Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N15/02—Investigating particle size or size distribution
  • G01N15/0205—Investigating particle size or size distribution by optical means
  • G01N15/0211—Investigating a scatter or diffraction pattern
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N15/10—Investigating individual particles
  • G01N15/14—Optical investigation techniques, e.g. flow cytometry
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N15/10—Investigating individual particles
  • G01N15/14—Optical investigation techniques, e.g. flow cytometry
  • G01N15/1434—Optical arrangements
  • G01N15/1436—Optical arrangements the optical arrangement forming an integrated apparatus with the sample container, e.g. a flow cell
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N15/10—Investigating individual particles
  • G01N15/14—Optical investigation techniques, e.g. flow cytometry
  • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
  • G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N21/47—Scattering, i.e. diffuse reflection
  • G01N21/4788—Diffraction
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N21/47—Scattering, i.e. diffuse reflection
  • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
  • G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N15/06—Investigating concentration of particle suspensions
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N2015/0042—Investigating dispersion of solids
  • G01N2015/0046—Investigating dispersion of solids in gas, e.g. smoke
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N15/10—Investigating individual particles
  • G01N15/14—Optical investigation techniques, e.g. flow cytometry
  • G01N2015/1486—Counting the particles
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N15/10—Investigating individual particles
  • G01N15/14—Optical investigation techniques, e.g. flow cytometry
  • G01N2015/1493—Particle size

Definitions

• the present invention relates to the field of optical detection of particles in general and more particularly of particles of micrometric or even nanometric size. It will find particularly advantageous but not limited to the detection of dust particles, smoke particles for detecting fires or the detection of polluting particles and especially so-called fine particles.
• Particle detectors are usually based on the diffraction of visible light, or near infrared, by particles. These detectors thus generally comprise optical sensors configured to measure the diffraction of light by the particles.
• the detectors comprise a light source and a channel through which the particles to be detected pass.
• optical sensors In the absence of particles, there is no diffraction, optical sensors do not measure light.
• light is diffracted by particles and optical sensors detect light diffracted in their solid detection angle. This measurement thus makes it possible to detect one or more particles.
• the intensity of the diffracted light and its angular pattern are characteristics of the nature, shape, size and concentration of the particles, the known solutions do not make it possible to measure all of these characteristics in such a way that faithful, at a reasonable cost and occupying a limited space.
• Document FR2963101 describes an existing solution. This solution provides a light source carried by a waveguide which illuminates a channel etched in a silicon substrate and through which particles will flow. The diffraction of the incident light by these particles is detected by two peripheral photodiodes produced on the silicon substrate.
• the present invention relates to a particle detector comprising at least:
• an optical device capable of being connected to at least one light source and configured to emit at least one light radiation generated by said light source
• a substrate extending in a main plane (x, y) and defining at least part of a channel intended to receive a fluid comprising particles, the channel extending mainly in a direction perpendicular (z) to the plane main (x, y), at least a portion of the substrate being configured to receive at least a portion of the light radiation emitted by the optical device.
• the detector further comprises a matrix of photodetectors and at least one reflecting surface, able to reflect the light radiation.
• the photodetector matrix and the reflecting surface are disposed on either side of said portion of the substrate.
• the detector is configured so that if particles are present in the channel, at least part of the light radiation emitted by the optical device passes through the channel being at least partially diffracted by at least one particle, then is reflected at least partly on the reflecting surface, and then reaches the less in part to the matrix of photodetectors.
• the association of the channel, the at least one reflecting surface and a matrix of photodetectors makes it possible to capture a greater number of light rays diffracted by the particles.
• the matrix of photodetectors can receive, on the one hand, the light rays diffracted by the particles and which after diffraction arrive directly on the matrix of photodetectors and, on the other hand, the rays that reach the photodetector matrix after reflection on the surface. reflective.
• the invention thus makes it possible to increase the diffraction pattern to which one has access.
• the combination of the reflecting surface, the matrix of photodetectors and the substrate carrying the channel makes it possible to approximate to a two-dimensional measurement a three-dimensional diffraction.
• the present invention thus makes it possible to project onto the same matrix of photodiodes a very large number of light beams diffracted in various directions in three dimensions.
• the geometry of the present invention allows projection of a vector space of three-dimensional propagation to a two-dimensional measurement space.
• the invention thus makes it possible to collect information in greater quantity and more precise concerning the particles.
• the detection of particles and the identification of their parameters, such as their size or their nature, is therefore improved.
• the present invention makes it possible to determine the refractive index of the particles.
• the photodetector array extends in a first plane and the reflective surface extends in a second plane, said first and second planes being parallel to the main plane (x, y) and located on either side of the plane. said portion of the substrate.
• the detector according to the invention is relatively simple to manufacture since all the layers (matrix of photodetectors and reflecting layers) can be formed in parallel planes.
• the detector according to the invention makes it possible to project, via the reflecting surface, the image of the diffraction pattern on the matrix of photodetectors, the latter possibly covering an extended surface whose size is little or not dependent. the shape and size of the channel.
• the invention thus makes it possible to collect reflected rays over a large area, while maintaining a limited space requirement, especially a limited length and channel width.
• the present invention also relates to a method for producing at least one particle detector according to the present invention, comprising at least the following steps:
• At least one first substrate comprising at least one photodetector array and a portion of at least one optical device configured to emit at least one light radiation, the first substrate extending in a main plane (x, y) and preferably, the array of photodetectors extending in a first plane parallel to said main plane (x, y);
• At least one second substrate comprising at least one reflecting layer capable of reflecting said at least one light radiation, the second substrate extending in part at least in the main plane (x, y) and, preferably, and the layer reflective film extending in a second plane parallel to said main plane (x, y); forming a third substrate by assembling the first substrate and the second substrate so that the photodetector array and the reflecting surface are disposed on either side of at least a portion of the substrate;
• forming at least one particle circulation channel extending mainly in a direction perpendicular (z) to said main plane (x, y) and passing through the third substrate so that, if particles are present in the channel, at least a portion of the light radiation emitted by the optical device passes through the channel while being at least partially diffracted by at least one particle, and then reflect at least partly on the reflecting surface, then then at least partially reaches the matrix of photodetectors.
• the method comprises the following steps:
• At least one additional reflective layer capable of reflecting said at least one light radiation on at least a portion of the second portion of the channel and preferably on at least one wall of said at least one channel.
