JPS60132000U - Ｘ線診断装置 - Google Patents

Ｘ線診断装置

Info

Publication number
JPS60132000U
JPS60132000U JP1985004053U JP405385U JPS60132000U JP S60132000 U JPS60132000 U JP S60132000U JP 1985004053 U JP1985004053 U JP 1985004053U JP 405385 U JP405385 U JP 405385U JP S60132000 U JPS60132000 U JP S60132000U
Authority
JP
Japan
Prior art keywords
ray diagnostic
electron beam
anode
control circuit
diagnostic equipment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1985004053U
Other languages
English (en)
Inventor
エルンスト、アマン
Original Assignee
シーメンス、アクチエンゲゼルシヤフト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by シーメンス、アクチエンゲゼルシヤフト filed Critical シーメンス、アクチエンゲゼルシヤフト
Publication of JPS60132000U publication Critical patent/JPS60132000U/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
    • H01J35/30—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof by deflection of the cathode ray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/045—Electrodes for controlling the current of the cathode ray, e.g. control grids
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/147—Spot size control

Landscapes

  • X-Ray Techniques (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【図面の簡単な説明】
第１図は本考案によるＸ線診断装置の一実施例″の概略
図、第２図は第１図に示した一実施例における焦点形状
を示す概略図、第３図ないし第５図は第１図および第２
図について説明するための特性曲線図である。 １・・・陰極、２・・・陽極、３・・・集束電極、４・
・・電子ビーム、５・・・ターゲツト面、６，７・・・
偏向電極、８．９・・・制御電圧発生器、１０・・・加
熱電圧発生器、１１・・・プログラム発信器、１２，１
３，１４．１５・・・入力、１６・・・制御格子、１７
・・・焦点範囲。

Claims (3)

    【実用新案登録請求の範囲】
  1. （１）陰極１と電子ビーム４用の集束手段３と陽極２と
    を有するＸ線管を備えるとともに、制御回路８，９．１
    １に接続されている電ビーム４片の偏向手段６，７を有
    し、前記制御回路は陽−−２上の電子ビーム４の衝突点
    が予め定められた軌道を描くように構成されているＸ線
    診断装置において、陽極２上の電子ビニム４の衝突点の
    軌道が調節可能であることを特徴とするＸ線診断装置。
  2. （２）電子ビーム４に対する偏向周波数は、陽極２上の
    焦点範囲１７が撮影時間中央なくとも１回完全に走査さ
    れるように選定されていることを特徴とする実用新案登
    録請求の範囲第１項記載のＸ線診断装置。
  3. （３）偏向を行なう際の電子ビーム４の強度が予め定め
    られた関数に基づいて調節されることを特徴とする実用
    新案登録請求の範囲第１項または第２項記載のＸ線診断
    装置。
JP1985004053U 1984-01-19 1985-01-16 Ｘ線診断装置 Pending JPS60132000U (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3401749.6 1984-01-19
DE19843401749 DE3401749A1 (de) 1984-01-19 1984-01-19 Roentgendiagnostikeinrichtung mit einer roentgenroehre

Publications (1)

Publication Number Publication Date
JPS60132000U true JPS60132000U (ja) 1985-09-03

Family

ID=6225360

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985004053U Pending JPS60132000U (ja) 1984-01-19 1985-01-16 Ｘ線診断装置

Country Status (4)

Country Link
US (1) US4748650A (ja)
EP (1) EP0150364B1 (ja)
JP (1) JPS60132000U (ja)
DE (2) DE3401749A1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009158138A (ja) * 2007-12-25 2009-07-16 Toshiba Corp Ｘ線管及びｘ線ｃｔ装置
JP2011129518A (ja) * 2009-12-16 2011-06-30 General Electric Co <Ge> マイクロ秒ｘ線強度切換えのためのｘ線管
JP2013516737A (ja) * 2010-01-08 2013-05-13 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 焦点をｘ及びｙ方向に複合偏向させる方法を備えるＸ線管

