NL7416557A - Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples - Google Patents
Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samplesInfo
- Publication number
- NL7416557A NL7416557A NL7416557A NL7416557A NL7416557A NL 7416557 A NL7416557 A NL 7416557A NL 7416557 A NL7416557 A NL 7416557A NL 7416557 A NL7416557 A NL 7416557A NL 7416557 A NL7416557 A NL 7416557A
- Authority
- NL
- Netherlands
- Prior art keywords
- samples
- ray diffraction
- appts
- sample
- enables automatic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Appts. for carrying out X-ray diffraction determns. of plate-type or powdered samples rotating in their plane and able to be installed at differing angles, comprises (a) a series of sample holders rotatably arranged in a rotatable sample ring, which itself can be tilted around a dia. in its upper plane and around a shaft coupled to a goniometer (b) the goniometer. The sample ring and the sample holder are brought into position for carrying out a determn. and can be driven by electromotors in accordance with a programme. A saving in testing time and increase in throughput of samples in a X-ray diffraction appts. can be achieved by arranging for a number of samples to be placed simultaneously in the appts., after which the required diffraction measurements can be carried out automatically according to a pre-selected programme.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL7416557A NL7416557A (en) | 1974-12-19 | 1974-12-19 | Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL7416557A NL7416557A (en) | 1974-12-19 | 1974-12-19 | Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7416557A true NL7416557A (en) | 1976-06-22 |
Family
ID=19822685
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7416557A NL7416557A (en) | 1974-12-19 | 1974-12-19 | Sample changer for use with an X-ray diffraction unit - enables automatic diffraction measurements to be made for a number of samples |
Country Status (1)
Country | Link |
---|---|
NL (1) | NL7416557A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1327877A1 (en) * | 2002-01-15 | 2003-07-16 | Avantium International B.V. | Method for successively performing powder diffraction analysis on a plurality of samples |
US7702071B2 (en) | 2002-01-15 | 2010-04-20 | Avantium International B.V. | Method for performing power diffraction analysis |
-
1974
- 1974-12-19 NL NL7416557A patent/NL7416557A/en unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1327877A1 (en) * | 2002-01-15 | 2003-07-16 | Avantium International B.V. | Method for successively performing powder diffraction analysis on a plurality of samples |
US7702071B2 (en) | 2002-01-15 | 2010-04-20 | Avantium International B.V. | Method for performing power diffraction analysis |
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