ES2005966A6 - Device for inspecting rotationally-symmetrical parts - Google Patents

Device for inspecting rotationally-symmetrical parts

Info

Publication number
ES2005966A6
ES2005966A6 ES8703495A ES8703495A ES2005966A6 ES 2005966 A6 ES2005966 A6 ES 2005966A6 ES 8703495 A ES8703495 A ES 8703495A ES 8703495 A ES8703495 A ES 8703495A ES 2005966 A6 ES2005966 A6 ES 2005966A6
Authority
ES
Spain
Prior art keywords
radiation
sensors
sensor
frequency
modulated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES8703495A
Other languages
Spanish (es)
Inventor
Gunter Hege
Michael Struck
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Robert Bosch GmbH
Original Assignee
Robert Bosch GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robert Bosch GmbH filed Critical Robert Bosch GmbH
Publication of ES2005966A6 publication Critical patent/ES2005966A6/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G01M13/005—Sealing rings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The device is intended in particular for inspecting circular-cross-section sealing rings known as O-rings. Two radiation sources (10, 11) are provided emitting radiation (12, 15) of a given frequency. The common light beam (16) is directed on to the surface to be checked (29) of the O-ring (24) by means of a beam forming system (20) and a first rotary mirror (21) as well as by a concentrating lens (22). The radiation (30) reflected from the surface (29) arrives at an arrangement of sensors (33) after passing through another convex lens (31) and deflection by a second rotary mirror (32). The sensor arrangement (33) comprises a first radiation sensor (34) which sends to an evaluation unit (35) an output signal which depends on the point of impingement of the radiation on the active surface (36) of the first sensor (34). Two further radiation sensors (35, 44, 49) are provided which supply the evaluation unit (35) with an output signal that varies according to the radiation intensity of said sensors (44, 49). Upstream of the latter are arranged colour-permeable filters (42, 47), the pass-band of one filter (42) being modulated to the radiation frequency (15) of the first radiation source (10), and that of the other filter (47) being modulated to the other radiation frequency (12) of the second radiation source (11). The apparatus described automatically identifies faults characterized by different geometrical and colour markings on the O-ring surface (29).
ES8703495A 1986-12-08 1987-12-04 Device for inspecting rotationally-symmetrical parts Expired ES2005966A6 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19863641862 DE3641862A1 (en) 1986-12-08 1986-12-08 DEVICE FOR TESTING ROTATION-SYMMETRICAL WORKPIECES

Publications (1)

Publication Number Publication Date
ES2005966A6 true ES2005966A6 (en) 1989-04-01

Family

ID=6315698

Family Applications (1)

Application Number Title Priority Date Filing Date
ES8703495A Expired ES2005966A6 (en) 1986-12-08 1987-12-04 Device for inspecting rotationally-symmetrical parts

Country Status (3)

Country Link
DE (1) DE3641862A1 (en)
ES (1) ES2005966A6 (en)
WO (1) WO1988004416A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3917076A1 (en) * 1989-05-26 1990-11-29 Klaue Hermann Rubber loop sealing ring automatic tester - takes up sample by conical mandrel, rolls to extend and reduces between cylindrical surfaces
DE4000121C1 (en) * 1990-01-04 1991-07-18 Fa. Carl Freudenberg, 6940 Weinheim, De Photoelectric quality control for sealing rings - has carrier for light source slidable and pivotable about axis in parallel with its length axis
BR9403734A (en) * 1994-10-20 1997-02-25 Samapre Ind De Maquinas Ltda Improvement in equipment for quality measurement
IT1395116B1 (en) * 2009-07-29 2012-09-05 Utpvision S R L OPTICAL SURFACE DETECTION SYSTEM

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3917414A (en) * 1973-10-11 1975-11-04 Geisco Associates Optical inspection system
DE2433682C3 (en) * 1974-07-12 1979-02-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Device for monitoring a material web or another scanning plane
DE2535686A1 (en) * 1975-08-09 1977-02-10 Freudenberg Carl Fa METHOD OF LIGHT GAP TESTING OF LIP SEALS MADE OF ELASTOMERS
US4265545A (en) * 1979-07-27 1981-05-05 Intec Corporation Multiple source laser scanning inspection system
JPS576307A (en) * 1980-06-13 1982-01-13 Toyota Central Res & Dev Lab Inc Method and apparatus of surface failure inspection of circular member
US4352017A (en) * 1980-09-22 1982-09-28 Rca Corporation Apparatus for determining the quality of a semiconductor surface
JPS5766345A (en) * 1980-10-09 1982-04-22 Hitachi Ltd Inspection device for defect
US4532723A (en) * 1982-03-25 1985-08-06 General Electric Company Optical inspection system
US4520388A (en) * 1982-11-01 1985-05-28 General Electric Company Optical signal projector
GB2173294B (en) * 1985-04-02 1988-10-12 Glaverbel Method of and apparatus for determining the location of defects present in flat glass

Also Published As

Publication number Publication date
DE3641862A1 (en) 1988-06-09
WO1988004416A1 (en) 1988-06-16

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