DE69903547D1 - Verfahren und vorrichtung zum abfasen von halbleiterscheiben - Google Patents
Verfahren und vorrichtung zum abfasen von halbleiterscheibenInfo
- Publication number
- DE69903547D1 DE69903547D1 DE69903547T DE69903547T DE69903547D1 DE 69903547 D1 DE69903547 D1 DE 69903547D1 DE 69903547 T DE69903547 T DE 69903547T DE 69903547 T DE69903547 T DE 69903547T DE 69903547 D1 DE69903547 D1 DE 69903547D1
- Authority
- DE
- Germany
- Prior art keywords
- wheel
- wafer
- beveling
- semiconductor discs
- edge flanks
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/02—Lapping machines or devices; Accessories designed for working surfaces of revolution
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/16—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B51/00—Arrangements for automatic control of a series of individual steps in grinding a workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
- B24B55/04—Protective covers for the grinding wheel
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
- B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
- B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
- B24B9/065—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9813606.2A GB9813606D0 (en) | 1998-06-25 | 1998-06-25 | Improvements relating to wafer edge polishing |
GBGB9910898.7A GB9910898D0 (en) | 1999-05-12 | 1999-05-12 | Wafer edge polishing method and apparatus |
PCT/GB1999/001928 WO1999067054A1 (en) | 1998-06-25 | 1999-06-17 | Wafer edge polishing method and apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69903547D1 true DE69903547D1 (de) | 2002-11-21 |
DE69903547T2 DE69903547T2 (de) | 2003-07-10 |
Family
ID=26313924
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69903547T Expired - Fee Related DE69903547T2 (de) | 1998-06-25 | 1999-06-17 | Verfahren und vorrichtung zum abfasen von halbleiterscheiben |
Country Status (11)
Country | Link |
---|---|
US (1) | US6428397B1 (de) |
EP (1) | EP1089851B1 (de) |
JP (1) | JP2002518195A (de) |
KR (1) | KR100416446B1 (de) |
CN (1) | CN1138612C (de) |
AT (1) | ATE226127T1 (de) |
DE (1) | DE69903547T2 (de) |
ES (1) | ES2186368T3 (de) |
GB (1) | GB2342060B (de) |
TW (1) | TW445193B (de) |
WO (1) | WO1999067054A1 (de) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2351684B (en) * | 1999-07-03 | 2001-07-11 | Unova Uk Ltd | Improvement in and relating to edge grinding |
KR100602186B1 (ko) | 2004-07-30 | 2006-07-19 | 주식회사 하이닉스반도체 | 웨이퍼 테두리 연마단자를 구비한 웨이퍼 세정장치 |
JP4524643B2 (ja) * | 2005-05-18 | 2010-08-18 | 株式会社Sumco | ウェーハ研磨方法 |
JP2007088143A (ja) * | 2005-09-21 | 2007-04-05 | Elpida Memory Inc | エッジ研磨装置 |
US20070298240A1 (en) * | 2006-06-22 | 2007-12-27 | Gobena Feben T | Compressible abrasive article |
KR100845967B1 (ko) * | 2006-12-28 | 2008-07-11 | 주식회사 실트론 | 웨이퍼 연삭방법 및 연삭휠 |
JP2008284682A (ja) * | 2007-05-21 | 2008-11-27 | Applied Materials Inc | 効率的なテープのルーティング配置を有する斜面研磨ヘッドを使用する方法及び装置 |
US8231431B2 (en) * | 2008-01-24 | 2012-07-31 | Applied Materials, Inc. | Solar panel edge deletion module |
DE102009037281B4 (de) * | 2009-08-12 | 2013-05-08 | Siltronic Ag | Verfahren zur Herstellung einer polierten Halbleiterscheibe |
US8815110B2 (en) * | 2009-09-16 | 2014-08-26 | Cabot Microelectronics Corporation | Composition and method for polishing bulk silicon |
JP6012719B2 (ja) * | 2012-05-07 | 2016-10-25 | 信越半導体株式会社 | 円板形ワーク用外周研磨装置 |
DE102013210057A1 (de) | 2013-05-29 | 2014-12-04 | Siltronic Ag | Verfahren zur Politur der Kante einer Halbleiterscheibe |
DE102013212850A1 (de) | 2013-07-02 | 2013-09-12 | Siltronic Ag | Verfahren zur Politur der Kante einer Halbleiterscheibe |
EP3053704A4 (de) * | 2013-10-04 | 2017-07-19 | Fujimi Incorporated | Poliervorrichtung, verarbeitungsverfahren für ein polierelement, verfahren zur modifikation des polierelements, formverarbeitendes schneidwerkzeug und oberflächenmodifikationswerkzeug |
