DK1466166T3 - Fremgangsmåde til udförelse af pulverdiffraktionsanalyse - Google Patents

Fremgangsmåde til udförelse af pulverdiffraktionsanalyse

Info

Publication number
DK1466166T3
DK1466166T3 DK03702460T DK03702460T DK1466166T3 DK 1466166 T3 DK1466166 T3 DK 1466166T3 DK 03702460 T DK03702460 T DK 03702460T DK 03702460 T DK03702460 T DK 03702460T DK 1466166 T3 DK1466166 T3 DK 1466166T3
Authority
DK
Denmark
Prior art keywords
sample
powder
radiation
detecting
radiation beam
Prior art date
Application number
DK03702460T
Other languages
Danish (da)
English (en)
Inventor
Erwin Blomsma
Langevelde Adriaan Jan Van
Original Assignee
Avantium Int Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26077587&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DK1466166(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from EP02075149A external-priority patent/EP1327877A1/fr
Application filed by Avantium Int Bv filed Critical Avantium Int Bv
Application granted granted Critical
Publication of DK1466166T3 publication Critical patent/DK1466166T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DK03702460T 2002-01-15 2003-01-15 Fremgangsmåde til udförelse af pulverdiffraktionsanalyse DK1466166T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US34789102P 2002-01-15 2002-01-15
EP02075149A EP1327877A1 (fr) 2002-01-15 2002-01-15 Méthode pour effectuer successivement la diffraction de poudre à une pluralité d'échantillons

Publications (1)

Publication Number Publication Date
DK1466166T3 true DK1466166T3 (da) 2006-10-09

Family

ID=26077587

Family Applications (1)

Application Number Title Priority Date Filing Date
DK03702460T DK1466166T3 (da) 2002-01-15 2003-01-15 Fremgangsmåde til udförelse af pulverdiffraktionsanalyse

Country Status (8)

Country Link
US (1) US7702071B2 (fr)
EP (1) EP1466166B2 (fr)
AT (1) ATE329254T1 (fr)
AU (1) AU2003205621A1 (fr)
DE (1) DE60305875T3 (fr)
DK (1) DK1466166T3 (fr)
ES (1) ES2266772T3 (fr)
WO (1) WO2003060497A1 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2849029B1 (fr) 2002-12-20 2005-03-18 Lafon Labor Procede de preparation et formes cristallines des enantiomeres optiques du modafinil.
DE10317678A1 (de) * 2003-04-17 2004-11-18 Bruker Axs Gmbh Röntgen-optisches System zum kombinatorischen Screening einer Probenbibliothek
CN100485373C (zh) 2004-07-14 2009-05-06 西南技术工程研究所 短波长x射线衍射测量装置和方法
US7597852B2 (en) 2004-09-03 2009-10-06 Symyx Solutions, Inc. Substrate for sample analyses
EP1720007B1 (fr) 2005-05-02 2011-10-05 F. Hoffmann-La Roche Ltd. Méthode et dispositif pour l'analyse par diffraction de rayons x
EP1720006A1 (fr) * 2005-05-02 2006-11-08 F. Hoffmann-La Roche Ag Méthode et dispositif pour l'analyse par diffraction de rayons x
KR20100041509A (ko) * 2008-10-14 2010-04-22 한국표준과학연구원 격자상수 측정용 표준시료 홀더 및 이를 이용한 정량 분석 방법
NL2002196C2 (en) * 2008-11-11 2010-05-17 Avantium Int Bv SAMPLE ANALYZES APPARATUS AND A METHOD OR ANALYZING A SAMPLE.
US9939393B2 (en) * 2015-09-28 2018-04-10 United Technologies Corporation Detection of crystallographic properties in aerospace components

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1598413A1 (de) 1966-01-20 1970-04-23 Exxon Research Engineering Co Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder
US3527942A (en) 1967-11-09 1970-09-08 Atlantic Richfield Co Automatic sample changer for positioning a plurality of pellets in an x-ray analyzer
NL7416557A (en) 1974-12-19 1976-06-22 Hoogovens Ijmuiden Bv Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples
US4016420A (en) * 1975-05-30 1977-04-05 Dekanat Prirodovedecke Fakulty University Karlovy Precession-type x-ray diffraction camera
US4199678A (en) * 1979-01-31 1980-04-22 U.S. Philips Corporation Asymmetric texture sensitive X-ray powder diffractometer
AU534668B2 (en) * 1980-02-05 1984-02-09 Commonwealth Of Australia, The Sample mounting for x-ray diffraction camera
US5359640A (en) 1993-08-10 1994-10-25 Siemens Industrial Automation, Inc. X-ray micro diffractometer sample positioner
JP2904055B2 (ja) 1995-05-30 1999-06-14 株式会社島津製作所 Ｘ線回折装置
US6069934A (en) 1998-04-07 2000-05-30 Osmic, Inc. X-ray diffractometer with adjustable image distance
DE19839472C1 (de) * 1998-08-29 2000-11-02 Bruker Axs Analytical X Ray Sy Automatischer Probenwechsler für Röntgen-Diffraktometer
AU2368900A (en) * 1998-12-18 2000-07-03 Symyx Technologies, Inc. Apparatus and method for characterizing libraries of different materials using x-ray scattering
US6507636B1 (en) 2000-02-10 2003-01-14 Studiengesellschaft Kohle Mbh Rapid X-ray diffraction screening method of polymorph libraries created in multi-well plates
US6400797B1 (en) 2000-06-22 2002-06-04 D'amico Kevin L. Sample changer for capillary geometry X-ray diffractometers
JP2002031609A (ja) * 2000-07-17 2002-01-31 Philips Japan Ltd 結晶構造解析方法
JP2004526949A (ja) 2000-10-19 2004-09-02 ストラクチュラル ジェノミックス，インコーポレーテッド その場ｘ線回折による結晶識別のための装置および方法
US6882739B2 (en) * 2001-06-19 2005-04-19 Hypernex, Inc. Method and apparatus for rapid grain size analysis of polycrystalline materials

Also Published As

Publication number Publication date
ATE329254T1 (de) 2006-06-15
EP1466166A1 (fr) 2004-10-13
DE60305875T2 (de) 2007-06-06
ES2266772T3 (es) 2007-03-01
US7702071B2 (en) 2010-04-20
DE60305875T3 (de) 2013-09-26
EP1466166B1 (fr) 2006-06-07
US20050002487A1 (en) 2005-01-06
AU2003205621A1 (en) 2003-07-30
EP1466166B2 (fr) 2013-05-01
DE60305875D1 (de) 2006-07-20
WO2003060497A1 (fr) 2003-07-24

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