EP1132794B1 - Methode d'obtention d'une référence de tension en dépendance de temperature et une circuit d'en obtenir - Google Patents

Methode d'obtention d'une référence de tension en dépendance de temperature et une circuit d'en obtenir Download PDF

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Publication number
EP1132794B1
EP1132794B1 EP01890066A EP01890066A EP1132794B1 EP 1132794 B1 EP1132794 B1 EP 1132794B1 EP 01890066 A EP01890066 A EP 01890066A EP 01890066 A EP01890066 A EP 01890066A EP 1132794 B1 EP1132794 B1 EP 1132794B1
Authority
EP
European Patent Office
Prior art keywords
temperature
voltage
adc
resistor
bipolar transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP01890066A
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German (de)
English (en)
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EP1132794A1 (fr
Inventor
Richard Forsyth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ams AG
Original Assignee
Austriamicrosystems AG
Austria Mikro Systeme International GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication of EP1132794A1 publication Critical patent/EP1132794A1/fr
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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities

Definitions

  • the invention relates to a method for obtaining a temperature-independent voltage reference with a bandgap reference circuit using at least one bipolar transistor and a voltage source and on a circuit arrangement to obtain a temperature-independent voltage reference.
  • the invention now aims to provide a method of the beginning to create the type mentioned, in which only a bipolar transistor is used and therefore the selection of one the characteristic of this transistor tuned second transistor is unnecessary.
  • the invention further aims to to further reduce the temperature dependence of the measured values and temperature compensation with much higher accuracy to achieve.
  • the invention Process essentially in that only one Bipolar transistor with its emitter in series with one Resistor is switched that different voltages be applied to the series connection that the voltages before and tapped after the series resistance and an analog-to-digital converter (ADC) and that the gain factor of the analog-digital converter from the digitized Measured values are calculated and used to correct the measured values becomes.
  • ADC analog-to-digital converter
  • the amplification factor is always recalculated from a plurality of measured values by the algorithm which will be explained in more detail below, it is possible within the scope of the method according to the invention, as is in accordance with a preferred development, that the value for S is updated continuously or at regular time intervals and is used to calculate the actual reference voltage and, if necessary, for the exact determination of test voltages.
  • the circuit arrangement according to the invention for obtaining a temperature-independent voltage reference can be particularly simple be trained and comes with a small number of components out.
  • the circuit arrangement is essentially as a result characterized in that they have a bipolar transistor and a has the resistor R connected in series, that on taps on both sides of the resistor R over Switch to achieve an analog-to-digital converter (ADC) digitized voltage measurements is connected and that the digital signals from the ADC to a computer to determine the gain factor are supplied, from which the corrected Voltage signal can be read out digitally.
  • ADC analog-to-digital converter
  • the switch can be used as a multiplexer component in a particularly simple manner be formed, the inputs of a control signal of the computer and have connections on which voltages to measure by operating the associated Switch.
  • the multiplexer thus transmits each after setting the switch, the analog signals to the analog input of the ADC.
  • the circuit arrangement can be found under Can be built using PNP or NPN transistors. in the The case of PNP transistors is the emitter with the resistor connected, and the collector connected to the base to ground placed with the adjustable voltage source on the other Connection of the resistor is connected.
  • a preferred use of the circuit arrangement according to the invention represents use in a digital voltmeter, the basic procedure as well as the circuit arrangement in no way on such digital voltmeters is limited.
  • the invention is based on the calculation of the Gain factor selected algorithm and based a circuit example for a digital voltmeter closer explained.
  • lnI x - 1 + S + dlnI x U G S - (-1 + S) x + ln A + xln q DLNI x k + ln R results.
  • S - 1 - lnI x + x + ln A + xln q DLNI x k + lnR - 1 - dlnI x U G + x
  • x, A and R can be individually calibrated for each circuit arrangement, and particularly suitable values can be calculated in advance by means of a simulation.
  • the value for the gain factor S is continuous in each case or updated at regular intervals so that increasingly precise values are obtained iteratively. Because of a such an iteration process is also straightforward allowed, only a first order Taylor expansion in the above Use calculation.
  • 1 denotes a variable voltage source with which different voltages can be generated.
  • the voltage is applied to terminal 2 of a resistor R, a PNP transistor being used in the circuit arrangement shown, the emitter E of which is connected to the tap 3 of the resistor.
  • the base and collector of the bipolar transistor 4 are in turn connected to ground or zero potential, the voltage values which can be tapped at 2 and 3 being alternatively fed to the analog-digital converter as analog signals via switches S 2 and S 3 .
  • the signal digitized in the ADC 5 passes via the signal line 6 to a computer 7, in which the corresponding corrections are carried out in accordance with the computing algorithm mentioned above.
  • a further switch S 1 is provided for use as a digital voltmeter, via which a test voltage can be applied to the ADC 5 via the connection 8 and measured.
  • the switches S 1 , S 2 and S 3 are now each closed alternatively, it being possible for these switches S 1 , S 2 and S 3 to be contained in a multiplexer and the switch positions themselves to be controlled by the computer 7.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Analogue/Digital Conversion (AREA)
  • Control Of Electrical Variables (AREA)
  • Amplifiers (AREA)

Claims (5)

