DK2669665T3 - Strålingsbilledopfangningsanordning - Google Patents
Strålingsbilledopfangningsanordning Download PDFInfo
- Publication number
- DK2669665T3 DK2669665T3 DK11857086.0T DK11857086T DK2669665T3 DK 2669665 T3 DK2669665 T3 DK 2669665T3 DK 11857086 T DK11857086 T DK 11857086T DK 2669665 T3 DK2669665 T3 DK 2669665T3
- Authority
- DK
- Denmark
- Prior art keywords
- radiation image
- catching device
- image catching
- radiation
- image
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011013192A JP5784916B2 (ja) | 2011-01-25 | 2011-01-25 | 放射線画像取得装置 |
| PCT/JP2011/074327 WO2012101879A1 (ja) | 2011-01-25 | 2011-10-21 | 放射線画像取得装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DK2669665T3 true DK2669665T3 (da) | 2020-06-02 |
Family
ID=46580466
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK11857086.0T DK2669665T3 (da) | 2011-01-25 | 2011-10-21 | Strålingsbilledopfangningsanordning |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9279890B2 (da) |
| EP (1) | EP2669665B1 (da) |
| JP (1) | JP5784916B2 (da) |
| CN (1) | CN203616268U (da) |
| DE (1) | DE202011110808U1 (da) |
| DK (1) | DK2669665T3 (da) |
| ES (1) | ES2787256T3 (da) |
| WO (1) | WO2012101879A1 (da) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5792472B2 (ja) | 2011-01-25 | 2015-10-14 | 浜松ホトニクス株式会社 | 放射線画像取得装置 |
| JP5944254B2 (ja) | 2012-07-20 | 2016-07-05 | 浜松ホトニクス株式会社 | 放射線画像取得装置 |
| EP2919037A1 (fr) * | 2014-03-13 | 2015-09-16 | Université de Technologie de Troyes | Procédé d'optimisation de la collection de photons dans des cristaux scintillateurs, cristal et utilisations associés |
| WO2015198961A1 (ja) * | 2014-06-24 | 2015-12-30 | 株式会社クボタ | 電動機の固定子及び回転電機の冷却構造 |
| CN104155681A (zh) * | 2014-07-21 | 2014-11-19 | 北京辛耕普华医疗科技有限公司 | 用于监测放射源的定位仪及监测放射源的方法 |
| US10859715B2 (en) | 2015-09-30 | 2020-12-08 | Hamamatsu Photonics K.K. | Radiation image acquisition system and radiation image acquisition method |
| US10845615B2 (en) | 2016-09-29 | 2020-11-24 | Marel Iceland Ehf | Method of generating a three dimensional surface profile of a food object |
| KR102592905B1 (ko) * | 2016-12-21 | 2023-10-23 | 삼성전자주식회사 | 엑스선 영상 촬영 장치 및 제어방법 |
| EP3690429B1 (en) * | 2019-02-04 | 2021-11-03 | MICROTEC S.r.l. | Tunnel ct scanner |
| JPWO2022113507A1 (da) | 2020-11-25 | 2022-06-02 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4578803A (en) * | 1981-12-07 | 1986-03-25 | Albert Macovski | Energy-selective x-ray recording and readout system |
| JPH0795100B2 (ja) | 1986-09-24 | 1995-10-11 | 株式会社日立メデイコ | Ｘ線荷物検査装置 |
| US5864146A (en) | 1996-11-13 | 1999-01-26 | University Of Massachusetts Medical Center | System for quantitative radiographic imaging |
| JPH05152391A (ja) * | 1991-12-02 | 1993-06-18 | Fujitsu Ltd | Ｘ線検査装置 |
| JPH05312734A (ja) * | 1992-05-11 | 1993-11-22 | Fujitsu Ltd | Ｘ線検出方法 |
| JPH0727866A (ja) * | 1993-07-14 | 1995-01-31 | Fuji Photo Film Co Ltd | 放射線検出器 |
| JPH0861941A (ja) * | 1994-08-23 | 1996-03-08 | Toshiba Corp | 放射線検査装置 |
| JP2000298198A (ja) | 1999-02-08 | 2000-10-24 | Fuji Photo Film Co Ltd | 放射線画像データ取得方法および装置 |
| JP2001004561A (ja) * | 1999-06-17 | 2001-01-12 | On Denshi Kk | 基板検査装置 |
| US7130375B1 (en) * | 2004-01-14 | 2006-10-31 | Xradia, Inc. | High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source |
| JP4494026B2 (ja) * | 2004-01-21 | 2010-06-30 | 名古屋電機工業株式会社 | Ｘ線検査装置、ｘ線検査方法およびｘ線検査装置の制御プログラム |
| JP2007155653A (ja) * | 2005-12-08 | 2007-06-21 | Olympus Corp | 放射線観察装置 |
| US7405406B1 (en) | 2006-04-21 | 2008-07-29 | Radiation Monitoring Devices, Inc. | Two-sided scintillation detectors and related methods |
| JP4853964B2 (ja) * | 2006-12-28 | 2012-01-11 | 株式会社Ｉｈｉ検査計測 | Ｘ線検査装置用のｘ線センサ |
| JP2007327967A (ja) * | 2007-07-30 | 2007-12-20 | Toshiba Corp | 放射線弁別測定装置 |
-
2011
- 2011-01-25 JP JP2011013192A patent/JP5784916B2/ja active Active
- 2011-10-21 WO PCT/JP2011/074327 patent/WO2012101879A1/ja active Application Filing
- 2011-10-21 ES ES11857086T patent/ES2787256T3/es active Active
- 2011-10-21 CN CN201190001001.8U patent/CN203616268U/zh not_active Expired - Lifetime
- 2011-10-21 DE DE202011110808.6U patent/DE202011110808U1/de not_active Expired - Lifetime
- 2011-10-21 DK DK11857086.0T patent/DK2669665T3/da active
- 2011-10-21 US US13/981,469 patent/US9279890B2/en active Active
- 2011-10-21 EP EP11857086.0A patent/EP2669665B1/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US9279890B2 (en) | 2016-03-08 |
| CN203616268U (zh) | 2014-05-28 |
| US20140016753A1 (en) | 2014-01-16 |
| JP5784916B2 (ja) | 2015-09-24 |
| ES2787256T3 (es) | 2020-10-15 |
| EP2669665A1 (en) | 2013-12-04 |
| WO2012101879A1 (ja) | 2012-08-02 |
| JP2012154733A (ja) | 2012-08-16 |
| DE202011110808U1 (de) | 2016-07-14 |
| EP2669665A4 (en) | 2017-04-19 |
| EP2669665B1 (en) | 2020-04-01 |
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