EP0294696A2 - Fiche de contact à ressort - Google Patents

Fiche de contact à ressort Download PDF

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Publication number
EP0294696A2
EP0294696A2 EP88108746A EP88108746A EP0294696A2 EP 0294696 A2 EP0294696 A2 EP 0294696A2 EP 88108746 A EP88108746 A EP 88108746A EP 88108746 A EP88108746 A EP 88108746A EP 0294696 A2 EP0294696 A2 EP 0294696A2
Authority
EP
European Patent Office
Prior art keywords
spring
contact pin
sleeve
helical compression
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP88108746A
Other languages
German (de)
English (en)
Other versions
EP0294696A3 (fr
Inventor
Klaus Giringer
Jochen Laube
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Feinmetall GmbH
Original Assignee
Feinmetall GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall GmbH filed Critical Feinmetall GmbH
Publication of EP0294696A2 publication Critical patent/EP0294696A2/fr
Publication of EP0294696A3 publication Critical patent/EP0294696A3/fr
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe

Definitions

  • the invention relates to a spring contact pin according to the preamble of claim 1.
  • Spring contact pins are known (KRÜGER "Test equipment for electrical testing of printed circuit boards for watches", yearbook of the German Society for Chronometry, Volume 30, 1979, pp. 269-276). They each have a sleeve, in which a helical compression spring is arranged, which spring-loads a straight contact pin which projects outward from the sleeve. This contact pin has a rod which is guided straight in the sleeve and on which a contact head is arranged, which serves to come into contact with the test specimens to be tested, i.e. to make contact with them.
  • the electrical or electronic test objects can be printed circuit boards, integrated circuits, such as chips or the like, or others trade electrical or electronic test specimens.
  • Test devices for testing such test objects have a test adapter which is connected to an electrical test device or evaluator.
  • the test adapter usually has a multiplicity of spring contact pins arranged parallel to one another in a predetermined grid or in some other arrangement in one or more plates.
  • the number of spring contact pins of a test adapter can possibly be very large. Mesit have test adapters hundreds or thousands, often even many thousands of spring contact pins.
  • Each spring contact pin must exert a relatively large force (contact force) on the test specimen with its contact head, so that reliable electrical contact occurs, in that oxide layers, dirt layers or the like can be pierced by the contact head at the point of the test specimen to be contacted.
  • the required contact force is exerted in the known, conventional spring contact pins by a single helical compression spring located in the sleeve and is usually more than 100 cN, often several 100 cN and in some cases a little less than 100 cN.
  • the spring exerting the contact force often has to withstand extremely large numbers of load changes without breaking, for example millions of load changes, so that they should not be subjected to excessive loads.
  • the spring contact pins must be arranged next to each other and electrically insulated from each other on the test adapter and may only have small maximum outer diameters so that they can be arranged in high density on the test adapter.
  • the outer diameters of the circular cylindrical areas of the sleeves of the spring contact pins are usually in the range of approximately 0.5 to 2.5 mm, but in some cases larger or smaller outer diameters can also be provided.
  • the maximum outer diameter of the contact head arranged on the rod of the contact bolt should not exceed that of the sleeve, since, of course, no electrical contacts may take place between the contact heads of the spring contact pins that are adjacent to one another on the test adapter.
  • the lengths of such spring contact pins should also be relatively small, even if they can be relatively large in relation to the diameters of the sleeves.
  • the lengths of the spring contact pins in the unloaded state are usually in the order of about 1 to 12 cm.
  • this spring contact pin in addition to the at least one inner spring arranged in the sleeve on the rod of its front contact bolt serving to contact test specimens outside the sleeve and an additional outer helical compression spring, its length can be reduced for a given maximum spring force and as a result the shorter length may also save costs in its manufacture.
