EP0957420A2 - Circuit de verrouillage - Google Patents
Circuit de verrouillage Download PDFInfo
- Publication number
- EP0957420A2 EP0957420A2 EP99109644A EP99109644A EP0957420A2 EP 0957420 A2 EP0957420 A2 EP 0957420A2 EP 99109644 A EP99109644 A EP 99109644A EP 99109644 A EP99109644 A EP 99109644A EP 0957420 A2 EP0957420 A2 EP 0957420A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- transistor
- voltage
- clamping
- diode
- field effect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/22—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the bipolar type only
- G05F3/222—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the bipolar type only with compensation for device parameters, e.g. Early effect, gain, manufacturing process, or external variations, e.g. temperature, loading, supply voltage
- G05F3/227—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the bipolar type only with compensation for device parameters, e.g. Early effect, gain, manufacturing process, or external variations, e.g. temperature, loading, supply voltage producing a current or voltage as a predetermined function of the supply voltage
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
- G05F3/242—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
- G05F3/247—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the supply voltage
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/262—Current mirrors using field-effect transistors only
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/267—Current mirrors using both bipolar and field-effect technology
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19821906 | 1998-05-15 | ||
DE19821906A DE19821906C1 (de) | 1998-05-15 | 1998-05-15 | Klemmschaltung |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0957420A2 true EP0957420A2 (fr) | 1999-11-17 |
EP0957420A3 EP0957420A3 (fr) | 2000-03-29 |
EP0957420B1 EP0957420B1 (fr) | 2003-04-16 |
Family
ID=7867934
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99109644A Expired - Lifetime EP0957420B1 (fr) | 1998-05-15 | 1999-05-14 | Circuit de verrouillage |
Country Status (3)
Country | Link |
---|---|
US (1) | US6137278A (fr) |
EP (1) | EP0957420B1 (fr) |
DE (2) | DE19821906C1 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7242240B2 (en) * | 2005-05-05 | 2007-07-10 | Agere Systems, Inc. | Low noise bandgap circuit |
US20090121770A1 (en) | 2007-03-29 | 2009-05-14 | Linear Technology Corporation | Method for clamping a semiconductor region at or near ground |
JP4553395B2 (ja) * | 2007-06-15 | 2010-09-29 | シャープ株式会社 | オシロスコープおよびそれを用いた半導体評価装置 |
EP2564220B1 (fr) * | 2010-04-30 | 2016-04-20 | Katholieke Universiteit Leuven | Circuit d'écrêtage de tension et son utilisation |
US20130027117A1 (en) * | 2011-07-28 | 2013-01-31 | Anadyne, Inc. | Precision voltage clamp with very low temperature drift |
CN109474246B (zh) * | 2018-10-31 | 2022-06-28 | 西安微电子技术研究所 | 电压箝位保护结构及运算放大器输入级结构 |
CN111208401B (zh) * | 2018-11-22 | 2023-01-31 | 宁波飞芯电子科技有限公司 | 一种钳位光电二极管的测试方法以及装置 |
CN112152189B (zh) * | 2020-09-15 | 2023-01-31 | 广东省大湾区集成电路与系统应用研究院 | 一种钳位电路和电子设备 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4764897A (en) * | 1985-09-30 | 1988-08-16 | Kabushiki Kaisha Toshiba | Semiconductor memory device employing normally-on type GaAs-MESFET transfer gates |
US5436552A (en) * | 1992-09-22 | 1995-07-25 | Mitsubishi Denki Kabushiki Kaisha | Clamping circuit for clamping a reference voltage at a predetermined level |
US5614850A (en) * | 1994-12-09 | 1997-03-25 | Texas Instruments Incorporated | Current sensing circuit and method |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3703711A (en) * | 1971-01-04 | 1972-11-21 | Honeywell Inf Systems | Memory cell with voltage limiting at transistor control terminals |
US3930172A (en) * | 1974-11-06 | 1975-12-30 | Nat Semiconductor Corp | Input supply independent circuit |
GB2189954B (en) * | 1986-04-30 | 1989-12-20 | Plessey Co Plc | Improvements relating to memory cell devices |
US4926073A (en) * | 1989-05-01 | 1990-05-15 | Motorola Inc. | Negative voltage clamp |
KR950005577B1 (ko) * | 1992-12-30 | 1995-05-25 | 현대전자산업주식회사 | 비트 라인 부하 회로 |
FR2718259A1 (fr) * | 1994-03-30 | 1995-10-06 | Philips Composants | Circuit régulateur fournissant une tension indépendante de l'alimentation et de la température. |
US5519341A (en) * | 1994-12-02 | 1996-05-21 | Texas Instruments Incorporated | Cross coupled quad comparator for current sensing independent of temperature |
-
1998
- 1998-05-15 DE DE19821906A patent/DE19821906C1/de not_active Expired - Fee Related
-
1999
- 1999-05-14 DE DE59905031T patent/DE59905031D1/de not_active Expired - Lifetime
- 1999-05-14 EP EP99109644A patent/EP0957420B1/fr not_active Expired - Lifetime
- 1999-05-17 US US09/313,423 patent/US6137278A/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4764897A (en) * | 1985-09-30 | 1988-08-16 | Kabushiki Kaisha Toshiba | Semiconductor memory device employing normally-on type GaAs-MESFET transfer gates |
US5436552A (en) * | 1992-09-22 | 1995-07-25 | Mitsubishi Denki Kabushiki Kaisha | Clamping circuit for clamping a reference voltage at a predetermined level |
US5614850A (en) * | 1994-12-09 | 1997-03-25 | Texas Instruments Incorporated | Current sensing circuit and method |
Also Published As
Publication number | Publication date |
---|---|
DE59905031D1 (de) | 2003-05-22 |
US6137278A (en) | 2000-10-24 |
DE19821906C1 (de) | 2000-03-02 |
EP0957420A3 (fr) | 2000-03-29 |
EP0957420B1 (fr) | 2003-04-16 |
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