EP2901102C0 - Procédé et dispositif de mesure pour mesurer la distance d'une surface, l'épaisseur et les propriétés optiques d'un objet - Google Patents
Procédé et dispositif de mesure pour mesurer la distance d'une surface, l'épaisseur et les propriétés optiques d'un objetInfo
- Publication number
- EP2901102C0 EP2901102C0 EP13837251.1A EP13837251A EP2901102C0 EP 2901102 C0 EP2901102 C0 EP 2901102C0 EP 13837251 A EP13837251 A EP 13837251A EP 2901102 C0 EP2901102 C0 EP 2901102C0
- Authority
- EP
- European Patent Office
- Prior art keywords
- measuring
- thickness
- distance
- optical properties
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C3/00—Measuring distances in line of sight; Optical rangefinders
- G01C3/02—Details
- G01C3/06—Use of electric means to obtain final indication
- G01C3/08—Use of electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
- G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Mathematical Physics (AREA)
- Engineering & Computer Science (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20125958A FI125408B (fi) | 2012-09-17 | 2012-09-17 | Menetelmä ja mittalaite pinnan etäisyyden, kohteen paksuuden ja optisten ominaisuuksien mittaamiseksi |
PCT/FI2013/050898 WO2014041254A1 (fr) | 2012-09-17 | 2013-09-17 | Procédé et dispositif de mesure pour mesurer la distance d'une surface, l'épaisseur et les propriétés optiques d'un objet |
Publications (4)
Publication Number | Publication Date |
---|---|
EP2901102A1 EP2901102A1 (fr) | 2015-08-05 |
EP2901102A4 EP2901102A4 (fr) | 2016-04-20 |
EP2901102B1 EP2901102B1 (fr) | 2023-06-07 |
EP2901102C0 true EP2901102C0 (fr) | 2023-06-07 |
Family
ID=50277691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP13837251.1A Active EP2901102B1 (fr) | 2012-09-17 | 2013-09-17 | Procédé et dispositif de mesure pour mesurer la distance d'une surface, l'épaisseur et les propriétés optiques d'un objet |
Country Status (6)
Country | Link |
---|---|
US (1) | US9476707B2 (fr) |
EP (1) | EP2901102B1 (fr) |
ES (1) | ES2947564T3 (fr) |
FI (1) | FI125408B (fr) |
PL (1) | PL2901102T3 (fr) |
WO (1) | WO2014041254A1 (fr) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI127908B (en) * | 2015-09-22 | 2019-05-15 | Teknologian Tutkimuskeskus Vtt Oy | Method and apparatus for measuring surface height |
CN105890625B (zh) * | 2016-04-05 | 2018-12-21 | 北京控制工程研究所 | 一种基于碳纳米管遮光罩的星敏感器的杂光测试方法 |
TWI616641B (zh) * | 2017-02-23 | 2018-03-01 | Method for measuring wafer thickness using near infrared ray | |
JP6821526B2 (ja) * | 2017-08-15 | 2021-01-27 | キヤノン株式会社 | 画像処理方法、画像処理装置、撮像装置、および、プログラム |
EP3674749A4 (fr) * | 2017-09-28 | 2021-04-28 | Pioneer Corporation | Dispositif de mesure de distance et dispositif de balayage optique |
US11287626B2 (en) | 2019-05-17 | 2022-03-29 | Hong Kong Applied Science and Technology Research Institute Comoanv Limited | Chromatic confocal system and a method for inspecting an object |
FI130557B (en) * | 2020-09-29 | 2023-11-17 | Lmi Tech Inc | DEVICE FOR DETERMINING TARGET DISTANCE, SURFACE THICKNESS AND OPTICAL PROPERTIES AND RELATED METHODS |
CN113959349B (zh) * | 2021-10-25 | 2022-04-19 | 湖南捷力泰科技有限公司 | 一种膜片质量检测装置及其方法 |
