DE969465C - Halbleiterelement mit scharfen p-n- oder p-n-p-UEbergaengen - Google Patents
Halbleiterelement mit scharfen p-n- oder p-n-p-UEbergaengenInfo
- Publication number
- DE969465C DE969465C DES34551A DES0034551A DE969465C DE 969465 C DE969465 C DE 969465C DE S34551 A DES34551 A DE S34551A DE S0034551 A DES0034551 A DE S0034551A DE 969465 C DE969465 C DE 969465C
- Authority
- DE
- Germany
- Prior art keywords
- protective layer
- semiconductor
- covered
- layer
- sharp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title claims description 23
- 239000010410 layer Substances 0.000 claims description 18
- 239000011241 protective layer Substances 0.000 claims description 12
- 239000013078 crystal Substances 0.000 claims description 7
- 239000010453 quartz Substances 0.000 claims description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 6
- 230000007704 transition Effects 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 5
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 239000004922 lacquer Substances 0.000 claims description 3
- 239000004020 conductor Substances 0.000 claims description 2
- 238000004544 sputter deposition Methods 0.000 claims description 2
- 239000000126 substance Substances 0.000 claims description 2
- 230000001681 protective effect Effects 0.000 claims 1
- 239000004033 plastic Substances 0.000 description 4
- 229920003023 plastic Polymers 0.000 description 4
- 238000009413 insulation Methods 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 239000003337 fertilizer Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000000379 polymerizing effect Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02172—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides
- H01L21/02197—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides the material having a perovskite structure, e.g. BaTiO3
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/15—External mechanical adjustment of electron or ion optical components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/32—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/291—Oxides or nitrides or carbides, e.g. ceramics, glass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3157—Partial encapsulation or coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Analytical Chemistry (AREA)
- Ceramic Engineering (AREA)
- Formation Of Insulating Films (AREA)
Priority Applications (12)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL107276D NL107276C (enrdf_load_stackoverflow) | 1953-07-28 | ||
NLAANVRAGE7906612,A NL189573B (nl) | 1953-07-28 | Scharnier voor een venster met een uit strengprofielen vervaardigde vleugellijst. | |
NL269212D NL269212A (enrdf_load_stackoverflow) | 1953-07-28 | ||
NL101504D NL101504C (enrdf_load_stackoverflow) | 1953-07-28 | ||
NL109229D NL109229C (enrdf_load_stackoverflow) | 1953-07-28 | ||
NL269213D NL269213A (enrdf_load_stackoverflow) | 1953-07-28 | ||
DES11109D DE911529C (de) | 1941-08-06 | 1941-08-06 | Verfahren zur Herstellung von Stereobildern mit Hilfe von Korpuskularstrahlapparaten |
DES34551A DE969465C (de) | 1953-07-28 | 1953-07-28 | Halbleiterelement mit scharfen p-n- oder p-n-p-UEbergaengen |
DES34714A DE1115838B (de) | 1953-07-28 | 1953-08-07 | Verfahren zum oxydierenden chemischen Behandeln von Halbleiteroberflaechen |
DES34794A DE977619C (de) | 1953-07-28 | 1953-08-13 | Verfahren zum Erzeugen einer Schutzschicht auf einer Halbleiteranordnung mit mindestens einem p-n-UEbergang |
DES38554A DE1012378B (de) | 1953-07-28 | 1954-04-05 | Halbleiteranordnung mit p-n-UEbergang |