  • a desired spring force can also be achieved with less stress on the springs, so that the invention can also reduce the stress on the springs, which reduces the risk of the springs breaking and the number of load changes which the springs can withstand without breaking can be extremely large and be larger than in the known spring contact pins with comparable dimensions and spring materials.
  • the spring contact pin according to the invention can also be designed for greater spring force.
  • the parameters of increasing the spring force, reducing the spring load and reducing the length of the spring contact pin can be coordinated with one another in any desired manner. If desired, particularly short spring travel can also be achieved.
  • the space available on the spring contact pin is better used than before for spring means.
  • One or more springs preferably a single spring, can be arranged within the sleeve, since, given the small size of the sleeve inner diameter, a single spring can be expedient here.
  • the at least one inner spring arranged in the sleeve can generally be expediently a helical compression spring, but it can also be a different spring, depending on the design of the sleeve. If, as can generally be provided, the sleeve has circular cross sections, the at least one inner spring located therein can be a helical compression spring for the best use of the space available for it.
  • a plurality of helical compression springs can also be arranged nested in one another in the sleeve, which does not change the fact that the external helical compression spring comprising the rod of the contact bolt outside the sleeve can result in additional spring force and / or increase in service life and / or shorter length of the spring contact pin since the spring forces of the springs acting on the contact pin add up and the contact force exerted on the test specimens by the contact pin can be increased and / or the stress on the springs and / or the length of the spring contact pin can be reduced.
  • the sleeve is a flat sleeve in which an approximately plate-shaped contact pin is guided straight
  • the at least one inner spring located in the sleeve can expediently not be a helical compression spring, but rather a zigzag-shaped one Spring or any other spring curved in one plane.
  • the spring contact pin has two contact pins which are guided in the same sleeve at opposite longitudinal end regions and which protrude from the sleeve and of which the front contact pin serves to contact test specimens with its contact head.
  • the rear contact pin serves to contact a connection contact on the test adapter that serves for the electrical connection of the spring contact pin.
  • the electrical connection contact can, for example, be arranged on a separate plate of the test adapter and an electrical conductor leading to the test device or evaluator of the test device in question can then be connected to it.
  • the rear contact pin can also be expediently spring-loaded, in addition to the at least one inner spring located in the sleeve, and by an additional external helical compression spring arranged on its rod outside the sleeve, so that for a given contact force the length of such a spring contact pin is additionally shortened and thus additionally Costs can be saved.
  • the sleeve forms a cylinder for the at least one contact pin, in which it is guided straight like a piston.
  • all parts of the spring contact pin can preferably be metallic, since the best possible and as constant as possible electrical conductivity of the spring contact pin over its length is desired is, in some cases it can also be provided that the outer spring be made of non-metal or electrically insulated. However, it is usually better to also form the at least one outer spring from electrically highly conductive metal, since it can then effectively contribute to the electrical resistance of the spring contact pin being as constant as possible, which is a further advantage of it. In some cases it is also possible to form the sleeve or the at least one inner spring from non-metal, but it is also particularly expedient for the reasons mentioned above to also form the sleeve and the at least one inner spring from metal.