CN104526493A (zh) * | 2014-11-18 | 2015-04-22 | 天津中环领先材料技术有限公司 | 一种单晶硅晶圆片边缘抛光工艺 |
AT517879B1 (de) * | 2015-11-03 | 2018-02-15 | Berndorf Band Gmbh | Verfahren und Vorrichtung zum Herstellen einer homogenen, geschliffenen Oberfläche eines Metallbands |
TWI583491B (zh) | 2015-11-03 | 2017-05-21 | 財團法人工業技術研究院 | 振動輔助拋光模組 |
CN107627216B (zh) * | 2017-10-11 | 2019-04-05 | 盐城环宇汽车零部件制造有限公司 | 一种基于物联网的高安全性能的智能磨床 |
CN108705396A (zh) * | 2018-07-05 | 2018-10-26 | 天长市百盛半导体科技有限公司 | 一种太阳能电池晶体硅的打磨装置 |
JP7258489B2 (ja) * | 2018-08-21 | 2023-04-17 | 株式会社岡本工作機械製作所 | 半導体装置の製造方法及び製造装置 |
CN109822419A (zh) * | 2019-03-04 | 2019-05-31 | 天通日进精密技术有限公司 | 晶圆转移装置及晶圆转移方法 |
JP7317441B2 (ja) * | 2019-04-15 | 2023-07-31 | 株式会社ディスコ | 面取り加工装置 |
CN110605629B (zh) * | 2019-09-19 | 2022-11-18 | 西安奕斯伟材料科技有限公司 | 一种研磨装置 |
CN111015489B (zh) * | 2019-11-22 | 2021-05-18 | 山西迪迈沃科光电工业有限公司 | 回转体外表面抛光装置 |
CN113714889B (zh) * | 2021-11-03 | 2022-02-11 | 天通控股股份有限公司 | 一种大尺寸超薄高精度铌酸锂晶片边缘加工方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4344260A (en) * | 1979-07-13 | 1982-08-17 | Nagano Electronics Industrial Co., Ltd. | Method for precision shaping of wafer materials |
SU1114528A1 (ru) * | 1981-10-13 | 1984-09-23 | Организация П/Я А-7124 | Устройство дл обработки фасок на полупроводниковых пластинах |
JP2559650B2 (ja) * | 1991-11-27 | 1996-12-04 | 信越半導体株式会社 | ウエーハ面取部研磨装置 |
JP2628424B2 (ja) * | 1992-01-24 | 1997-07-09 | 信越半導体株式会社 | ウエーハ面取部の研磨方法及び装置 |
US5538463A (en) * | 1992-11-26 | 1996-07-23 | Shin-Etsu Handotai Co., Ltd. | Apparatus for bevelling wafer-edge |
JPH07205001A (ja) * | 1993-11-16 | 1995-08-08 | Tokyo Seimitsu Co Ltd | ウェーハ面取り機 |
JP3010572B2 (ja) * | 1994-09-29 | 2000-02-21 | 株式会社東京精密 | ウェーハエッジの加工装置 |
TW308561B (de) * | 1995-08-24 | 1997-06-21 | Mutsubishi Gum Kk | |
GB2317585B (en) * | 1997-06-11 | 1999-12-01 | Western Atlas Uk Ltd | Improvements in and relating to grinding machines |
JP3620679B2 (ja) * | 1996-08-27 | 2005-02-16 | 信越半導体株式会社 | 遊離砥粒によるウエーハの面取装置及び面取方法 |
GB2326523B (en) * | 1997-11-24 | 1999-11-17 | United Microelectronics Corp | Chemical mechanical polishing methods using low ph slurry mixtures |
-
1999
- 1999-06-17 US US09/720,111 patent/US6428397B1/en not_active Expired - Fee Related
- 1999-06-17 CN CNB998097063A patent/CN1138612C/zh not_active Expired - Fee Related
- 1999-06-17 JP JP2000555724A patent/JP2002518195A/ja not_active Withdrawn
- 1999-06-17 GB GB9914215A patent/GB2342060B/en not_active Expired - Fee Related
- 1999-06-17 AT AT99926637T patent/ATE226127T1/de not_active IP Right Cessation
- 1999-06-17 ES ES99926637T patent/ES2186368T3/es not_active Expired - Lifetime
- 1999-06-17 DE DE69903547T patent/DE69903547T2/de not_active Expired - Fee Related
- 1999-06-17 EP EP99926637A patent/EP1089851B1/de not_active Expired - Lifetime
- 1999-06-17 WO PCT/GB1999/001928 patent/WO1999067054A1/en active IP Right Grant
- 1999-06-17 KR KR10-2000-7014818A patent/KR100416446B1/ko not_active IP Right Cessation
- 1999-07-22 TW TW088112436A patent/TW445193B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US6428397B1 (en) | 2002-08-06 |
GB2342060B (en) | 2001-03-07 |
EP1089851B1 (de) | 2002-10-16 |
GB9914215D0 (en) | 1999-08-18 |
GB2342060A (en) | 2000-04-05 |
JP2002518195A (ja) | 2002-06-25 |
ES2186368T3 (es) | 2003-05-01 |
CN1312747A (zh) | 2001-09-12 |
KR100416446B1 (ko) | 2004-01-31 |
DE69903547T2 (de) | 2003-07-10 |
TW445193B (en) | 2001-07-11 |
EP1089851A1 (de) | 2001-04-11 |
WO1999067054A1 (en) | 1999-12-29 |
CN1138612C (zh) | 2004-02-18 |
ATE226127T1 (de) | 2002-11-15 |
KR20010072644A (ko) | 2001-07-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8339 | Ceased/non-payment of the annual fee |