• Figure 1a is a top view of a particle detector according to a first embodiment of the present invention.
• a projection of the diffraction pattern of light rays by particles is schematized.
• This figure represents a possible arrangement of a photodetector array with respect to a particle circulation channel and the distal portion of an optical device.
• Figure 1b shows a view according to section AA of Figure 1a.
• the optical path of light rays extracted from an extraction network is shown. This optical path encounters the flow of particles in the particle circulation channel thus forming diffracted light rays shown schematically in this figure.
• the reflections of the extracted light rays and light rays diffracted by an upper reflecting layer are also shown.
• FIG. 2a is a view from above, similar to the view of FIG. 1a, but according to a variant of the embodiment of FIG. 1a in which photodetectors are distributed over the whole of a substrate so as to cover a larger detection area.
• Figure 2b is a view according to section A-A of Figure 2a.
• Figure 2b in a manner identical to FIG. 1b, are diagrammatically the optical paths of light rays extracted from an extraction network situated at a distal portion of a waveguide, as well as those of light rays. diffracted and reflected.
• Figure 2c is a view according to section B-B of Figure 2a.
• Figure 2c in a manner identical to FIG. 2b, are diagrammatically the optical paths of light rays extracted from the extraction network, as well as those of diffracted and reflected light rays.
• Figure 3a is a detail view A of Figure 1a. This is a top view of an example of the extraction network and its dimensions.
• Figure 3b is a detail view B of Figure 1b. This is a sectional view of the extraction network, the section being taken at the distal portion of the waveguide.
• Figures 4a to 6d illustrate steps of making a detector according to the present invention. More precisely :
• FIGS. 4a to 4h illustrate, according to an embodiment and in a view according to section AA, the steps of forming the extraction network on a first substrate comprising a matrix of photodetectors and at least the distal portion of the waveguide intended to understand the extraction network.
• Figures 5a to 5d illustrate, according to the first embodiment and in a view according to section A-A, the main steps of forming a second substrate and the reflective layer.
• Figures 6a to 6d illustrate, according to the first embodiment and in a view according to section A-A, the assembly of the first and second substrates illustrated in Figures 4h and 5d and the formation of the particle circulation channel.
• FIGS. 7a and 7b illustrate, according to yet another embodiment, two views along section A-A intersecting the particle circulation channel.
• FIG. 7a shows an optical path that passes through the channel directly at the exit of the extraction network.
• FIG. 7b shows an optical path that passes through the channel directly at the exit of the extraction network after reflection on a reflecting surface.
• Figure 8a is a top view of an alternative embodiment of Figure 7a in which photodetectors are distributed across a substrate to cover a larger sensing area.
• Figures 8b and 8c are views according to section B-B of the detector according to Figure 8a. These figures 8b and 8c correspond to the views 7a and 7b applied to the embodiment of FIG. 8a.
• FIGS. 9a to 9f illustrate steps for producing the detector illustrated in FIGS. 8a to 8c.
• FIGS. 9a and 9b illustrate, according to one embodiment and in a view according to section AA, the steps of formation of the extraction network on a first substrate comprising a matrix of photodetectors and at least the distal portion of the waveguide as well as forming a first portion of the channel.
• FIGS. 9c to 9e illustrate, according to one embodiment and in a view according to section A-A, the steps of forming a second substrate and a second portion of the channel as well as the deposition of the upper reflecting layer.
• FIG. 9f illustrates, according to one embodiment and in a view according to section A-A, the assembly of the first and second substrates.
• Figures 10 and 11 illustrate two embodiments of the present invention in which the substrate comprises two particle circulation channels.
• a projection of light ray diffraction patterns by particles is schematized.
• These figures represent possible arrangements of a matrix of photodetectors with respect to the two particle circulation channels.
• the optical device comprises a waveguide separating into two arms.
• Fig. 11 is a top view of an alternative embodiment of Fig. 10 in which photodetectors are distributed over a whole substrate so as to cover a larger sensing area.
• Figures 12 and 13 illustrate an optical device according to two embodiments of the present invention.
• the optical device comprises a waveguide separating into two arms.
• the term “over”, “overcomes”, “overlaps” or “underlying” or their equivalents do not mean “in contact with”.
• the deposition of a first layer on a second layer does not necessarily mean that the two layers or substrates are in direct contact with one another, but that means that the first layer at least partially covers the second layer. layer by either being directly in contact with it or being separated from it by at least one other layer or at least one other element.
• a particle is a material element whose largest dimension is less than one millimeter (10 "3 meters) and preferably a few tens of micrometers (10 " 6 meters) and preferably less than one micrometer, or even of the order nanometer (10 "9 meters) In general, these are objects made of material whose dimensions are small relative to the dimensions of the particle circulation channel.
• the terms "light radiation”, “wave” or “radius” or their equivalents are defined as having an electromagnetic flux having a main lambda wavelength or an average lambda wavelength. around the main wavelength with a standard deviation preferably lower or of the order of 20% for example and propagating preferably in a single main direction or a mean direction around the main direction with a lower standard deviation or of the order of 10% for example. This direction of propagation is also called “optical path”.
• the terms “diffusion”, “diffraction” or their equivalents refer to the phenomenon by which a propagation medium produces a distribution, in many directions, the energy of an electromagnetic wave, light for example.
• the term "transparency" or its equivalents refers to the phenomenon of relatively propagate light radiation in a so-called transparent material.
• a material is considered as transparent since it allows at least 50% of light radiation to pass through, preferably at least 75% and advantageously at least 90%.
• the optical device is located at least partly between said first and second planes.
• the substrate has a first face turned facing or disposed in contact with the reflecting surface and a second face, opposite to the first face and facing facing or disposed in contact with the matrix of photodetectors.
• the matrix of photodetectors and the reflecting surface are located at least in part and preferably entirely in line with each other in said perpendicular direction (z).
• the particle detector according to the present invention is configured so that at least a portion of the light radiation is reflected by at least a portion of the reflecting surface before passing through the channel to be diffracted by at least one particle.
• a reflective surface located before the passage of the particle channel for example located opposite the output of the optical device such as a waveguide, allows the present invention to take advantage of the backscattered rays in addition to diffracted light rays, thereby increasing the number of measurements and therefore the wealth of information detected.
• At least a portion of the light radiation preferably at least 90% of the light radiation, preferably all the light radiation, remains confined in the substrate, that is to say between the first plane and the second plane.
