NL7416557A - Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples - Google Patents

Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples

Info

Publication number
NL7416557A
NL7416557A NL7416557A NL7416557A NL7416557A NL 7416557 A NL7416557 A NL 7416557A NL 7416557 A NL7416557 A NL 7416557A NL 7416557 A NL7416557 A NL 7416557A NL 7416557 A NL7416557 A NL 7416557A
Authority
NL
Netherlands
Prior art keywords
samples
ray diffraction
appts
sample
enables automatic
Prior art date
Application number
NL7416557A
Other languages
Dutch (nl)
Original Assignee
Hoogovens Ijmuiden Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoogovens Ijmuiden Bv filed Critical Hoogovens Ijmuiden Bv
Priority to NL7416557A priority Critical patent/NL7416557A/en
Publication of NL7416557A publication Critical patent/NL7416557A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Appts. for carrying out X-ray diffraction determns. of plate-type or powdered samples rotating in their plane and able to be installed at differing angles, comprises (a) a series of sample holders rotatably arranged in a rotatable sample ring, which itself can be tilted around a dia. in its upper plane and around a shaft coupled to a goniometer (b) the goniometer. The sample ring and the sample holder are brought into position for carrying out a determn. and can be driven by electromotors in accordance with a programme. A saving in testing time and increase in throughput of samples in a X-ray diffraction appts. can be achieved by arranging for a number of samples to be placed simultaneously in the appts., after which the required diffraction measurements can be carried out automatically according to a pre-selected programme.
NL7416557A 1974-12-19 1974-12-19 Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples NL7416557A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
NL7416557A NL7416557A (en) 1974-12-19 1974-12-19 Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7416557A NL7416557A (en) 1974-12-19 1974-12-19 Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples

Publications (1)

Publication Number Publication Date
NL7416557A true NL7416557A (en) 1976-06-22

Family

ID=19822685

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7416557A NL7416557A (en) 1974-12-19 1974-12-19 Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples

Country Status (1)

Country Link
NL (1) NL7416557A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1327877A1 (en) * 2002-01-15 2003-07-16 Avantium International B.V. Method for successively performing powder diffraction analysis on a plurality of samples
US7702071B2 (en) 2002-01-15 2010-04-20 Avantium International B.V. Method for performing power diffraction analysis

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1327877A1 (en) * 2002-01-15 2003-07-16 Avantium International B.V. Method for successively performing powder diffraction analysis on a plurality of samples
US7702071B2 (en) 2002-01-15 2010-04-20 Avantium International B.V. Method for performing power diffraction analysis

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