EP0064496A1 - Bande de vieillissement accelere a double couche conductrice a bandes multiples - Google Patents
Bande de vieillissement accelere a double couche conductrice a bandes multiplesInfo
- Publication number
- EP0064496A1 EP0064496A1 EP19810901371 EP81901371A EP0064496A1 EP 0064496 A1 EP0064496 A1 EP 0064496A1 EP 19810901371 EP19810901371 EP 19810901371 EP 81901371 A EP81901371 A EP 81901371A EP 0064496 A1 EP0064496 A1 EP 0064496A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- strip
- tape
- conductors
- bonded
- semiconductors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5384—Conductive vias through the substrate with or without pins, e.g. buried coaxial conductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5385—Assembly of a plurality of insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Abstract
Une bande connectrice (10) pour porter des signaux pour tester et donc effectuer un vieillissement accelere d'une pluralite de pastilles semiconductrices comprend une bande de support non conductrice (104) avec des conducteurs de puissance de non croisement (106, 108) et des conducteurs de signaux (110-140) lies a cette bande non conductrice de support. Une pluralite d'ensembles de points de contact (110a-140a) sont egalement lies a la bande de support (104) pour s'engager avec des points de test sur une bande (12) du dispositif sur laquelle les pastilles sont connectees. Des trous d'entrainement par encliquetage (142) sont prevus pour l'avance et l'alignement.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1980/001496 WO1982001803A1 (fr) | 1980-11-07 | 1980-11-07 | Bande de vieillissement accelere a double couche conductrice a bandes multiples |
Publications (1)
Publication Number | Publication Date |
---|---|
EP0064496A1 true EP0064496A1 (fr) | 1982-11-17 |
Family
ID=22154640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19810901371 Withdrawn EP0064496A1 (fr) | 1980-11-07 | 1980-11-07 | Bande de vieillissement accelere a double couche conductrice a bandes multiples |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP0064496A1 (fr) |
WO (1) | WO1982001803A1 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4507544A (en) * | 1982-09-29 | 1985-03-26 | Reliability, Inc. | Burn-in clock monitor |
US4580193A (en) * | 1985-01-14 | 1986-04-01 | International Business Machines Corporation | Chip to board bus connection |
GB2210515A (en) * | 1987-09-25 | 1989-06-07 | Marconi Electronic Devices | Fixture for an integrated circuit chip |
US5164888A (en) * | 1988-12-29 | 1992-11-17 | International Business Machines | Method and structure for implementing dynamic chip burn-in |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3440027A (en) * | 1966-06-22 | 1969-04-22 | Frances Hugle | Automated packaging of semiconductors |
US3859718A (en) * | 1973-01-02 | 1975-01-14 | Texas Instruments Inc | Method and apparatus for the assembly of semiconductor devices |
US3818279A (en) * | 1973-02-08 | 1974-06-18 | Chromerics Inc | Electrical interconnection and contacting system |
US3939381A (en) * | 1974-03-22 | 1976-02-17 | Mcm Industries, Inc. | Universal burn-in fixture |
US4177519A (en) * | 1975-07-28 | 1979-12-04 | Sharp Kabushiki Kaisha | Electronic control assembly mounted on a flexible carrier and manufacture thereof |
US4089733A (en) * | 1975-09-12 | 1978-05-16 | Amp Incorporated | Method of forming complex shaped metal-plastic composite lead frames for IC packaging |
US4132856A (en) * | 1977-11-28 | 1979-01-02 | Burroughs Corporation | Process of forming a plastic encapsulated molded film carrier CML package and the package formed thereby |
US4147889A (en) * | 1978-02-28 | 1979-04-03 | Amp Incorporated | Chip carrier |
CA1138122A (fr) * | 1978-10-13 | 1982-12-21 | Yoshifumi Okada | Carte de cablage imprime souple |
US4195193A (en) * | 1979-02-23 | 1980-03-25 | Amp Incorporated | Lead frame and chip carrier housing |
-
1980
- 1980-11-07 WO PCT/US1980/001496 patent/WO1982001803A1/fr unknown
- 1980-11-07 EP EP19810901371 patent/EP0064496A1/fr not_active Withdrawn
Non-Patent Citations (1)
Title |
---|
See references of WO8201803A1 * |
Also Published As
Publication number | Publication date |
---|---|
WO1982001803A1 (fr) | 1982-05-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5663654A (en) | Universal wafer carrier for wafer level die burn-in | |
US5539324A (en) | Universal wafer carrier for wafer level die burn-in | |
US6562636B1 (en) | Wafer level burn-in and electrical test system and method | |
US4977441A (en) | Semiconductor device and tape carrier | |
US4956605A (en) | Tab mounted chip burn-in apparatus | |
KR960009090A (ko) | 제품 웨이퍼에 형성된 집적 회로를 테스트 하는 장치 및 그 방법과 웨이퍼 | |
US5977784A (en) | Method of performing an operation on an integrated circuit | |
US6249114B1 (en) | Electronic component continuity inspection method and apparatus | |
EP0295007A3 (fr) | Feuille de support, procédé pour la fabrication d'un dispositif semi-conducteur utilisant cette feuille et essayeur associé | |
EP0064496A1 (fr) | Bande de vieillissement accelere a double couche conductrice a bandes multiples | |
JPH10319080A (ja) | 非実装プリント回路基板の試験装置及び方法 | |
US7511520B2 (en) | Universal wafer carrier for wafer level die burn-in | |
KR100751068B1 (ko) | 웨이퍼 레벨 번인 및 전기 테스트 시스템 및 방법 | |
JPH04262551A (ja) | ウェハ試験方法及びこれによって試験された半導体装置 | |
EP0364536A1 (fr) | Pastilles d'essai de vieillissement pour structures d'interconnexion a bonderisation automatique a film | |
JPH11121553A (ja) | ウェハ一括型測定検査のためプローブカードおよびそのプローブカードを用いた半導体装置の検査方法 | |
JPH05114632A (ja) | 電気的特性評価用ボード | |
JPH08110362A (ja) | 微細パターンを含むプリント配線板の導通検査方法 | |
JPH0545398A (ja) | 回路基板の試験方法 | |
JP2000260835A (ja) | 半導体集積回路の検査装置及び検査方法 | |
JP2004228208A (ja) | 検査用基板 | |
JPH03284861A (ja) | プローブカード | |
JPH0338849A (ja) | 半導体集積回路測定治具 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT CH DE FR LU NL SE |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 19830103 |
|
RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: MULHOLLAND, WAYNE A. |