• at least a portion of the light radiation, preferably at least 90% of the light radiation, preferably all the light radiation remains confined in the substrate, that is to say between the first face and the second face.
• the substrate is formed of at least one material passing through at least 50%, preferably at least 75% and preferably at least 90% of said light radiation, preferably the substrate comprises a transparent material relative to the light radiation.
• the optical device has a distal portion through which the light radiation is emitted, the distal portion and the photodetector array are located on either side of the channel relative to said perpendicular direction (z).
• the optical device and the matrix of photodetectors are arranged in the substrate.
• the optical device and the matrix of photodetectors are arranged outside the at least one channel.
• the optical device and the matrix of photodetectors are arranged in the substrate and outside the at least one channel, so as to be protected from direct contact with the fluid comprising particles.
• the invention makes it possible to prolong the performance of the detector over time.
• the invention makes it possible to limit the maintenance operations to be performed on the detector.
• the matrix of photodetectors extends around, preferably all around, the channel.
• the matrix extends over 360 ° around the channel.
• the positioning of photodetectors under the waveguide also makes it possible to have blind photodetectors making it possible to virtually determine the relative position of the other photodetectors and thus to know virtually the geometry of the detector. Moreover, this allows facilitate the positioning of the optical device by reducing positioning constraints.
• the matrix of photodetectors extends around the channel covering an arc of at least 180 ° and preferably 250 ° and preferably 300 °.
• At least a portion of the reflecting surface is carried by at least a portion of the wall of the channel.
• the substrate comprises at least a first substrate and a second substrate, the first substrate carrying the photodetector matrix and preferably at least a portion of the optical device and the second substrate carrying at least the reflecting surface, preferably the first substrate being configured to provide a diffracted light radiation detection function and the second substrate configured to provide at least partially a reflection function of the light radiation diffracted towards the photodetector array.
• the substrate comprises at least a first substrate and a second substrate, the first substrate carrying at least a first portion of the channel and the second substrate carrying at least a second portion of the channel, each portion extending in said perpendicular direction (z ), the average surface of the section of the first portion is substantially equal to or less than the average surface of the section of the second portion, the average surface of the section of a portion corresponding to the average of the surfaces taken on the whole the height along the z axis.
• the average thickness of the first portion is substantially equal to or less than the average thickness of the second portion, the thicknesses being measured along said perpendicular direction (z).
• the substrate is a monolayer substrate.
• the substrate is a multilayer substrate.
• the optical device is formed in said substrate.
• the reflective surface covers the entire substrate.
• the photodetector matrix and the reflecting surface are shifted in the perpendicular direction (z).
• the light radiation is a monochromatic radiation.
• the optical device comprises at least one waveguide, carried by the substrate, configured to guide the light radiation towards the channel.
• the optical device comprises at least one distal portion shaped to form, at the output of the optical device, an extraction network configured to generate a set of extracted light rays, preferably parallel to one another, at the output of the optical device, the extraction network has a shape that flares in the main plane (x, y) towards the channel.
• the extraction network comprises a plurality of elliptical grooves, each groove being an extraction groove of at least a portion of the light radiation.
• the extraction network comprises at least a plurality of elliptical grooves and the plurality of grooves form an alternation of trenches and projections.
• the thickness of the etching determines the morphology of the extraction grooves and, by the same, the dimensions of the extracted beam.
• the extracted beam is wide, and little divergent, so composed of extracted light rays having substantially the same vertical deviation corresponding to the angle a.
• the extracted beam is narrow spatially, so divergent, thus composed of extracted light rays having vertical deviations varying around the value of the angle a.
• This elliptical appearance makes it possible to follow the profile of the wavefront of the light radiation during its propagation in said distal portion.
• the optical device comprises at least one waveguide comprising a heart having a distal portion and a sheath encapsulating the heart, the heart having, at the level of the distal portion, a plurality of grooves of smaller thickness than the rest of the the distal portion arranged periodically in a pitch P such that P satisfies the following expression:
• n eff the effective refractive index of the fundamental mode of light radiation
• n c the refractive index of the waveguide core
• n g the refractive index of the sheath of the waveguide
• n eff being between n c and n g.
• the light radiation propagating in the waveguide forms an angle ⁇ with the main plane (x, y), with 0 ° ⁇ a ⁇ 90 °, preferably 10 ° ⁇ a ⁇ 45 ° and preferably 20 ⁇ ⁇ ⁇ 40 ⁇ and preferably 20 ⁇ ⁇ 30 ⁇ and preferably about 25 °.
• the optical device comprises at least one waveguide, the waveguide being monomode.
• the optical device comprises at least one waveguide comprising a core and a sheath, the thickness h of the waveguide measured along said perpendicular direction (z) is such that:
• ⁇ the wavelength of the light radiation
• n c the refractive index of the waveguide core
• n g the refractive index of the sheath of the waveguide.
• the present invention comprises at least a first particle circulation channel and at least a second particle circulation channel.
• the present invention comprises at least a first channel and a second particle circulation channel, each channel being intended to receive the fluid comprising particles and being configured to receive at least a portion of the light radiation emitted by the optical device.
• the present invention is configured so that the light radiation received by each channel comes from a single optical device and preferably from a single light source.
• the photodetector matrix and the reflecting surface are disposed on either side of said portion of the substrate so that at least a portion of the light radiation emitted by the optical device passes through each of the channels or at least one of the channels. by being diffracted by at least one particle, then reflected on the reflecting surface, and then arrives at the photodetector array.
• This embodiment allows good detection even if one of the channels is out of use, for example if it is clogged, typically with dust or large particles such as insects. This embodiment thus makes it possible to improve the reliability of the detection.
• the optical device comprises at least one waveguide comprising at least one junction configured to form at least a first arm of the waveguide and at least one second arm of the waveguide.
• the detector is configured so that:
• At least a part of the light radiation emitted by the optical device through the first arm of the waveguide passes through the first channel while being diffracted by at least one particle, then is reflected on the reflecting surface and then reaches the matrix photodetectors; at least a portion of the light radiation emitted by the optical device through the second arm of the waveguide passes through the second channel while being diffracted by at least one particle, then is reflected on the reflecting surface and then reaches the matrix photodetectors.
• the present invention finds the preferred field of application the detection of particles of various sizes, preferably in the field of microscopic or even nanoscale particles.