  • a part or more parts or all parts of the spring contact pin can be provided with suitable metallic coatings, as is known per se with spring contact pins, in order to reduce the electrical contact resistances and / or for other reasons.
  • All springs of the spring contact pin can be appropriately preloaded so that they can constantly engage the associated contact bolt or the associated contact bolt and thus be in constant contact with them, which, inter alia, provides the spring travel required in operation to achieve the desired contact forces on the test specimens in a particularly short manner can be, for example, often only need to be a few millimeters. But in some cases it can also be provided that at least one spring is not biased and this then needs ent only occasionally to call the assigned contact pin.
  • the outer winding diameter of the outer helical compression spring is larger than the outer winding diameter of the inner spring, if this is designed as a helical compression spring, preferably the outer winding diameter of the outer helical compression spring in the rest position of the contact bolt, on the rod of which it is located is arranged, can approximately correspond to the maximum outer diameter of the sleeve and / or the contact head of this contact bolt.
  • the outer helical compression spring consists of thicker spring wire than the inner spring and / or that the outer helical compression spring has a larger spring constant than the inner helical compression spring.
  • the at least one inner spring is expediently a compression spring.
  • the at least one inner spring is designed as a tension spring, which pulls the associated contact pin in the direction of the contact force to be exerted by it.
  • the spring contact pin 10 shown in Fig. 1 consists of a straight sleeve 11, two preloaded cylindrical helical compression springs 12, 13 and a solid front straight contact pin 15 protruding from the front end of the sleeve 11.
  • This front contact pin 15 is the only contact pin here Spring contact pin 10.
  • All parts of the spring contact pin 10 consist of electrically highly conductive, possibly provided with metallic coatings, metals, so that it is constantly electrically conductive over its entire length.
  • the rotationally symmetrical straight sleeve 11 is made from a circular cylindrical tube, this tube having been plastically deformed only at two points.
  • One point is an inwardly directed annular collar 16 in the vicinity of the upper free end face 17 of the sleeve 11 and the other deformation relates to the inward bending of the lower end region of the sleeve 11 to form a bottom-like abutment 19 for the preferably preloaded, cylindrical in the sleeve 11
  • Helical compression spring 13 which is referred to as an internal helical compression spring.
  • the axial distance from the top Front end 17 of the single, one-piece sleeve 11 arranged annular collar 16 forms a stop limiting the axial movement of the rigid or rigid contact bolt 15.
  • rotationally symmetrical contact pin 15 consists of a rod 20 and a widened contact head 21 fixed to it, the maximum outer diameter of which is larger than that of the rod 15 and approximately corresponds to that of the sleeve 11.
  • the rod 20 has a tapered lower end 23, against which the inner helical compression spring 13 constantly rests and which centers the upper end of this spring 13. Otherwise, the rod 20 has three circular-cylindrical, adjoining longitudinal sections 24, 25 and 26, as shown.
  • the longitudinal sections 24 and 26 have the same outer diameters.
  • the lower longitudinal section 24, which is always located in the sleeve 11, and the longitudinal area of the longitudinal section 26 projecting into the sleeve 11 are mounted in the sleeve 11 with little sliding bearing play and thus form straight-guided "piston areas" of the rod 20 in the sleeve 11.
  • the annular collar 16 limits the axial upward and downward movement of the contact pin 15.
  • the cylindrical helical compression spring 12, which is referred to as the "outer helical compression spring" is pushed onto the longitudinal section 26 outside the sleeve 11.
  • the outer helical compression spring 12 which is pushed onto the area of the longitudinal section 26 of the rod 20 projecting from the sleeve 11, is constantly pretensioned against both the lower shoulder 31 of the contact head 21 and the free upper end face 17 of the sleeve 11.
