PL2800946T3 - Układ do pomiarów optycznych i powiązany sposób - Google Patents
Układ do pomiarów optycznych i powiązany sposóbInfo
- Publication number
- PL2800946T3 PL2800946T3 PL12813838T PL12813838T PL2800946T3 PL 2800946 T3 PL2800946 T3 PL 2800946T3 PL 12813838 T PL12813838 T PL 12813838T PL 12813838 T PL12813838 T PL 12813838T PL 2800946 T3 PL2800946 T3 PL 2800946T3
- Authority
- PL
- Poland
- Prior art keywords
- arrangement
- related method
- optical measurements
- measurements
- optical
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
- G01C11/04—Interpretation of pictures
- G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20125014A FI125320B (en) | 2012-01-05 | 2012-01-05 | ORGANIZATION AND SIMILAR METHOD FOR OPTICAL MEASUREMENTS |
| EP12813838.5A EP2800946B1 (en) | 2012-01-05 | 2012-12-20 | Arrangement for optical measurements and related method |
| PCT/EP2012/076345 WO2013102572A1 (en) | 2012-01-05 | 2012-12-20 | Arrangement for optical measurements and related method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL2800946T3 true PL2800946T3 (pl) | 2021-10-25 |
Family
ID=47557081
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL12813838T PL2800946T3 (pl) | 2012-01-05 | 2012-12-20 | Układ do pomiarów optycznych i powiązany sposób |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9423245B2 (pl) |
| EP (1) | EP2800946B1 (pl) |
| JP (1) | JP6291418B2 (pl) |
| CN (1) | CN104040287B (pl) |
| ES (1) | ES2875052T3 (pl) |
| FI (1) | FI125320B (pl) |
| PL (1) | PL2800946T3 (pl) |
| WO (1) | WO2013102572A1 (pl) |
Families Citing this family (49)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106415248B (zh) * | 2013-10-24 | 2020-08-18 | 飞利浦灯具控股公司 | 缺陷检查系统和方法 |
| KR101886947B1 (ko) * | 2014-05-05 | 2018-08-08 | 아르코닉 인코포레이티드 | 용접 측정을 위한 장치 및 방법 |
| CN104236480B (zh) * | 2014-09-22 | 2017-06-27 | 电子科技大学 | 一种线结构光机器视觉六角钢坯轮廓测量装置及方法 |
| WO2016057043A1 (en) * | 2014-10-10 | 2016-04-14 | Georgia Tech Research Corporation | Dynamic digital fringe projection techniques for measuring warpage |
| US9885561B2 (en) * | 2014-12-15 | 2018-02-06 | Test Research, Inc. | Optical inspection system |
| FI126498B (en) * | 2014-12-29 | 2017-01-13 | Helmee Imaging Oy | Optical measurement system |
| EP3070641B1 (en) * | 2015-03-11 | 2021-11-24 | Ricoh Company, Ltd. | Vehicle body with imaging system and object detection method |
| CN106296643A (zh) * | 2015-06-10 | 2017-01-04 | 西安蒜泥电子科技有限责任公司 | 用于多视图几何三维重建的特征点补充系统 |
| CN106296798A (zh) * | 2015-06-10 | 2017-01-04 | 西安蒜泥电子科技有限责任公司 | 基于特征点补充的低成本高清晰度人体三维扫描成像系统 |
| KR102018070B1 (ko) | 2015-06-19 | 2019-09-04 | 야마하하쓰도키 가부시키가이샤 | 부품 실장 장치 및 부품 실장 방법 |
| US9470641B1 (en) * | 2015-06-26 | 2016-10-18 | Glasstech, Inc. | System and method for measuring reflected optical distortion in contoured glass sheets |
| DE112015006596T5 (de) * | 2015-08-17 | 2018-05-24 | Yamaha Hatsudoki Kabushiki Kaisha | Komponentenbefestigungsvorrichtung |