• the present invention can be used for the detection of particles from fumes, dust particles, pollutant particles or particles derived from allergens such as pollens, mold spores or carcinogenic particles, or biological particles such as bacteria, viruses, or exosomes.
• the present invention applies to all types of particles carried by a fluid, whether it is liquid and / or gaseous.
• FIG. 1a is a view from above of a substrate 100 comprising a reflecting surface 41, a distal portion 10 of an optical device 15, a channel 50 for circulating the particles 60 and a matrix 20 of photodetectors 21.
• Figure 1b shows a view of the substrate 100 according to section A-A shown in Figure 1a.
• the reflecting layer 41 is preferably arranged in line with the matrix 20 of photodetectors 21.
• the channel 50 for circulating the particles 60 is disposed between the distal portion 10 of the optical device 15 and at least a portion of the matrix 20 of photodetectors 21.
• the relative arrangement of the reflective layer 41, the photodetector matrix 20 and the distal portion 10 of the optical device 15 is configured so that, when particles 60 are present in the channel 50, the light rays extracted 1 since the optical device 15 passes through the channel 50 by being at least partially diffracted by at least one particle 60 so as to produce diffracted light rays 12.
• the extracted and diffracted light rays 12 are then at least partially reflected on the reflective layer 41 so as to produce reflected light radiation rays 13 and reflected diffracted light rays 14 reaching the matrix 20 of photodetectors 21.
• the substrate 100 comprises at least a first substrate 30 and at least a second substrate 40.
• the first substrate 30 and the second substrate 40 are secured, for example by molecular bonding, so as to form the substrate 100.
• the substrate 100 can thus be described as an assembly substrate or of "third substrate” obtained by assembling the first 30 and second 40 substrates.
• the matrix 20 of photodetectors 21 is carried by the first substrate 30.
• the matrix 20 of photodetectors 21 is advantageously protected from direct contact with the fluid comprising particles 60, so as to limit its fouling by said particles.
• the matrix 20 of photodetectors 21 is in particular situated outside the channel 50.
• the matrix 20 of photodetectors 21 may be arranged in or encapsulated by the substrate 100. This makes it possible to prolong the performance of the matrix 20 over time. photodetectors 21 and thus the detector. Moreover, the maintenance operations to be performed on this detector are reduced compared to the detectors in which the photodetectors are potentially in contact with a fluid comprising particles.
• the invention therefore also limits the maintenance operations to be performed.
• the first substrate 30 carries at least part of the optical device 15.
• the latter comprises at least one waveguide having a distal portion 10.
• the waveguide advantageously comprises a core and a sheath.
• the heart of the waveguide comprises at least one nitride-based material.
• the sheath of the waveguide preferably comprises less a silica-based material, this material preferably forming the base material of the substrate 30.
• This waveguide is configured to bring closer to the channel 50 the light radiation emitted by the optical device 15.
• the distal portion 10 of the waveguide, and preferably the optical device 15, are protected from direct contact with the fluid comprising particles 60, so as to limit their fouling by said particles.
• the distal portion 10 and / or at least a portion of the device 15 comprising the distal portion 10 are located outside the channel 50. According to an advantageous embodiment, they may be arranged in or encapsulated by the substrate 100.
• This waveguide is advantageously located in the main plane (x, y) in which the substrate 100 extends, the x, y, z mark being represented in FIGS. 1a and 1b.
• the waveguide is preferably located between a first plane at which the matrix 20 of photodetectors 21 is disposed, this first plane preferably being parallel to the (x, y) plane, and a second plane at which the reflecting surface 41, this second plane being parallel to the foreground.
• the first plane contains the matrix 20 of photodetectors 21.
• the second plane contains the at least one reflecting surface 41.
• the channel 50 for circulating the particles 60 has a main direction of circulation extending in the direction z perpendicular to the main plane (x, y).
• This circulation channel 50 extends from an inlet port 51 to an outlet port 52.
• the channel 50 for circulating the particles 60 is positioned between the distal portion 10 of the waveguide and the matrix 20 of photodetectors 21. In this position, the matrix 20 of photodetectors 21 receives most of the diffracted light rays 12 and 14.
• the matrix 20 of photodetectors 21 may also be arranged around the distal portion 10 of the waveguide so as to also receive the backscattered rays, not shown in FIG. 1b, that is, - say diffracted in a direction substantially opposite to the main direction of extraction of light rays extracted 1 1.
• the particles 60 of large size, relative to the wavelength of the light rays extracted 1 1, can backscatter the extracted light rays 1 1, that is to say produce light rays diffracted in the opposite direction of the propagation of incident rays.
• the matrix 20 of photodetectors 21 can be positioned all around the channel 50 for circulating the particles 60 as illustrated through FIGS. 2a and 2b and this so as to extend the zone of detection of the diffracted light rays 12 and 14 and backscattered rays. This makes it possible to have a larger detection area and to measure the diffraction pattern 70 as a whole.
• FIG. 2b illustrates, according to the section BB of FIG. 2a, the diffracted light rays 12 propagating in multiple directions all around the main direction (z) of extension of the channel 50.
• the optical device 15 is able to be connected to at least one light source.
• this light source may be a light emitting diode or a laser diode.
• the present particle detector may be designed to use the light source of a portable device such as lighting, preferably monochromatic, of a smartphone-type mobile phone for example, in order to have a portable particle detector module.
• a portable device such as lighting, preferably monochromatic, of a smartphone-type mobile phone for example.
• This application allows for example to perform analyzes of air quality.
• the optical device 15 comprises at least one light source of light radiation and a waveguide comprising a distal portion 10 configured to generate light rays January 1 from the waveguide.
• the waveguide is configured to allow propagation of the light radiation from the optical device 15 to the level of the channel 50 for circulating the particles 60.
• the distal portion 10 comprises a lateral extension extending in the main plane (x, y) and widening towards the channel 50.
• the maximum dimension of this lateral extension, taken along the y axis, is less than or substantially equal to the maximum dimension of the channel 50 taken according to this same direction.
• the width D of the distal portion 10 is less than or equal to the diameter of the channel 50.
• this distal portion 10 comprises an extraction network 10a of light rays.
• This extraction network 10a may have a series of peaks and valleys at a certain periodicity P, as will be described in detail later.
• the light radiation propagating in the waveguide is extracted from the extraction network 10a by taking a main extraction direction forming an angle ⁇ with the main plane (x, y). This angle a is illustrated in FIG.