  1. Procédé d'obtention d'une référence de tension indépendante de la température, comprend un circuit de référence à intervalle de bande en utilisant un transistor bipolaire (4) et une source de tension (1),
       caractérisé par le fait que
       seulement un transistor bipolaire (4) est branché par son émetteur (E) en série avec une résistance (R),
       on applique sélectivement différentes tensions sur ce circuit série,
       on prélève les tensions avant et après la résistance série et on les envoie à un convertisseur analogique-numérique (ADC), et
       à partir d'une multiplicité de valeurs mesurées numérisées, on détermine le facteur d'amplification du convertisseur analogique-numérique pour la température respective régnante et on l'utilise pour la correction des valeurs mesurées.
  2. Procédé selon la revendication 1,
       caractérisé par le fait que
       pour la détermination du facteur d'amplification du convertisseur analogique-numérique ADC, on détecte une valeur mesurée pour la tension base-émetteur du transistor bipolaire et une valeur mesurée pour le courant à l'état bloqué du transistor bipolaire à partir de la chute de tension à la résistance, et
       en utilisant un procédé de calcul, on élimine celles des composantes des deux valeurs mesurées qui sont dépendantes de la température et on détermine le facteur d'amplification valable pour la température respective régnant à l'instant de mesure.
  3. Procédé selon la revendication 1 ou 2,
       caractérisé par le fait qu'on calcule le facteur d'amplification avec S = - 1- lnIx + x + ln A + xln qdlnIxk + ln R- 1- dlnIx UG + x lnIx étant le logarithme népérien de la valeur mesurée pour le courant de collecteur, x et A des constantes, R la valeur de résistance et UG la tension d'intervalle de bande.
  4. Procédé selon la revendication 3,
       caractérisé par le fait qu'on actualise la valeur pour S de façon continue ou à intervalles de temps réguliers et on l'exploite pour le calcul de la tension de référence effective et éventuellement de tensions de test.
  5. Circuit d'obtention d'une référence de tension indépendante de la température ayant un circuit de référence à intervalle de bande,
       caractérisé par le fait que
       il comporte dans un montage en série seulement un transistor bipolaire (4) et une résistance (R) reliée à l'émetteur du transistor (4),
       un convertisseur analogique-numérique (ADC) (5) est raccordé à des prises (2, 3) des deux côtés de la résistance (R) par l'intermédiaire d'interrupteurs (S2, S3) afin d'obtenir une multiplicité de valeurs mesurées numérisées, et
       les signaux numérisés du convertisseur analogique-numérique ADC (5) sont envoyés à un calculateur (7) qui est destiné à déterminer le facteur d'amplification du convertisseur analogique-numérique ADC pour la température respective régnante et à partir duquel des valeurs mesurées corrigées peuvent être lues sous une forme numérique.
EP01890066A 2000-03-10 2001-03-07 Methode d'obtention d'une référence de tension en dépendance de temperature et une circuit d'en obtenir Expired - Lifetime EP1132794B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AT0040400A AT410722B (de) 2000-03-10 2000-03-10 Verfahren zur gewinnung einer temperaturunabhängigen spannungsreferenz sowie schaltungsanordnung zur gewinnung einer derartigen spannungsreferenz
AT4042000 2000-03-10

Publications (2)

Publication Number Publication Date
EP1132794A1 EP1132794A1 (fr) 2001-09-12
EP1132794B1 true EP1132794B1 (fr) 2004-05-26

Family

ID=3673631

Family Applications (1)

Application Number Title Priority Date Filing Date
EP01890066A Expired - Lifetime EP1132794B1 (fr) 2000-03-10 2001-03-07 Methode d'obtention d'une référence de tension en dépendance de temperature et une circuit d'en obtenir

Country Status (4)

Country Link
US (1) US6535053B2 (fr)
EP (1) EP1132794B1 (fr)
AT (1) AT410722B (fr)
DE (1) DE50102379D1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60123925D1 (de) * 2001-04-27 2006-11-30 St Microelectronics Srl Stromreferenzschaltung für niedrige Versorgungsspannungen
DE102005045635B4 (de) * 2005-09-23 2007-06-14 Austriamicrosystems Ag Anordnung und Verfahren zur Bereitstellung eines temperaturabhängigen Signals
CN117666693B (zh) * 2024-01-31 2024-04-05 悦芯科技股份有限公司 一种高精度可调基准电压源

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8630980D0 (en) * 1986-12-29 1987-02-04 Motorola Inc Bandgap reference circuit
JPH02112007A (ja) * 1988-10-21 1990-04-24 Nec Corp 基準電圧発生回路
US4940930A (en) * 1989-09-07 1990-07-10 Honeywell Incorporated Digitally controlled current source
US4990846A (en) * 1990-03-26 1991-02-05 Delco Electronics Corporation Temperature compensated voltage reference circuit
AT397311B (de) * 1991-08-16 1994-03-25 Hans Dr Leopold Verfahren zur bestimmung einer messgrösse sowie schaltungsanordnung zur durchführung des verfahrens
US5453682A (en) * 1994-01-27 1995-09-26 Newport Electronics, Inc. Wide-range thermistor meter
TW300348B (fr) * 1995-03-17 1997-03-11 Maxim Integrated Products
US5936392A (en) * 1997-05-06 1999-08-10 Vlsi Technology, Inc. Current source, reference voltage generator, method of defining a PTAT current source, and method of providing a temperature compensated reference voltage
US5936391A (en) * 1997-10-01 1999-08-10 Lucent Technologies, Inc. Partially temperature compensated low noise voltage reference

Also Published As

Publication number Publication date
AT410722B (de) 2003-07-25
EP1132794A1 (fr) 2001-09-12
US20010026188A1 (en) 2001-10-04
DE50102379D1 (de) 2004-07-01
US6535053B2 (en) 2003-03-18
ATA4042000A (de) 2002-11-15

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