| KR102319841B1 (ko) | 2015-09-16 | 2021-10-29 | 하우매트 에어로스페이스 인코포레이티드 | 리벳 공급 장치 |
| TWI583932B (zh) * | 2015-12-09 | 2017-05-21 | 財團法人國家實驗研究院 | 量測鏡頭光學品質的裝置 |
| JP2017120232A (ja) * | 2015-12-28 | 2017-07-06 | キヤノン株式会社 | 検査装置 |
| US10593034B2 (en) | 2016-03-25 | 2020-03-17 | Arconic Inc. | Resistance welding fasteners, apparatus and methods for joining dissimilar materials and assessing joints made thereby |
| FR3049709B1 (fr) * | 2016-04-05 | 2019-08-30 | Areva Np | Procede de detection d'un defaut sur une surface par eclairage multidirectionnel et dispositif associe |
| CN107869957B (zh) * | 2016-09-27 | 2020-09-25 | 宝山钢铁股份有限公司 | 一种基于成像系统的圆柱截面尺寸测量装置和方法 |
| JP6499139B2 (ja) * | 2016-10-14 | 2019-04-10 | 矢崎総業株式会社 | 検査装置 |
| KR102339677B1 (ko) * | 2016-11-09 | 2021-12-14 | 브이 테크놀로지 씨오. 엘티디 | 광학 검사 장치 |
| DE102017207071A1 (de) * | 2017-04-27 | 2018-10-31 | Robert Bosch Gmbh | Prüfvorrichtung zur optischen Prüfung eines Objekts und Objektprüfungsanordnung |
| GB201721451D0 (en) * | 2017-12-20 | 2018-01-31 | Univ Manchester | Apparatus and method for determining spectral information |
| US10628646B1 (en) * | 2017-12-29 | 2020-04-21 | Cognex Corporation | Off-axis dual-sensor vision system camera and method for using the same |
| US11481568B1 (en) | 2017-12-29 | 2022-10-25 | Cognex Corporation | Dome illuminator for vision system camera and method for using the same |
| US10527557B2 (en) * | 2017-12-29 | 2020-01-07 | Radiant Vision Systems, LLC | Adaptive diffuse illumination systems and methods |
| KR102461481B1 (ko) * | 2018-01-24 | 2022-10-31 | 사이버옵틱스 코포레이션 | 거울 표면을 위한 구조화 광의 투영 |
| WO2019170591A1 (de) * | 2018-03-04 | 2019-09-12 | Vision Tools Hard- Und Software Entwicklungs-Gmbh | Erstellung eines abstandsbildes |
| US20200408512A1 (en) | 2018-03-16 | 2020-12-31 | Nec Corporation | Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, program, and storage medium |
| CN108445615A (zh) * | 2018-03-29 | 2018-08-24 | 中国工程物理研究院激光聚变研究中心 | 一种光学元件面散射缺陷探测装置 |
| DE102018213740A1 (de) | 2018-08-15 | 2020-02-20 | Robert Bosch Gmbh | Messvorrichtung und Verfahren zur Bestimmung einer Oberfläche |
| US20210314477A1 (en) * | 2018-08-17 | 2021-10-07 | Hewlett-Packard Development Company, L.P. | Exposure control of captured images |
| WO2020073065A1 (en) * | 2018-10-04 | 2020-04-09 | Du Preez Isak | Optical surface encoder |
| CN109443199B (zh) * | 2018-10-18 | 2019-10-22 | 天目爱视（北京）科技有限公司 | 基于智能光源的3d信息测量系统 |
| CN109883443B (zh) * | 2019-02-19 | 2021-06-18 | 北京工业大学 | 一种线结构光传感器空间姿态标定方法 |
| CN110017792A (zh) * | 2019-04-10 | 2019-07-16 | 中山大学 | 一种新型光学曲面二维测量方法及其测量系统 |
| CN111006615A (zh) * | 2019-10-30 | 2020-04-14 | 浙江大学 | 一种平坦表面特征扫描成像装置和方法 |
| CN110702699B (zh) * | 2019-11-15 | 2024-03-08 | 湖南讯目科技有限公司 | 一种压延玻璃缺陷检测装置和方法 |
| JP7411928B2 (ja) * | 2019-12-26 | 2024-01-12 | 株式会社Rutilea | 物品撮影装置 |