• the angle a may be greater than or equal to 45 °, preferably 75 ° and preferably 85 °.
• the extraction angle ⁇ is such that the extracted light rays 1 1 exit through the outlet orifice 52 of the channel 50.
• the matrix 20 of photodiodes 21 detects only the diffracted light rays 12 and 14 by the particles 60, it does not detect the undiffracted light rays emitted by the optical device 15.
• the value of the angle a allows the detection of non-diffracted light rays emitted by the optical device 15
• this then makes it possible to follow the drift of the power of the light source over time, corresponding to the aging of this source bright, or the fouling of the channel in time.
• the analysis of this drift can then make it possible to make no mistake about the ratio between the amount of diffracted light and the quantity of light emitted by the light source. This ratio is indeed a quantity often useful to go back to certain parameters of the particles as their nature or their concentration.
• the undiffracted light rays emitted by the optical device 15 may act as a source of stray light relatively detection by the matrix 20 of photodiodes 21 of the diffracted light rays 12 and 14.
• the extracted light rays 1 1 are diffracted by the particles 60. At least a portion of the diffracted light rays 12 is reflected on the reflective layer 41, preferably metal, at least partially facing the matrix 20 of photodetectors 21, the diffraction pattern 70 is thus substantially projected in its entirety on the matrix 20 of photodetectors 21.
• the matrix 20 receives part of the diffraction pattern 70 directly from the particles and on the other hand it receives a complementary part of the diffraction pattern 70 after reflection of the diffracted light rays 12 on the reflecting layer 41.
• the present invention may be adapted according to the type of particles to be detected, whether from a materials, geometry or light radiation point of view itself.
• the present invention makes it possible to adapt the light radiation to various fields of application.
• the radiation comprises a wavelength adapted to the detection needs, for example less than the main dimension of the particles to be measured.
• the first substrate 30 has a main detection function and the second substrate 40 has a main function of transparency and mirror.
• the first substrate 30 comprises silicon and the second substrate 40 comprises, according to one embodiment, at least one transparent material relative to the light radiation so as to allow the light radiation, the extracted light rays 1 1 and 13 and the diffracted light rays 12 and 14 to pass through it.
• the second substrate 40 may comprise silicon oxide, that is to say for example be made of glass.
• the reflecting layer 41 is disposed on the upper surface of the second substrate 40 opposite to the lower surface of the second substrate 40 facing or in contact with the first substrate 30.
• the reflected diffracted light rays 14 pass through the second substrate 40 before reaching the photodetectors 21.
• the refractive index of the second substrate 40 is configured to be close to that of air. In this situation, there are very few reflections at the interfaces between the inside of the channel 50 and the second substrate 40, that is to say at the level of the walls of the channel 50.
• an antireflection layer may be deposited on the walls of the channel after forming thereof in order to reduce or even avoid reflections at the interfaces between the inside of the channel 50 and the second substrate 40.
• mirror a reflective layer 41 called "mirror" on the upper face of the second substrate 40 makes it possible to project the image of the diffraction pattern 70 onto the matrix 20 of photodetectors 21 located at the surface of the first substrate 30.
• FIGS. 3a and 3b illustrate a possible geometry of the distal portion 10 of the waveguide comprising the extraction network 10a.
• the waveguide includes a second end opposite the first end.
• This second end has a dimension w, taken along the y axis.
• w is less than D.
• the distal portion 10 of the waveguide has an extension length L taken in the direction x and substantially corresponding to the length of the extraction network.
• the distal portion 10 of the waveguide to have a very large divergence in the main plane (x, y).
• the enlargement coefficient of the distal portion 10 is then important.
• This configuration thus makes it possible for a very short distance, the extracted light rays 1 1 together have a spatial extension substantially equal to D and preferably substantially equal to the diameter of the channel 50.
• This configuration thus increases the compactness of the present invention.
• Those skilled in the art, with the known electromagnetic tools will be able to size L, w and the extraction network 10a, as a function of D, in order to obtain this effect of compactness.
• the waveguide in order to be able to control the main direction of extraction of light rays extracted 1 1 by the extraction network 10a, the waveguide is preferably designed so that it is monomode relative to the radiation luminous.
• the thickness h of the waveguide, taken along the z direction, is therefore relatively small in comparison with the wavelength ⁇ of the light radiation.
• the thickness h of the waveguide is such that:
• FIG. 3b is a detail view B of Figure 1b.
• the extraction network 10a comprises a series of valleys and ridges whose periodicity is noted P.
• This extraction network 10a is produced by partial or total etching of the distal portion 10 of the waveguide.
• a lower reflecting layer 31 may be disposed below at least the distal portion 10 of the waveguide.
• This optical distance advantageously corresponds to a distance, called "physical", greater than ⁇ / (4 ⁇ ), where n is the refractive index of the material located between the waveguide and the lower reflective layer 31.
• This minimum distance ensures that the reflective layer does not disturb too much the radius in the guide and it serves to return the light extracted upwards. This condition on this thickness makes it possible to increase the flow of radiation towards the channel 50.
• the present invention has demonstrated that when the wavelength of the light radiation used is less than 600 nm, the aluminum has a better reflectivity than copper, for example.
• FIGS. 4 to 6 an exemplary method for producing at least one particle detector according to the first embodiment presented above.
• This method comprises, in a simplified manner, the following steps:
• the realization of the waveguide on the first substrate 30 comprising beforehand the matrix 20 of photodetectors 21;
• a reflecting layer 41 on the second substrate 40 preferably made of glass
• the second substrate 40 is then bonded to the first substrate 30 so that the matrix 20 of photodetectors 21 and the reflecting surface 41 are arranged at a distance from one another and on either side of a portion of the substrate 40;
• the channel 50 of particle circulation 60 is formed through the first and second substrates 30 and 40.
• This formation of the channel 50 may for example be performed by etching, dry or wet.
• Figures 4a to 4h show an embodiment of the first substrate 30 according to the present invention.
• the first substrate 30 comprises a matrix 20 of photodetectors 21.
• the first substrate 30 is made of silicon.
• the photodetector matrix 20 comprises an antireflection layer, not shown, disposed at the level of the surface of the photodetectors 21 configured to limit the reflection of the rays arriving at the photodetector matrix 21.