  • the solid contact pin 15 is in one piece in FIG. 1, but the contact head 21 can also preferably be arranged as a separate, preferably replaceable part on the rod 20, which is the case with the spring contact pin 10 according to FIG. 2.
  • the point to be contacted by the spring contact pin 10 is contacted by the tip 22 of the contact head 22 and the front contact pin 15 is moved axially downward in a straight line relative to the sleeve 11, so that it penetrates deeper into the sleeve 11 and the tip 22 of the contact head 21 is pressed with the contact force determined by the compression of the springs 12, 13 of preferably more than 100 cN to the contacted point of the test specimen 27 to produce a good electrically conductive connection with it.
  • the contact pin 15 returns to the rest position shown.
  • the straight spring contact pin 10 of FIG. 2 differs from that of FIG. 1 essentially in that in its straight, essentially circular cylindrical sleeve 11, a total of two mutually coaxial, straight contact pins 15, 15 'are mounted in a straight line on opposite end regions of the sleeve 11 , namely a front contact pin 15 and a rear contact pin 15 '. Also in this spring contact pin 10, all of its parts are made of metal, so that it is also electrically conductive over its entire length. His two contacts Bolt 15, 15 'are loaded by the same, arranged within the sleeve 11, preferably preloaded inner cylindrical helical compression spring 13, by constantly abutting the conical ends of the contact bolts 15, 15' projecting into them on both sides.
  • Each contact pin 15, 15 ' is in principle designed like the contact pin 15 according to FIG. 1 and lies with a circular cylindrical longitudinal section 24 or 24' which is always located within the sleeve 11 'in the unloaded rest position of the contact pin 15 or 15' on the collar 16 or 16 'of the sleeve 11, namely by the bias of the springs 12, 13 and 13, 14.
  • On these longitudinal sections 24 and 24' of the rods 20 and 20 'of the contact bolts 15 and 15' close again in Diameter reduced circular cylindrical longitudinal sections or 25 'of these rods to which again enlarged circular cylindrical longitudinal sections 26 and 26' connect, which extend to the widened contact heads 21 and 21 '.
  • the front contact pin 15 is completely rotationally symmetrical, and the like.
  • the sleeve 11, whereas the rear contact pin 15 ' is rotationally symmetrical, with the exception of the cutting tip of its contact head 21'.
  • the outer diameter of the longitudinal sections 26 and 26 ' are the same and correspond to those of the longitudinal sections 24 and 24'. These outer diameters are such that the contact bolts 15, 15 'are guided axially straight through the rods 20, 20' in the sleeve 11 with little Plain bearing play.
  • a cylindrical, prestressed outer helical compression spring 12 or 14 is arranged and is supported on the relevant end face of the sleeve 11 and the relevant contact head 21 and 21 respectively 'From, so that the total spring force exerted on the front contact pin 15, the sum of the spring forces of the springs 12 and 13 and the total spring force exerted on the rear contact pin 15' corresponds to the sum of the spring forces of the springs 13 and 14.
  • the rear, lower, massive, straight contact pin 15 is used to contact a connection contact arranged in a plate, not shown, of a test adapter, also not shown, from which a further conductor leads to a test device or evaluator of the test device in question.
  • the upper contact pin 15 serves to contact the respective test object 27.
  • the outer helical compression springs 12 and 14 allow the length of the spring contact pin to be shortened and / or higher spring forces and / or higher number of load cycles.
  • the spring contact pin according to FIG. 3 differs from that according to FIG. 1 in that its front contact pin 15, like the front contact pin 15 in FIG. 2, has a conical tip 22 on the contact head 21. Furthermore, it has the contact head 21 load-bearing rod 20 a circular cylindrical longitudinal section 24 'arranged constantly within the straight sleeve 11, which serves only to guide the contact pin 15 in the sleeve 11 and on the underside of which a conical tip 23 is arranged for centering the inner cylindrical helical compression spring 13.
