EP0150364B1 - Dispositif de radiodiagnostique comportant un tube à rayons X - Google Patents

Dispositif de radiodiagnostique comportant un tube à rayons X Download PDF

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Publication number
EP0150364B1
EP0150364B1 EP84115065A EP84115065A EP0150364B1 EP 0150364 B1 EP0150364 B1 EP 0150364B1 EP 84115065 A EP84115065 A EP 84115065A EP 84115065 A EP84115065 A EP 84115065A EP 0150364 B1 EP0150364 B1 EP 0150364B1
Authority
EP
European Patent Office
Prior art keywords
electron beam
anode
ray
focus
ray tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
EP84115065A
Other languages
German (de)
English (en)
Other versions
EP0150364A3 (en
EP0150364A2 (fr
Inventor
Ernst Dr. Ammann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of EP0150364A2 publication Critical patent/EP0150364A2/fr
Publication of EP0150364A3 publication Critical patent/EP0150364A3/de
Application granted granted Critical
Publication of EP0150364B1 publication Critical patent/EP0150364B1/fr
Expired legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
    • H01J35/30—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof by deflection of the cathode ray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/045—Electrodes for controlling the current of the cathode ray, e.g. control grids
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/147—Spot size control

Definitions

  • the invention relates to an X-ray diagnostic device according to the preamble of patent claim 1.
  • the requirement is that the X-ray tube current can be changed very quickly.
  • this change results in a relatively long delay time, which is not always acceptable.
  • a rapid change in the x-ray tube current is possible if a control grid is provided between the cathode and the anode of the x-ray tube.
  • the focus must have a predetermined shape and size, on the one hand precluding overloading the anode of the x-ray tube, but on the other hand not exceeding a blurring of the x-ray image given by the focus dimensions. For this purpose, it is known to provide a line focus that is generated on the inclined anode path of the X-ray tube.
  • a method for operating an X-ray tube which has a planar anode, in which the electron beam is deflected on the anode.
  • the anode is designed as a transmission anode. Due to the overall concept, the known X-ray tube is not suitable for use in medical technology.
  • the invention has for its object to provide an X-ray diagnostic device of the type mentioned in such a way that the shape and size of the focus area on the anode can be easily adapted to the respective requirements.
  • a fine electron beam can be generated, the beam current strength of which can be changed quickly with the aid of a control electrode.
  • the electron beam is deflected electronically over a predetermined focus range. In this way it is possible to scan an area which corresponds to the known line focus with the aid of an electron beam. This scanning process accordingly allows the focus size of a line focus to be changed in length and width.
  • the focus size can also be varied in steps or continuously in length and / or width. This means that an optimal focus size with maximum tube utilization can be selected depending on the respective examination method or the object to be examined.
  • a further development of the invention consists in that the intensity of the electron beam during the deflection is adjusted according to a predetermined function.
  • a predetermined function e.g. B. a focus with Gaussian intensity distribution can be realized.
  • the intensity can also be set depending on the object.
  • radiation detectors can be provided which are used to record the actual value of the respective radiation intensity.
  • the cathode 1 shows an X-ray tube, a cathode 1 and an anode 2, which is formed by a rotating anode plate. With the aid of focusing electrodes 3, the cathode 1 emits a filament-shaped electron beam 4 which strikes the focal spot path 5 of the anode 2.
  • the electron beam 4 can be deflected in two mutually perpendicular directions by deflection electrodes 6, 7, which are connected to control voltage generators 8.
  • the cathode 1 is supplied by a heating voltage generator 10.
  • the heating voltage generator 10 and the control voltage generators 8, 9 are connected to a programmer 11 which receives information about the desired focus size and shape at an input 12, about the power per square millimeter on the anode 2 at an input 13 and about the intensity distribution in focus at the input 14 are supplied.
  • An on-off signal is also fed to an input 15.
  • the electron beam 4 is deflected at the start of an on signal at the input 15, corresponding to the signals at the inputs 12 to 14, so that it scans a predetermined focus area.
  • this scanning can take place in a meandering manner in the x and y directions.
  • the sampling frequency for the focus area can be constant or variable. It can be determined depending on the object and / or depending on the selected examination method. This makes it possible to To optimally adapt the shape and size of the focus area to the respective requirements.
  • the intensity distribution in the focus can be fixed, but also variable.
  • FIG. 3 shows the time profile of the voltage Ux at the deflection electrodes 6 for the focus shape according to FIG. 2 and
  • FIG. 4 shows the time profile of the voltage Uy for the focus shape according to FIG. 2 at the deflection electrodes 7.
  • curve a shows the time profile of the voltage at a control grid 16, which determines the intensity of the electron beam 4 in the event that this intensity is constant during the period T, during which an X-ray image is taken.
  • the curve b shows a variable intensity curve, the z. B. can be selected depending on the object and is determined by the signal at input 14.
  • FIG. 1 shows the focus area 17 scanned by the electron beam 4 on the anode 2, which is shown in broken lines in FIG.
  • This focus area can be scanned once during the recording time, as can be seen from FIGS. 2 to 5. Multiple scans are also possible.
  • This facility also allows, for. B. for stereo operation with a single cathode to generate two foci on the anode side.