• FIG. 4b illustrates the optional deposition of a lower reflective layer 31, able to reflect the light radiation emitted by the optical device.
• this lower reflective layer 31 comprises at least one metal such as aluminum or copper.
• FIG. 4c shows the etching of a portion of the lower reflective layer 31 so as to discover at least a portion of the matrix 20 of photodetectors 21.
• This engraving can be wet or dry. It can be preceded by conventional lithography steps to select the area to be engraved.
• a first silicon oxide layer 32 is deposited on the surface of the first substrate 30 so as not to cover, after planarization by CMP (Chemical Mechanical Planarization) for example, that the portion of the surface of the first substrate 30 not being covered by the lower reflective layer 31, as shown in Figure 4d.
• CMP Chemical Mechanical Planarization
• these previous steps may be replaced by a damascene based on copper and silica, for example.
• FIG. 4e shows the deposition of a buffer layer 33, of silica for example, over the entire surface of the first substrate 30 so as to form a buffer layer 33 whose optical thickness is at least a quarter of the wavelength of the light radiation.
• This optical thickness advantageously corresponds to a so-called "physical" thickness, at least equal to ⁇ / (4 ⁇ ), where n is the refractive index of the buffer layer 33.
• This buffer layer 33 provides the previously described function of constraining the extracted light rays 1 1 to propagate in a direction away from the surface of the first substrate 30.
• a guide layer 34 is deposited on the whole of the buffer layer 33 so as to form, after etching, the waveguide comprising the distal portion 10.
• this guide layer 34 comprises a nitride-based material.
• Figures 4f and 4e show the structuring steps of the guiding layer 34 by partial or total etching, so as to form the extraction network 10a at the distal portion 10 of the waveguide.
• FIG. 4h then illustrates the deposition of a second oxide layer 35, for example silica, covering the entire surface of the first substrate 30.
• a second oxide layer 35 for example silica
• a planarization step by mechanical-chemical polishing can for example be performed in order to smooth the surface of the first substrate 30 thus formed by the previous steps.
• the second substrate 40 is prepared.
• the second substrate 40 preferably transparent to the light radiation considered, is covered on one of these main surfaces, said upper surface, by a reflective layer 41, preferably based on metal, like aluminum or copper for example.
• a portion of the reflective layer 41 is removed by lithography and etching so as to expose a portion of the upper surface of the second substrate 40.
• This etching is configured to form an opening 42 for the future embodiment of the channel 50 for circulating particles 60.
• the substrate 100 is formed by assembling the first 30 and second 40 substrates.
• This assembly may comprise bonding the first and second substrates so that the surface comprising the photodetector array 21 and the waveguide of the first substrate 30 is brought into contact with the bottom surface of the opposing second substrate 40. at the upper surface comprising the reflecting layer 41.
• the upper reflecting layer 41 is, in the z direction, facing the matrix 20 of photodetectors 21 and the waveguide through the second substrate 40.
• a step of forming the channel 50 for circulating the particles 60 is carried out through the substrate 100, that is to say through the first 30 and second substrates 40 and passing substantially between the matrix 20 photodetectors 21 and the extraction network.
• This formation of the channel 50 can be achieved by a few conventional lithography steps, and one or more engravings.
• this etching may be an etching based on a chemistry comprising potassium hydroxide (KOH) or tetramethylammonium hydroxide (TMAH) and based on a chemistry comprising acid hydrofluoric (HF) for etching the second substrate 40 if it is glass for example.
• KOH potassium hydroxide
• TMAH tetramethylammonium hydroxide
• HF acid hydrofluoric
• the first substrate 30 can be etched using a KOH or TMAH-based chemistry if it is silicon for example and having previously deposited a resin 36 in which an opening 37 is made, the opening 37 then being at the location of the future inlet 51 of the channel 50. This etching of the first substrate 30 thus allows the formation of a first portion 50a of channel 50.
• the second substrate 40 may be etched to it using HF-based chemistry through, for example, aperture 42 previously made. This etching of the second substrate 40 thus allows the formation of a second portion 50b of the channel 50.
• the etching based on KOH or TMAH causes only a very low residual roughness since it is carried out according to the crystalline planes of silicon.
• HF etching generally generates a very low roughness, of the order of about ten nanometers only.
• a subsequent step of depositing a silica layer on the etched surface of the second substrate 40 is possible in order to smooth the surface of the channel 50 for circulating the particles 60.
• a very low roughness at the surface of the channel 50 makes it possible to minimize or even avoid the presence of light rays diffracted by the walls of the channel 50 during the passage of the light rays from or to the channel 50.
• This roughness if it is too great, can induce a diffraction parasite, called background diffraction, measured by the photodetectors 21 even in the absence of particles 60 in the channel 50.
• a treatment of the measured signals can reduce this nuisance, nevertheless the precise choice of the engravings described here ensures a very low roughness reducing the problems of diffraction parasite by the channel 50 itself. The accuracy of the detection is thus improved.
• the channel 50 for circulating the particles 60 then crosses the substrate 100 from one end to the other, allowing a stream of particles 60 conveyed by a fluid to flow therethrough.
• the first and second portions 50a and 50b serving to form the channel 50 can be formed before the step of assembling the substrate 100.
• a dry etching may be used, for example based on ions, for the partial or total formation of the channel 50.
• the photodetectors are generally in direct contact with the particles, this can cause the formation of a deposit on their surface which reduces their sensitivity or blind.
• the photodetectors 21 are protected by the presence of the second transparent substrate 40 directly located at their contact.
• the photodetectors 21 are protected while receiving a greater amount of light information via the reflection phenomenon allowing a better measurement of the diffraction pattern 70 of the particles 60 and therefore their size and nature, for example.
• the present invention comprises a second embodiment, fully compatible with the first described above.
• FIGS. 7a and 7b This second embodiment, illustrated by FIGS. 7a and 7b, is based on the use of a first substrate 30 identical to that of the first preceding embodiment and a second substrate 40 which can be substantially opaque to light radiation. According to the present embodiment, the transparency of the second substrate 40 relative to the light radiation is not necessary.
• FIGS. 7a and 7b illustrate the substrate 100 resulting from the assembly of the first substrate 30 with the second substrate 40.
• the channel 50 passes through the first and second substrates 30 and 40.
• the second substrate 40 is configured so that the second portion 50b of the channel 50, the one passing through the second substrate 40, presents a diameter greater than the diameter of the first portion 50a of the channel 50, that passing through the first substrate 30.
