DE9012816U1 - - Google Patents
Info
- Publication number
- DE9012816U1 DE9012816U1 DE9012816U DE9012816U DE9012816U1 DE 9012816 U1 DE9012816 U1 DE 9012816U1 DE 9012816 U DE9012816 U DE 9012816U DE 9012816 U DE9012816 U DE 9012816U DE 9012816 U1 DE9012816 U1 DE 9012816U1
- Authority
- DE
- Germany
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/85—Investigating moving fluids or granular solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0696—Pulsed
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE9012816U DE9012816U1 (de) | 1990-09-07 | 1990-09-07 | |
US07/652,150 US5153674A (en) | 1990-09-07 | 1991-02-07 | Semiconductor production control and/or measuring unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE9012816U DE9012816U1 (de) | 1990-09-07 | 1990-09-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE9012816U1 true DE9012816U1 (de) | 1990-11-08 |
Family
ID=6857286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE9012816U Expired - Lifetime DE9012816U1 (de) | 1990-09-07 | 1990-09-07 |
Country Status (2)
Country | Link |
---|---|
US (1) | US5153674A (de) |
DE (1) | DE9012816U1 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5815264A (en) * | 1994-09-21 | 1998-09-29 | Laser Sensor Technology, Inc | System for acquiring an image of a multi-phase fluid by measuring backscattered light |
JP2956653B2 (ja) * | 1996-12-16 | 1999-10-04 | 日本電気株式会社 | パーティクルモニター装置 |
US5922606A (en) * | 1997-09-16 | 1999-07-13 | Nalco Chemical Company | Fluorometric method for increasing the efficiency of the rinsing and water recovery process in the manufacture of semiconductor chips |
EP1432972A1 (de) | 2001-09-07 | 2004-06-30 | Inficon, Inc. | Signalverarbeitungsverfahren zur in-situ-teilchenüberwachung mit einem gescannten strahl |
US7170602B2 (en) * | 2004-04-08 | 2007-01-30 | Tokyo Electron Limited | Particle monitoring device and processing apparatus including same |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4291230A (en) * | 1979-03-07 | 1981-09-22 | Baxter Travenol Laboratories, Inc. | Fluorometric analyzer including shutter means for simultaneously shielding sample and photodetector during sample change |
US4429995A (en) * | 1980-07-21 | 1984-02-07 | National Research Development Corporation | Two dimensinal flow analyzer |
US4380392A (en) * | 1981-03-18 | 1983-04-19 | Karabegov Mikhail A | Method and apparatus for calibration of instruments serving to count and to determine the size of particles suspended in dispersion medium |
US4394237A (en) * | 1981-07-17 | 1983-07-19 | Bell Telephone Laboratories, Incorporated | Spectroscopic monitoring of gas-solid processes |
JPS61186854A (ja) * | 1985-02-14 | 1986-08-20 | Fuji Photo Film Co Ltd | 超純水中のバクテリア数測定装置 |
GB8606748D0 (en) * | 1986-03-19 | 1986-04-23 | Secr Defence | Monitoring surface layer growth |
US4745285A (en) * | 1986-08-21 | 1988-05-17 | Becton Dickinson And Company | Multi-color fluorescence analysis with single wavelength excitation |
EP0283047A3 (de) * | 1987-03-19 | 1991-02-06 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und Einrichtung zur berührungsfreien Gewinnung von Daten zur ortsaufgelösten Bestimmung der Dichte und Temperatur in einem Messvolumen |
US4919536A (en) * | 1988-06-06 | 1990-04-24 | Northrop Corporation | System for measuring velocity field of fluid flow utilizing a laser-doppler spectral image converter |
DE3901017A1 (de) * | 1989-01-14 | 1990-07-19 | Leybold Ag | Verfahren und vorrichtung zur ueberwachung des schichtabtrags bei einem trockenaetzprozess |
-
1990
- 1990-09-07 DE DE9012816U patent/DE9012816U1/de not_active Expired - Lifetime
-
1991
- 1991-02-07 US US07/652,150 patent/US5153674A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US5153674A (en) | 1992-10-06 |