DK175850B1 - System og fremgangsmåde til måling af lagtykkelser af et flerlagsrör - Google Patents

System og fremgangsmåde til måling af lagtykkelser af et flerlagsrör Download PDF

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Publication number
DK175850B1
DK175850B1 DK200100644A DKPA200100644A DK175850B1 DK 175850 B1 DK175850 B1 DK 175850B1 DK 200100644 A DK200100644 A DK 200100644A DK PA200100644 A DKPA200100644 A DK PA200100644A DK 175850 B1 DK175850 B1 DK 175850B1
Authority
DK
Denmark
Prior art keywords
detector
tube
measuring
layer thicknesses
scintillation
Prior art date
Application number
DK200100644A
Other languages
Danish (da)
English (en)
Inventor
Finn Fallentin Olesen
Joergen Fink
Bill Sejer Nielsen
Original Assignee
Force Technology
Sciteq Hammel As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Force Technology, Sciteq Hammel As filed Critical Force Technology
Priority to DK200100644A priority Critical patent/DK175850B1/da
Priority to EP02764048.1A priority patent/EP1381826B1/de
Priority to US10/475,944 priority patent/US7092486B2/en
Priority to PCT/DK2002/000260 priority patent/WO2002086421A1/en
Publication of DK200100644A publication Critical patent/DK200100644A/da
Application granted granted Critical
Publication of DK175850B1 publication Critical patent/DK175850B1/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK200100644A 2001-04-24 2001-04-24 System og fremgangsmåde til måling af lagtykkelser af et flerlagsrör DK175850B1 (da)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DK200100644A DK175850B1 (da) 2001-04-24 2001-04-24 System og fremgangsmåde til måling af lagtykkelser af et flerlagsrör
EP02764048.1A EP1381826B1 (de) 2001-04-24 2002-04-22 System und verfahren zur messung der schichtendicke einer mehrschichtigen röhre
US10/475,944 US7092486B2 (en) 2001-04-24 2002-04-22 System and method for the measurement of the layer thickness of a multi-layer pipe
PCT/DK2002/000260 WO2002086421A1 (en) 2001-04-24 2002-04-22 System and method for the measurement of the layer thicknesses of a multi-layer pipe

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DK200100644A DK175850B1 (da) 2001-04-24 2001-04-24 System og fremgangsmåde til måling af lagtykkelser af et flerlagsrör
DK200100644 2001-04-24

Publications (2)

Publication Number Publication Date
DK200100644A DK200100644A (da) 2002-10-25
DK175850B1 true DK175850B1 (da) 2005-03-29

Family

ID=8160450

Family Applications (1)

Application Number Title Priority Date Filing Date
DK200100644A DK175850B1 (da) 2001-04-24 2001-04-24 System og fremgangsmåde til måling af lagtykkelser af et flerlagsrör

Country Status (4)

Country Link
US (1) US7092486B2 (de)
EP (1) EP1381826B1 (de)
DK (1) DK175850B1 (de)
WO (1) WO2002086421A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2441130C (en) * 2001-03-09 2009-01-13 Sumitomo Metal Industries, Ltd. Steel pipe for embedding-expanding, and method of embedding-expanding oil well steel pipe
EP1801536A1 (de) * 2005-12-23 2007-06-27 Uponor Innovation Ab Verfahren zur Herstellung eines Rohres und ein entsprechendes Rohr
FR2904421B1 (fr) 2006-07-28 2008-10-31 Areva Np Sas Procede de caracterisation non destructif, notammenent pour les particules de combustible nucleaire pour reacteur a haute temperature
WO2008039056A1 (en) * 2006-09-25 2008-04-03 Röntgen Technische Dienst Arrangement and method for non destructive measurement of wall thickness and surface shapes of objects with inner surface
CN102059257B (zh) * 2010-11-04 2012-10-03 天津市核人仪器设备有限公司 一种使用γ射线在线测量热轧金属管材壁厚的装置
TW201705047A (zh) * 2015-07-24 2017-02-01 Cliff Young Trading Co Ltd 影像式板體數量計數裝置及方法
US10168288B2 (en) * 2015-09-21 2019-01-01 General Electric Company System for radiography imaging and method of operating such system
EP4163588A1 (de) * 2021-10-08 2023-04-12 Tech Pro Packag S.L. Verfahren und anlage zur herstellung und inspektion von metallbehältern
CN114279373A (zh) * 2021-12-15 2022-04-05 哈尔滨工业大学 一种测量碳氢燃料在冷却通道内产生结焦层厚度的系统、方法和设备

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7906634A (nl) * 1979-09-05 1981-03-09 Philips Nv Inrichting voor het bepalen van lokale absorptie- verschillen in een objekt.
DE3123685A1 (de) * 1980-06-19 1982-03-18 Fuji Electric Co., Ltd., Kawasaki, Kanagawa Verfahren zur wanddicken-messung von rohrfoermigen gegenstaenden
US4574387A (en) * 1981-09-18 1986-03-04 Data Measurement Corporation Apparatus and method for measuring thickness
US4560877A (en) * 1982-12-29 1985-12-24 General Electric Company Solid state detector module
DE3327267A1 (de) 1983-07-28 1985-02-14 Fuji Electric Co., Ltd., Kawasaki, Kanagawa Vorrichtung zur messung der wandstaerke eines rohrfoermigen teils
GB2146115B (en) 1983-09-07 1987-01-07 Fuji Electric Co Ltd Tube wall thickness
US4725963A (en) * 1985-05-09 1988-02-16 Scientific Measurement Systems I, Ltd. Method and apparatus for dimensional analysis and flaw detection of continuously produced tubular objects
DE3669928D1 (de) * 1985-07-12 1990-05-03 Siemens Ag Roentgendetektorsystem.
FR2587804B1 (fr) 1985-09-23 1988-06-17 Commissariat Energie Atomique Systeme de controle au defile, de pieces, par un rayonnement penetrant
US5414648A (en) * 1990-05-31 1995-05-09 Integrated Diagnostic Measurement Corporation Nondestructively determining the dimensional changes of an object as a function of temperature
GB9411468D0 (en) 1994-06-08 1994-07-27 Beta Instr Co Scanning apparatus
US6304626B1 (en) * 1998-10-20 2001-10-16 Kabushiki Kaisha Toshiba Two-dimensional array type of X-ray detector and computerized tomography apparatus
DE69931253T2 (de) 1999-05-10 2007-02-22 Ge Inspection Technologies Gmbh Verfahren zum Messen der Wanddicke rohrförmiger Objekte

Also Published As

Publication number Publication date
US20060098774A9 (en) 2006-05-11
US7092486B2 (en) 2006-08-15
EP1381826B1 (de) 2015-05-27
EP1381826A1 (de) 2004-01-21
US20040234027A1 (en) 2004-11-25
WO2002086421A1 (en) 2002-10-31
DK200100644A (da) 2002-10-25

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Effective date: 20180424