• the second portion 50b of the channel 50 comprises a diameter which decreases as the channel 50 is directed, along the z axis, towards the outlet orifice 52. This diameter narrowing makes it possible to form inclined walls 41 relative to the main plane (x, y).
• These walls 41 are advantageously covered with a reflective layer
• FIGS. 7a and 7b thus illustrate the optical path of extracted light rays 1 1 and diffracted 12 from the extraction network 10a towards the matrix 20 of photodetectors 21.
• the extracted light rays 1 1 from the extraction network 10a and the diffracted light rays 12 are reflected on the walls 41a of the second portion 50b of the channel 50, allowing their measurement by the photodetectors 21.
• the walls 41a are inclined, it is possible to cause the reflected light rays reflected 13 and the reflected diffracted light rays 14 to have an angle of incidence that is almost normal to the surface of the photodetector matrix 21.
• This geometry has the advantage of not deforming the diffracted light front by projection on the matrix 20 of photodetectors 21, that is to say the diffraction pattern 70 of the particles 60.
• the digital processing of the diagram diffraction 70 measured is simplified, because the geometric corrections to be made are weak or nonexistent.
• the wall 41a of this second portion 50b of the channel 50, passing through the second substrate 40 has a cylindrical or parallelepipedal shape.
• the wall 41a may have a vertically extruded shape.
• the wall 41a may have a pyramid shape.
• the wall 41a will have a pyramid shape for presenting inclinations around the z axis to allow the reflection of incident light rays while maintaining a flat surface at the wall 41a so that not distort the forehead of light.
• wet etching is an advantageous embodiment.
• the matrix 20 of photodetectors 21 can be positioned all around the channel 50 for circulating the particles 60 as illustrated through FIGS. 8a and 8b and this so as to extend the detection zone to the diffracted light rays 12 and 14 and backscattered rays. In a manner identical to the embodiment illustrated in FIGS. 2a and 2b, this makes it possible to have a larger detection area and to measure the diffraction pattern 70 as a whole.
• FIG. 8b illustrates, according to section B-B of FIG. 8a, the diffracted light rays 12 propagating in multiple directions all around the main direction (z) of extension of the channel 50.
• the angle that the walls 41 of the channel 50 form with the surface of the second substrate 40 parallel to the main plane (x, y) can be perfectly controlled during manufacture. Indeed, in the case of wet etching of a crystalline material for example, the etching planes are predictable and therefore this angle can be easily known and controlled.
• a wet etching based on KOH causes the formation of walls 41a whose angle ⁇ with respect to the principal plane (x, y) is substantially equal to 54.7 ° .
• ⁇ is illustrated in FIGS. 8b and 8c.
• the angle of incidence of the light rays extracted 1 1 on the reflective layer 41 deposited on the walls 41a is also perfectly known and controlled since it depends on the configuration of the extraction network 10a.
• the angle of incidence on the matrix 20 of photodetectors 21 is also well known by simple geometrical construction.
• the angle of incidence of the reflected reflected rays 13 and reflected diffracted light rays 14 may be close to the normal (z) relative to the plane main (x, y), that is to say relative to the plane of the matrix 20 of photodetectors 21.
• FIGS. 4e to 4h and 9a to 9f we will now describe the method of producing at least one particle detector 60 according to this second embodiment illustrated in FIGS. 7a to 8c.
• the steps described in FIGS. 4a to 4h above are identical for this second embodiment and allow the formation and structuring of the first substrate 30.
• an orifice is formed so as to form the first portion 50a of the channel 50, ie that passing through the first substrate 30.
• This formation may comprise an etching of the first substrate 30. This etching is preferably carried out between the distal portion 10 of the waveguide and the matrix 20 of photodetectors 21.
• FIGS. 9c to 9e show the formation and structuring of the second substrate 40 through the formation of a second portion 50b of the channel 50 for circulating the particles 60 through the second substrate 40.
• This second portion 50b is advantageously produced by etching , and preferably by wet etching. Indeed the wet etching makes it possible to have inclined surfaces whose advantages are indicated above.
• the substrate 100 is formed by assembling the second substrate 40 with the first substrate 30 so as to form a channel 50 of particle circulation 60 defined by the meeting of the first and second portions 50a and 50b of the channel 50. As previously this assembly can be achieved by a molecular bonding.
• This second embodiment in addition to having many advantages in common with the first embodiment, reduces to a minimum the roughness of the channel 50 by the clever use of a wet etching operated on a crystalline material.
• the almost total lack of roughness of the channel 50 is indeed possible by the wet etching of the silicon by a KOH-based chemistry, this etching being without roughness since carried out along the crystalline planes of the silicon.
• this second embodiment makes it possible to obtain a direction of propagation of the extracted reflected rays 13 and of the diffracted light rays 14 that are almost normal, that is to say substantially along the axis (z), on the surface.
• This situation has the advantage of giving a direct image of the diffraction pattern 70 of the particles 60, without deformation due to projections which must otherwise be corrected electronically and / or electronically by processing the signals measured by the matrix 20 of photodetectors 21.
• extracted light rays 1 1 can be backscattered .
• the extraction angle a is such that the extracted light rays 1 1 have a main direction of extraction substantially parallel to the z direction and are moving towards the outlet port 52 of the channel 50, that is to say with an angle substantially equal to 90 °.
• the matrix 20 of photodetectors 21 detects only the diffracted light rays 12 and 14 and backscattered by the particles 60.
• the channel 50 may be blocked over time by very large particles, for example dust, or insects. It is also possible that the production method generates defects in the channel, leading to its total or partial obstruction.
• FIGS. 10 and 11 advantageously combine with the preceding embodiments.
• FIGS. 10 and 11 illustrate a substrate 100 comprising a first 50c and a second 50d particle circulation channel 60.
• the unobstructed channel allows the present invention to continue to operate.
• a single light source 1 in the form of a light emitting diode for example has been shown.
• This light source 1 is configured to emit light radiation.
• the optical device 15 is advantageously configured to understand this light source 1 or to be able to connect to it.
• the optical device 15 and the light source 1 cooperate so that this light radiation is guided in the waveguide 2.
• the waveguide 2 may have one or more junctions 3 so as to form a plurality of arms 4b and 4c.
• FIGS. 10 and 11 illustrate the case of a single junction 3 allowing the formation of a first arm 4b of the waveguide 2 and of a second arm 4c of the waveguide 2.