  • the rod 20 adjoins a reduced diameter circular cylindrical longitudinal section 26 ⁇ of the rod 20, which extends to the contact head 21 carried by it and on which the outer cylindrical helical compression spring 12 is located on the contact head 21 and the upper front end 17th 'Of the sleeve 11 is arranged in a supporting manner, which together with the inner helical compression spring 13 arranged inside the sleeve 11, the contact bolt 15 mounted in a straight manner in the sleeve 11, so that the total spring force acting on it also corresponds to the sum of the spring forces of the springs 12 and 13.
  • the upper contact pin 15 is used to contact test specimens, one of which is indicated at 27 by dash-dotted lines still out of contact with the tip 22.
  • the sliding straight guide of the contact pin 15 in the sleeve 11 serving longitudinal section 24 'of the contact pin 15 is here constantly within the sleeve 11 and is in the rest position of the contact pin by the prestressed compression springs 12,13 to the inwardly flanged edge of the upper end face 17' the sleeve pressed.
  • the contact pin 15 When contacting a test object, the contact pin 15 is further through the test object in the sleeve 11 while increasing the it is pressed in by the two springs 12, 13, adding up spring forces, which increase accordingly. In this embodiment, the contact pin 15 can be moved down until the compression spring 12 is fully compressed.
  • the outer helical compression spring 12 can also be wound from thicker wire than in the exemplary embodiments according to FIGS. 1 and 2 because of the thinner area 26 ⁇ of the contact pin rod 20 relative to the area 24 ⁇ . results in an even greater spring constant and an even lower risk of breakage.
  • the lower abutment for the inner helical compression spring 13 is formed by a pin 35 which is pressed into the essentially circular cylindrical, rotationally symmetrical sleeve 11 from below.
  • this pin 35 can, if necessary, also be slide-guided in the sleeve 11 with plain bearing play.
  • This pin 35 has an outside of the sleeve, widened contact head 21 '.
  • the sleeve 11 of the spring contact pin 10 can then be arranged and held in the test adapter, for example, in a manner not shown, so that this contact head 21 'is pressed onto a terminal contact 36 firmly inserted in a plate 34 of the test adapter, from which an electrical conductor 39 to one not shown test device or the like.
  • the outer ones Helical compression springs 12, 14 are considerably shorter than the inner helical compression springs 13. This is particularly expedient for reasons of not so great protrusion of the respective contact bolt 15 over the associated sleeve 11.
  • the inner helical compression spring 13 of the spring contact pin 10 can preferably be at least 2 times, preferably at least 3 times longer than the outer helical compression spring 12 or 14.
  • all of the springs 12 to 14 are expediently cylindrical helical springs. However, in special cases it can also be provided to provide non-cylindrical helical springs, such as conical springs or the like, if this is or may be expedient for any reason.
  • the individual solid contact pin 15 is rigid or stiff and cannot be compressed in the axial direction, so that the ends of the prestressed springs 12, 13 which are in contact with it, when it moves axially by a distance, also move by an equally large distance. The same applies to the contact pin 15 'and the abutting ends of the springs 13,14.
  • the outer helical compression spring 12 or 14 also has the important advantage that its outer winding diameter corresponds at least approximately to the outer diameter of the sleeve 11 and can therefore in any case advantageously be larger than the outer winding diameter of the inner helical compression spring 13. This also enables the outer helical compression spring to have a considerably larger spring constant than the inner one Helical compression spring and is therefore more resilient, is exposed to even less risk of breakage, is less expensive to manufacture, etc.
  • outer helical compression spring 12 or 14 can be wound from thicker spring wire than the inner helical compression spring 14, since this makes the expediently larger outer diameter of the outer helical compression spring possible, at least in many cases.
  • outer helical compression spring 12 or 14 may consist of spring wire of the same thickness or thinner than the inner spring 13.