| JP2021117114A (ja) * | 2020-01-27 | 2021-08-10 | 株式会社Ｓｃｒｅｅｎホールディングス | 撮像装置、検査装置および検査方法 |
| EP3910314B1 (de) | 2020-05-14 | 2022-07-20 | KRÜSS GmbH, Wissenschaftliche Laborgeräte | Verfahren und vorrichtung zur analyse der wechselwirkung zwischen einer oberfläche einer probe und einer flüssigkeit |
| CN112908126B (zh) * | 2021-01-21 | 2022-07-08 | 潍坊学院 | 一种具有对焦状态数字化显示的透镜成像实验装置 |
| CN112923877B (zh) * | 2021-01-27 | 2023-08-11 | 荆门宏图特种飞行器制造有限公司 | 球壳板曲率偏差检测装置及方法 |
| CN113218961B (zh) * | 2021-04-21 | 2023-08-11 | 中国科学院光电技术研究所 | 一种基片缺陷检测装置与方法 |
| CN114354607B (zh) * | 2021-10-09 | 2023-10-31 | 七海测量技术（深圳）有限公司 | 一种基于螺旋相衬滤波算法的光度立体瑕疵检测方法 |
| CN114113136A (zh) * | 2021-11-09 | 2022-03-01 | 慧三维智能科技(苏州)有限公司 | 一种用于检测高亮面表面缺陷的装置 |
| EP4184145B1 (de) | 2021-11-17 | 2023-08-30 | KRÜSS GmbH, Wissenschaftliche Laborgeräte | Vorrichtung zur erfassung einer geometrie eines auf einer probenoberfläche angeordneten tropfens |
| FI130408B (en) | 2022-01-18 | 2023-08-17 | Helmee Imaging Oy | ARRANGEMENT AND CORRESPONDING METHOD FOR OPTICAL MEASUREMENTS |
| WO2023191791A1 (en) * | 2022-03-31 | 2023-10-05 | Hewlett-Packard Development Company, L.P. | Three-dimensional topographical surface capture device |
| TWI797039B (zh) * | 2022-07-21 | 2023-03-21 | 中國鋼鐵股份有限公司 | 測量系統 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4427880A (en) | 1981-06-29 | 1984-01-24 | Westinghouse Electric Corp. | Non-contact visual proximity sensing apparatus |
| US5060065A (en) | 1990-02-23 | 1991-10-22 | Cimflex Teknowledge Corporation | Apparatus and method for illuminating a printed circuit board for inspection |
| US5245421A (en) | 1990-09-19 | 1993-09-14 | Control Automation, Incorporated | Apparatus for inspecting printed circuit boards with surface mounted components |
| US5365084A (en) * | 1991-02-20 | 1994-11-15 | Pressco Technology, Inc. | Video inspection system employing multiple spectrum LED illumination |
| JPH05231837A (ja) * | 1991-12-25 | 1993-09-07 | Toshiba Corp | 形状測定方法及び装置 |
| US5461417A (en) * | 1993-02-16 | 1995-10-24 | Northeast Robotics, Inc. | Continuous diffuse illumination method and apparatus |
| DE4413832C2 (de) * | 1994-04-20 | 2000-05-31 | Siemens Ag | Vorrichtungen zur Kontrolle von Halbleiterscheiben |
| US6222630B1 (en) * | 1998-08-26 | 2001-04-24 | Teradyne, Inc. | Measuring and compensating for warp in the inspection of printed circuit board assemblies |
| US6788411B1 (en) * | 1999-07-08 | 2004-09-07 | Ppt Vision, Inc. | Method and apparatus for adjusting illumination angle |
| FR2806478B1 (fr) | 2000-03-14 | 2002-05-10 | Optomachines | Dispositif et procede de controle optique de pieces de vaisselle comme des assiettes emaillees ou tout produit ceramique emaille |
| US7075565B1 (en) * | 2000-06-14 | 2006-07-11 | Landrex Technologies Co., Ltd. | Optical inspection system |
| US6618123B2 (en) * | 2000-10-20 | 2003-09-09 | Matsushita Electric Industrial Co., Ltd. | Range-finder, three-dimensional measuring method and light source apparatus |