• each of these distal portions 10b, 10c forms or carries an extraction network as for the previously described embodiments.
• the first channel 50c, the photodetector matrix 20 and the distal portion 10b of the first waveguide arm 2b are arranged so that at least a portion of the light radiation emitted at the distal portion 10b of the first waveguide arm 4b 2 crosses the first channel 50c by being diffracted by at least one particle 60, then is reflected on the reflecting surface 41, then reaches the matrix 20 of photodetectors 21.
• the second channel 50d, the photodetector matrix 20 and the distal portion 10c of the second waveguide arm 2c are arranged such that at least a portion of the light radiation emitted at the level of the portion distal 10c of the second waveguide arm 2c crosses the second channel 50d by being diffracted by at least one particle 60, then is reflected on the reflecting surface 41, then arrives at the photodetector matrix 21.
• a single photodetector matrix 20 receives the light radiation that has passed through all the channels 50c, 50d.
• This matrix 20 is preferably continuous. In Figure 1 1, the matrix 20 extends around the channels 50c, 50d.
• Figures 12 and 13 describe two embodiments of the waveguide 2 of the optical device 15 and particularly two embodiments of the junction 3 so as to form the first arm 4b and the second arm 4c.
• FIG. 12 represents the formation of the first arm 4b and the second arm 4c by a simple separating junction 3 at the level of the waveguide 2.
• FIG. 13 presents an advantageous embodiment in which the junction
• an interferometer 4a preferably multimode, thereby providing this optical device 15 with greater robustness to technological inaccuracies.
• the distance, in the direction perpendicular (z) to the main plane (x, y) in which the substrate 100 extends, between the matrix 20 of photodetectors 21 and the reflecting surface 41 is between 10 ⁇ and 10mm, preferably between ⁇ ⁇ 1 mm and advantageously between 500 ⁇ and 1 mm.
• the length of the circulation channel 50 of the particles 60 is between ⁇ ⁇ and 10mm, preferably between 100 ⁇ and 5mm and advantageously between 500 ⁇ and 2mm.
• the diameter of the first portion 50a of the channel 50 of circulation of the particles 60 in the direction y is between 10 ⁇ and 10mm, preferably between ⁇ ⁇ and 5mm and advantageously between 500 ⁇ and 2mm.
• the channel 50 extends in a main direction (z) of circulation of said particles 60 and the light radiation, at the output of the optical device 15, has a main direction of propagation forming with the main flow direction of the particles 60 an angle included between 0 and 90 °, preferably between 10 ° and 75 ° and advantageously between 10 ° and 45 °.
• the waveguide may or may not be at the same vertical level as the photodetector array.
• the waveguide is located at a raised level relative to the photodetector array.
• the light radiation comprises a wavelength of between 400 nm and 2 ⁇ m, preferably between 500 nm and 1.6 ⁇ m and advantageously between 600 nm and 1 ⁇ m.
• the diffraction of the light rays extracted is all the more important that the wavelength of the light radiation is small to given particle size.
• the diameter w of the waveguide is between 100 nm and ⁇ ⁇ , preferably between 200 nm and 800 nm and advantageously between 300 nm and 600 nm.
• the thickness h of the waveguide is between 100 nm and ⁇ ⁇ , preferably between 200 nm and 800 nm and advantageously between 300 nm and 600 nm.
• the extension length L of the distal portion 10 of the waveguide is between 10 ⁇ and 10mm, preferably between 100 ⁇ and 5mm and advantageously between 1 mm and 3mm.
• the dimension D of the distal portion 10 of the waveguide is between 10 ⁇ and 10mm, preferably between 100 ⁇ and 5mm and advantageously between 1 mm and 3mm.
• the lower reflective layer 31 has a thickness of between 10 nm and ⁇ ⁇ ⁇ m, preferably between 50 nm and 1 ⁇ m and advantageously between 100 nm and 300 nm.
• the first oxide layer 32 has a thickness of between 10 nm and ⁇ ⁇ , preferably between 50 nm and 1 ⁇ m and advantageously between 100 nm and 300 nm.
• the buffer layer 33 has a thickness that can be between 10 nm and ⁇ ⁇ ⁇ m, preferably between 50 nm and 5 ⁇ m and advantageously between 100 nm and 1 ⁇ m.
• the guiding layer 34 has a thickness between 100 nm and ⁇ ⁇ , preferably between 200 nm and 800 nm and advantageously between 300 nm and 600 nm.
• the second oxide layer 35 has a thickness of between 0.1 nm and ⁇ ⁇ , preferably between 1 nm and 1 ⁇ and advantageously between 10 nm and 500 nm.
• the reflecting layer 41 has a thickness between 10 nm and ⁇ ⁇ ⁇ m, preferably between 50 nm and 1 ⁇ m and advantageously between 100 nm and 300 nm.
• the walls 41a of the second portion 50b of the channel 50 have an angle with the perpendicular direction (z) between 5 ° and 75 °, preferably between 10 ° and 65 ° and preferably between 15 ° and 55 °.
• the first substrate comprises at least one material selected from: silicon, III-V materials, for example GaN, InP for integrating the light source into the substrate itself.
• the second substrate comprises at least one material selected from: glass, silicon.
• the optical device 15 comprises a core and a sheath, the core comprising at least one material selected from: silicon nitride (SiN), titanium dioxide ( ⁇ 02) and the sheath comprising at least one material selected from: silica, MgF 2, Al 2 O 3.
• the reflecting surface 41 comprises at least one material selected from: aluminum, copper, silver, gold.
• the implementation of the present invention may include the use of various mathematical and computer tools to extract from the photodetector measurements, intrinsic parameters of the particles such as their size for example.
• a "fluid” is understood as a body whose constituents, particles for example, have little adhesion and can slide freely on each other, in the case of liquids, or move independently from each other, in the case of a gas.
• air is a fluid, as well as water.
• a fluid can carry particles, such as micrometric and nanometric particles transported by air, for example.
• the matrix of photodetectors may advantageously be periodic or aperiodic and have a polygonal or circular shape.
• the present invention can also be applied to the case of one or more channels of circulation of possibly open particles in a longitudinal direction. Thus, the contour of the channel (s) is not closed.
• the section of the channel in the plane (x, y) is not necessarily circular.
• it can be polygonal, for example rectangular or square.

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