DE8714912U1 - - Google Patents

Info

Publication number
DE8714912U1
DE8714912U1 DE8714912U DE8714912U DE8714912U1 DE 8714912 U1 DE8714912 U1 DE 8714912U1 DE 8714912 U DE8714912 U DE 8714912U DE 8714912 U DE8714912 U DE 8714912U DE 8714912 U1 DE8714912 U1 DE 8714912U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8714912U
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE8714912U priority Critical patent/DE8714912U1/de
Publication of DE8714912U1 publication Critical patent/DE8714912U1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
    • G02B21/20—Binocular arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/87—Investigating jewels
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/10—Condensers affording dark-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
DE8714912U 1987-05-21 1987-11-09 Expired DE8714912U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8714912U DE8714912U1 (de) 1987-05-21 1987-11-09

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3717051 1987-05-21
DE8714912U DE8714912U1 (de) 1987-05-21 1987-11-09

Publications (1)

Publication Number Publication Date
DE8714912U1 true DE8714912U1 (de) 1988-02-11

Family

ID=25855851

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8714912U Expired DE8714912U1 (de) 1987-05-21 1987-11-09

Country Status (1)

Country Link
DE (1) DE8714912U1 (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1582905A2 (de) * 2004-03-31 2005-10-05 Swift Instruments, Inc. Mikroskop mit höhenverstellbarem Probentisch
DE102007039630B3 (de) * 2007-08-22 2009-01-15 Ullrich Gmbh Verfahren und Vorrichtung zum Prüfen eines Prüfobjekts
EP2594982A1 (de) * 2011-11-16 2013-05-22 Olympus Corporation Mikroskopsystem

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1582905A2 (de) * 2004-03-31 2005-10-05 Swift Instruments, Inc. Mikroskop mit höhenverstellbarem Probentisch
EP1582905A3 (de) * 2004-03-31 2006-03-22 Swift Instruments, Inc. Mikroskop mit höhenverstellbarem Probentisch
US7315414B2 (en) 2004-03-31 2008-01-01 Swift Instruments, Inc. Microscope with adjustable stage
DE102007039630B3 (de) * 2007-08-22 2009-01-15 Ullrich Gmbh Verfahren und Vorrichtung zum Prüfen eines Prüfobjekts
US7916297B2 (en) 2007-08-22 2011-03-29 Ullrich Gmbh Method and apparatus for testing a test object
EP2594982A1 (de) * 2011-11-16 2013-05-22 Olympus Corporation Mikroskopsystem
US9052509B2 (en) 2011-11-16 2015-06-09 Olympus Corporation Microscope system including detachable stage and detachable transmitted illumination optical system

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