DK108587A - Apparat til maaling af et emnes overfladeprofil - Google Patents

Apparat til maaling af et emnes overfladeprofil

Info

Publication number
DK108587A
DK108587A DK108587A DK108587A DK108587A DK 108587 A DK108587 A DK 108587A DK 108587 A DK108587 A DK 108587A DK 108587 A DK108587 A DK 108587A DK 108587 A DK108587 A DK 108587A
Authority
DK
Denmark
Prior art keywords
measuring
surface profile
subject surface
subject
profile
Prior art date
Application number
DK108587A
Other languages
Danish (da)
English (en)
Other versions
DK108587D0 (da
Inventor
Hugh Rogers Lane
Peter Dean Onyon
Original Assignee
Rank Taylor Hobson Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rank Taylor Hobson Ltd filed Critical Rank Taylor Hobson Ltd
Publication of DK108587D0 publication Critical patent/DK108587D0/da
Publication of DK108587A publication Critical patent/DK108587A/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/282—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring roundness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
    • G01B7/345—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces for measuring evenness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DK108587A 1986-03-04 1987-03-03 Apparat til maaling af et emnes overfladeprofil DK108587A (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB868605324A GB8605324D0 (en) 1986-03-04 1986-03-04 Metrological apparatus

Publications (2)

Publication Number Publication Date
DK108587D0 DK108587D0 (da) 1987-03-03
DK108587A true DK108587A (da) 1987-09-05

Family

ID=10594021

Family Applications (1)

Application Number Title Priority Date Filing Date
DK108587A DK108587A (da) 1986-03-04 1987-03-03 Apparat til maaling af et emnes overfladeprofil

Country Status (8)

Country Link
US (1) US4807152A (cs)
EP (1) EP0240151B1 (cs)
JP (2) JPH0648186B2 (cs)
CN (1) CN87102434A (cs)
DE (3) DE3764135D1 (cs)
DK (1) DK108587A (cs)
GB (1) GB8605324D0 (cs)
IN (1) IN169315B (cs)

