatus and method of monitoring optical coatings |
US7515253B2 (en) * | 2005-01-12 | 2009-04-07 | Kla-Tencor Technologies Corporation | System for measuring a sample with a layer containing a periodic diffracting structure |
US7370525B1 (en) | 2006-10-31 | 2008-05-13 | Swan International Sensors Pty. Ltd. | Inflight ice detection system |
AT504136B1 (de) * | 2006-12-29 | 2008-03-15 | Univ Linz | Verfahren zur bestimmung der dicke einer metallisierungsschicht auf einer polymerfolie |
CN100470193C (zh) * | 2007-06-08 | 2009-03-18 | 中国科学院上海光学精密机械研究所 | 石英波片厚度的测量装置和测量方法 |
US20090002686A1 (en) * | 2007-06-29 | 2009-01-01 | The Material Works, Ltd. | Sheet Metal Oxide Detector |
DE102008021199A1 (de) * | 2008-04-28 | 2009-10-29 | Focke & Co.(Gmbh & Co. Kg) | Verfahren und Vorrichtung zum Prüfen von mit Folie umwickelten Zigarettenpackungen |
JP2012032239A (ja) * | 2010-07-29 | 2012-02-16 | Horiba Ltd | 試料検査装置及び試料検査方法 |
ES2808550T3 (es) * | 2013-03-15 | 2021-03-01 | Sensory Analytics | Método y sistema para la medición en tiempo real durante el proceso del espesor de recubrimiento |
JP6355066B2 (ja) * | 2013-08-29 | 2018-07-11 | 株式会社リコー | センサ装置及び画像形成装置 |
WO2019101803A1 (en) * | 2017-11-24 | 2019-05-31 | Abb Schweiz Ag | System and method for characterizing a coating such as a paint film by radiation, and painting facility with such a system |
CN113155040B (zh) * | 2021-03-04 | 2023-02-28 | 上海精测半导体技术有限公司 | 一种探测反射光束角度变化的装置、方法及膜厚测量装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3426201A (en) * | 1965-10-12 | 1969-02-04 | Texas Instruments Inc | Method and apparatus for measuring the thickness of films by means of elliptical polarization of reflected infrared radiation |
US3906844A (en) * | 1974-05-28 | 1975-09-23 | Int Envelope Limited | Method and apparatus for producing envelopes having a closure flap |
US3908508A (en) * | 1974-09-23 | 1975-09-30 | Modulus Corp | Strain indicator |
JPS51129279A (en) * | 1975-05-02 | 1976-11-10 | Nippon Kogaku Kk <Nikon> | Polarizing analyzer |
US4585348A (en) * | 1981-09-28 | 1986-04-29 | International Business Machines Corporation | Ultra-fast photometric instrument |
EP0075689A1 (en) * | 1981-09-28 | 1983-04-06 | International Business Machines Corporation | Optical instruments for viewing a sample surface |
US4850711A (en) * | 1986-06-13 | 1989-07-25 | Nippon Kokan Kabushiki Kaisha | Film thickness-measuring apparatus using linearly polarized light |
-
1988
- 1988-11-28 NL NL8802920A patent/NL8802920A/nl not_active Application Discontinuation
-
1989
- 1989-11-23 EP EP89202969A patent/EP0371550B1/en not_active Expired - Lifetime
- 1989-11-23 DE DE89202969T patent/DE68911659T2/de not_active Expired - Fee Related
- 1989-11-23 ES ES89202969T patent/ES2047108T3/es not_active Expired - Lifetime
- 1989-11-23 AT AT89202969T patent/ATE99046T1/de not_active IP Right Cessation
- 1989-11-27 US US07/441,641 patent/US5170049A/en not_active Expired - Fee Related
- 1989-11-27 MX MX018502A patent/MX172398B/es unknown
- 1989-11-27 CA CA002003983A patent/CA2003983C/en not_active Expired - Fee Related
- 1989-11-28 AU AU45636/89A patent/AU629265B2/en not_active Ceased
- 1989-11-28 TR TR89/0974A patent/TR26149A/xx unknown
- 1989-11-28 JP JP1306757A patent/JPH0678892B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
AU4563689A (en) | 1990-05-31 |
ATE99046T1 (de) | 1994-01-15 |
JPH0678892B2 (ja) | 1994-10-05 |
TR26149A (tr) | 1994-01-14 |
US5170049A (en) | 1992-12-08 |
EP0371550A1 (en) | 1990-06-06 |
NL8802920A (nl) | 1990-06-18 |
EP0371550B1 (en) | 1993-12-22 |
CA2003983C (en) | 1993-12-14 |
DE68911659D1 (de) | 1994-02-03 |
AU629265B2 (en) | 1992-10-01 |
DE68911659T2 (de) | 1994-05-05 |
MX172398B (es) | 1993-12-15 |
CA2003983A1 (en) | 1990-05-28 |
JPH02263105A (ja) | 1990-10-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
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