| US7113313B2 (en) * | 2001-06-04 | 2006-09-26 | Agilent Technologies, Inc. | Dome-shaped apparatus for inspecting a component or a printed circuit board device |
| US6730926B2 (en) * | 2001-09-05 | 2004-05-04 | Servo-Robot Inc. | Sensing head and apparatus for determining the position and orientation of a target object |
| EP1601939A2 (en) * | 2003-02-26 | 2005-12-07 | Raymond J. Castonguay | Spherical light-scatter and far-field phase measurement |
| EP1611430B1 (en) * | 2003-02-28 | 2010-04-21 | Koninklijke Philips Electronics N.V. | A scatterometer and a method for observing a surface |
| US7145125B2 (en) * | 2003-06-23 | 2006-12-05 | Advanced Optical Technologies, Llc | Integrating chamber cone light using LED sources |
| DE102004056698B3 (de) * | 2004-11-24 | 2006-08-17 | Stratus Vision Gmbh | Inspektionsvorrichtung für ein Substrat, das mindestens eine aufgedruckte Schicht aufweist |
| EP1864081B1 (de) | 2005-03-24 | 2014-05-07 | SAC Sirius Advanced Cybernetics GmbH | Vorrichtung zur optischen formerfassung von gegenständen und oberflächen |
| US8032017B2 (en) * | 2006-09-29 | 2011-10-04 | Microscan Systems, Inc. | Methods for providing diffuse light |
| SG173070A1 (en) | 2009-02-06 | 2011-08-29 | Agency Science Tech & Res | A light detection arrangement and a method for detecting light in a light detection arrangement |
| US20100259746A1 (en) * | 2009-04-10 | 2010-10-14 | Omron Corporation | Profilometer |
| US8717578B2 (en) * | 2009-04-10 | 2014-05-06 | Omron Corporation | Profilometer, measuring apparatus, and observing apparatus |
| JP5170154B2 (ja) * | 2010-04-26 | 2013-03-27 | オムロン株式会社 | 形状計測装置およびキャリブレーション方法 |
| US8334985B2 (en) * | 2010-10-08 | 2012-12-18 | Omron Corporation | Shape measuring apparatus and shape measuring method |
-
2012
- 2012-01-05 FI FI20125014A patent/FI125320B/en active IP Right Grant
- 2012-12-20 JP JP2014550675A patent/JP6291418B2/ja active Active
- 2012-12-20 WO PCT/EP2012/076345 patent/WO2013102572A1/en active Application Filing
- 2012-12-20 US US14/370,547 patent/US9423245B2/en active Active
- 2012-12-20 ES ES12813838T patent/ES2875052T3/es active Active
- 2012-12-20 CN CN201280066177.0A patent/CN104040287B/zh active Active
- 2012-12-20 EP EP12813838.5A patent/EP2800946B1/en active Active
- 2012-12-20 PL PL12813838T patent/PL2800946T3/pl unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP2015508499A (ja) | 2015-03-19 |
| WO2013102572A1 (en) | 2013-07-11 |
| EP2800946A1 (en) | 2014-11-12 |
| CN104040287B (zh) | 2017-11-24 |
| EP2800946B1 (en) | 2021-03-24 |
| FI20125014A (fi) | 2013-07-06 |
| US9423245B2 (en) | 2016-08-23 |
| CN104040287A (zh) | 2014-09-10 |
| FI125320B (en) | 2015-08-31 |
| US20140376003A1 (en) | 2014-12-25 |
| JP6291418B2 (ja) | 2018-03-14 |
| ES2875052T3 (es) | 2021-11-08 |
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