Families Citing this family (80)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0240150B1 (en) 1986-03-04 1991-04-17 Rank Taylor Hobson Limited Workpiece position control
IT1211390B (it) * 1987-10-06 1989-10-18 Dea Spa Sistema grafico interattivo per la matematizzazione di modelli fisici
JPH0833433B2 (ja) * 1987-11-30 1996-03-29 東京エレクトロン株式会社 プローブ装置
FR2627582B3 (fr) * 1988-02-23 1990-06-15 Renault Automation Machine a mesurer par coordonnees
GB2218227A (en) * 1988-05-05 1989-11-08 Rank Taylor Hobson Ltd Controlling surface sensing apparatus
DE8814393U1 (de) * 1988-11-17 1989-02-02 Dipl.-Ing. Wolfgang Zwicker GmbH & Co. Elektronische Sensortechnik, 1000 Berlin Ausrichtbarer Sensor
JPH03115902A (ja) * 1989-06-23 1991-05-16 Rank Taylor Hobson Ltd 度量衡装置およびその校正の方法
IT1232879B (it) * 1989-07-21 1992-03-05 Prima Ind Spa Dispositivo e metodo per la misurazione automatica delle dimensioni di solidi di rivoluzione
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US5355439A (en) * 1991-08-05 1994-10-11 Bio Tek Instruments Method and apparatus for automated tissue assay
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GB2294327A (en) * 1994-10-18 1996-04-24 Rank Taylor Hobson Ltd Roundness measuring
JP2701141B2 (ja) * 1995-05-23 1998-01-21 株式会社ミツトヨ 真円度測定装置
US6697748B1 (en) 1995-08-07 2004-02-24 Immersion Corporation Digitizing system and rotary table for determining 3-D geometry of an object
GB2306654A (en) * 1995-10-31 1997-05-07 Rank Taylor Hobson Ltd Surface measuring apparatus
GB9612383D0 (en) 1995-12-07 1996-08-14 Rank Taylor Hobson Ltd Surface form measurement
GB2332056B (en) * 1997-12-04 2000-08-09 Taylor Hobson Ltd Surface measuring apparatus
US6578276B2 (en) * 1998-01-27 2003-06-17 Eastman Kodak Company Apparatus and method for marking multiple colors on a contoured surface having a complex topography
EP0931649A3 (en) * 1998-01-27 2000-04-26 Eastman Kodak Company Apparatus and method for making a contoured surface having complex topology
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US7270785B1 (en) 2001-11-02 2007-09-18 Ventana Medical Systems, Inc. Automated molecular pathology apparatus having fixed slide platforms
US7468161B2 (en) * 2002-04-15 2008-12-23 Ventana Medical Systems, Inc. Automated high volume slide processing system
DK1890127T3 (da) * 2002-04-15 2013-09-23 Ventana Med Syst Inc Automatiseret objektglasfarvningssystem med høj kapacitet
US11249095B2 (en) 2002-04-15 2022-02-15 Ventana Medical Systems, Inc. Automated high volume slide processing system
ES2548158T3 (es) * 2002-04-26 2015-10-14 Ventana Medical Systems, Inc. Aparato de procesamiento de portaobjetos automático
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JP4568621B2 (ja) * 2005-02-28 2010-10-27 株式会社ミツトヨ 表面性状測定機の真直度補正方法および表面性状測定機
JP4755429B2 (ja) * 2005-03-04 2011-08-24 株式会社ミツトヨ 検出器駆動装置
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GB2429291B (en) 2005-08-18 2008-08-20 Taylor Hobson Ltd A metrological apparatus
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GB2437982B (en) * 2006-05-08 2011-07-27 Taylor Hobson Ltd Metrological apparatus
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GB2464509C (en) * 2008-10-17 2014-05-21 Taylor Hobson Ltd Surface measurement instrument and method
KR101548407B1 (ko) 2008-11-12 2015-08-28 벤타나 메디컬 시스템즈, 인코포레이티드 시료 운반 슬라이드를 가열하기 위한 방법 및 장치
JP5371532B2 (ja) * 2009-04-23 2013-12-18 株式会社ミツトヨ 三次元測定機
JP5451180B2 (ja) * 2009-05-22 2014-03-26 株式会社ミツトヨ 真円度測定機
US8650939B2 (en) * 2009-10-13 2014-02-18 Mitutoyo Corporation Surface texture measuring machine and a surface texture measuring method
JP5301412B2 (ja) * 2009-10-21 2013-09-25 株式会社ミツトヨ 測定力制御装置
GB2493214B (en) * 2011-07-29 2016-06-08 Taylor Hobson Ltd Metrological apparatus
GB2493786B (en) 2011-08-19 2017-09-27 Taylor Hobson Ltd Metrological apparatus
AT512005A1 (de) * 2012-02-14 2013-04-15 Minebea Co Ltd Verfahren und vorrichtung zur bestimmung des abstands eines punktes auf einer technischen oberfläche
JP5839476B2 (ja) * 2012-03-19 2016-01-06 大和製衡株式会社 計量装置
JP6113963B2 (ja) * 2012-04-26 2017-04-12 株式会社ミツトヨ 形状測定方法、及び形状測定装置
JP6113998B2 (ja) * 2012-10-18 2017-04-12 株式会社ミツトヨ 形状測定機、形状測定機の調整方法および形状測定方法
CN102944190B (zh) * 2012-11-26 2015-08-05 青岛港湾职业技术学院 一种测量大尺寸机械零件圆度的高精度检测仪及方法
JP6574137B2 (ja) 2013-02-05 2019-09-11 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ 部品を測定する方法および装置
ES2927378T3 (es) 2013-12-13 2022-11-04 Ventana Med Syst Inc Aparato de procesamiento de portaobjetos automatizado
US9581424B2 (en) 2014-12-09 2017-02-28 Tokyo Seimitsu Co., Ltd. Roundness measuring apparatus
CN106272069A (zh) * 2015-06-11 2017-01-04 徐工集团工程机械股份有限公司 一种外圆柱面磨削的圆度与直线度检测装置及检测方法
US10391712B2 (en) * 2016-02-18 2019-08-27 Xerox Corporation System and method for automated cleaning of parts produced by a three-dimensional object printer
US10352679B2 (en) * 2017-03-31 2019-07-16 Mitutoyo Corporation Compact coordinate measurement machine configuration with large working volume relative to size
CN107101570B (zh) * 2017-06-06 2019-07-05 哈尔滨精达测量仪器有限公司 一种齿轮测量中心的直角校准块布局方法、坐标标定方法和坐标调整方法
CN107726973B (zh) * 2017-11-24 2019-11-26 西安工业大学 一种用于大型齿轮的旁置式测量机的测量坐标系建立方法
CN109238210B (zh) * 2018-09-19 2019-12-27 大连理工大学 一种圆形低刚度工件的平行度及平面度测量装置及方法
CN109238218B (zh) * 2018-09-19 2019-12-27 大连理工大学 一种大型抛光机盘面平面度检测装置及其工作方法
CN109813203A (zh) * 2019-03-19 2019-05-28 广东工业大学 一种轮廓仪
GB201918864D0 (en) * 2019-12-19 2020-02-05 Renishaw Plc Apparatus
DE102022124770B3 (de) * 2022-09-27 2024-02-15 Jenoptik Industrial Metrology Germany Gmbh Oberflächenmessgerät

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Also Published As

Publication number Publication date
EP0240151A3 (en) 1988-03-02
DE3789872T2 (de) 1994-09-01
JPH0791949A (ja) 1995-04-07
US4807152A (en) 1989-02-21
JPS62276405A (ja) 1987-12-01
DE3764135D1 (de) 1990-09-13
EP0240151A2 (en) 1987-10-07
JP2606787B2 (ja) 1997-05-07
CN87102434A (zh) 1987-11-25
DE3789875T2 (de) 1994-09-01
EP0240151B1 (en) 1990-08-08
GB8605324D0 (en) 1986-04-09
IN169315B (cs) 1991-09-28
DE3789872T3 (de) 1999-11-25
DE3789875D1 (de) 1994-06-23
DK108587D0 (da) 1987-03-03
JPH0648186B2 (ja) 1994-06-22
DE3789872D1 (de) 1994-06-23

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