JPS6441819A - Position detecting apparatus - Google Patents

Position detecting apparatus

Info

Publication number
JPS6441819A
JPS6441819A JP19850287A JP19850287A JPS6441819A JP S6441819 A JPS6441819 A JP S6441819A JP 19850287 A JP19850287 A JP 19850287A JP 19850287 A JP19850287 A JP 19850287A JP S6441819 A JPS6441819 A JP S6441819A
Authority
JP
Japan
Prior art keywords
light
mask
photodetector
code plate
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19850287A
Other languages
Japanese (ja)
Inventor
Keiji Kubo
Masaki Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP19850287A priority Critical patent/JPS6441819A/en
Publication of JPS6441819A publication Critical patent/JPS6441819A/en
Pending legal-status Critical Current

Links

Landscapes

  • Optical Transform (AREA)

Abstract

PURPOSE:To decrease nonlinear errors and to enhance resolution in position detection, by continuously scanning the light from a light source on a code plate, a mask and a photodetector. CONSTITUTION:The light from a light source is continuously scanned on a code plate 23, a mask 24 and a photodetector 25. Thus, the output of the change in light amount from the photodetector caused by said scanning for Moire fringes due to the code plate 23 and the mask 24 becomes continuous. When the light from the single light source is continuously scanned, the amount of the emitted light becomes uniform and constant. Therefore, the highly accurate detection of a minute position can be performed.
JP19850287A 1987-08-07 1987-08-07 Position detecting apparatus Pending JPS6441819A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19850287A JPS6441819A (en) 1987-08-07 1987-08-07 Position detecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19850287A JPS6441819A (en) 1987-08-07 1987-08-07 Position detecting apparatus

Publications (1)

Publication Number Publication Date
JPS6441819A true JPS6441819A (en) 1989-02-14

Family

ID=16392199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19850287A Pending JPS6441819A (en) 1987-08-07 1987-08-07 Position detecting apparatus

Country Status (1)

Country Link
JP (1) JPS6441819A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005050141A1 (en) * 2003-11-20 2005-06-02 Mitsubishi Denki Kabushiki Kaisha Optical encoder

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS576996A (en) * 1980-06-17 1982-01-13 Tokyo Optical Absolute encoder
JPS61221616A (en) * 1984-09-29 1986-10-02 Satoru Toyooka Optical measuring method for fine displacement

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS576996A (en) * 1980-06-17 1982-01-13 Tokyo Optical Absolute encoder
JPS61221616A (en) * 1984-09-29 1986-10-02 Satoru Toyooka Optical measuring method for fine displacement

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005050141A1 (en) * 2003-11-20 2005-06-02 Mitsubishi Denki Kabushiki Kaisha Optical encoder
US7285769B2 (en) 2003-11-20 2007-10-23 Mitsubishi Denki Kabushiki Kaisha Optical encoder with reduced reflected light error having a light non-transparent portion with inclined surfaces
KR100867053B1 (en) * 2003-11-20 2008-11-04 미쓰비시덴키 가부시키가이샤 Optical encoder

Similar Documents

Publication Publication Date Title
JPS57104815A (en) Angle measuring apparatus employing line sensor
EP0638784A3 (en) Photo-electric length- or angle measuring device.
EP0372748A3 (en) Fingerprint-detecting device
JPS52479A (en) Optical scanning instrument
DE3777924D1 (en) DEVICE FOR EVALUATING TEST STRIPS.
JPS5391754A (en) Scannint type photo detector
EP0186802A3 (en) Optical measurement device
JPS6441819A (en) Position detecting apparatus
JPS5646433A (en) Measuring device of laser beam diameter
JPS57207808A (en) Printing area measuring method
ES2005965A6 (en) Surface inspection device
JPS5242747A (en) Device for measuring the abrasion wear of a trolley line
JPS5654309A (en) Device for measurement of pattern area from printed board for offset print
JPS5232324A (en) Photoelectric detecting device for in or out of focus in the optical s ystem
JPS649304A (en) Height measuring apparatus
EP0399562A3 (en) Pattern area ratio measuring apparatus
JPS6457105A (en) Optical mechanism for detecting displacement of displacement member in apparatus for inflammable gas
JPS57108614A (en) Angle measuring device by using line sensor
JPS53148314A (en) Control method of feeding solid state image sensor
JPS57136104A (en) Pitch detector
JPS5511606A (en) Photoelectric conversion device
JPS5570032A (en) Wafer scribing line detector
JPS57104807A (en) Edge detector for object
JPS6325533A (en) Measurement of quantity of light from lighted object
JPS53114456A (en) Sizing system of optical beam scanning type