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  • Measuring Leads Or Probes (AREA)
EP88108746A 1987-06-10 1988-06-01 Fiche de contact à ressort Withdrawn EP0294696A3 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3719309 1987-06-10
DE3719309 1987-06-10

Publications (2)

Publication Number Publication Date
EP0294696A2 true EP0294696A2 (fr) 1988-12-14
EP0294696A3 EP0294696A3 (fr) 1989-04-26

Family

ID=6329395

Family Applications (1)

Application Number Title Priority Date Filing Date
EP88108746A Withdrawn EP0294696A3 (fr) 1987-06-10 1988-06-01 Fiche de contact à ressort

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US (1) US4918384A (fr)
EP (1) EP0294696A3 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0422546A2 (fr) * 1989-10-10 1991-04-17 Ingersoll-Rand Company Mécanisme de contact électrique pour transducteurs ultrasoniques sur éléments de fixation

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US5084673A (en) * 1989-06-15 1992-01-28 Nhk Spring Co., Ltd. Electric contact probe
US5225773A (en) * 1992-02-26 1993-07-06 Interconnect Devices, Inc. Switch probe
US5557213A (en) * 1994-12-01 1996-09-17 Everett Charles Technologies, Inc. Spring-loaded electrical contact probe
KR100316450B1 (ko) * 1999-09-21 2001-12-20 배흡 측정기 연결용 전선 접촉구
US6844749B2 (en) * 2002-07-18 2005-01-18 Aries Electronics, Inc. Integrated circuit test probe
US6677772B1 (en) 2002-08-21 2004-01-13 Micron Technology, Inc. Contactor with isolated spring tips
JP3981042B2 (ja) 2003-06-09 2007-09-26 アルプス電気株式会社 コンタクトプローブ及びプローブソケット及び電気特性測定装置並びにコンタクトプローブの押し当て方法
TWI258255B (en) * 2005-05-20 2006-07-11 Ramtek Technology Inc Method of testing ball grid array packed device in real system and test socket assembly therefor
JP4999079B2 (ja) * 2007-04-10 2012-08-15 サンユー工業株式会社 プローブ
DE102008028831C5 (de) * 2008-06-19 2013-06-06 Dorma Gmbh + Co. Kg Antriebssystem zum Antrieb und zur Führung eines Wandelementes für ein Raumtrennwandsystem
US9329204B2 (en) 2009-04-21 2016-05-03 Johnstech International Corporation Electrically conductive Kelvin contacts for microcircuit tester
US8988090B2 (en) 2009-04-21 2015-03-24 Johnstech International Corporation Electrically conductive kelvin contacts for microcircuit tester
KR101149760B1 (ko) * 2009-07-03 2012-06-01 리노공업주식회사 검사용 탐침 장치
KR101247499B1 (ko) * 2012-02-14 2013-04-03 주식회사 휴먼라이트 상하 접점 구조를 갖는 스프링 타입 프로브 핀 및 그 제조 방법
CN102636669A (zh) * 2012-04-24 2012-08-15 北京元六鸿远电子技术有限公司 弹簧探针
US9887478B2 (en) * 2015-04-21 2018-02-06 Varian Semiconductor Equipment Associates, Inc. Thermally insulating electrical contact probe
US9899193B1 (en) 2016-11-02 2018-02-20 Varian Semiconductor Equipment Associates, Inc. RF ion source with dynamic volume control
HUP1700051A2 (hu) * 2017-02-02 2018-08-28 Equip Test Kft Kontaktáló eszköz, fejegység ahhoz, valamint eljárások kontaktáló eszköz és fejegység elõállítására
US10367279B2 (en) * 2017-10-26 2019-07-30 Xilinx, Inc. Pusher pin having a non-electrically conductive portion
CN108336521A (zh) * 2018-04-11 2018-07-27 范长东 一种架空输电线应急用线夹子
KR102216143B1 (ko) * 2019-12-24 2021-02-16 주식회사 아이에스시 검사용 탐침장치

Citations (2)

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Publication number Priority date Publication date Assignee Title
EP0030407A1 (fr) * 1979-12-10 1981-06-17 John Fluke Mfg. Co., Inc. Sonde d'essai électrique pour l'utilisation dans des circuits d'essai pour des plaquettes à circuits imprimés et analogues
EP0237732A1 (fr) * 1986-02-27 1987-09-23 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Tige de contact à ressort pour appareils de test

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JPS59195164A (ja) * 1983-04-20 1984-11-06 Terukazu Yamanishi 回路検出用プロ−ブコンタクト
JPS60140160A (ja) * 1983-12-27 1985-07-25 Sumitomo Wiring Syst Ltd コネクタの端子検査器
DE3706652A1 (de) * 1986-03-26 1987-10-01 Feinmetall Gmbh Pruefadapter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0030407A1 (fr) * 1979-12-10 1981-06-17 John Fluke Mfg. Co., Inc. Sonde d'essai électrique pour l'utilisation dans des circuits d'essai pour des plaquettes à circuits imprimés et analogues
EP0237732A1 (fr) * 1986-02-27 1987-09-23 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Tige de contact à ressort pour appareils de test

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0422546A2 (fr) * 1989-10-10 1991-04-17 Ingersoll-Rand Company Mécanisme de contact électrique pour transducteurs ultrasoniques sur éléments de fixation
EP0422546A3 (en) * 1989-10-10 1992-07-01 Sps Technologies, Inc. Electrical contact mechanism for ultrasonic transducers on fasteners

Also Published As

Publication number Publication date
EP0294696A3 (fr) 1989-04-26
US4918384A (en) 1990-04-17

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