DE102022202778B4 (de) | 2022-02-11 | 2024-05-16 | Micro-Epsilon Optronic Gmbh | System und Verfahren zur konfokal-chromatischen Linienabstandsmessung |
WO2023151736A1 (fr) | 2022-02-11 | 2023-08-17 | Micro-Epsilon Optronic Gmbh | Système et procédé de mesure confocale-chromatique de distance linéaire |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2906641A1 (de) | 1979-02-21 | 1980-08-28 | Freudenberg Carl Fa | Verfahren zur optisch-elektrischen messung des abstandes zwischen einer messeinrichtung und einem pruefling |
US4936676A (en) * | 1984-11-28 | 1990-06-26 | Honeywell Inc. | Surface position sensor |
JPH1194543A (ja) | 1997-07-09 | 1999-04-09 | Yeda Res & Dev Co Ltd | カラーコード形光学式プロフイル測定用の三角測量方法及びシステム |
IL121267A0 (en) | 1997-07-09 | 1998-01-04 | Yeda Res & Dev | Method and device for determining the profile of an object |
US6573998B2 (en) | 1997-11-06 | 2003-06-03 | Cynovad, Inc. | Optoelectronic system using spatiochromatic triangulation |
KR100406843B1 (ko) * | 2001-04-06 | 2003-11-21 | (주) 인텍플러스 | 색정보를 이용한 실시간 3차원 표면형상 측정방법 및 장치 |
AU2003236291A1 (en) * | 2002-03-28 | 2003-10-27 | Matsuuradenkosha Company Limited | Evaluation method and device for gel state or sol-gel state change of object |
FR2848664B1 (fr) | 2002-12-11 | 2005-03-11 | Micro Module | Detecteur de position, forme et reflectivite d'une surface |
TWI245114B (en) * | 2004-10-11 | 2005-12-11 | Ind Tech Res Inst | Apparatus for measuring imaging spectrograph |
US20060232790A1 (en) | 2005-04-18 | 2006-10-19 | Lee Chase | Confocal measurement method and apparatus in a paper machine |
JP2007147299A (ja) * | 2005-11-24 | 2007-06-14 | Kobe Steel Ltd | 変位測定装置及び変位測定方法 |
US20070263228A1 (en) | 2006-05-12 | 2007-11-15 | Voith Paper Patent Gmbh | Device and process for optical distance measurement |
FI119259B (fi) | 2006-10-18 | 2008-09-15 | Valtion Teknillinen | Pinnan ja paksuuden määrittäminen |
US20080137061A1 (en) | 2006-12-07 | 2008-06-12 | Christopher John Rush | Displacement Measurement Sensor Using the Confocal Principle |
JPWO2008099778A1 (ja) | 2007-02-14 | 2010-05-27 | 株式会社ニコン | スリット走査共焦点顕微鏡 |
FI124299B (fi) | 2009-10-08 | 2014-06-13 | Focalspec Oy | Mittalaite ja menetelmä kohteen ja kohteen pinnan ominaisuuksien mittaamiseksi |
TWI414817B (zh) * | 2010-07-23 | 2013-11-11 | Univ Nat Taipei Technology | 線型彩色共焦顯微系統 |
-
2012
- 2012-09-17 FI FI20125958A patent/FI125408B/fi active IP Right Grant
-
2013
- 2013-09-17 ES ES13837251T patent/ES2947564T3/es active Active
- 2013-09-17 US US14/427,127 patent/US9476707B2/en active Active
- 2013-09-17 PL PL13837251.1T patent/PL2901102T3/pl unknown
- 2013-09-17 EP EP13837251.1A patent/EP2901102B1/fr active Active
- 2013-09-17 WO PCT/FI2013/050898 patent/WO2014041254A1/fr active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2014041254A1 (fr) | 2014-03-20 |
US9476707B2 (en) | 2016-10-25 |
EP2901102A1 (fr) | 2015-08-05 |
US20150219454A1 (en) | 2015-08-06 |
EP2901102A4 (fr) | 2016-04-20 |
FI125408B (fi) | 2015-09-30 |
EP2901102B1 (fr) | 2023-06-07 |
ES2947564T3 (es) | 2023-08-11 |
PL2901102T3 (pl) | 2023-11-20 |
FI20125958A (fi) | 2014-03-18 |
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