Landscapes

  • X-Ray Techniques (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Claims (3)

1. Appareil de radiodiagnostic comportant un tube à rayons X, qui possède une cathode (1), des moyens (3) de focalisation du faisceau d'électrons (4) et une anode tournante (2), et dans lequel il est prévu des moyens (6, 7) de déviation du faisceau d'électrons (4), qui sont raccordés à un circuit de commande (8, 9, 11) qui est agencé de telle sorte que le point d'impact du faisceau d'électrons (4) sur l'anode (2) décrit une trajectoire prédéterminée, caractérisé par le fait que la trajectoire du point d'impact du faisceau d'électrons (4) peut être réglée à l'intérieur d'une zone focale déterminée (17) sur l'anode (2).
2. Appareil de radiodiagnostic suivant la revendication 1, caractérisé par le fait que la fréquence de déviation du faisceau d'électrons (4) est choisie de manière qu'une zone focale (17) située sur l'anode (2) est complètement explorée par balayage au moins une fois pendant la durée de prise de vue.
3. Appareil de radiodiagnostic suivant la revendication 1 ou 2, caractérisé par le fait que l'intensité du faisceau d'électrons (4) est réglée, lors de la déviation, conformément à une fonction prédéterminée.
EP84115065A 1984-01-19 1984-12-10 Dispositif de radiodiagnostique comportant un tube à rayons X Expired EP0150364B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19843401749 DE3401749A1 (de) 1984-01-19 1984-01-19 Roentgendiagnostikeinrichtung mit einer roentgenroehre
DE3401749 1984-01-19

Publications (3)

Publication Number Publication Date
EP0150364A2 EP0150364A2 (fr) 1985-08-07
EP0150364A3 EP0150364A3 (en) 1985-09-04
EP0150364B1 true EP0150364B1 (fr) 1988-04-06

Family

ID=6225360

Family Applications (1)

Application Number Title Priority Date Filing Date
EP84115065A Expired EP0150364B1 (fr) 1984-01-19 1984-12-10 Dispositif de radiodiagnostique comportant un tube à rayons X

Country Status (4)

