DK0876619T3 - Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene - Google Patents

Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene

Info

Publication number
DK0876619T3
DK0876619T3 DK96926571T DK96926571T DK0876619T3 DK 0876619 T3 DK0876619 T3 DK 0876619T3 DK 96926571 T DK96926571 T DK 96926571T DK 96926571 T DK96926571 T DK 96926571T DK 0876619 T3 DK0876619 T3 DK 0876619T3
Authority
DK
Denmark
Prior art keywords
machine
pct
printed circuits
electrical testing
adjustable positioning
Prior art date
Application number
DK96926571T
Other languages
Danish (da)
English (en)
Inventor
Jozef Vodopivec
Cesare Fumo
Original Assignee
New System Srl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New System Srl filed Critical New System Srl
Application granted granted Critical
Publication of DK0876619T3 publication Critical patent/DK0876619T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
DK96926571T 1995-12-22 1996-08-09 Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene DK0876619T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT95UD000251A IT1282829B1 (it) 1995-12-22 1995-12-22 Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda
PCT/IT1996/000160 WO1997023784A1 (en) 1995-12-22 1996-08-09 Machine for the electric test of printed circuits with adjustable position of the sound needles

Publications (1)

Publication Number Publication Date
DK0876619T3 true DK0876619T3 (da) 2001-10-22

Family

ID=11421986

Family Applications (1)

Application Number Title Priority Date Filing Date
DK96926571T DK0876619T3 (da) 1995-12-22 1996-08-09 Maskine til elektrisk test af trykte kredsløb med justerbar positionering af testnålene

Country Status (27)

Country Link
US (1) US6124722A (de)
EP (1) EP0876619B1 (de)
JP (1) JP2000502791A (de)
KR (1) KR100526744B1 (de)
CN (1) CN1175270C (de)
AT (1) ATE202850T1 (de)
AU (1) AU718507B2 (de)
BR (1) BR9612251A (de)
CA (1) CA2241326C (de)
CZ (1) CZ298035B6 (de)
DE (1) DE69613717T2 (de)
DK (1) DK0876619T3 (de)
ES (1) ES2160830T3 (de)
GR (1) GR3036790T3 (de)
HU (1) HUP9901931A3 (de)
IT (1) IT1282829B1 (de)
MX (1) MX9805100A (de)
NO (1) NO315877B1 (de)
NZ (1) NZ315085A (de)
PL (1) PL327496A1 (de)
PT (1) PT876619E (de)
RO (1) RO119659B1 (de)
RU (1) RU2212775C2 (de)
SI (1) SI9620133B (de)
TR (1) TR199801178T2 (de)
UA (1) UA28121C2 (de)
WO (1) WO1997023784A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1282827B1 (it) 1995-09-22 1998-03-31 New System Srl Macchina per il controllo contrapposto dei circuiti stampati
IL152940A0 (en) 2000-07-19 2003-06-24 Orbotech Ltd Apparatus and method for electrical testing of electrical circuits
WO2005093441A1 (fr) * 2004-03-26 2005-10-06 Quanta Display Inc. Dispositif et procede de reparation et de mise a l'essai d'un defaut de ligne
CN100357752C (zh) * 2004-03-26 2007-12-26 广辉电子股份有限公司 线路缺陷检测维修设备及方法
CN100388001C (zh) * 2004-05-24 2008-05-14 名威科技实业有限公司 具有多个侦测单元的检测芯片
DE102009004555A1 (de) 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
CN108761233A (zh) * 2018-05-23 2018-11-06 沈小晴 针对ied设备柔性化测试的模块可切换针盘设备及测试方法
CN113039443A (zh) * 2018-09-11 2021-06-25 迈吉克汽车运动公司 用于在电气和/或电子电路上进行测试的工具和组件
KR102501995B1 (ko) * 2019-12-18 2023-02-20 주식회사 아도반테스토 하나 이상의 피시험 장치를 테스트하기 위한 자동식 테스트 장비 및 자동식 테스트 장비의 작동 방법
JP7217293B2 (ja) * 2019-12-18 2023-02-02 株式会社アドバンテスト １または複数の被テストデバイスをテストするための自動テスト装置、および、自動テスト装置を操作するための方法
TWI797552B (zh) * 2020-02-06 2023-04-01 日商愛德萬測試股份有限公司 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU563614A1 (ru) * 1974-04-17 1977-06-30 Московский Ордена Ленина Энергетический Институт Вихретоковый преобразователь
DE2628428C3 (de) * 1976-06-24 1979-02-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung
DE3781979D1 (de) * 1986-08-07 1992-11-05 Siemens Ag Pruefeinrichtung fuer beidseitige, zweistufige kontaktierung bestueckter leiterplatten.
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
US4975637A (en) * 1989-12-29 1990-12-04 International Business Machines Corporation Method and apparatus for integrated circuit device testing
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts

Also Published As

Publication number Publication date
GR3036790T3 (en) 2002-01-31
ITUD950251A1 (it) 1997-06-22
CZ298035B6 (cs) 2007-05-30
ITUD950251A0 (de) 1995-12-22
TR199801178T2 (xx) 1998-12-21
NO982707D0 (no) 1998-06-12
CN1175270C (zh) 2004-11-10
KR19990076663A (ko) 1999-10-15
AU718507B2 (en) 2000-04-13
EP0876619B1 (de) 2001-07-04
BR9612251A (pt) 1999-07-13
SI9620133B (sl) 2005-10-31
RO119659B1 (ro) 2005-01-28
PL327496A1 (en) 1998-12-21
ATE202850T1 (de) 2001-07-15
NO982707L (no) 1998-07-13
EP0876619A1 (de) 1998-11-11
ES2160830T3 (es) 2001-11-16
HUP9901931A3 (en) 1999-11-29
DE69613717D1 (de) 2001-08-09
CZ187498A3 (cs) 1998-11-11
HUP9901931A2 (hu) 1999-10-28
US6124722A (en) 2000-09-26
NZ315085A (en) 2007-12-21
CN1205774A (zh) 1999-01-20
IT1282829B1 (it) 1998-03-31
JP2000502791A (ja) 2000-03-07
WO1997023784A1 (en) 1997-07-03
PT876619E (pt) 2001-12-28
DE69613717T2 (de) 2002-05-16
MX9805100A (es) 1998-10-31
UA28121C2 (uk) 2000-10-16
AU6668496A (en) 1997-07-17
NO315877B1 (no) 2003-11-03
KR100526744B1 (ko) 2005-12-21
RU2212775C2 (ru) 2003-09-20
CA2241326C (en) 2001-11-27
CA2241326A1 (en) 1997-07-03
SI9620133A (sl) 1998-12-31

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