EP3279680A3 - Systeme und verfahren zur verringerung der temperaturkoeffizienten für hallplattenempfindlichkeit höherer ordnung - Google Patents

Systeme und verfahren zur verringerung der temperaturkoeffizienten für hallplattenempfindlichkeit höherer ordnung Download PDF

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Publication number
EP3279680A3
EP3279680A3 EP17180353.9A EP17180353A EP3279680A3 EP 3279680 A3 EP3279680 A3 EP 3279680A3 EP 17180353 A EP17180353 A EP 17180353A EP 3279680 A3 EP3279680 A3 EP 3279680A3
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EP
European Patent Office
Prior art keywords
amplifier
systems
high order
hall plate
methods
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
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EP17180353.9A
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English (en)
French (fr)
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EP3279680A2 (de
EP3279680B1 (de
Inventor
Juan Manuel Cesaretti
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Allegro Microsystems Inc
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Allegro Microsystems Inc
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Publication of EP3279680A2 publication Critical patent/EP3279680A2/de
Publication of EP3279680A3 publication Critical patent/EP3279680A3/de
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Publication of EP3279680B1 publication Critical patent/EP3279680B1/de
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
    • G01R33/0082—Compensation, e.g. compensating for temperature changes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0029—Treating the measured signals, e.g. removing offset or noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Toxicology (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
  • Amplifiers (AREA)
EP17180353.9A 2016-07-12 2017-07-07 Systeme und verfahren zur verringerung der temperaturkoeffizienten für hallplattenempfindlichkeit höherer ordnung Active EP3279680B1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US15/207,903 US10162017B2 (en) 2016-07-12 2016-07-12 Systems and methods for reducing high order hall plate sensitivity temperature coefficients

Publications (3)

Publication Number Publication Date
EP3279680A2 EP3279680A2 (de) 2018-02-07
EP3279680A3 true EP3279680A3 (de) 2018-06-13
EP3279680B1 EP3279680B1 (de) 2019-06-19

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EP17180353.9A Active EP3279680B1 (de) 2016-07-12 2017-07-07 Systeme und verfahren zur verringerung der temperaturkoeffizienten für hallplattenempfindlichkeit höherer ordnung

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US (2) US10162017B2 (de)
EP (1) EP3279680B1 (de)

Families Citing this family (16)

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US10107873B2 (en) * 2016-03-10 2018-10-23 Allegro Microsystems, Llc Electronic circuit for compensating a sensitivity drift of a hall effect element due to stress
US10162017B2 (en) * 2016-07-12 2018-12-25 Allegro Microsystems, Llc Systems and methods for reducing high order hall plate sensitivity temperature coefficients
IT201700071189A1 (it) 2017-06-26 2018-12-26 St Microelectronics Srl Circuito di compensazione in temperatura, dispositivo e procedimento corrispondenti
US10520559B2 (en) 2017-08-14 2019-12-31 Allegro Microsystems, Llc Arrangements for Hall effect elements and vertical epi resistors upon a substrate
EP3467522B1 (de) * 2017-10-06 2023-02-22 STMicroelectronics S.r.l. Temperaturkompensierungsschaltung, entsprechende vorrichtung und verfahren
JP7297479B2 (ja) * 2019-03-15 2023-06-26 エイブリック株式会社 半導体装置
US11402280B2 (en) * 2019-08-12 2022-08-02 Allegro Microsystems, Llc Magnetic sensor with improved stress compensation accounting for temperature
TWI721801B (zh) * 2020-02-27 2021-03-11 立錡科技股份有限公司 具自我校準功能的電流感測電路
US11971463B2 (en) * 2020-03-02 2024-04-30 Allegro Microsystems, Llc Temperature compensated MTJ-based sensing circuit for measuring an external magnetic field
CN113358919B (zh) * 2020-03-05 2023-05-23 立锜科技股份有限公司 具有自我校准功能的电流感测电路
JP7511368B2 (ja) * 2020-03-23 2024-07-05 エイブリック株式会社 半導体装置
DE102020110682A1 (de) * 2020-04-20 2021-10-21 Infineon Technologies Ag Magnetfeldsensorvorrichtung und Verfahren
KR20220022284A (ko) 2020-08-18 2022-02-25 삼성전기주식회사 홀 센서 오프셋 저감 장치 및 렌즈 모듈 제어 장치
JPWO2022209719A1 (de) * 2021-03-31 2022-10-06
US11567108B2 (en) 2021-03-31 2023-01-31 Allegro Microsystems, Llc Multi-gain channels for multi-range sensor
CN116192061B (zh) * 2023-04-26 2023-06-27 成都观岩科技有限公司 一种带温度分段补偿特性的跨阻放大器芯片

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EP3279680B1 (de) 2019-06-19
US10162017B2 (en) 2018-12-25
US10746818B2 (en) 2020-08-18
US20190049528A1 (en) 2019-02-14
US20180017637A1 (en) 2018-01-18

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