FR1112727D FR1112727A (fr) | 1953-07-28 | 1954-07-28 | élément semi-conducteur et procédé de fabrication dudit élément |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES34551A DE969465C (de) | 1953-07-28 | 1953-07-28 | Halbleiterelement mit scharfen p-n- oder p-n-p-UEbergaengen |
DES34714A DE1115838B (de) | 1953-07-28 | 1953-08-07 | Verfahren zum oxydierenden chemischen Behandeln von Halbleiteroberflaechen |
DES34794A DE977619C (de) | 1953-07-28 | 1953-08-13 | Verfahren zum Erzeugen einer Schutzschicht auf einer Halbleiteranordnung mit mindestens einem p-n-UEbergang |
DES38554A DE1012378B (de) | 1953-07-28 | 1954-04-05 | Halbleiteranordnung mit p-n-UEbergang |
Publications (1)
Publication Number | Publication Date |
---|---|
DE969465C true DE969465C (de) | 1958-06-04 |
Family
ID=27437475
Family Applications (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DES34551A Expired DE969465C (de) | 1941-08-06 | 1953-07-28 | Halbleiterelement mit scharfen p-n- oder p-n-p-UEbergaengen |
DES34714A Pending DE1115838B (de) | 1941-08-06 | 1953-08-07 | Verfahren zum oxydierenden chemischen Behandeln von Halbleiteroberflaechen |
DES34794A Expired DE977619C (de) | 1941-08-06 | 1953-08-13 | Verfahren zum Erzeugen einer Schutzschicht auf einer Halbleiteranordnung mit mindestens einem p-n-UEbergang |
DES38554A Pending DE1012378B (de) | 1941-08-06 | 1954-04-05 | Halbleiteranordnung mit p-n-UEbergang |
Family Applications After (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DES34714A Pending DE1115838B (de) | 1941-08-06 | 1953-08-07 | Verfahren zum oxydierenden chemischen Behandeln von Halbleiteroberflaechen |
DES34794A Expired DE977619C (de) | 1941-08-06 | 1953-08-13 | Verfahren zum Erzeugen einer Schutzschicht auf einer Halbleiteranordnung mit mindestens einem p-n-UEbergang |
DES38554A Pending DE1012378B (de) | 1941-08-06 | 1954-04-05 | Halbleiteranordnung mit p-n-UEbergang |
Country Status (3)
Country | Link |
---|---|
DE (4) | DE969465C (enrdf_load_stackoverflow) |
FR (1) | FR1112727A (enrdf_load_stackoverflow) |
NL (6) | NL107276C (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1163978B (de) * | 1961-08-30 | 1964-02-27 | Licentia Gmbh | Verfahren zur Erzeugung einer Schutzschicht auf Oberflaechen von Halbleiterkoerpern fuer Halbleiterbauelemente |
DE1172777B (de) * | 1960-08-30 | 1964-06-25 | Int Standard Electric Corp | Halbleiterbauelement mit mindestens einem pn-UEbergang und Verfahren zum Herstellen |
DE2700463A1 (de) * | 1977-01-07 | 1978-07-13 | Siemens Ag | Verfahren zum passivieren von halbleiterelementen |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1246886B (de) * | 1960-07-30 | 1967-08-10 | Elektronik M B H | Verfahren zur Stabilisierung und Verbesserung der Sperreigenschaften von Halbleiterbauelementen |
DE1246888C2 (de) * | 1960-11-24 | 1975-10-23 | Semikron, Gesellschaft für Gleichrichterbau und Elektronik m.b.H., 8500 Nürnberg | Verfahren zum herstellen von gleichrichteranordnungen in brueckenschaltung fuer kleine stromstaerken |
DE1244966B (de) * | 1962-01-17 | 1967-07-20 | Telefunken Patent | Verfahren zur Herstellung von oberflaechenstabilisierten Halbleiterbauelementen |
DE2413608C2 (de) * | 1974-03-21 | 1982-09-02 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Verfahren zum Herstellen eines Halbleiterbauelements |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH262415A (de) * | 1945-04-28 | 1949-06-30 | Hugh Brittain Francis | Kristallgleichrichter und Verfahren zu seiner Herstellung. |
US2524033A (en) * | 1948-02-26 | 1950-10-03 | Bell Telephone Labor Inc | Three-electrode circuit element utilizing semiconductive materials |