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5029195A (en) * 1985-08-13 1991-07-02 Michael Danos Apparatus and methods of producing an optimal high intensity x-ray beam
EP0269927B1 (de) * 1986-11-25 1993-05-05 Siemens Aktiengesellschaft Computertomograph
FR2644931A1 (fr) * 1989-03-24 1990-09-28 Gen Electric Cgr Tube a rayons x a balayage avec plaques de deflexion
IL91119A0 (en) * 1989-07-26 1990-03-19 Elscint Ltd Arrangement for controlling focal spot position in x-ray tubes
DE4124294C2 (de) * 1991-07-22 1997-03-20 Siemens Ag Verfahren für den Betrieb einer Röntgenröhre und Verwendung des Verfahrens
US5581591A (en) * 1992-01-06 1996-12-03 Picker International, Inc. Focal spot motion control for rotating housing and anode/stationary cathode X-ray tubes
DE19509516C1 (de) * 1995-03-20 1996-09-26 Medixtec Gmbh Medizinische Ger Mikrofokus-Röntgeneinrichtung
DE19810346C1 (de) 1998-03-10 1999-10-07 Siemens Ag Röntgenröhre und deren Verwendung
DE19820243A1 (de) 1998-05-06 1999-11-11 Siemens Ag Drehkolbenstrahler mit Fokusumschaltung
DE19832972A1 (de) 1998-07-22 2000-01-27 Siemens Ag Röntgenstrahler
US6236713B1 (en) 1998-10-27 2001-05-22 Litton Systems, Inc. X-ray tube providing variable imaging spot size
DE19903872C2 (de) * 1999-02-01 2000-11-23 Siemens Ag Röntgenröhre mit Springfokus zur vergrößerten Auflösung
GB9906886D0 (en) * 1999-03-26 1999-05-19 Bede Scient Instr Ltd Method and apparatus for prolonging the life of an X-ray target
GB2350891B (en) * 1999-06-12 2001-04-18 Medical Res Council X-ray beam position monitors
US6771735B2 (en) 2001-11-07 2004-08-03 Kla-Tencor Technologies Corporation Method and apparatus for improved x-ray reflection measurement
DE10224292A1 (de) * 2002-05-31 2003-12-11 Philips Intellectual Property Röntgenröhre
US6839405B2 (en) * 2002-05-31 2005-01-04 Siemens Medical Solutions Usa, Inc. System and method for electronic shaping of X-ray beams
DE102005041923A1 (de) * 2005-09-03 2007-03-08 Comet Gmbh Vorrichtung zur Erzeugung von Röntgen- oder XUV-Strahlung
GB2438439A (en) * 2006-05-27 2007-11-28 X Tek Systems Ltd An automatic x-ray inspection system
US20080095317A1 (en) * 2006-10-17 2008-04-24 General Electric Company Method and apparatus for focusing and deflecting the electron beam of an x-ray device
DE102008046288B4 (de) * 2008-09-08 2010-12-09 Siemens Aktiengesellschaft Elektronenstrahlsteuerung eines Röntgenstrahlers mit zwei oder mehr Elektronenstrahlen
JP5675808B2 (ja) * 2009-08-13 2015-02-25 コーニンクレッカ フィリップス エヌ ヴェ 独立したｘ及びｚ方向の動的フォーカルスポット偏向を持つＸ線管
US8320521B2 (en) * 2010-09-30 2012-11-27 General Electric Company Method and system for operating an electron beam system
US9748070B1 (en) 2014-09-17 2017-08-29 Bruker Jv Israel Ltd. X-ray tube anode
US11282668B2 (en) * 2016-03-31 2022-03-22 Nano-X Imaging Ltd. X-ray tube and a controller thereof
US11302508B2 (en) 2018-11-08 2022-04-12 Bruker Technologies Ltd. X-ray tube

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52100891A (en) * 1976-02-19 1977-08-24 Nippon Telegr & Teleph Corp <Ntt> X ray generation method and its device

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1177257B (de) * 1961-10-31 1964-09-03 Licentia Gmbh Verfahren zum Betrieb einer Hochleistungs-roentgenroehre mit grossflaechiger Durchstrahlanode
JPS5435078B1 (ja) * 1970-07-30 1979-10-31
DE2812644A1 (de) * 1977-03-23 1978-10-12 High Voltage Engineering Corp Verfahren und einrichtung fuer die transaxiale rechnerunterstuetzte roentgentomographie
GB1604252A (en) * 1977-06-03 1981-12-09 Emi Ltd X-ray generating arrangements
GB2044489B (en) * 1979-03-21 1983-01-12 Emi Ltd X-ray tube arrangements
DE2932042A1 (de) * 1979-08-07 1981-02-26 Siemens Ag Drehanoden-roentgenroehre
US4426722A (en) * 1981-03-12 1984-01-17 Bell Telephone Laboratories, Incorporated X-Ray microbeam generator

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52100891A (en) * 1976-02-19 1977-08-24 Nippon Telegr & Teleph Corp <Ntt> X ray generation method and its device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009158138A (ja) * 2007-12-25 2009-07-16 Toshiba Corp Ｘ線管及びｘ線ｃｔ装置
JP2011129518A (ja) * 2009-12-16 2011-06-30 General Electric Co <Ge> マイクロ秒ｘ線強度切換えのためのｘ線管
JP2013516737A (ja) * 2010-01-08 2013-05-13 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 焦点をｘ及びｙ方向に複合偏向させる方法を備えるＸ線管

Also Published As

Publication number Publication date
DE3401749A1 (de) 1985-08-01
EP0150364A2 (de) 1985-08-07
DE3470361D1 (en) 1988-05-11
EP0150364A3 (en) 1985-09-04
US4748650A (en) 1988-05-31
EP0150364B1 (de) 1988-04-06

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