Country Link
US (1) US4748650A (fr)
EP (1) EP0150364B1 (fr)
JP (1) JPS60132000U (fr)
DE (2) DE3401749A1 (fr)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5029195A (en) * 1985-08-13 1991-07-02 Michael Danos Apparatus and methods of producing an optimal high intensity x-ray beam
EP0269927B1 (fr) * 1986-11-25 1993-05-05 Siemens Aktiengesellschaft Appareil de tomographie assisté par ordinateur
FR2644931A1 (fr) * 1989-03-24 1990-09-28 Gen Electric Cgr Tube a rayons x a balayage avec plaques de deflexion
IL91119A0 (en) * 1989-07-26 1990-03-19 Elscint Ltd Arrangement for controlling focal spot position in x-ray tubes
DE4143490C2 (de) * 1991-07-22 1999-04-15 Siemens Ag Verfahren zum Betrieb einer Röntgenröhre
US5581591A (en) * 1992-01-06 1996-12-03 Picker International, Inc. Focal spot motion control for rotating housing and anode/stationary cathode X-ray tubes
DE19509516C1 (de) * 1995-03-20 1996-09-26 Medixtec Gmbh Medizinische Ger Mikrofokus-Röntgeneinrichtung
DE19810346C1 (de) * 1998-03-10 1999-10-07 Siemens Ag Röntgenröhre und deren Verwendung
DE19820243A1 (de) 1998-05-06 1999-11-11 Siemens Ag Drehkolbenstrahler mit Fokusumschaltung
DE19832972A1 (de) * 1998-07-22 2000-01-27 Siemens Ag Röntgenstrahler
US6236713B1 (en) 1998-10-27 2001-05-22 Litton Systems, Inc. X-ray tube providing variable imaging spot size
DE19903872C2 (de) * 1999-02-01 2000-11-23 Siemens Ag Röntgenröhre mit Springfokus zur vergrößerten Auflösung
GB9906886D0 (en) 1999-03-26 1999-05-19 Bede Scient Instr Ltd Method and apparatus for prolonging the life of an X-ray target
GB2350891B (en) * 1999-06-12 2001-04-18 Medical Res Council X-ray beam position monitors
US6771735B2 (en) 2001-11-07 2004-08-03 Kla-Tencor Technologies Corporation Method and apparatus for improved x-ray reflection measurement
DE10224292A1 (de) * 2002-05-31 2003-12-11 Philips Intellectual Property Röntgenröhre
US6839405B2 (en) * 2002-05-31 2005-01-04 Siemens Medical Solutions Usa, Inc. System and method for electronic shaping of X-ray beams
DE102005041923A1 (de) * 2005-09-03 2007-03-08 Comet Gmbh Vorrichtung zur Erzeugung von Röntgen- oder XUV-Strahlung
GB2438439A (en) * 2006-05-27 2007-11-28 X Tek Systems Ltd An automatic x-ray inspection system
US20080095317A1 (en) * 2006-10-17 2008-04-24 General Electric Company Method and apparatus for focusing and deflecting the electron beam of an x-ray device
JP5426089B2 (ja) * 2007-12-25 2014-02-26 株式会社東芝 Ｘ線管及びｘ線ｃｔ装置
DE102008046288B4 (de) * 2008-09-08 2010-12-09 Siemens Aktiengesellschaft Elektronenstrahlsteuerung eines Röntgenstrahlers mit zwei oder mehr Elektronenstrahlen
CN102473574B (zh) * 2009-08-13 2017-12-29 皇家飞利浦电子股份有限公司 具有独立的x和z动态焦斑偏转的X射线管
US8401151B2 (en) * 2009-12-16 2013-03-19 General Electric Company X-ray tube for microsecond X-ray intensity switching
WO2011083416A1 (fr) * 2010-01-08 2011-07-14 Koninklijke Philips Electronics N.V. Tube à rayons x avec un procédé de déviation de foyer x et y combiné
US8320521B2 (en) * 2010-09-30 2012-11-27 General Electric Company Method and system for operating an electron beam system
US9748070B1 (en) 2014-09-17 2017-08-29 Bruker Jv Israel Ltd. X-ray tube anode
US11282668B2 (en) * 2016-03-31 2022-03-22 Nano-X Imaging Ltd. X-ray tube and a controller thereof
US11302508B2 (en) 2018-11-08 2022-04-12 Bruker Technologies Ltd. X-ray tube

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DE1177257B (de) * 1961-10-31 1964-09-03 Licentia Gmbh Verfahren zum Betrieb einer Hochleistungs-roentgenroehre mit grossflaechiger Durchstrahlanode
JPS5435078B1 (fr) * 1970-07-30 1979-10-31
JPS52100891A (en) * 1976-02-19 1977-08-24 Nippon Telegr & Teleph Corp <Ntt> X ray generation method and its device
NL7803065A (nl) * 1977-03-23 1978-09-26 High Voltage Engineering Corp Roentgengenerator voor transaxiale tomografie.
GB1604252A (en) * 1977-06-03 1981-12-09 Emi Ltd X-ray generating arrangements
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US4426722A (en) * 1981-03-12 1984-01-17 Bell Telephone Laboratories, Incorporated X-Ray microbeam generator

Also Published As

Publication number Publication date
EP0150364A3 (en) 1985-09-04
EP0150364A2 (fr) 1985-08-07
US4748650A (en) 1988-05-31
JPS60132000U (ja) 1985-09-03
DE3470361D1 (en) 1988-05-11
DE3401749A1 (de) 1985-08-01

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