GB713996A (en) * | 1951-04-28 | 1954-08-18 | Rca Corp | Improvements in transitor devices |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE626305C (de) * | 1928-03-10 | 1936-03-02 | Siegmund Loewe Dr | Mehrfachroehre |
DE724888C (de) * | 1936-05-30 | 1942-09-09 | Siemens Ag | Verfahren zum Herstellen von Selen-Gleichrichtern |
US2362545A (en) * | 1942-01-29 | 1944-11-14 | Bell Telephone Labor Inc | Selenium rectifier and method of making it |
US2469569A (en) * | 1945-03-02 | 1949-05-10 | Bell Telephone Labor Inc | Point contact negative resistance devices |
NL34436C (enrdf_load_stackoverflow) * | 1945-04-20 | |||
NL144803C (enrdf_load_stackoverflow) * | 1948-02-26 | |||
US2497770A (en) * | 1948-12-29 | 1950-02-14 | Bell Telephone Labor Inc | Transistor-microphone |
NL153395B (nl) * | 1949-02-10 | Contraves Ag | Verbetering van een bistabiele trekkerschakeling. | |
NL152683C (enrdf_load_stackoverflow) * | 1949-03-31 | |||
CA478611A (en) * | 1949-12-29 | 1951-11-13 | Western Electric Company, Incorporated | Etching processes and solutions |
US2619414A (en) * | 1950-05-25 | 1952-11-25 | Bell Telephone Labor Inc | Surface treatment of germanium circuit elements |
BE507187A (enrdf_load_stackoverflow) * | 1950-11-30 | |||
US2669692A (en) * | 1951-08-10 | 1954-02-16 | Bell Telephone Labor Inc | Method for determining electrical characteristics of semiconductive bodies |
GB1576783A (en) * | 1977-11-07 | 1980-10-15 | Teledyne Canada | Control apparatus for a pneumaticallyoperated hopper feeder |
-
0
- NL NL269213D patent/NL269213A/xx unknown
- NL NL269212D patent/NL269212A/xx unknown
- NL NLAANVRAGE7906612,A patent/NL189573B/xx unknown
- NL NL109229D patent/NL109229C/xx active
- NL NL101504D patent/NL101504C/xx active
- NL NL107276D patent/NL107276C/xx active
-
1953
- 1953-07-28 DE DES34551A patent/DE969465C/de not_active Expired
- 1953-08-07 DE DES34714A patent/DE1115838B/de active Pending
- 1953-08-13 DE DES34794A patent/DE977619C/de not_active Expired
-
1954
- 1954-04-05 DE DES38554A patent/DE1012378B/de active Pending
- 1954-07-28 FR FR1112727D patent/FR1112727A/fr not_active Expired
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH262415A (de) * | 1945-04-28 | 1949-06-30 | Hugh Brittain Francis | Kristallgleichrichter und Verfahren zu seiner Herstellung. |
US2524033A (en) * | 1948-02-26 | 1950-10-03 | Bell Telephone Labor Inc | Three-electrode circuit element utilizing semiconductive materials |
GB713996A (en) * | 1951-04-28 | 1954-08-18 | Rca Corp | Improvements in transitor devices |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1172777B (de) * | 1960-08-30 | 1964-06-25 | Int Standard Electric Corp | Halbleiterbauelement mit mindestens einem pn-UEbergang und Verfahren zum Herstellen |
DE1163978B (de) * | 1961-08-30 | 1964-02-27 | Licentia Gmbh | Verfahren zur Erzeugung einer Schutzschicht auf Oberflaechen von Halbleiterkoerpern fuer Halbleiterbauelemente |
DE2700463A1 (de) * | 1977-01-07 | 1978-07-13 | Siemens Ag | Verfahren zum passivieren von halbleiterelementen |
Also Published As
Publication number | Publication date |
---|---|
FR1112727A (fr) | 1956-03-19 |
DE977619C (de) | 1967-08-31 |
NL189573B (nl) | 1900-01-01 |
NL107276C (enrdf_load_stackoverflow) | 1900-01-01 |
DE1115838B (de) | 1961-10-26 |
NL101504C (enrdf_load_stackoverflow) | 1900-01-01 |
NL109229C (enrdf_load_stackoverflow) | 1900-01-01 |
NL269213A (enrdf_load_stackoverflow) | 1900-01-01 |
DE1012378B (de) | 1957-07-18 |
NL269212A (enrdf_load_stackoverflow) | 1900-01-01 |
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